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Analysis

examine and interpret that sensed.

See Also: Analyze, Analyzers, Analytics, Data


Showing results: 2986 - 3000 of 3741 items found.

  • PXIe-5111, 350 MHz, 3 GS/s, 8-Bit PXI Oscilloscope

    785769-01 - NI

    PXIe, 350 MHz, 3 GS/s, 8-Bit PXI Oscilloscope—The PXIe-5111 oscilloscope has two channels that sample up to 3 GS/s with flexible and programmable settings for coupling, input impedance, voltage range, and filtering. PXI Oscilloscopes also feature a number of triggering modes, deep onboard memory, and an instrument driver that facilitates high-speed data throughput and includes analysis functions. This device is ideal for automated and partially automated applications that require flexible measurement configurations and up to 350 MHz of analog bandwidth. The PXIe-5111 also features advanced PXI synchronization and data throughput capabilities. Some options also support CableSense™ technology, which can detect and locate signal path faults, changes, or discontinuities.

  • PXIe-5110, 100 MHz, 1 GS/s, 8-Bit PXI Oscilloscope

    785767-01 - NI

    PXIe, 100 MHz, 1 GS/s, 8-Bit PXI Oscilloscope—The PXIe-5110 oscilloscope has two channels that sample up to 1 GS/s with flexible and programmable settings for coupling, input impedance, voltage range, and filtering. PXI Oscilloscopes also feature a number of triggering modes, deep onboard memory, and an instrument driver that facilitates high-speed data throughput and includes analysis functions. This device is ideal for automated and partially automated applications that require flexible measurement configurations and up to 100 MHz of analog bandwidth. The PXIe-5110 also features advanced PXI synchronization and data throughput capabilities. Some options also support CableSense™ technology, which can detect and locate signal path faults, changes, or discontinuities.

  • PXIe-5110, 100 MHz, 1 GS/s, 8-Bit PXI Oscilloscope

    785768-11 - NI

    PXIe, 100 MHz, 1 GS/s, 8-Bit PXI Oscilloscope—The PXIe-5110 oscilloscope has two channels that sample up to 1 GS/s with flexible and programmable settings for coupling, input impedance, voltage range, and filtering. PXI Oscilloscopes also feature a number of triggering modes, deep onboard memory, and an instrument driver that facilitates high-speed data throughput and includes analysis functions. This device is ideal for automated and partially automated applications that require flexible measurement configurations and up to 100 MHz of analog bandwidth. The PXIe-5110 also features advanced PXI synchronization and data throughput capabilities. Some options also support CableSense™ technology, which can detect and locate signal path faults, changes, or discontinuities.

  • PXIe-5110, 100 MHz, 1 GS/s, 8-Bit PXI Oscilloscope

    785768-01 - NI

    PXIe, 100 MHz, 1 GS/s, 8-Bit PXI Oscilloscope—The PXIe-5110 oscilloscope has two channels that sample up to 1 GS/s with flexible and programmable settings for coupling, input impedance, voltage range, and filtering. PXI Oscilloscopes also feature a number of triggering modes, deep onboard memory, and an instrument driver that facilitates high-speed data throughput and includes analysis functions. This device is ideal for automated and partially automated applications that require flexible measurement configurations and up to 100 MHz of analog bandwidth. The PXIe-5110 also features advanced PXI synchronization and data throughput capabilities. Some options also support CableSense™ technology, which can detect and locate signal path faults, changes, or discontinuities.

  • PXIe-5110, 100 MHz, 1 GS/s, 8-Bit PXI Oscilloscope

    785767-11 - NI

    PXIe, 100 MHz, 1 GS/s, 8-Bit PXI Oscilloscope—The PXIe-5110 oscilloscope has two channels that sample up to 1 GS/s with flexible and programmable settings for coupling, input impedance, voltage range, and filtering. PXI Oscilloscopes also feature a number of triggering modes, deep onboard memory, and an instrument driver that facilitates high-speed data throughput and includes analysis functions. This device is ideal for automated and partially automated applications that require flexible measurement configurations and up to 100 MHz of analog bandwidth. The PXIe-5110 also features advanced PXI synchronization and data throughput capabilities. Some options also support CableSense™ technology, which can detect and locate signal path faults, changes, or discontinuities.

