Showing results: 871 - 885 of 977 items found.
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Keysight Technologies
Generate and analyze 802.11ad fully coded PHY waveforms for complete component, subsystem, and system performance at baseband, IF, and millimeter-wave. This Reference Solution combines Keysight Technologies software and hardware to provide a flexible testbed for 802.11ad waveform generation and analysis. Software provides the flexibility to generate and analyze 802.11ad waveforms with a wide range of different attributes. Hardware provides the flexibility to support baseband, IF, and millimeter-wave test planes. Create waveform sequences with unique 802.11ad packet structures including Modulation Coding Scheme (MCS), packet length, payload data type, and interpacket gap length, etc.
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CK518A -
Spanawave Corporation
The Network Analyzer Calibration Kits with open, short, load, and thru (OSLT) provide the RF components needed to enable stable and accurate error correct measurements. Calibration of a network analyzer using Spanawave's Network Analyzer Calibration Kits allow for precise measurements. The Calibration Kits offer broad test equipment coverage for use with the 8003 Scalar Network Analyzer as well as being compatible with most network analyzers produced by other manufacturers. Spanawave calibration kits yield complete calibrations, as it takes into consideration the three major sources of systematic error correction by one port calibration at both ports.
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CK519A -
Spanawave Corporation
The Network Analyzer Calibration Kits with open, short, load, and thru (OSLT) provide the RF components needed to enable stable and accurate error correct measurements. Calibration of a network analyzer using Spanawave's Network Analyzer Calibration Kits allow for precise measurements. The Calibration Kits offer broad test equipment coverage for use with the 8003 Scalar Network Analyzer as well as being compatible with most network analyzers produced by other manufacturers. Spanawave calibration kits yield complete calibrations, as it takes into consideration the three major sources of systematic error correction by one port calibration at both ports.
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R347B -
Keysight Technologies
The Keysight R347B noise source covers a 26.5 to 40 GHz frequency range. This waveguide noise source allows you to make accurate and convenient noise figure measurements on millimeter-wave devices. The R347B provides highly precise broadband noise at the input of the system or component under test. The noise figure meter then processes the ON/OFF ratio of noise power present in the system IF, and provides an accurate reading of noise figure and gain. The R347B noise source has remarkable ENR stability over time, which allows longer recalibration cycles and more accurate noise figure measurements.
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Protector Edge Press Family -
Test Electronics
Designed for testing heavy massive boards. Boards with heavy components like large transformers and inductors can destroy normal test fixtures. This design utilizes a 3 plate system where an internal lever actuated sub plate containing the test pins raises to probe the circuit board when the handle is pulled. Heavy boards can bend and break exposed test pins. Similarly large boards which need to be probed by very small delicate test pins can also benefit from this protected test fixture design. This fixture is recommended in situations where there is a high board mass to pin size ratio and pin protection is required. Front and rear panel modular inserts allow for easy updates and customizations to the user hardware interface.
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LabXplorer -
DesignSoft, Inc.
LabXplorer turns your desktop, laptop, tablet or smart phone into a powerful, multifunction test and measurement instrument for a wide range of applications. Instruments, whatever you need, are at your fingertips. LabXplorer provides multimeter, oscilloscope, spectrum analyzer, logic analyzer, programmable analog and digital signal generator, impedance analyzer and also measures characteristics of passive electronic components and semiconductor devices.
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JP3X Series -
Danbridge a/s
The Danbridge non-destructive High Voltage Insulation Testers meet the demands for a gentle method of testing insulation condition and detecting leakage currents while protecting hardware, components and materials. Danbridge have two High Voltage Insulation Testers depending on requirements - JP30A can test using up to 30k volt, while JP36A is used when voltages up to 36k volt are desired.
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PLG Series -
Jinan Testing Equipment IE Corporation
The series of electromagnetic resonance fatigue testing machines are used for fatigue tests of metal materials and components under tension, compression or reversal loads. If relevant grips are provided, three-point bending test, four-point and circle test, gear wheat, bolt, connecting rod, roller chain, crackle expanding test can be available. The series of electromagnetic resonance fatigue testing machines feature an optimized design and a rational structure. The automatic controlled system adopts an advanced and wide-pulse-control system and a new-type of power amplifier to improve the reliability of the electric system. The electromagnetic resonance fatigue testing system is with high efficiency, easy and non-stop shake, low energy consuming, accurate control, and small fluctuation.
