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DFT Consulting
SiliconAid Solutions provides expert consulting services for all aspects of semiconductor Design-for-Test (DFT) development and implementation. Staffed by experts with proven track records from major semiconductor manufacturers, SiliconAid focused expertise provides you resources when and where you need them the most.
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A Comprehensive Package of DFT Tools
DFT- PRO Plus
DFT-PRO Plus offers an integrated DFT solution covering scan synthesis and ATPG, memory Built-In Self-Test (BIST) synthesis and boundaryscan (BSD) synthesis. The corresponding tools generate RTL blocks that fit seamlessly into an existing synthesis flow
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DFT Testability Analysis Software
Landrex Technologies Co., Ltd.
DFT Testability Analysis Software
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Design for Testability (DFT Test)
Corelis can provide you with design consultation and an analysis of your design for boundary-scan testability. We will review your design and make specific recommendations that if implemented will improve the testability. We can also suggest improvements that will increase test coverage and allow boundary-scan to be implemented in a more cost-effective manner.This service also includes a DFT test coverage analysis that we recommend to do after schematic capture and before PCB layout. At this stage of product development, Corelis provides you with a comprehensive test coverage reports that identifies all of the boundary-scan nets and pins and classifies them as completely tested, partially tested, or not tested. The report also recommends where to add test points (pads) for physical “nails” access if additional test coverage is required.
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DFT Validation And Silicon Debug Platform
NEBULA Silicon Debugger
NEBULA provides advanced features for performing early validation of DFT infrastructure and ATPG patterns in first silicon. The NEBULA solution directly imports test pattern formats and DFT information from leading EDA vendor tools, such as Synopsys' TetraMAX and Cadence's Encounter Test.
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Electrical DfT & Fault Coverage Analyzer
TestWay
TestWay's electrical DfT analyzer enables designers to validate designs at the schematic capture stage, to ensure that adequate measures have been included to comply with the manufacturers test requirements. The ability to verify that PCB designs have been developed with adequate Design-for-Test in mind, is key in determining the most effective test strategies and accurately calculating fault coverage, which is crucial in improving competitive advantage, lowering cost and ensuring product quality.
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Boundary-Scan Test Coverage Analysis Tool
ScanExpress DFT Analyzer
Test coverage statistics provide engineers and managers valuable information to make critical decisions in product development and manufacturing.ScanExpress DFT Analyzer is an automatic test coverage analysis tool for printed circuit boards and systems that include a mix of boundary-scan and non-boundary-scan devices. The tool assists design and test engineers to increase fault coverage and reduce boundary-scan test procedure development times. Using ScanExpress DFT Analyzer results in better informed test decisions.
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Integration Tool Suite
TurboDFT
TurboDFT contains a suite of very useful and powerful DFT integration tools. TurboDFT allows users to automatically integrate and stitch DFT cores, whether they are created using DFT tools from SynTest or other vendors
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Design for Test
Test Coach offers Design for Test (DFT) consulting to assist customers with design review of prototype boards prior to release for production. Design for Test analysis is extremely important in ensuring that an assembly will achieve the highest possible test coverage. For ICT, this DFT will review the board to confirm that the bed-of-nails test fixture can be fabricated to test an assembly without sacrificing test coverage. As with ICT, Flying Probe benefits from DFT analysis by reviewing test point access and mechanical challenges that may affect the potential test coverage. Completing a DFT enables Test Coach to make recommendations to our customers that may be implemented on boards during the design phase which will allow for the most comprehensive coverage at time of test.
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COATING THICKNESS GAGES
Coating thickness or dry film thickness (DFT) is an important variable that plays a role in product quality, process control, and cost control. Measurement of film thickness can be accomplished by selecting the best mil gage for the particular application.
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Prototyping & Test Consulting Services Solutions
Don’t cut corners on the path to quality. We are experts in Design for Test (DFT), Design for Manufacturing (DFM), agile development, prototyping and standards/best practices in many industries. Speak to our prototyping and consulting services experts to ensure you make the right decisions and investments at the start of your project.
