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Analyzers

examine data methodically by separating into parts and studying their interrelations. AKA: Analysers

See Also: Analyze, Analytics, Analysis


Showing recent results 2731 - 2745 of 3187 products found.

  • Solar Test Systems

    Princeton Applied Research

    Ametek Scientific Instruments manufactures a range of application specific XM (Xtreme Measurement) products focused on solar cell / photovoltaic research (developed in collaboration with Professor Laurie Peter of the University of Bath, UK). These products are so versatile that they can also be used for photoelectrochemical (PEC) water splitting applications; and make use of Solartron’s unique high performance XM specified potentiostats and frequency response analyzers to provide a full complement of techniques for research into energy, corrosion and analytical electrochemistry.

  • Solar Test Systems

    Ametek Scientific Instruments

    AMETEK Scientific Instruments manufactures a range of application specific XM (Xtreme Measurement) products focused on solar cell / photovoltaic research (developed in collaboration with Professor Laurie Peter of the University of Bath, UK). These products are so versatile that they can also be used for photoelectrochemical (PEC) water splitting applications; and make use of Solartron’s unique high performance XM specified potentiostats and frequency response analyzers to provide a full complement of techniques for research into energy, corrosion and analytical electrochemistry.

  • Stroke-to-Raster Scan Conversion

    SSC/300 - Delta Digital Video

    The Model SSC/300 Stroke-to-Video Scan Converter is a rugged, flight-worthy unit designed to convert cockpit stroke video from XYZ vector to a standard raster video format. The converted video can then be recorded, displayed, switched or transmitted using standard video equipment. Stroke video is generated by a variety of random-deflection devices, including certain radar and sonar devices, spectrum analyzers, and Heads Up Display (HUD) generators. A choice of RS-170 or PAL formats are available.

  • 200 MHz Digital Waveform Generator/Analyzer

    PXIe-6548 / 781012-03 - NI

    PXIe, 200 MHz, 32-Channel PXI Digital Waveform Instrument—The PXIe‑6548 is a digital waveform generator and analyzer for interfacing and basic characterization test with 32 single-ended digital pins. The device is capable of sampling digital waveforms at up to 200 MHz and interfacing with user-programmable voltage levels that have a 100 mV resolution. The PXI‑6548 also features advanced synchronization capabilities for building integrated mixed-signal test systems, hardware comparison for bit-error test, and per-bank digital timing features.

  • 200 MHz Digital Waveform Generator/Analyzer

    PXIe-6548 / 781012-01 - NI

    PXIe, 200 MHz, 32-Channel PXI Digital Waveform Instrument—The PXIe‑6548 is a digital waveform generator and analyzer for interfacing and basic characterization test with 32 single-ended digital pins. The device is capable of sampling digital waveforms at up to 200 MHz and interfacing with user-programmable voltage levels that have a 100 mV resolution. The PXI‑6548 also features advanced synchronization capabilities for building integrated mixed-signal test systems, hardware comparison for bit-error test, and per-bank digital timing features.

  • 200 MHz Digital Waveform Generator/Analyzer

    PXIe-6548 / 781012-02 - NI

    PXIe, 200 MHz, 32-Channel PXI Digital Waveform Instrument—The PXIe‑6548 is a digital waveform generator and analyzer for interfacing and basic characterization test with 32 single-ended digital pins. The device is capable of sampling digital waveforms at up to 200 MHz and interfacing with user-programmable voltage levels that have a 100 mV resolution. The PXI‑6548 also features advanced synchronization capabilities for building integrated mixed-signal test systems, hardware comparison for bit-error test, and per-bank digital timing features.

  • 2.7 GHz Dual 8 1 50 Multiplexer

    PXIe-2747 - NI

    PXIe, 2.7 GHz, Dual 8x1 PXI RF Multiplexer Switch Module—The PXIe‑2747 is a PXI RF multiplexer switch module that is ideal for switching RF signals up to 2.7 GHz in production test applications. The high channel count of the PXIe‑2747 makes it well-suited for test systems that require switching a large number of RF signals, such as switching several devices under test to a single channel on the RF analyzer. It also features onboard relay counting for relay monitoring.

