Showing results: 421 - 435 of 435 items found.
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783762-02 -
NI
PXIe, ±200 V, ±1 A DC, ±3 A Pulsed, Up to 40 W DC, 10 fA Precision System PXI Source Measure Unit - The PXIe-4135 is a high-precision, system source measure unit (SMU). It features 4-quadrant operation and sources up to 40 W of DC power and can pulse up to 500 W. Analog-to-digital converter technology and native triaxial connectors help you perform high-precision measurements with a current resolution of 10 fA or high-speed acquisitions up to 1.8 MS/s. The module also can maximize stability and measurement accuracy with SourceAdapt technology, which you can use to tune the transient response to match the characteristics of any load. The PXIe-4135 is ideal for a broad range of applications including manufacturing test, board-level test, and lab characterization with devices such as ICs, power management ICs (PMICs), and RFICs and discrete devices including LEDs and optical transceivers.
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783762-01 -
NI
PXIe, ±200 V, ±1 A DC, ±3 A Pulsed, Up to 40 W DC, 10 fA Precision System PXI Source Measure Unit - The PXIe-4135 is a high-precision, system source measure unit (SMU). It features 4-quadrant operation and sources up to 40 W of DC power and can pulse up to 500 W. Analog-to-digital converter technology and native triaxial connectors help you perform high-precision measurements with a current resolution of 10 fA or high-speed acquisitions up to 1.8 MS/s. The module also can maximize stability and measurement accuracy with SourceAdapt technology, which you can use to tune the transient response to match the characteristics of any load. The PXIe-4135 is ideal for a broad range of applications including manufacturing test, board-level test, and lab characterization with devices such as ICs, power management ICs (PMICs), and RFICs and discrete devices including LEDs and optical transceivers.
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783761-02 -
NI
PXIe, ±200 V, ±1 A DC, ±3 A Pulsed, Up to 40 W DC, 100 fA Precision System PXI Source Measure Unit - The PXIe-4137 is a high-precision, system source measure unit (SMU). It features 4-quadrant operation and sources up to 40 W of DC power and can pulse up to 500 W. Analog-to-digital converter technology helps you perform high-precision measurements with a current resolution of 100 fA or high-speed acquisitions up to 1.8 MS/s. The module also can maximize stability and measurement accuracy with SourceAdapt technology, which you can use to tune the transient response to match the characteristics of any load. The PXIe-4137 is ideal for a broad range of applications including manufacturing test, board-level test, and lab characterization with devices such as ICs, power management ICs (PMICs), and RFICs and discrete devices including LEDs and optical transceivers
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783761-01 -
NI
PXIe, ±200 V, ±1 A DC, ±3 A Pulsed, Up to 40 W DC, 100 fA Precision System PXI Source Measure Unit - The PXIe-4137 is a high-precision, system source measure unit (SMU). It features 4-quadrant operation and sources up to 40 W of DC power and can pulse up to 500 W. Analog-to-digital converter technology helps you perform high-precision measurements with a current resolution of 100 fA or high-speed acquisitions up to 1.8 MS/s. The module also can maximize stability and measurement accuracy with SourceAdapt technology, which you can use to tune the transient response to match the characteristics of any load. The PXIe-4137 is ideal for a broad range of applications including manufacturing test, board-level test, and lab characterization with devices such as ICs, power management ICs (PMICs), and RFICs and discrete devices including LEDs and optical transceivers.
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Duma Optronics LTD
The M2 factor wil define the beam propagation characteristics compared to ideal Gaussian beam propagation. According to ISO Standard 11146 rightfully offers the laser beam characterization as "M2 times diffraction limited beam", as such, a perfect beam will have an M2 of 1. 1 will be the best achievable value and no beam could have an M2 less than 1. Our conceptual design is based on sub-assemblies allowing to change the sensing head in the M2 device, offering multiple wavelengths heads up to 2.7 microns from deep UV (knife-edge technology) and camera based technology with built-in automatic filter wheel for adjustment. For focused beams, the same measuring head could be attached to a device for meauring highly divergent or highly convergent beams - FocusGage-BA, wherein the Laser Analyzing Electronic Autocollimator offers the capability of divergence measurement with Coming Soon M2 definition. M2Beam is the cornerstone of those measuring devices.
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LDA-602EH -
Vaunix Technology Corporation
The LDA-602EH has a large attenuation range of 120 dB with an exceptional 0.1 dB step size, allowing for both precision and accuracy during fading tests or device characterizations. This attenuator also features a fast 15 us switching speed, an operating temperature from -30oC to 50oC, a maximum RF input of +28 dBm, and is priced at $875. The LDA602-EH operates with a low insertion loss of 9 dB to 6 GHz, an input IP3 of +55 dBm and a typical VSWR of 1.3:1. Easily programmed for ATE applications, the LDA digital attenuators are a cost effective solution whether you are in engineering, the production test lab, or in the field. Units are ROHS compliant and can be used with any PC or laptop computer with USB 2.0 port (or powered USB hub) and Windows operating system. Lab Brick Signal Generators are provided with easy to use Lab Brick GUI software, 32 and 64 bit API DLL files, LabVIEW and Linux compatible drivers.