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2440 -
Photon Kinetics
The 2440 Launch Analyzer is the first fully automated test system for characterizing the optical power distribution of the light produced by VCSEL laser sources, multimode fiber test equipment and launch cords utilized in multimode fiber links. Built on over 20 years of experience testing the transmission and geometric properties of muitimode fibers, the 2440 is the ideal solution for ensuring that source launches comply with applicable international component specifications and measurement standards. The 2440 can be configured for measurements in either or both the 850 and 1300 nm windows.
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MPI Advanced Semiconductor Test
Addressing the RF and High Power communication devices and discrete passive components production test market requirements, MPI introduced the TS2500 200 mm fully automatic probe system series. The system is based on industry leading production equipment from the Photonics Automation Division and incorporates decades of experience in RF and High Power measurement techniques from the MPI’s Advanced Semiconductor Test (AST) Division in combination with other AST products such as RF Probes, related calibration technology, and High Power accessories.
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Guangdong Bell Experiment Equipment Co.,Ltd
DGBell’s Thermal Shock Chamber provide the sudden temperature changes between extreme cold and extreme hot from -65℃ to 150℃ (customized available), specially for environmental stress screen test of the industries that rely on thermal testing, such as component, board electronic assemblies, defense, material stress, consumer products etc. The thermal shock test can cause faulting or cracking by the expansion and contraction on the products, indicates the hidden manufacturing defects. Bell’s Thermal Shock Chamber ensure you to launch qualified product to the market.
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LEON System -
Konrad Technologies GmbH
A universal ICT, FCT, ISP and Boundary Scan platform.Based on the ABex platform, which directly integrates Konrad analog bus technology and PXI/PXIe in one chassis, the LEON platform can be configured to solve various test challenges. Due to this architecture only one system provides the complete test flow combining ICT, ISP, Boundary Scan and FCT.Various form factors and configurations allow a perfect combination between cost, speed and test coverage. The modular architecture provides the possibility to reconfigure or upgrade the systems based on your test needs.The LEON System software provides a powerful development and test execution environment which directly supports NI TestStand. All systems and components could be integrated into third party software using supplied APIs.
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ACMAS Technologies Pvt. Ltd.
Weiber walk in humidity test chambers are conceptualized and designed to create test chambers to study and contemplate the effects of different environmental parameters such as humidity, temperature applications tests involving micro-organisms, plants, tissues, electronic components etc. apart from various customized industrial and research applications. Our humidity test chambers have a variety of usage in R and D laboratories, research studies and product testing facilities across the globe. Apart from that, these chambers have a variety of usages in tissue culture applications, enzyme reaction studies, growth observation studies, fermentation analysis and various other general and specialized applications in various laboratories. We specialize in both standard and customized humidity test cabinets, specifically designed to meet the challenging demands of various scientists for individual and specialized research applications.
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Arcadia Test
Board stress analysis is an increasingly critical part of the test fixture build process today. Probe densities under BGA devices put tremendous pressure onto the solder joints of these devices. If the fixture is not designed properly, immediate damage can occur to the BGA’s, or even more devastating, future damage, which creates field failures. We can provide strain testing before shipping your fixture to insure that there are not excessive forces placed on your BGA parts. With the use of National Instruments Strain equipment, and tri-directional rosettes, we cycle test the board/fixture and measure and record the amount of strain from each corner of each BGA. Any over limit conditions are corrected before shipment. This service insures that your products will not be damaged at ICT, and help to reduce field failures from damaged components, compromised solder joints, or lifted pads.
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VTC SERIES -
EMIC Corporation
HALT/HASS testing challenges the design, components, sub-assemblies and final assemblies of today's manufactured products. Stresses are applied through a number of conditions to set operational limits and ultimately precipitate failure in the HALT/HASS test environment. Rapid thermal change rate is one of the classic conditions that facilitate product stress.VTC Series chambers are equipped with an LN2 cooling system, with modulating valve and directed air flow to the product, provides the rapid thermal change rates required to achieve maximum product stress. Additionally, these rates are accomplished with smaller space requirements, lower audible noise, no water requirement, and lower maintenance costs than a typical refrigeration system.