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Analysis

examine and interpret that sensed.

See Also: Analyze, Analyzers, Analytics, Data


Showing results: 2866 - 2880 of 3756 items found.

  • PoE Service Analyzer

    PSA-3002-SA - Sifos Technologies, Inc.

    Comprehensive Assessment of 2-Pair (802.3at) PoE Service at Any PD Outlet. The only PoE Service Tester built on Sifos PowerSync® Analyzer technology.• Analysis and Troubleshooting for All Standard 2-Pair (802.3at) PoE Installations Including Type-2, LLDP Power • Provisioning• Fully Verify Interoperability of PoE Service to the PD• Verify PoE Service Safety Features• Assess Continuous Power Delivery at the PD by PD Class• Assess Transient Power Delivery at the PD• Troubleshoot Intermittent PoE Service Problems• Colorful Microsoft Excel Reporting• Portable Instrument with Rugged Carrying Case

  • RF Adapter Module For FlexRIO

    NI

    RF Adapter Modules for FlexRIO feature frequency coverage from 200 MHz to 4.4 GHz, with up to 200 MHz instantaneous bandwidth. When paired with a PXI FPGA Module for FlexRIO or the Controller for FlexRIO, you can program the FPGA using LabVIEW to implement custom signal processing, including modulation and demodulation, channel emulation, spectral analysis, and even closed-loop control. These modules are all based on a direct conversion architecture and feature an onboard local-oscillator which can be shared with adjacent modules for synchronization. RF adapter modules also provide digital I/O capability for interfacing with external hardware.

  • PXIe-5122, 100 MHz, 100 MS/s, 14-Bit PXI Oscilloscope

    779967-01 - NI

    The PXIe‑5122 high-resolution PXI oscilloscope has two channels with greater than 75 dBc spurious‑free dynamic range (SFDR) and flexible settings for coupling, impedance, voltage range, and filtering. PXI oscilloscopes also feature a number of triggering modes, deep onboard memory, and an instrument driver that includes data streaming and analysis functions. This device is ideal for both time-domain and frequency-domain applications that require high-resolution, low-noise measurements with up to 100 MS/s and 100 MHz of analog bandwidth. The PXIe‑5122 also features advanced PXI synchronization and data streaming capabilities.

  • PXIe-5114, 125 MHz, 250 MS/s, 8-Bit PXI Oscilloscope, 256 MB

    783591-03 - NI

    PXIe, 125 MHz, 250 MS/s, 8-Bit PXI Oscilloscope—The PXIe‑5114 low-cost PXI oscilloscope has two channels that sample up to 250 MS/s with flexible settings for coupling, impedance, voltage range, and filtering. PXI oscilloscopes also feature a number of triggering modes, deep onboard memory, and an instrument driver that includes data streaming and analysis functions. This device is ideal for applications with fast signals that require flexible measurement configurations and up to 125 MHz of analog bandwidth. The PXIe‑5114 also features advanced PXI synchronization and data streaming capabilities.

  • 16/8 Channel 14-bit 250 MS/s Digitizer

    VX1725 / VX1725S - CAEN S.p.A.

    The VX1725S family comes in a VME64X form factor, with 16/8 input channels. The communication to and from the board is provided through the VMEBus and Optical Link interfaces. The VX1725S is a digitizer capable of recording waveforms along with performing advanced algorithms for online digital pulse processing (DPP). Utilizing DPP Firmware, users can acquire quantitative physical parameters (Integrated Charge, Pulse Shape Discrimination with very fine time resolution, Pulse Height Analysis) as well as read out waveforms with automatic pulse identification and baseline suppression on channel basis (Zero-Length Encoding and Dynamic Acquisition Window).

  • Multifunctional Meter

    CPM-12 - Chuan Sheng Electronics Co., Ltd.

    CPM-12 multifunction power meter provide high accuracy single phase and three-phase measuring and displaying, energy accumulating, power quality analysis, and data communication.Hardware can be option a a RS485 Modbus communication port.Auto wiring change (Note) via softwareCE and FCC approved

  • Radio Frequency (RF) Generators

    ViaSat, Inc.