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NplusT -
Saniffer
NplusT was created in December 2002 by Tams Kerekes' 20-years experience in the field of electrical semiconductors and reliability testing.The company started with the sales representation of semiconductor equipment and consumable suppliers. In the meantime, qualified engineering services, linked to the represented products, were provided in Europe.In 2003 NplusT started to market "RIFLE", the non-volatile memory engineering tester, and related services. In a few years, this product has become a reference platform for many memory makers.In 2005 Liliom Laboratories, a Hungarian software development company, merged into NplusT. Thanks to this operation, the company became leader in the test data collection and processing segment.From 2008 a dominant portion of NplusTs turn-over derived from licensing software products. Today almost every European along with several Far East semicon companies license our software products and make use of qualified engineering services.From 2011, NplusT provides turn-key solutions for device testing and characterization, including hardware, software and support.
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FTB-4 Pro -
EXFO Inc.
The FTB-4 Pro is the latest addition to EXFO’s test orchestration portfolio which transforms business as usual into smarter, scalable network testing that significantly increases operational efficiency and provides vital insights into field operations, network performance and service delivery. The 4 slot modular FTB-4 Pro platform enables a unique combination for 100G commissioning, turn-up and troubleshooting which includes the FTBx-88200NGE 100G Multiservice tester (with iOptics transceiver validation software) and the FTB-5240S-P optical spectrum analyzer. There is no need to carry additional platforms or swap modules for unmatched transport and spectral testing on a single platform that no one in the industry can offer. The versatile FTB-4 Pro platform supports a wide range of modules for field testing, data center interconnect, submarine testing, and lab applications for maximum flexibility and ROI across all phases of the service delivery chain: development, deployment, maintenance and troubleshooting. Module combinations on the FTB-4 Pro can also include iOLM/OTDRs, market leading OLTS for fiber characterization, dispersion solutions and other transport modules all with compatibility with EXFO’s market leading fiber inspection probes.
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Enlitech
From the review of the scientific development history, reliable and stable artificial light sources have played a very important role in the past century. For example, the artificial solar simulator is an important part of simulating sunlight to ensure accurate performance of PV characterization. With the growth of light sensor applications, more and more requirement of light simulators (or artificial light sources) explored. One of the core technologies of Enlitech is the artificial light sources. We can manipulate different lamp types (short arc lamps, LEDs, filament lamps et. al.) to generate different spectrum-form in different light intensity levels, beam sizes, and wavelength ranges. We have launched different artificial light source products for different applications fields. For instance, SS-X series solar simulators and ILS-30 ambient light simulator are for the PV field, HAAS is highly accurate star light simulator for the space field, and ALS-300 is a general-purpose light source in science research field. These products can not only meet the needs of your application, but also speed up the process of your research or mass-production.
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Bruker Corporation
Bruker Semiconductor develops, manufactures, markets, and supports metrology solutions for thin films, which are based on novel, rapid, non-contacting and non-destructive X-ray technology. With Bruker’s acquisition of Jordan Valley Semiconductors, a name synonymous with unparalleled worldwide customer service and support, 75% of the world's top 25 semiconductor manufacturers rely on Bruker metrology tools for front-end and back-end applications, including development of their next-generation thin films. Bruker commitment to innovation and technology leadership drives the continued release of new advancements in metrology, and has garnered numerous awards and industry recognition. In applications ranging from C-S thin films materials characterization to wafer substrate analysis and defect detection, Bruker’s systems provide simulation analysis and fit. HRXRD, XRR, WA-XRD, and XRDI measurement types are fully supported, enabling researchers, production engineers, and process developers unparalleled capabilities. Whether you are a semi and C-S fabricator, R&D center or academy, or an industry materials research facility, Bruker has a specifically designed solution for your metrology needs.
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EXFO-100 -
Hangzhou Softel Optic Co., Ltd.
* Top user-friendliness: one-button testing, combined with EXFO’s proprietary FTTx software package (macrobend/fault finder, pass/fail indicators)*Multiple options, including power meter, visual fault locator (VFL), fiber inspection probe, printer and IP testing*Fault Finder mode, for quick identification/location of a fiber break*Complete connectivity flexibility: USB stick compatibility and USB cable data download via ActiveSync**Advanced TFT transflective color display, for assured legibility under direct sunlight or in other demanding outside conditions*Handheld, small, lightweight unit: 1 kg (2.2 lb)*Built-in ruggedness for outside-plant usage*Troubleshooting option, enabling in-service, out-of-band network testing *EXFO’s AXS-100 Access OTDR combines the industry’s leading OTDR technology with power meter functiona lities in one powerful handheld unit.Optimized for testing passive optical networks (PON) within FTTx architectures, it offers several wavelength configurations and a wide range of options, for first-class flexibility. Use it at the optical network terminal(ONT), drop terminal or fiber distribution hub (FDH) for FTTH distribution(F2) fiber characterization, troubleshooting and fault locating.
