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Showing results: 5731 - 5745 of 8165 items found.

  • Saluki S2106 Series OTDR (up to 45dB)

    Saluki Technology Inc.

    Saluki S2106 Series Optical Time Domain Reflectometer is a high performance multi-function test instrument designed for the FTTx network. The product has a range resolution of up to 0.05m and a ultra-short event blind zone of 0.8m. This product integrates OTDR, LS, OPM, VFL, Event Map (iONM), OLT and OFD function all in one. It adopts touch and button dual operation mode. The product has rich external interface, which can realize remote control through Ethernet interface or two different USB interface for external USB flash drive, printer and data communication with PC.

  • Single, Dual Or Quad Stream MIL-STD-1553A/BTest And Simulation Modules For XMC

    AXC1553-x - AIM GmbH

    MIL-STD-1553 Test and Simulation modules for XMC with 1, 2 or 4 dual redundant streams plus 8 Discrete I/O’s (on Rear-I/O).*Concurrent BC, MRT (31) & Chronological/Mailbox Bus Monitor*Full Error Injection/Detection (AS4112)*Complex Triggering, Data Capture/Filtering and 100% Bus Recording*Physical Bus Replay*IRIG-B Time Encoder/Decoder*Full Function, Single Function and Simulator Only versions available*Drivers for Linux and Windows*Drivers for other embedded applications are available on request*Optional Databus Test and Analysis Software and RT Production Test Plan

  • Single or Dual Stream MIL-STD-1553A/B Test and Simulation Modules

    AXC1553-xT - AIM GmbH

    MIL-STD-1553 Test and Simulation modules for XMC with 1 or 2 dual redundant streams plus 8 Discrete I/O’s (on Rear-I/O).*Concurrent BC, MRT (31) and Chronological/Mailbox Bus Monitor*Full Error Injection/Detection (AS4112)*Complex Triggering, Data Capture/Filtering & 100% Bus Recording*Physical Bus Replay*IRIG-B Time Encoder/Decoder*Programmable Bus Coupling, onboard Bus Network and variable Output amplitude*Full Function, Single Function and Simulator Only versions available*Drivers for Linux and Windows*Optional Databus Test and Analysis Software and RT Production Test Plan

  • Software

    Focus Microwaves

    Beyond traditional Noise and Harmonic Load/Source Pull, FDCS also supports Tuner and Fixture (TRL) calibrations, Time Domain Load Line acquisition, Pulsed IV and Load Pull and Active feedback Power Injection operations (for Γ ≥ 1).The measured data are processed graphically into 2D and 3D plots and are converted into popular simulator formats (ADS, AWR etc.).The FDCS user unterface includes many many improvements and optimizations to make load pull and noise measurement easier.The software has ActiveX control for controlling MPT tuners in any ActiveX compatible platform.

  • Source Measure Units

    NGU - Rohde & Schwarz GmbH & Co. KG

    Thanks to their extremely high accuracy and fast load recovery time, the R&S®NGU source measure units (SMU) are perfect for challenging applications. A special ammeter design is used to precisely measure current drains from nA to A in one pass – no need to make multiple measurement sweeps. The instruments’ short recovery times enable them to handle fast load changes that occur, for example, when mobile communications devices switch from sleep mode to transmit mode. With high speed data acquisition, every detail is detected down to 2 μs resolution.

  • SparkFun SAMD21 Development Board

    Qwiic Micro - SparkFun Electronics

    Looking for a super small microcontroller to use with the Qwiic eco-system? The SparkFun Qwiic Micro is molded to fit our standard 1"x1" Qwiic standard size which makes it one of our smallest micro-controller offerings to date. At it's core is the powerful and versatile ATSAMD21E18, which is an ARM Cortex M0+, 32-bit microcontroller, with 256KB of flash memory that can run at up to 48MHz! It has 12 digital pins which include 5 analog pins, SPI, I²C, and an additional UART data bus as well as a Qwiic connector for easy integration into the Qwiic ecosystem and I²C prototyping.

  • temperature Measurement

    Educated Design & Development, Inc.

    Up to 8 resistance reading channels, 4-wire methodUp to 12 temperature reading chanels, use of Type K, 24 AWG, Teflon thermocouplesIn the Box:8 - data cable (Cat5e) to connect the isolation modules to the Resistance Reading Channels8 - Isolation Module connected between the HOT-30 and EUT (Equipment Under Test) to isolate high voltage8 - Banana Jack Sets (2 red, 2 black), to replace Kelvin Leads in tight places8 - Kelvin Probe Set12 - 72 inch K Type Thermocouple1 - USB2.0 Type A (standard) to Type B USB cable

  • Traceroute and Network Diagnostic Tool

    VisualRoute - Visualware, Inc.