    Find and fix design problems during developmental testing. Viasat’s RF signal environment generation surpasses ordinary simulation and computer modeling techniques to deliver a true-to-life, dense avionics environment for the most accurate analysis of RF communication system performance.

  • Logic Analyzer Probes

    FS2354 & FS2355 - FuturePlus Systems

    The FS2354 and FS2355 are logic analyzer probes used to test DDR3 SO-DIMM memory modules. When used with the triggering and analysis capabilities of Keysight’s Logic Analyzer modules, it gives the user an extremely effective tool for debugging, testing and verifying DDR3 SO-DIMM systems.

  • Radio Conformance Analyzer

    RCA G9200 - Hermon Laboratories Ltd.

    LTE test solution for development, verification and conformance testing of LTE mobile equipment. The G9200 RCA is able to perform analysis of LTE mobile devices at all layers from the physical to the application layer, and is suitable for development, conformance, pre-conformance, and production test applications.

  • Design for Test Service

    Testing House, Inc.

    Design For Test (DFT) is a technique used to implement certain testability features into a product. Testing House can provide an analysis of the CAD data for testability of your circuit board. Access to a board can be very difficult as boards get smaller and designs get more densely populated. We can work with your design engineer to improve testability and maintain an effective in-circuit test. When access to the board is limited and boundary scan devices are present, we can provide the customer a list of key nodes that will require access in order to provide a very effective test. Our analysis will provide a list of all the accessible test points and an explanation for any nodes declared inaccessible.

  • Ancillary Test Cell Products

    SAKOR Technologies, Inc.

    In addition to our innovative and industry leading AccuDyne AC Dynamometers and DynoLAB Test Automation Systems, SAKOR fully integrates a complete range of ancillary products and subsystems necessary for an advanced test cell. Examples include:*Combustion air consumption measurement and conditioning subsystems*Exhaust handling systems*Fuel consumption measurement and conditioning subsystems*Coolant and oil conditioning systems*Throttle actuators*Spark/Fuel controls*Combustion analysis systems*Complete exhaust emissions analysis systems (per 40 CFR 1065 regulations)*Sound attenuating (up to STC 52) test cell enclosures with several fire suppression options*Process water evaporative cooling tower

  • PCIe Adapters

    Teledyne LeCroy

    Teledyne LeCroy offers a broad spectrum of PCI Express protocol analyzer platforms (Summit T516, Summit T54, Summit M5x, Summit™ T416, Summit T48, Summit™ T3-16, Summit T3-8, Summit T34, Summit T28, and Summit T24). The Summit T516, T54 and M5x are Teledyne LeCroy’s leading edge products supporting PCIe 5.0 and CXL specifications. The Summit T416, T48, T34, T3-16 and T3-16 are Teledyne LeCroys midrange protocol analyzers. These protocol analyzers are at the forefront of SSD and computer storage analysis, test and compliance. The Summit T28 and T24 are entry level protocol analysis tools for development and test at PCIe 2.0.

  • Embedded Engineering Solutions

    Rapita Systems Ltd.

    Our engineering solutions support the development of safety-critical embedded systems. We support systems, hardware and software engineering, software V&V including multicore timing analysis, the development of efficient automated test environments, and develop custom tools to meet verification needs.

  • X-ray Inspection Performance

    MXI Quadra 7 - Nordson Corporation

    Ultimate image quality and magnification, Quadra 7 reveals quality defects as small as 0.1 µm. Ideal for root cause failure analysis, wire bond integrity checking, component cracking, MEMS inspection and wafer level components including TSV and wafer bumps.

  • Component & PCB Assembly Testing

    National Technical Systems

    The ever advancing electronics industry requires an increasing need for electronic component testing (IC testing) and component verification. The component test capabilities and component verification lab at NTS performs test and inspection to determine proper component functionality, verification or failure analysis (F/A).

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