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Phase Meter
SD1000
The SD1000 phase meter offers superb accuracy with a wide range of signal conditions. Conventional phase meters are easily upset when small levels of noise and distortion are present - the result is often unstable and incorrect phase readings. The SD1000 overcomes this by using Discrete Fourier Analysis (DFT), this process rejects any noise and distortion without the need for tracking filters.
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ASIC / COT / FPGA Design
EL & Associates, Inc. specializes in integrated solutions for design (RTL to GDSII), Design-For-Test (DFT) and Design-For-Manufacturing (DFM) services for ASIC, ASSP, COT, and FPGA. We engage with customers from RTL phase to silicon prototype. The ELA methodology is optimized to manage risk in design, manufacture and product deployment. ELA has successfully completed over 750 designs to date.
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Impedance/Game-Phase Analyzers
A/D converted input signals undergo discrete Fourier transform (DFT) to calculate complex impedance values and obtain parameters and characteristics specific to the DUT, such as its capacitance, inductance and quality factor. Original NF algorithms are also applied to allow equivalent circuits made up of R, L and C along with the constants for those circuits to be estimated from the complex impedance spectrum obtained by sweeping the frequencies.
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Automated Aerospace and Defense Test
Obsolescence management, evolving RF requirements, and design for test (DFT) challenges every test organization in the aerospace and defense industry. Organizations are transitioning from rack-and-stack box instruments and closed-architecture automated test equipment (ATE) systems to smarter test systems built on a modular platform that scales to meet current and future needs.
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ScanWorks IJTAG Test
ScanWorks IJTAG Test
The ScanWorks Internal JTAG (IJTAG) tools allow system-on-a-chip (SoC) designers, DFT engineers and validation engineers a new and simpler way to access, control and run any embedded instrument designed into chips. When the IEEE ratifies the IEEE 1687 IJTAG standard in 2013, it will enable easy access to run any functional type of IJTAG instrument. ASSET is the first tool supplier with development tools available today for the early adopters of this important new technology.
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Transistor-Level Defect Simulator
Tessent DefectSim
Tessent DefectSim is a transistor-level defect simulator for analog, mixed-signal (AMS), and non-scan digital circuits. It measures defect coverage and defect tolerance. Tessent DefectSim is perfect for both high-volume and high-reliability ICs. Tessent DefectSim replaces manual test coverage assessment in AMS circuits needed to meet quality standards such as ISO 26262 and provides objective data to guide improvements in DFT. Tessent DefectSim dramatically reduces SPICE simulation time compared to simulating every potential defect.
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Framework for Soft-Error Protection
RobustScan™
RobustScan™ provides a platform for users to pick patented Configurable Soft-Error Resilience (CSER) cells or their preferred SER mitigation cells. First, Soft-Error Rate (SER) analysis is performed. Then it performs automatic robust-scan-cell and hardenedcombinational- cell selection and synthesis. Finally it generates verification testbenches for the final design. RobustScan™ can be used with scan chains inserted using third-party tools; it can be linked to third-party�s SER analysis programs and is fully compatible with SynTest�s existing DFT tools for test, debug, and diagnosis.
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JTAG based Test & Flash Programming Services
We offer EMS companies and design houses services and solutions in manufacturing testing with bias towards JTAG (IEEE 1149.x Boundary Scan) and functional test: System-level DFT rule checking for production testing and inspection. Test strategy development and optimization for test cost reduction. JTAG, functional, and emulation-based test development and deployment. Product testing and troubleshooting services. Ultra fast in-system programming solutions (Flash, EEPROM).
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Coating Thickness Meters
PCE Instruments' accurate, affordable coating thickness gauge, thickness meter, surface testing and film gauge devices are used for material testing, manufacturing quality control and automotive paint inspection applications. Choose from a variety of coating thickness gauge, mil gage or paint meter products used for the non-destructive measurement of nonmagnetic coating, insulating layer and dry film thickness (DFT) on ferrous and / or non-ferrous metal substrates such as steel and aluminum.
