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Characterization

is defining an objects attributes and make up.

See Also: Qualification


Showing results: 271 - 285 of 435 items found.

  • High-Resolution Precision SMU (10 FA, 210 V)

    PZ2110A - Keysight Technologies

    The Keysight PZ2110A is a precision source / measure unit (SMU) that expands precise measurements from conventional static measurements and pulsed measurements, to fast dynamic measurements. It is ideal for a wide variety of current versus voltage (IV) measurement tasks that require both high resolution and accuracy. The PZ2110A can accurately perform characterization, parametric tests, and reliability tests of semiconductors, active / passive components, and general electronic devices.

  • Power Measurements For The 3000A/T/G X-Series

    D3000PWRB - Keysight Technologies

    The power software package for Keysight’s InfiniiVision 3000A, 3000T, and 3000G X-Series oscilloscopes enables a broad range of automated power supply characterization measurements including critical frequency response measurements (3000T/G X-Series only) such as power supply rejection ratio (PSRR) and control loop response. This package also enables hardware-based pass / fail mask testing and USB PD triggering and decode (3000T/G X-Series only).

  • PXIe-6571, 1-Slot, 100 MVector/s PXI Digital Pattern Instrument

    786320-01 - NI

    1-Slot, 100 MVector/s PXI Digital Pattern Instrument - The PXIe‑6571 is designed for semiconductor characterization and production test. It includes the Digital Pattern Editor for configuring pin maps, specifications, levels, timing, and patterns. It also includes debugging tools … like Shmoo, digital scope, and viewers for history RAM, pin states, and system status. The PXIe-6571 requires a chassis with 82 W slot cooling capacity, such as the PXIe-1095.

  • Calibration Light Source

    CAL1 - Image Engineering GmbH & Co. KG

    The one light source solution in the field of camera characterization and calibration. CAL1The CAL1 calibration light source is designed to characterize and calibrate cameras in the lab or on the production line. Its compact design consists of one iQ-LED element in a 0.3 m integrating sphere that illuminates a 70 mm opening. Because of the non-reflective special diffusor filter on the sphere opening, a uniformity of more than 98% could be reached

  • Semi-automatic Measuring And Alignment System

    McBain Z-NIR Near Infrared Inspection Microscope - McBain Systems

    The McBain Z-NIR Near Infrared Inspection System is best-in-class for wafer-to-wafer and die-to-die alignment measurement and verification. This unique tool has been sold into many industries with various applications including sub-surface wafer and die inspection for cracks and bond integrity, MEMS, wafer bonding, 3-D chip stacking, failure analysis, process development, tool verification, part characterization, environmental testing and more.

  • Low-leakage Switch Matrix Family

    Keysight Technologies

    Conducting all the parametric measurements necessary for the numerous test structures on a semiconductor wafer can be a time-consuming and expensive process. With the cost of end-user devices continuing to drop, even laboratory characterization environments must reduce the cost of test.  Until now engineers and scientists working on current and future semiconductor process technologies were faced with a difficult choice: either use a semiconductor parameter analyzer with positioners on a wafer prober, which limits the ability to perform automated test, or use a switching matrix and probe card, which reduced the analyzer's measurement resolution.  Utilizing a switching matrix with a semi-automatic or fully-automatic wafer prober enables characterization tests to be automated, eliminating the need to have an operator manually reposition the probes each time a new module needs to be tested.  This reduces both test time and cost.  Due to the many price/performance points available, Keysight's switching matrix solutions provide the flexibility to choose exactly what your testing needs require, without overspending.

  • Centrifugal FFF

    CF2000 - Postnova Analytics GmbH

    The new advanced Postnova CF2000 Series was developed to become the first professional modular Centrifugal FFF system available. It is completely controled by the NovaFFF single software platform which runs the entire system from autosampler to detectors. The CF2000 Centrifugal FFF incorporates the combined proven know-how and the technologies from three decades of leadership in FFF. Due to its unique design, the CF2000 Centrifugal FFF system offers more flexibility, higher robustness and better performance than traditional particle sizer systems. The CF2000 allows high resolution particle separation and sizing at the same time and consequently sets a complete new standard and offers a real alternative to traditional particle characterization techniques.

