Filter Results By:

Products

Applications

Manufacturers

Analyzers

examine data methodically by separating into parts and studying their interrelations.

See Also: Analyze, Analytics, Analysis


Showing results 2746 - 2760 of 3039 products found.

  • PXI Single 4 to 1 RF Multiplexer 2GHz 50 Ohm SMA

    40-745-591 - Pickering Interfaces Ltd.

    40-740, 40-745 and 40-746 RF Multiplexers are a range of Bi-Directional Multiplexers with bandwidth up to 2000MHz. They are arranged as Single 8 to 1, Dual 4 to 1 or Single 4 to 1 configurations, all with excellent Insertion Loss, VSWR and Isolation, in 50 Ohm or 75 Ohm versions with a wide choice of connectors.Applications include routing high frequency signals to and from oscilloscopes, analyzers, signal generators and synthesizers, telecoms tributary switching (from 2MBit/s to 155MBit/S),video/audio switching and switching high frequency logic signals.

  • PXI Single 4 to 1 RF Multiplexer 2GHz 75 Ohm SMZ

    40-745-711 - Pickering Interfaces Ltd.

    40-740, 40-745 and 40-746 RF Multiplexers are a range of Bi-Directional Multiplexers with bandwidth up to 2000MHz. They are arranged as Single 8 to 1, Dual 4 to 1 or Single 4 to 1 configurations, all with excellent Insertion Loss, VSWR and Isolation, in 50 Ohm or 75 Ohm versions with a wide choice of connectors. Applications include routing high frequency signals to and from oscilloscopes, analyzers, signal generators and synthesizers, telecoms tributary switching (from 2MBit/s to 155MBit/S),video/audio switching and switching high frequency logic signals.

  • Particle Deposition Systems

    2300-1 and 2300-2 - MSP Corporation

    2300-1 and 2300-2 Particle Deposition Systems (PDS™) are the latest, most advanced particle deposition tools from MSP for creating polystyrene latex (PSL) sphere size standards needed to calibrate KLA-Tencor, Applied Materials, TopCon, Hitachi and other wafer surface inspection systems. The new NPT (Nano Particle Technology) tools provide:True 20nm deposition capabilityUp to 12 different PSL sphere sizes and up to 50 different spots of particles in a single recipe±2% particle size accuracy for particles >50nm and ±1.0nm for particles < 50nmFull deposition and pattern deposition (spot, arc, and ring) while retaining all the desirable features of the popular 2300 tools:Differential mobility analyzer (DMA) technology for accurate particle sizing and size classificationAutomated NIST traceable calibration routineRecipe controlDeposition of Process Particles (Si, SiO2, Al2O3, TiO2, Si3N4, Ti, W, Ta, Cu, etc.) as well as PSL spheresThe 2300N-PT1 requires manual wafer loading while the 2300-NPT2 has automated wafer handling including dual FOUP load ports and an ISO Class 1 mini-environment. Bridge tool options for handling 200 and 300mm wafers are available. Please contact factory for more details.

  • EMI Test Receiver

    ESRP - Rohde & Schwarz GmbH & Co. KG

    EMI test receiver and signal/spectrum analyzer combined in one boxOptional preselection and preamplifier (R&S®ESRP-B2)Resolution bandwidths in line with CISPR, optionally in decade steps from 10 Hz to 1 MHz (R&S®ESRP-B29)Weighting detectors: max. peak, min. peak, average, RMS, quasi-peak, average with meter time constant, and RMS in line with current CISPR 16-1-1 versionStandard-compliant disturbance measurements for pulsed disturbances with repetition frequencies ≥ 10 Hz (with R&S®ESRP-B2 preselection/preamplifier option)Very fast FFT-based time domain scan as an option (R&S®ESRP-K53)Automatic test routinesIF analysis as an option (R&S®ESRP-K56)

  • Multifunctional Meter

    CPM-80 - Chang Shuan Electronics Co., Ltd.

    CPM-80 multifunction power analyzer provide high accuracy single phase and three-phase energy measuring and displaying, energy accumulating, power quality analysis, data logging and data communication. CPM-80 series meters are able to measure bidirectional, four quadrants kWh and kVarh. It provides maximum/minimum records for power usage and power demand parameters. Hardware standard built in a RS485 Modbus communication port , 4 Digital inputs, 2 Relay outputs, LCM and 2MB flash for data-logging. In addition , also provide TOU , voltage and current THD, harmonics up to the 63rd and auto wiring change via software .

  • Modular Power System

    N6700 Series - Keysight Technologies

    The Keysight N6700 Modular Power System (MPS) mainframes offer solutions for automated test system environments as well as R&D. The Keysight N6700 Low-Profile mainframes simplify test-system assembly, programming, debugging and operation. Its flexibility, small size, and fast command processing time make it ideal for ATE and production test environments. The N6705 DC Power Analyzer mainframe provides unrivaled productivity gains for sourcing and measuring DC voltage and current by integrating up to four advanced power supplies with DMM, Scope, Arb, and Data Logger features.

  • MIL-STD-1553 A, B Simulator/Analyzer/Tester

    CIC201 - Andor Design Corp.

    MIL-STD-1553 A, B Simulator/Analyzer/Tester - CIC201B VME/VXI B Size Interface, CIC201C VME/VXI C Size Interface - The CIC201 can be used for Validation Testing, Production Testing, full bus simulation and monitoring, as a general purpose 1553 interface or a stand alone bus Analyzer. For precise message scheduling and measurements, the Major and minor frame times are independent of message sequences or retransmissions on errors and the start of all command messages are independent of message length, response time or length of response. Message timing is calibrated and RT responses have low jitter.

