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are a PCB format of instrument.

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Showing results: 3001 - 3015 of 3415 items found.

  • PCIe 16 Bit Multi-purpose Digitizer - up to 5 MS/s on 8 Channels (Single Channel) or 4 Channels (Differential)

    M2P.5913-X4 - Spectrum Instrumentation

    The M2p.59xx series allows recording of up to eight single-ended channels or up to four differential channels both with sampling rates of up to 125 MS/s. These PCI Express cards offer outstanding A/D features both in resolution and speed. The cards can be switched between single-ended inputs with a programmable offset and true differential inputs. If used in differential mode each two inputs are connected together reducing the number of available channels by half. The 16 bit vertical resolution have four times the accuracy compared to 14 bit cards and sixteen times the accuracy if compared with a 12 bit card. All boards of the M2p.59xx series may use the whole installed on-board memory of up to 512 MSamples completely for the currently activated number of channels.

  • PCIe 16 Bit Multi-purpose Digitizer - up to 20 MS/s on 8 Channels (Single Ended) or 4 Channels (Differential)

    M2P.5923-X4 - Spectrum Instrumentation

    The M2p.59xx series allows recording of up to eight single-ended channels or up to four differential channels both with sampling rates of up to 125 MS/s. These PCI Express cards offer outstanding A/D features both in resolution and speed. The cards can be switched between single-ended inputs with a programmable offset and true differential inputs. If used in differential mode each two inputs are connected together reducing the number of available channels by half. The 16 bit vertical resolution have four times the accuracy compared to 14 bit cards and sixteen times the accuracy if compared with a 12 bit card. All boards of the M2p.59xx series may use the whole installed on-board memory of up to 512 MSamples completely for the currently activated number of channels.

  • Virtex UltraScale+ HBM FPGA Processor - SOSA Aligned 3U VPX

    Model 5586 - Pentek, Inc.

    - Jade 5585 and 5586 FAQ- Co-processor for distributed FPGA processing tasks- High-Bandwidth Memory (HBM) delivers 20x more memory bandwidth than traditional DDR4 solutions- Board interfaces: 1 GigE, 10 GigE, 40 GigE, dual 100 GigE and PCIe- High-bandwidth memory, FPGA logic and DSP density make this board a single-slot 3U VPX proessing powerhouse- Features Xilinx Virtex UltraScale+ HBM FPGAs- 10 GigE Interface and 40 GigE Interface- Optional VITA 67.3C optical interface for backplane gigabit serial communication- Dual 100 GigE UDP interface- Compatible with several VITA standards including: VITA 46, VITA 48.11, VITA 67.3C and VITA 65 (OpenVPX™ System Specification)- Ruggedized and conduction-cooled- Navigation Design Suite for software and custom IP development

  • Debug Fixture

    IST Engineering, INC.

    With at-speed test, debug can easily become a problem: If test points are on the bottom, as is often the case for test processing, then this requires the board to be flip over for the debug. However, during at-speed testing, key devices and signal paths are often on the topside. IST Engineering has in-house expertise with debug fixtures, which allow the test technician to flip over a test board, or even hold it vertically for dual-sided access, while still running the Device-Under-Test at full-speed through card-edge connectors - whether these are standard DIN type or F or N type co-ax connectors. The debug stations are constructed robustly, with metal frames and high-grade flexible cabling and can also be used as backup test stations in a manufacturing flow. They can be built with custom machined waveguide connections for RF/Microwave applications, or with standard, off the shelf connectors, as defined by the application. A number of these debug fixtures are in production use with a range of customers.

  • IC/BGA Tester

    Focus-2005 - Kyoritsu Testsystem Co., Ltd.

    As a screening checker to detect defective devices(mainly electrostatic destruction)which are returned from fields before failure analysis process of IC/LC in the quality assurance division of semiconductor manufacture.As a screening checker to detect defective devices before acceptance inspection by IC/LSI expensive tester at semiconductor company(trading, manufacture)Short/Open checker for semiconductor sensor device.It is possible to measure two kinds of measurements which are constant voltage biased current measurement and constant current biased voltage measurement. User can set the threshold of 10 ranks. (auto measurement)Only device can be measured. It is also possible to fabricate the test fixture.Various devices can be measured by replacing the socket board.It is no need to generate complex test programs as reference values are calculated from good device.It can be expanded by adding multiplexer boards which are 128pins per one board.(MAX 2048pins)

  • FPGA PXI High-Performance Digital I/O Card

    GX3700 - Marvin Test Solutions, Inc.

