Showing results: 631 - 645 of 977 items found.
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7Layers, Inc.
Electromagnetic compatibility (EMC) must be demonstrated for all devices with integrated radio components for approval in almost every country in the world. EMC tests examine whether the electromagnetic emissions from your product are within the specified limits and whether your product and its functionalities themselves are not negatively influenced by electromagnetic emissions. We offer EMC tests for modules and end products with integrated radio technology as well as IT and IoT products. Our accredited EMC test laboratories are equipped to test almost all modern radio technologies, and our EMC experts have many years of experience in this area. With us, your modern radio products are on the safe path to the global market.
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Crystal instruments
Automated production testing is critical in today’s competitive manufacturing environment. Companies can no longer rely on variable costs, non-uniformity, and potential health hazards that come with a laborer-based manufacturing line. This is no less true for sound and vibration tests, ranging from in-process burn-in tests to product validation and verification tests. The measurement tools and intelligence behind present day manufacturing include data acquisition equipment as well as closed-loop control. And while these systems may not take part in the assembly of any goods, they are just as important to ensure quality control for both components coming into an assembly line and products going out.
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2811 LP -
Standard Electric Works Co., Ltd
● Microprocessor-controlled.● Displays and sound warning if external voltage present.● Displays mains voltage, scroll trough menus.● Checks wiring integrity (LEDs and display).● Single button operation.● Auto-off/auto-ranging.● Combined prospective short circuit current, PSC and LOOP tester.● Built-in carry case, test leads in separate pouch.● Loop test for L-E and L-N and PSC.● Voltage test L-N and L-E.● Enables analysis of constituent components in L-E and L-N loops giving resistance of earth, neutral wire, live wire and transformer winding.● Display can be customized for special orders.● 60Hz available on request.
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JL-XC -
Lisun Electronics Inc.
JL-XC series waterproof test chamber is mainly used for small electronic and electrical products. Such as lamps, electrical cabinets, electrical components and so one. The products are tested for physical and other related properties under simulated climatic conditions. After the test, it is judged whether the performance of the product meets the requirements by verification, so as to be used in the design, improvement, verification and factory inspection of the product. Comply with IEC60529:2001 《Degrees of protection provided by enclosures (IP Code)》, GB4208-2008 《Shell Protection Grade (IP Code)》 14.2.8 Terms and GB7000.1 《Lamps Part 1: General Requirements and Tests》 9.2.9 Terms.
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Protector Adjustable Family -
Test Electronics
Designed for testing heavy massive boards. Boards with heavy components like large transformers and inductors can destroy normal test fixtures. This design utilizes a 3 plate system where an internal lever actuated sub plate containing the test pins raises to probe the circuit board when the handle is pulled. Heavy boards can bend and break exposed test pins. Similarly large boards which need to be probed by very small delicate test pins can also benefit from this protected test fixture design. This fixture is recommended in situations where there is a high board mass to pin size ratio and pin protection is required. Front and rear panel modular inserts allow for easy updates and customizations to the user hardware interface.
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Protector Press Rods Family -
Test Electronics
Designed for testing heavy massive boards. Boards with heavy components like large transformers and inductors can destroy normal test fixtures. This design utilizes a 3 plate system where an internal lever actuated sub plate containing the test pins raises to probe the circuit board when the handle is pulled. Heavy boards can bend and break exposed test pins. Similarly large boards which need to be probed by very small delicate test pins can also benefit from this protected test fixture design. This fixture is recommended in situations where there is a high board mass to pin size ratio and pin protection is required. Front and rear panel modular inserts allow for easy updates and customizations to the user hardware interface.
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Fivestar HV Testing Equipment Co., Ltd.
HV DC voltage generators are used to generate high voltage DC test voltages for routine, type and development test on components and complete systems found in electrical power supply systems and operating on DC voltage (HV transmission systems etc). There are K and M series, and available for indoor and outdoor.
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µModule® -
Analog Devices Inc.
Analog Devices µModule® (micromodule) receivers consist of high performance, high speed ADCs with fixed-gain, high speed amplifiers and antialias filters. Our integrated ADC and driver products include integrated bypass capacitance and simplify the high frequency layout required to preserve ac performance. The board space savings are significant for instrumentation applications such as spectrum analyzers, oscilloscopes ,and communications test equipment, or for communications applications such as high sensitivity receivers, software-defined radio (SDR), or signal intelligence receivers. Our portfolio uses system-in-package (SiP) technology similar to multichip modules (MCM) to integrate components with different technologies, along with passive components to make an integrated subsystem.
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Teledyne LeCroy
Gen-Z is a data-access technology designed to provide high-speed, low-latency, memory-semantic access to data and devices via direct-attached, switched or fabric topologies. Gen-Z components use low-latency read and write operations to directly access data and use a variety of advanced operations to move data with minimal application or processor involvement. Gen-Z fabric utilizes memory-semantic communications to move data between memories on different components with minimal overhead. Memory-semantic communications are extremely efficient and simple, which is critical to delivering optimal performance and power consumption. Teledyne LeCroy provides protocol analysis and error injection test equipment to support development and debug of Gen-Z based devices
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UI2001B -
Lisun Electronics Inc.
• Measure input parameters: Vrms, lrms, W, PF, Hz, current crest factor, total harmonic and 0~50th harmonic components. V range: 10.0~300.0V, A range: 0.010~2.000A, F range: 45~65Hz • Measure output parameters: Vrms, lrms, W, PF, Hz, current crest factor, total harmonic and 0~50th harmonic components Lamp voltage range: 10.0~450.0V, Lamp current range: 0.010~2.000A • Accuracy: ± (0.4% reading+0.1% range+1 digit) • Can test every kind of curve, print both data & curve • Communication interface available for PC, running under Windows98/2000/XP/Vista
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Aehr Test Systems
System Level Test (SLT) is a paradigm shift from traditional structural and functional testing. The device is tested in a complete, integrated system to evaluate its compliance against specified requirements. The system approach allows for higher and more cost-effective test coverage especially for multi-function and non-deterministic devices. It also brings new integration and test challenges like: ..Designing test fixtures on Burn-in Boards with system components ...
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3682 -
VECTOR Electronics and Technology, Inc.
44 Gold plated edge contacts (22 each side)on 0.156"(3.96mm) centers.Interleaved buses pattern on wiring side only solder- coated for user convenience. Bus outline silkscreened on component side to facilitatecomponent placement. Mounts DIPs with 0.3”, 0.4” & 0.9” lead spacing. Unclad test point area at top of board Row and column legends provided
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3682-2 -
VECTOR Electronics and Technology, Inc.
44 Gold plated edge contacts (22 each side)on 0.156"(3.96mm) centers.Interleaved buses pattern on wiring side only solder- coated for user convenience.Bus outline silkscreened on component side to facilitatecomponent placement. Mounts DIPs with 0.3”, 0.4” & 0.9” lead spacing. Unclad test point area at top of board Row and column legends provided
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Series 547 -
Aries
Universal SOIC Zero Insertion Force Test Socket. Devices with up to 44 pins can be inserted without bending or otherwise damaging the legs, since no force is required to either insert or remove the component from the socket. Accepts SOIC gull-wing and J-lead devices, up to 44 pins on .050 [1.27] lead pitch, body widths from .150 to .600 [3.81 to 15.24].
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Amida Technology, Inc.
AMIDA VCSEL tester can be divided into three parts: LIV measurement system, Near Field measurement system and Far Field measurement system. To achieve the above three measurements, in addition to the necessary optical components and optical instruments, the core technology is to provide fast and stable current pulses to drive the VCSEL laser diode to emit light, and then to test various optical and electrical properties