  • Thermal FFF

    TF2000 - Postnova Analytics GmbH

    The new award winning Postnova TF2000 Thermal FFF Series was invented to become the first professional modular Thermal FFF system available. It is completely integrated by the NovaFFF single software platform which runs the entire system from autosampler to detectors. The TF2000 Series incorporates the combined solid know-how and the proven technologies from three decades of leadership in FFF. Due to its unique design, the TF2000 Thermal FFF system offers more flexibility, higher robustness and better performance than traditional chromatographic systems. No separation column with stationary phase is required anymore and consequently the TF2000 technology sets a complete new standard and offers a real alternative to column-based polymer characterization techniques.

  • Transceiver Driver

    S-112 - Notice

    Transceiver Driver slot module of FOTS system is an efficient module for the characterization of SFP type transceiver and the test of optical line or components. This module is a kind of Small Form Factor Pluggable(SFP) host board that can be used to test SFP transceiver modules to define the modules’ performance. The transceiver driver slot has two SFP cage and 20-pin SFP connector sets to mount and control two SFP transceivers simultaneously.

  • Pattern Generator

    S-113 - Notice

    The Pattern Generator slot module of FOTS system is an efficient module for the characterization and test of external optical components and systems to be performed in high bit rate. This module is a kind of pattern generator and bit error rate tester that can be used to modulate optical components or systems and to test the bit error rate characteristics of optical systems or optical lines. This pattern generator slot includes two differential Tx/Rx channels, which can be operated simultaneously.

  • Antenna Test System

    ATS1000 - Rohde & Schwarz GmbH & Co. KG

    Offering measurements on active and passive devices - supporting also extreme temperature testing. 5G is all about data, speed and reliability using high frequency millimeter wave bands. The lack of conventional external RF connectors makes 5G antenna characterization challenging. 5G antenna, chipset and UE manufacturers as well as wireless market operators need a viable solution for research, diagnostics and debugging up to type approval.

  • FT-NIR Analyzer

    ASP400 series - ABB Ltd.

    The TALYS ASP400 series analyzer is designed to achieve monitoring and control of continuous processes. Its seamless installation enables real-time process monitoring, determination of stream properties or physical qualities, process characterization and early troubleshooting. This analyzer is suitable for a wide range of refinery process monitoring applications including naphtha conversion units such as catalytic reforming, isomerization, naphtha hydro-treating and steam-cracking as well as applications in HF alkylation, gasoline blending and LPG.

  • Fiber Geometry System

    2400 - Photon Kinetics

    The 2400 Fiber Geometry System is designed to provide high-speed automated measurements of optical fiber end-face geometry. Repeatable and accurate measurement of parameters such as core and cladding diameter, core and cladding non-circularity, as well as core-cladding concentricity provide invaluable process control information, and ensure that customer demands for low loss fiber splices are satisfied. Measurement options are available for both side view coating geometry measurement and fiber curl characterization.

  • Pulsed IV

    AURIGA 4850 - Focus Microwaves

    Auriga’s 4th generation pulsed IV/RF characterization system delivers unparalleled performance, capturing measurements with incredible speed and accuracy. Pulsed IV (current-voltage) measurements have emerged as the preferred method of capturing current-voltage characteristics of active devices such as field effect (FETs) and bipolar junction (BJTs) transistors. With the growing popularity of higher-power devices, like GaN HEMTs, LDMOS, SiC, and graphene, current and voltage requirements are constantly being pushed higher and higher.

  • Metrology

    KLA-Tencor Corp

    KLA’s metrology systems address a range of chip and substrate manufacturing applications, including verification of design manufacturability, new process characterization and high volume manufacturing process monitoring. By providing precise measurement of pattern dimensions, film thicknesses, layer-to-layer alignment, pattern placement, surface topography and electro-optical properties, our comprehensive set of metrology systems allows chip manufacturers to maintain tight control of their processes for improved device performance and yield.

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