    The GX3700 is a user configurable, FPGA-based, 3U PXI card which offers 160 digital I/O signals which can be configured for single-ended or differential interfaces. The card employs the Altera Stratix III FPGA, which can support SerDes data rates up to 1.2 Gb/s, digital I/O clock rates of 700 MHz, and features 47,500 logic elements and 2.1 kb of memory. The GX3700 is supplied with an integral expansion board providing access to the FPGA’s 160 I/Os. Alternatively, users can design their own custom expansion cards for specific applications - eliminating the need for additional external boards which are cumbersome and physically difficult to integrate into a test system. The design of the FPGA is done by using Altera’s free Quartus II Web Edition tool set. Once the user has compiled the FPGA design, the configuration file can be loaded into the FPGA directly or via an on-board EEPROM.

  • ​​​​​Non-terminated SPDT Indium Phosphide Active RF Switch

    Part No. InP​1012-20​​​ - Teledyne Defense Electronics Relays & Coax Switch

    Non-terminated SPDT Indium Phosphide Active RF Switch • 3mm x 3mm x 1mm package size • 100ns switching time• Monolithic solid-state switch with no mechanical wear• Flip-chip packaging provides shock & vibration resistance• ENEPIG surface finish for solder bonding• Low loss package with organic overmold• Test board with K-connectors can be provided​​DC-20GHz

  • ​Non-terminated SPDT Indium Phosphide Active RF Switch

    Part No. InP​1012-14​ - Teledyne Defense Electronics Relays & Coax Switch

    Non-terminated SPDT Indium Phosphide Active RF Switch • 3mm x 3mm x 1mm package​ size • 100ns switching time• Monolithic solid-state switch with no mechanical wear• Flip-chip packaging provides shock & vibration resistance​• ENEPIG surface finish for solder bonding• Low loss package with organic overmold• Test board with K-connectors can be provided​​DC-14GHz

  • ​Non-terminated SPDT Indium Phosphide Active RF Switch

    Part No. InP​1012-​3​0​ - Teledyne Defense Electronics Relays & Coax Switch

    Non-terminated SPDT Indium Phosphide Active RF Switch • 3mm x 3mm x 1mm package size • 100ns switching time• Monolithic solid-state switch with no mechanical wear• Flip-chip packaging provides shock & vibration resistance• ENEPIG surface finish for solder bonding• Low loss package with organic overmold• Test board with K-connectors can be provided​​​DC-30GHz

  • Power Interface and Prototype PXI Card

    GX7404 - Terotest Systems Ltd.

    The GX7404 power interface board offers a low cost method for providing controlled power to UUT interface and test circuitry. The GX7404 provides +5 V, +3.3 V, +12 V, and -12 V voltage outputs which are present on the PXI motherboard to be switched through a DB25 connector for use by a UUT (unit under test) and / or interface circuitry.

  • Portable RF Analyzer

    PMT-330 - Sensortech Systems, Inc.

    The Process Sensors Portable Moisture Tester (PMT-330) puts the capabilities of an on-line moisture analysis and control system into the palm of your hand, allowing operators to spot-check moisture content of boards, wood, plastic, and paper products quickly and easily. It features radio frequency dielectric (RF) measurement technology that penetrates the surface of products and instantly displays accurate moisture data.

  • Energy Meter

    Orbit Controls AG

    The energy meters were specially developed for measuring energy on board electric traction vehicles. You can measure both the DC and the AC signals of any existing traction power supply system (1.5kV DC, 3kV DC, 15kV / 16.7 Hz, 25kV / 50 Hz). In addition, they are also suitable for multi-system locomotives with more than one electrification system.

  • RF High Frequency Probe > 20GHz

    CSP-30TS-011 - ECT

    high frequency probes for the PCBA test market. This next generation coaxial probe provides instrumentation-quality interface for broadband RF measurements exceeding 20GHz, delivering superior performance while seamlessly mating with pads, vias, and other board features. The CSP-30TS-011 RF probe combines several innovative features to provide a truly reliable and cost-effective testing solution.

  • Functional & ICT Tester

    igentic® 621t - Sterner Automation Limited

    Growing demand for light emitting diode (LED) products and increasing testing complexity continue to challenge electronic printed circuit board (PCB) manufacturers. The igentic® 621t is a flexible PCB tester that ensures quality while increasing production. The tester can handle multiple PCB products and test for light measurements, resistance and push button or post detection, as required.

  • Fault Diagnostics in Power-Off State

    QT55 - Qmax Test Technologies Pvt. Ltd.

    Signature Method of Testing is also known as VI Trace Characteristics, is a proven fault diagnostics technique in Power-Off state while testing a board. By applying known wave from signal with desired Voltage, Source impedance and Frequency of the stimulus signals, depending upon the test node and its characteristics, a Voltage (V) vs Current (I) graph is plotted and studied.

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