  • HD/SD Rasterizers

    PHABRIX Limited

    Based on the award-winning PHABRIX Sx handheld test & measurement range, the rack-mounted Rx series delivers advanced 2K/3G/HD/SD signal generation, analysis and monitoring for faster compliance testing and fault diagnosis of video and audio. Video capture speeds intermittent fault finding, and remote access offers monitoring from any location.

  • Faster fault diagnosis

    Rx Series - PHABRIX Limited

    Based on the award-winning PHABRIX Sx handheld test & measurement range, the rack-mounted Rx series delivers advanced 2K/3G/HD/SD signal generation, analysis and monitoring for faster compliance testing and fault diagnosis of video and audio. Video capture speeds intermittent fault finding, and remote access offers monitoring from any location.

  • Testing Software

    Instron

    Materials testing software packages are available for all new Instron systems and as upgrades to existing Instron systems. All software interfaces are designed to be natural extensions of the instruments for efficient test operation, while also providing a powerful post-test analysis tools, like DIC Replay, and data management tools, like TrendTracker™.

  • Load Bank

    Titan - Simplex Inc

    Very high capacity electrical loads, typically in excess of 10MW, for testing, maintenance and performance analysis of large AC power systems can be formed using the Simplex Titan Load Bank as a building block element. The Titan Load Bank is a self-contained, semi-portable unit providing resistive and inductive loads to 15KVA, .8 power factor, to 600VAC.

  • Multi-channel low-pass filter board

    AAF-2 - Alligator Technologies

    The AAF-2 is a multi-channel low-pass filter board designed for use in front of A/D converters with resolution up to 16-bits.  It is ideal for filtering applications in sound and vibration testing, ultrasonics, acoustics, structural analysis, industrial, test, scientific and laboratory data collection and applied mechanical applications in electronics, aerospace, field research, automotive, and process control industries.

  • Test Laboratory

    Espotel

    We provide research and test laboratory services for electronic devices, systems and solutions in our laboratory located in Jyvskyl, Finland. Laboratory services include:Assistance and consultation in product certificationElectromagnetic compatibility measurements and testing (EMC/ESD)Radio frequency testing (RF)RF and hardware interoperability testingAntenna performance measurementsEnvironmental, mechanical and reliability testingFailure analysis and quality assurance

  • Energy Analyzer

    EP600i - CANDURA Instruments

    The EnergyPro EP600i is portable and easy to use. Perfect for single phase or three phase energy consumption analysis and basic power quality monitoring. It supports standard wiring configurations and comes with a set of 1A - 2500A WideRangeFlexCT ™. The graphics display makes setup very easy and intuitive - you can setup and record data without looking at the manual!

  • Power Quality Meter

    EPM 9800 - GE Digital Energy

    With the socket type mount design EPM 9800 meter is perfect for industrial and utility substation automation applications where both power quality monitoring and revenue accuracy are required. EPM 9800 provides most accurate analysis of electric power and energy. Using advanced DSP technology meter measures instant and stored revenue power data.

  • Semi-Automated Probe Stations

    SPS 2600, SPS 2800, and SPS 12000 Series - MicroXact, Inc.

    The SPS 2600, SPS 2800, and SPS 12000 Series systems are MicroXact’s semi-automated probe stations designed to be flexible and easy to use when performing high productivity device characterization, wafer level reliability testing and failure analysis. These semi-automatic probe station systems are designed to support manual and semi-automatic probing of up to 200mm wafers.

  • MPI Automated Probe Systems

    MPI Advanced Semiconductor Test

    MPI’s 200 mm and 300 mm automated probe systems are dedicated and designed to address current and future requirements for all facets of Device Characterization for Modeling and Technology/Process Development, Failure Analysis, Design Verification, IC engineering, Wafer Level Reliability as well as special requirements for MEMS, High Power, RF and mmW device testing.

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