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Showing results: 3886 - 3900 of 6936 items found.

  • Capacitor Testing

    EMC Partner AG

    The test system includes control of the nominal AC supply via an integrated variac and also the stress impulse that is applied to the capacitors. Impulse amplitudes are programmable up to 8kV which covers all the requirements. X1 capacitors are stressed up to 4kV, X2 and Y4 capacitors up to 2.5kV and Y2 capacitors up to 5kV. Capacitors up to 1F can be tested with the COMP0804CAP and up to 50F when the COMP0804CAP includes also the decoupling elements to prevent the disturbance signal entering the power mains supply. Control is from the EMC PARTNER Operating System (EPOS) interface which allows fast and easy control of the test process.

  • Rotary Position Sensors -AEC- Q200 Compliant

    Bourns

    A rotary position sensor translates angular mechanical position to an electrical signal. Rotary position sensors are designed for applications that typically require frequent adjustment. Shaftless designs allow for different engagement mechanisms, such as a customized shaft, a motor control, a human interface adjustment or a mechanical arm position locator. Rotary position sensors can be used in applications where a user needs to control a variable output such as a frequency, speed or volume control. Typical applications include test and measurement equipment, consumer electronics, small engines, robotics, and medical equipment. The Bourns® Model 3382 Series uses resistive technology to sense rotary position.

  • Non-Contacting Single-turn

    Bourns

    A rotary position sensor translates angular positions to an electrical signal. Rotary position sensors are designed for applications that typically require frequent adjustment. Shaftless designs allow for a different engagement mechanisms, such as a customized shaft, a motor control, a human interface adjustment or a mechanical arm position locator. Rotary position sensors can be used in applications where a user needs to control a variable output such as a frequency, speed or volume control. Typical applications include test and measurement equipment, consumer electronics, small engines, robotics, and medical equipment. The Bourns® Model AMS22S Series uses Hall Effect magnetic technology to sense rotary position.

  • Flexible Test Environments and Integration Services for your Integrated System Tests

    TESTERLYZER® Frame 4.0 - Ruetz Technologies GmbH

    The TESTERLYZER® Frame 4.0 provides a flexible test environment for vehicle control units in an integrated system and is easily accessible from all sides. Customized adaption is provided for panel designs, control unit holders and cable adapters. A TESTERLYZER® I-Box 4.0 is a standard component of the TESTERLYZER® Frame 4.0 and provides the basis for a wide range of structures for the testing of control units, software and services relating to vehicles in research and development. The backbone of the I-Box provides all signals required with distribution to standardized adapter sockets and interfaces. The modular assembly structure ensures swift and safe setting up of the required test environment.

  • Real-Time Vision I/O Card With Multifunction

    AX92350 - Axiomtek Co., Ltd.

    The AX92350 is a PCI Express x1 vision card with vision-specific I/Os and real-time controls. A machine vision system requires accurate interaction between lighting, camera, actuator and sensor devices. The AX92350 vision I/O card integrates LED lighting controller, camera trigger, encoder input, and digital I/O to connect and control all the vision devices. The encoder input function is well-suited for conveyor applications. There are 4-CH trigger input, 4-CH or 8-CH trigger output, 4-CH LED lighting control, 1-CH quadrature encoder, 8-CH isolated DI and DO, and 1-CH auto measurement function for rugged machine vision and video surveillance applications.

  • Internal Vapor Analyzer

    IVA® MODEL 210S - Oneida Research Services, Inc

    The IVA® system is specifically designed for the quantitative analysis of low molecular weight gases contained in hermetic packages, cavities and other enclosures. The Model 210s concept integrates automated hardware with easy-to-use icon-driven software. Its design permits routine quality control, failure analysis and research level testing operation as a turn-key analytical system. The IVA® Model 210s includes a high-performance, quadrupole-mass spectrometer analyzer, a sample-mounting interface and precision hardware. The instrument is also computer-controlled and equipped with exclusive ORS integrated system control software — which provides instrument control, data analysis, data archiving and ease of operation.

  • USB-7845, Kintex-7 70T FPGA, 500 kS/s Multifunction Reconfigurable I/O Device

    783200-02 - NI

    Kintex-7 70T FPGA, 500 kS/s Multifunction Reconfigurable I/O Device - The USB‑7845 features a user-programmable FPGA for high-performance onboard processing and direct control over I/O signals for complete flexibility of system timing and synchronization. You can customize these devices with the LabVIEW FPGA Module to develop applications requiring precise timing and control such as hardware‑in‑the‑loop testing, custom protocol communication, sensor simulation, and high-speed control. The USB‑7845 features a dedicated A/D converter per channel for independent timing and triggering. This design offers specialized functionality such as multirate sampling and individual channel triggering, which are outside the capabilities of typical DAQ hardware.

  • USB-7845, Kintex-7 70T FPGA, 500 kS/s Multifunction Reconfigurable I/O Device

    783200-01 - NI

    Kintex-7 70T FPGA, 500 kS/s Multifunction Reconfigurable I/O Device - The USB‑7845 features a user-programmable FPGA for high-performance onboard processing and direct control over I/O signals for complete flexibility of system timing and synchronization. You can customize these devices with the LabVIEW FPGA Module to develop applications requiring precise timing and control such as hardware‑in‑the‑loop testing, custom protocol communication, sensor simulation, and high-speed control. The USB‑7845 features a dedicated A/D converter per channel for independent timing and triggering. This design offers specialized functionality such as multirate sampling and individual channel triggering, which are outside the capabilities of typical DAQ hardware.

