Showing results: 121 - 135 of 2543 items found.
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ADLINK Technology Inc.
Embedded vision systems, also referred to as compact vision systems, offer an alternative to Smart cameras and computer-based systems. The ADLINK EOS series is a complete embedded system that offers image acquisition, processing, archiving, and display capabilities. It is equipped with a multi-core CPU, ideal for applications requiring high computing power and multi-camera imaging, such as 3D vision and robotics guidance. Featuring rich I/O connectivity with factory-floor networks, including RS-232/422/485, USB, and isolated digital I/O, as well as onboard storage, ADLINK’s embedded vision system is ready to deploy. A system monitoring feature, feeding back temperature and voltage data, combines with a watchdog timer to maximize robustness and reliability of the ADLINK EOS series in mission critical applications.
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EOS-i6000-M Series -
ADLINK Technology Inc.
The ADLINK AI Plug-and-Play (PnP) Solution is a set of ADLINK AI edge hardware and data connectivity platforms that help our partners build and deploy AI solutions faster and simpler. With ADLINK Data River™ enabled at AI edge platforms, devices, AI inferences, and data integrations, the AI PnP Solution offers a crossplatform, flexible, scalable solution that delivers business value.
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LEC-BTS -
ADLINK Technology Inc.
The SMARC ("Smart Mobility ARChitecture") is a versatile small form factor computer Module definition targeting applications that require low power, low costs, and high performance. The Modules will typically use ARM SOCs similar or the same as those used in many familiar devices such as tablet computers and smart phones. Alternative low power SOCs and CPUs, such as tablet oriented X86 devices and other RISC CPUs may be used as well. The Module power envelope is typically under 6W.
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HPERC-KBL-MH -
ADLINK Technology Inc.
Inside the tiny footprint of ADLINK’s HPERC lives the power of Intel® Xeon® processor and optional GPGPU parallel processing engine based on a NVIDIA Quadro MXM module. Dual removable secure erase RAID-0 SSDs provide 12Gb/s throughput and security for deployment in hostile environments.
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7200 -
Chroma ATE Inc.
Among several factors for PV to achieve grid-parity, Reliability of the PV Modules plays an important role. Since its known that some of the cell defects such as edge chips/ flakes, bumps of cell surface were proved to be source of infant mortality of the c-Si PV modules, therefore, to detect those defects is very important for c-Si cell manufacturers.
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31000R -
Chroma ATE Inc.
Cobra is the most advanced, compact,powerful temperature-forcing system on the market. Cobra is an adaptable solution to the ever-increasing thermal demands of post silicon validation and device characterization.
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7505-K006 -
Chroma ATE Inc.
The Chroma 7505-K006 Cylindrical Battery Cell Automated Optical Inspection System equipped with high-resolution camera can perform 2D defect detection that is suitable for inspecting various sizes of cylindrical batteries on the mainstream market.
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7505-02 -
Chroma ATE Inc.
The 7505-02 Automated Optical Inspection System is integrated with high speed camera to shoot Roll to Roll manufacturing processes of ITO (Indium Tin Oxide) film, RFID and FPC that is Line-scan Image Inspection System with PC-based structure.
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7980 -
Chroma ATE Inc.
Chroma 7980 Wafer Metrology System applies White Light Interference Measurement Technique to perform nondestructive and rapid surface profile measurement and analysis.
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7505-01 -
Chroma ATE Inc.
Chroma 7505-01 is the newest multi-function optical inspection system that equips with the capability of measuring 1D, 2D and 3D at the same time. Penetrating reflection measurement is used for 1D film thickness measurement to measure the non-destructive film thickness on transparent and translucent material.
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58620 -
Chroma ATE Inc.
The Chroma 58620 Laser Diode Characterization Station is a state-of-the-art full turnkey system specially designed for laser diode testing. Features range from macro inspection of the facet or aperture active area to a full suite of electro-optical parametic tests.
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7505-05 -
Chroma ATE Inc.
Recent advancement in optical inspection technology continues to find its path into a variety of market applications. Innovative automated optical testing has become essential and indispensable in areas such as effective dimensional measurement to ensure product manufacturability and process control.
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7945 -
Chroma ATE Inc.
Chroma 7945 wafer chip inspection system is an automated inspection system for pre and post diced patterned wafers. Change kits enable switching between various applications by allowing different carriers including metal frame or grip ring.
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