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Coating Thickness Meters
PCE Instruments' accurate, affordable coating thickness gauge, thickness meter, surface testing and film gauge devices are used for material testing, manufacturing quality control and automotive paint inspection applications. Choose from a variety of coating thickness gauge, mil gage or paint meter products used for the non-destructive measurement of nonmagnetic coating, insulating layer and dry film thickness (DFT) on ferrous and / or non-ferrous metal substrates such as steel and aluminum.
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Thickness Meters
Choose from a variety of thickness meter, mil gage or paint meter products used for the non-destructive measurement of nonmagnetic coating, insulating layer and dry film thickness (DFT) on ferrous and / or non-ferrous metal substrates such as steel and aluminum. Explore PCE Instruments' selection of accurate, affordable thickness meter, coating thickness gauge, surface testing and film gauge devices used for automotive paint inspection, material testing and manufacturing quality control applications.
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JTAG Visualizer
JTAG Visualizer is an advanced graphical viewer and data management system for PCB schematics and layouts. Visualizer integrates seamlessly with the JTAG Technologies family of boundary-scan products, such as the ProVision application development platform, and accepts PCB data from a variety of CAD, CAM and EDA tools. In design Visualizer provides DfT (design for test) feedback to the user by enabling a graphical view of fault coverage on their design. In manufacture and test Visualizer can be used to highlight faulty nets (short circuits, opens, stuck-ats etc.) in both layout and schematics views.
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Design for Test Service
Design For Test (DFT) is a technique used to implement certain testability features into a product. Testing House can provide an analysis of the CAD data for testability of your circuit board. Access to a board can be very difficult as boards get smaller and designs get more densely populated. We can work with your design engineer to improve testability and maintain an effective in-circuit test. When access to the board is limited and boundary scan devices are present, we can provide the customer a list of key nodes that will require access in order to provide a very effective test. Our analysis will provide a list of all the accessible test points and an explanation for any nodes declared inaccessible.
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Static Design Verification
ALINT-PRO
ALINT-PRO™ is a design verification solution for RTL code written in VHDL, Verilog, and SystemVerilog, which is focused on verifying coding style and naming conventions, RTL and post-synthesis simulation mismatches, smooth and optimal synthesis, correct FSM descriptions, avoiding problems on further design stages, clocks and reset tree issues, CDC, RDC, DFT, and coding for portability and reuse. The solution performs static analysis based on RTL and SDC™ source files uncovering critical design issues early in the design cycle, which in turn reduces design signoff time dramatically. Running ALINT-PRO before the RTL simulation and logic synthesis phases prevents design issues spreading into the downstream stages of design flow and reduces the number of iterations required to finish the design.
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Parallel Simulation Engine
RocketSim
Complementing compiled-code simulators, Cadence® RocketSim™ parallel simulation engine eliminates functional verification bottlenecks by speeding up simulation using commonly available multi-core servers. The engine is proven for register-transfer level (RTL) system on chip (SoC), gate-level functional simulation, and gate-level design for test (DFT) simulation in numerous marquee systems and semiconductor companies in the mobile, server, and graphics domains. Ever-growing chip density and complexity slow down simulation, making functional verification a severe bottleneck. As a result, chip design projects miss their time-to-market targets, or designers end up taping out early with less confidence. RocketSim parallel simulation engine solves the bottleneck common in existing compiled-code simulators by offloading the time-consuming calculations to an ultrafast multi-core engine.
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Material Thickness Meters
Choose from a variety of material thickness meter, mil gage or paint meter products used for the non-destructive measurement of nonmagnetic coating, insulating layer and dry film thickness (DFT) on ferrous and / or non-ferrous metal substrates such as steel and aluminum. Explore PCE Instruments' selection of accurate, affordable material thickness meter, coating thickness gauge, surface testing and film gauge devices used for automotive paint inspection, material testing and manufacturing quality control applications.A material thickness meter is an essential quality assurance tool when anodizing, galvanizing and applying zinc coating to metallic surfaces. A material thickness meter also is used to measure body paint thickness and uniformity on pre-owned cars, revealing repainted spots, identifying hidden damages and exposing undisclosed accidents. This information is important when determining the actual value of a used car. In addition, certain types of thickness meters can measure wall thickness and determine the hardness of metals, plastics and glass.