  • USB-7855, Kintex-7 70T FPGA, 1 MS/s Multifunction Reconfigurable I/O Device

    782915-01 - NI

    Kintex-7 70T FPGA, 1 MS/s Multifunction Reconfigurable I/O Device - The USB‑7855 features a user-programmable FPGA for high-performance onboard processing and direct control over I/O signals for complete flexibility of system timing and synchronization. You can customize these devices with the LabVIEW FPGA Module to develop applications requiring precise timing and control such as hardware‑in‑the‑loop testing, custom protocol communication, sensor simulation, and high-speed control. The USB‑7855 features a dedicated A/D converter per channel for independent timing and triggering. This design offers specialized functionality such as multirate sampling and individual channel triggering, which are outside the capabilities of typical DAQ hardware.

  • PXI-2514, 7-Channel, 40 A PXI Signal Insertion Switch Module

    778572-14 - NI

    7-Channel, 40 A PXI Signal Insertion Switch Module—The PXI‑2514 fault insertion unit (FIU) is designed for hardware‑in‑the‑loop (HIL) applications and electronic reliability tests. Each module has a set of feedthrough channels that you can open or short to one or more fault buses. You can use this architecture to simulate open or interrupted connections as well as shorts between pins, shorts to battery voltages, and shorts to ground on a per-channel basis. When controlled with the LabVIEW Real-Time Module, the PXI‑2514 is ideal for validating the integrity of control systems including engine control units (ECUs) and full authority digital engine controls

  • PXI-2512, 7-Channel, 10 A PXI Signal Insertion Switch Module

    778572-12 - NI

    7-Channel, 10 A PXI Signal Insertion Switch Module—The PXI‑2512 fault insertion unit (FIU) is designed for hardware‑in‑the‑loop (HIL) applications and electronic reliability tests. Each module has a set of feedthrough channels that you can open or short to one or more fault buses. You can use this architecture to simulate open or interrupted connections as well as shorts between pins, shorts to battery voltages, and shorts to ground on a per-channel basis. When controlled with the LabVIEW Real-Time Module, the PXI‑2512 is ideal for validating the integrity of control systems including engine control units (ECUs) and full authority digital engine controls

  • USB-7846, Kintex-7 160T FPGA, 500 kS/s Multifunction Reconfigurable I/O Device

    783201-01 - NI

    Kintex-7 160T FPGA, 500 kS/s Multifunction Reconfigurable I/O Device - The USB‑7846 features a user-programmable FPGA for high-performance onboard processing and direct control over I/O signals for complete flexibility of system timing and synchronization. You can customize these devices with the LabVIEW FPGA Module to develop applications requiring precise timing and control such as hardware‑in‑the‑loop testing, custom protocol communication, sensor simulation, and high-speed control. The USB‑7846 features a dedicated A/D converter per channel for independent timing and triggering. This design offers specialized functionality such as multirate sampling and individual channel triggering, which are outside the capabilities of typical DAQ hardware.

  • USB-7846, Kintex-7 160T FPGA, 500 kS/s Multifunction Reconfigurable I/O Device

    783201-02 - NI

    Kintex-7 160T FPGA, 500 kS/s Multifunction Reconfigurable I/O Device - The USB‑7846 features a user-programmable FPGA for high-performance onboard processing and direct control over I/O signals for complete flexibility of system timing and synchronization. You can customize these devices with the LabVIEW FPGA Module to develop applications requiring precise timing and control such as hardware‑in‑the‑loop testing, custom protocol communication, sensor simulation, and high-speed control. The USB‑7846 features a dedicated A/D converter per channel for independent timing and triggering. This design offers specialized functionality such as multirate sampling and individual channel triggering, which are outside the capabilities of typical DAQ hardware.

  • USB-7856, Kintex-7 160T FPGA, 1 MS/s Multifunction Reconfigurable I/O Device

    782916-01 - NI

    Kintex-7 160T FPGA, 1 MS/s Multifunction Reconfigurable I/O Device - The USB‑7856 features a user-programmable FPGA for high-performance onboard processing and direct control over I/O signals for complete flexibility of system timing and synchronization. You can customize these devices with the LabVIEW FPGA Module to develop applications requiring precise timing and control such as hardware‑in‑the‑loop testing, custom protocol communication, sensor simulation, and high-speed control. The USB‑7856 features a dedicated A/D converter per channel for independent timing and triggering. This design offers specialized functionality such as multirate sampling and individual channel triggering, which are outside the capabilities of typical DAQ hardware.

  • PXI-2510, 68-Channel, 2 A PXI Signal Insertion Switch Module

    778572-10 - NI

    68-Channel, 2 A PXI Signal Insertion Switch Module—The PXI‑2510 fault insertion unit (FIU) is designed for hardware‑in‑the‑loop (HIL) applications and electronic reliability tests. Each module has a set of feedthrough channels that you can open or short to one or more fault buses. You can use this architecture to simulate open or interrupted connections as well as shorts between pins, shorts to battery voltages, and shorts to ground on a per-channel basis. When controlled with the LabVIEW Real-Time Module, the PXI‑2510 is ideal for validating the integrity of control systems including engine control units (ECUs) and full authority digital engine controls

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