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Maury Microwave Corporation
Maury manual tuners are based on precision slide screw technology that utilizes broadband slab line transmission structure and passive probes to create impedances for devices. The probes are designed to be very close to onequarter wavelength in the linear dimension at the mid-band of each range. Since each tuner has two probes, this results in improved matching characteristics for each unit. Another key feature of this series of tuners is the inclusion of a LCD position readout of the carriage position on those units operating below 18 GHz. Higher frequency tuners utilize a micrometer carriage drive. The positional repeatability and high matching range of these tuners make them ideally suited for use as a variable impedance source in applications like device characterization. Such measurements depend upon the ability of the tuner to establish impedances out near the edge of the Smith chart and to reproduce the electrical characteristics as a function of mechanical position. The tuners in this series are also easy to use due to the nearly independent electrical results of the mechanical motions. The depth of penetration of the probe into the transmission line determines the magnitude of the reflection, while the position of the probe along the line determines the phase. While there is some interaction, the effects are almost independent of each other. https://www.maurymw.com/images/mw-rf/mst982e35.jpg
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EL Imaging Tester -
OAI
EL Testing for Si Solar Cells using High Performance CCD. The determination of luminescence (photo emissions) in solar cells is an important characterization tool. Typical solar cells often have defects which limit the efficiency or lifetime of a cell. Many of these defects are visualized with Luminescence Imaging. By using this technique, the manufacturing process can be optimized to produce better cells. Luminescence Imaging takes advantage of the radiative inter-band recombination of excited charge carriers in solar cells. The emitted photons can be captured with a sensitive CCD camera to obtain an image of the distribution of the radiative recombination in the cell. This distribution is determined by the local excitation level, allowing the detection of electrical losses, thus mapping the diffusion length of minority carriers as the emitted light is low intensity and in the near infra-red range, the CCD camera has a high sensitivity wavelength from 900 to 1100 nm with little thermal noise. This CCD camera provides excellent resolution of 1024 x 1024 pixels with a large 1μm pixel size, multi-megahertz readout speed, and robust USB 2.0 connectivity. The EL CCD Camera is the ultimate high-performance CCD camera for electroluminescence and photoluminescence imaging for Photovoltaic (PV) Cells and Modules. This camera combines low noise electronics and optimal sensitivity in NIR.
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G-MIX 5CH -
BioAge s.r.l.
G-MIX is an integrated versatile system that can be easily employed to set up countless gaseous mixtures, the gaseous flows are accurately controlled by five MFC (Mass Flow Controller), every MFC has stored inside its memory the calibration tables for 10 different gases. All the hydraulic system has been realized by means of Stainless Steel AISI316 pipes, connectors and valves, this is the best available solution for this kind of applications. The stoichiometric composition of the gaseous mixture can be easily controlled by means of a software, running under Windows, with an intuitive and friendly user interface, the software can be easily installed on a common PC and the communication with G-MIX is possible by means of an USB port. G-MIX can be used as a stand-alone system too, without connecting it to a PC, because every MFC is supplied with a graphic LCD display and with a little user keypad that can be used to set up the gas flow value. The G-MIX system can be used to create gaseous mixtures with a well controlled and known chemical composition, these mixtures can be used in the laboratory to perform countless experiments such the test and/or the calibration of sensors and/or transducers or the characterization of chemical films. The GMIX system is extremely compact and completely enclosed in a hard and smart enclosure of satin aluminum, the interior of the enclosure is brightened by high intensity LED diodes, and it is visible thanks to a clear polycarbonate front panel. The excellent materials used to realize G-MIX allow the use of corrosive and/or toxic gases, providing a reliable and very hard system.
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6500 series -
Chroma ATE Inc.
The global AC power testing requirements demand more sophisticated AC Power Source that is capable of simulating a wide variety of AC line conditions, harmonic waveforms, accurate power measurement and analysis. The Chroma 6500 series Programmable AC Power Source delivers the right solution to simulate all kinds of normal/abnormal input conditions and measure the critical characteristics of the product under test. It can be used for R&D design characterization, production testing, and QA verification of commercial, industrial, and aerospace electronic products. The Chroma 6500 series delivers maximum rated power for any output voltage up to 300 Vac, and at any frequency between 15Hz to 2000Hz. It is suitable for commercial applications (47-63Hz); for avionics,marine, military applications at 400Hz or higher frequency; or for electrical motor, air-conditioner test applications at 20Hz. All models generate very clean sine or square waveforms output with typical distortion less than 0.5%. The Chroma 6500 series has built-in Direct Digital Synthesis (DDS) Waveform Generator to provide user programmable high precision waveform. For testing products under AC line distortion conditions, clipped sinewave can be generated with 0% to 43% distortion and amplitude from 0% to 100%. It also can simulate all kinds of power line disturbances such as cycle dropout, transient spike, brown out, phase angle, voltage and frequency ramp up (ramp down), etc.. Up to 30 harmonic waveforms are factory installed, and testing for compliance to AC line harmonic immunity standards can be easily achieved in the field.