  • 2.7 GHz Quad 4 1 50 Multiplexer

    PXIe-2746 - NI

    PXIe, 2.7 GHz, Quad 4x1 PXI RF Multiplexer Switch Module—The PXIe‑2746 is a PXI RF multiplexer switch module that is ideal for switching RF signals up to 2.7 GHz in production test applications. The high channel count of the PXIe‑2746 makes it well-suited for test systems that require switching a large number of RF signals, such as switching several devices under test to a single channel on the RF analyzer. It also features onboard relay counting for relay monitoring.

  • 350 MHz 8 9 50 Matrix

    PXI-2540 / 778572-40 - NI

    350 MHz, 8x9 PXI RF Matrix Switch Module—The PXI‑2540 is an RF signal switching matrix. With its non-blocking design, you can simultaneously connect any row or column within the switching matrix and maximize the flexibility of your test system. Isolation relays on the module disconnect unused parts of the switching matrix to maintain RF performance and high isolation. The density and bandwidth of the PXI‑2540 is ideal for routing signals between digitizers, function generators, and other RF generators and analyzers.

  • 3 GHz 16 1 50 Multiplexer

    PXIe-2748 - NI

    PXIe, 3 GHz, 16x1 PXI RF Multiplexer Switch Module—The PXIe‑2748 is a PXI RF multiplexer switch module that is ideal for switching RF signals up to 3 GHz in production test applications. The high channel count of the PXIe‑2748 makes it well-suited for test systems that require switching a large number of RF signals, such as switching several devices under test to a single channel on the RF analyzer. It also features onboard relay counting for relay monitoring.

  • 4 x 28 Gb/s Bit Error-Rate Tester

    CA9803 - UC Instruments, Corp.

    CA9803 is a high performance, easy to use, all‐in‐one,costeffective,  4 x 28 Gb/s Bit Error‐Rate Tester(BERT) for current 100 GTOSA/ROSA components R&D and manufacturing environments as well as field installations. The CA9803 incorporates an internal reference clock, a pattern generator, clock recovery circuits, and a BER analyzer, in one compact module that provides both electrical and optical interfaces at data rates up to 28 Gb/s. The CA9803 is offered with an RS‐232 or USB interface.

  • AC Hipot w/ Ground Bond Test Capability

    HypotULTRA® Series - Associated Research

    In a world where data is king, HypotUTLRA improves traceability with on-board data storage and allows you to automate hipot testing with a variety of communication interfaces. Increase efficiency with our direct barcode scanner connection and intuitive touch screen interface. Models 7804 and 7854 are a 4-in-1 solution with the addition of 40A AC Ground Bond test capability added to HypotULTRA's already impressive feature list. HypotULTRA is a dielectric analyzer designed to take your production line to the next level.

  • Auger Microprobe

    Auger - JEOL Ltd.

    It is a high specification Auger electron spectrometer with a hemispherical analyzer to provide high throughput analysis of the chemical bonding state at nano to micro areas, and a field emission electron gun also used for EPMA, because it can deliver a large, stable electric current The highly precise eucentric specimen stage makes it possible to perform the previously-impossible analysis of insulators. This in combination with the floating type ion gun offers the versatility to handle any specimen, such as metals and insulation materials, to obtain composition information to and chemical information.

  • Benchtop X-ray diffraction (XRD) instrument

    MiniFlex - Rigaku Corp.

    New sixth generation MiniFlex X-ray diffractometer (XRD) is a multipurpose analytical instrument that can determine: phase identification and quantification, percent (%) crystallinity, crystallite size and strain, lattice parameter refinement, Rietveld refinement, and molecular structure. It is widely used in research, especially in material science and chemistry, as well as in industry for research and quality control. It is the newest addition to MiniFlex series of benchtop X-ray diffraction analyzers from Rigaku, which began with the introduction of the original MiniFlex system decades ago.

  • Bias Current Test System

    Model 11300 - MEL Systems and Services Ltd.

    Chroma 11300 bias current test system is an integration test system of LCR Meter and Bias Current Source.It consists of Chroma 3252/3302 series Automatic Component Analyzer and Chroma 1320 series Bias Current Source. The Chroma 1320 series bias current source output can be controlled by Chroma 3252/3302 LCR meter directly. The bias current output capacity can be selected up to 100A to satisfy various testing in R&D, QC, QA, and production applications.