    Traceroute. Key diagnostic data such as packet loss and response times are displayed in an easy to understand traceroute table. Hop by hop analysis makes it easy to pin point problem areas. Reverse trace (remote agents). One of the most powerful features of VisualRoute (SupportPro edition) is the ability to create remote agents. Remote agents allow the user to perform a reverse trace between two locations without actually being present in either location. Reverse DNS. Use VisualRoute to perform a reverse DNS lookup. This allows the user to uncover the IP address behind a domain name, such as www.visualware.com.

  • 8-Channel 250 MHz A/D Jade XMC Module w/ 72 DDCs for Defense & Radar Phased-Array Applications

    Pentek, Inc.

    member of the Jade" family of high-performance data converter XMC modules based on the Xilinx Kintex Ultrascale FPGA. The Model 71132 is an XMC module featuring eight 250 MHz 16-bit A/Ds with eight wideband digital down converters (DDCs) and 64 multiband DDCs, all fully programmable. The Model 71132 doubles the number of A/D channels and DDCs over previous models giving this the best price per channel ratio in the product family. Applications monitoring a broad spectrum with a need to quickly analyze specific portions of the identified spectrum can greatly benefit from the capabilities of the 71132.

  • Open VSwitch With DPDK Ready Software Development Kit

    AXPacket 1.0 - Axiomtek Co., Ltd.

    AXPacket is a software development kit integrating Open vSwitch V2.8 (OVS V2.8) with the Data Plane Development Kit V17.05.2 (DPDK V17.05.2). The AXPacket enables developers to accelerate their network development without increasing any cost. It has a user friendly UI and smooth installation procedure to help software developers to minimize the effort of fine-tuning performance. The AXPacket offers a wizard type procedure to guide the user through installation and configuration.With the AXPacket, software developers can install OVS with DPDK (OVS-DPDK) and parameters for CPU cores, Hugepages, and NIC ports on Axiomtek’s network appliances with just a few selections.

  • 3D Semiconductor & MEMS Process Modeling Platform

    SEMulator3D - Coventor

    SEMulator3D® is a powerful 3D semiconductor and MEMS process modeling platform that offers wide ranging technology development capabilities. Based on highly efficient physics-driven voxel modeling technology, SEMulator3D has a unique ability to model complete process flows. Starting from input design data, SEMulator3D follows an integrated process flow description to create the virtual equivalent of the complex 3D structures created in the fab. Because the full integrated process sequence is modeled, SEMulator3D has the ability to predict downstream ramifications of process changes that would otherwise require build-and-test cycles in the fab.

  • Bluehill® Universal Software

    Instron

    Bluehill Universal is our newest static testing software, built from the ground-up for touch interaction. The new portrait layout, with its meticulously crafted visual design, gives the most comprehensive view of the test workspace on the Operator Dashboard, a stunning large-format touch monitor with an integrated controller. Bluehill Universal’s large touchpoints and intuitive gestures make the user experience simpler and smarter. While maintaining all of the power and flexibility found in previous versions of Bluehill Software, Bluehill Universal boasts many advanced capabilities, such as pre-loaded test methods, QuickTest in seconds, and enhanced data exporting.

  • Advanced Node Solution

    Cadence Design Systems

    A major new challenge at 20nm/14nm is the requirement for extra masks (double patterning technology, or DPT) to make existing lithography work at this advanced node. Read 20 questions on 20nm - a Q&A document. Escalating data volume and denser, more complex chips are testing the limits of traditional routing architectures. Even the slightest perturbations in the design flow can cause dramatic swings in design integrity. Engineers face a predictability crisis riddled with silicon failures, performance degradation, and prolonged design schedules. And new process and design innovationshigh-k metal gate, SOI, 3D-IC packagingare intensifying the pressures of adoption and rapid deployment.

  • Vibration Monitoring Solution

    FLIR SV87-KIT - Teledyne FLIR

    Vibration trending and analysis can help detect serious problems with industrial machines long before the damage can be seen. That’s why the FLIR SV87-KIT Vibration Monitoring Solution is essential for manufacturing processes that use rotating machinery, industrial pumps, fans, gearboxes, and motors. The included remote monitoring gateway stores sensor data and wirelessly transmits readings in real time to a mobile device or PC. This allows professionals to make knowledgeable decisions about machine operation and maintenance without having to wait for the next manual inspection – reducing unplanned downtime, lowering operational costs, and improving profitability.

  • Imaging Automation

    XImage - Extreme Protocol Solutions

    Whether you are a Microsoft Authorized Refurbisher, Microsoft Registered Refurbisher or just getting started in refurbishing, Erasure, Test and Re-Imaging are a must to get the most out of your assets. The problem is that until now, this required a big work force.  One group to perform the testing and visual inspection, one group to perform erasure, someone to create and manage all your images and substantial knowledge on how to automate and deploy those images.  Even with all of these bases covered, it can still be a complicated, time consuming task. Not to mention the fact that it is typically done in a separate process from data erasure, testing and auditing.

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