  • Micro probes 1 MHz up to 1 GHz

    MFA 02 set - Langer EMV-Technik GmbH

    The two in the set included micro probes are used to measure low-frequency magnetic fields up to 1 GHz, e.g. at signal conductors (150µm), SMD componets (0603-0201) or IC pins. The MFA micro probes are guided by hand. An amplifier stage is integrated into the probe head. The amplifier stage (9V, 100mA) is powered via the BT 706 Bias tee. It has an impedance of 50 Ohm. The micro probes are connected via the Bias tee to a spectrum analyzer or an oscilloscope. The MFA 02 set delivery of Langer EMV-Technik GmbH includes correction lines. With the help of the correction lines the probe output voltage is converted either into the respective magnetic field or to the current which is running through the conductor.

  • Micro probes 1 MHz up to 6 GHz

    MFA 01 set - Langer EMV-Technik GmbH

    The micro probes are used to measure magnetic fields and they have a high resolution. They measure magnetic fields up to 6 GHz, e.g. at signal conductors (150µm), SMD components (0603-0201) or IC pins. The MFA micro probes are guided by hand. An amplifier stage is integrated into the probe head. The amplifier stage (9V, 100mA) is powered via the Bias tee BT 706. It has an impedance of 50 Ohm. The micro probes are connected via the Bias tee BT 706 to a spectrum analyzer or an oscilloscope. Langer EMV-Technik GmbH includes correction lines in the delivery. With the help of the correction lines the probe output voltage is converted either into the respective magnetic field or to the current which is running through the conductor.

  • NanoVIP QUADRA

    Elcontrol Energy Net S.r.l.

    Portable MRH™ analyzers of power qualityNANOVIP® QUADRA™ represents a brand new technology for modern high-end analyzers.MRH™ technology makes it possible to perform realtime energy and power quality measurement on spread and complex networks; thanks to its wireless capability it does not require any wiring and boosts up easiness of installation and usage.A powerfull and reliable wireless capability makes it possible to make realtime and concurrent measures on wide networks as it can can guarantee connection with a maximum point to point distance of 600m outdoor and 60m indoor. The mesh strategy of the network makes it possible to reach huge network extensions, because each device repeats signals through the network.

  • Near Field Probes 1GHz - 10 GHz

    SX set - Langer EMV-Technik GmbH

    The SX1 set consists of 3 passive near field probes for making measurements in the development phase of E-field and magnetic field with a high clock frequency in the range from 1 GHz to 10 GHz. The probe heads of the set SX allow for measurements close to electronic assemblies, e.g. on single IC pins, conducting paths, components and their connectors, to localize interference sources. Field orientation and field distribution on an electronic assembly can be detected through trained use of the near field probe. The near field probes are small and handy. They have a sheath current attenuation and are electrically shielded. They can be connected to a spectrum analyzer or an oscilloscope with a 50 Ω input. They have an internal terminating resistance.

  • Near Field Probes 30 MHz up to 3 GHz

    RF1 set - Langer EMV-Technik GmbH

    The RF1 near field probe set consists of 4 passive near field probes for making measurements in the development phase of E-field and magnetic field in the ranges of 30 MHz to 3 GHz on electronic assemblies. The probe heads of the RF1 set allow for measurements close to the electronic assemblies, e.g. on single IC pins, conducting paths, components and their connectors in order to localize interference sources. Field orientation and field distribution on an electronic assembly can be detected through a trained special use of the near field probe. The near field probes are small and handy. They have a sheath current attenuation and are electrically shielded. They can be connected to a spectrum analyzer or an oscilloscope with a 50 Ω input. They do not have an internal terminating resistance.

  • Insulation Resistance Measurement

    MD 5075x - Scope T&M Pvt, Ltd.

    The digital insulation tester model MD-5075x is Megabras'' cutting edge insulation analyzer equipment and it is one of the most complete and sophisticated available in the international market. A powerful software allows for further analysis of tests results, including features such as graphical representation and automatic report generation. Its proven technology provides safe, reliable and accurate measurements of insulation resistances up to 5 TW, with 4 pre-selected test voltages, 500 V - 1 kV - 2.5 kV - 5 kV. Other test voltages may be selected in steps of 25 V, 100 V or 500 V.

  • MCA and Power Supply

    PX5 DPP - Amptek Inc.

    The Amptek PX5 interfaces between (1) an X-ray and gamma-ray detector with its preamplifier and (2) a computer running data acquisition and control software. Designed principally to support Amptek’s XR-100 series of SDD, Si-PIN, and CdTe detectors, it can be used with many other radiation detectors and preamplifiers, including HPGe detectors and scintillators. It is compatible with both reset and feedback preamplifiers of either polarity. The PX5 includes (1) a high performance digital pulse processor (replacing a conventional shaping amplifier), (2) a multichannel analyzer, and (3) both low and high voltage power supplies (±HV).

  • Bluetooth Measurement Application, Multi-Touch UI

    N9081C - Keysight Technologies

    The Bluetooth measurement application is one in a common library of more than 25 measurement applications in the Keysight X-Series, an evolutionary approach to signal analysis that spans instrumentation, measurements and software. Transforming the X-Series signal analyzers into standard-based transmitter testers, the application provides fast, one-button RF conformance measurements to help you design, evaluate, and manufacture your Bluetooth RF transmitters. The measurement application satisfies the test conditions defined in the Bluetooth Core Specifications to help verify your Bluetooth design with confidence while supporting manufacturing with a single application covering Basic Rate, EDR and Low Energy technologies.