Showing results: 7666 - 7680 of 8165 items found.
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4012 -
Barth Electronics, Inc
The Model 4012 VFTLP+™ test system was developed in early 2000 to add high speed measurements to the usual I-V plot, to measure and record the real TDDB waveform which causes oxide failure.*Accurate measurements of this waveform have finally been identified by Barth Electronics Inc. and CDM protection can now be based on known dimensional design parameters. We identify the response of your CDM protection circuits with 100ps risetime pulses which simulate the real CDM test. This is the only way with which to provide the total gate oxide threat voltage data.*Convenient, precise, repeatable operation*Computer controlled for automated testing
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ZERA® COM5003 -
Powermetrix Systems
The COM5003 Reference Standard is part of the ZERA/Powermetrix high precision measuring instrument series. With the highest accuracy of 0.005 % (50 ppm), the COM5003 presents its new innovative digital technology and extended features for measurement. As a primary standard, the COM5003 is designed for testing current and voltage meters as well as single- or three-phase power and energy meter testing systems. This precise technology is especially useful in metrological institutes, official utility lab applications, and other environments for energy suppliers or manufacturers of electric meters and designed for integration of existing systems. All operation, measurements and data visualizations can be viewed using by the COM5003’s simple user interface and 9“ touchscreen.
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PeakTech Prüf- und Messtechnik GmbH
This innovative combination meter for testing electrical installations according to VDE 0100 convinces by its technical performance in the high-end range.With the large 3.5 "TFT color display all important safety checks as the RCD-, Voltage-, Loop-, Low-Ohm, Earth resistance and Insulation tests for annual safety-checks and newly installed systems can safely be carried out by the responsible electrical engineer.Since this new development was designed only according to the latest standards, the required measuring values can be even more convenient stored with an App (iOS / Android) via Bluetooth on the mobile phone, saved to an SD card or, when work is completed, from the internal data memory via USB connection to a PC.
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Model DI-4208 -
DATAQ Instruments, Inc.
USB Data Acquisition (DAQ) System. Eight armored analog differential inputs*. Programmable range per channel: ±2, 5, 10, 20, 50 100 V full scale. Up to 120 V rms without damage. 50 dB common mode rejection. Supports ChannelStretch™ multi-unit synchronization*. Adaptable low-pass filter per channel. Corner frequency set as a function of sampling rate. 16-bit analog-to-digital resolution. 160 kHz analog sample throughput rate. Seven digital ports*. Programmable per port as input or switch. Support for rate measurements to 50 kHz. Support for 16-bit counter.
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LCMS-8045 -
Shimadzu Corp.
Equipped with a heated ESI probe, the LCMS-8045 has the highest sensitivity in its class. The heated ESI probe, high-temperature heating block, desolvation line (DL) and drying gas, all act to promote desolvation and prevent contamination due to the penetration of liquid droplets into the MS unit. This improves the robustness, so reliable and high-accuracy data can be obtained over the long term. The LCMS-8045 also achieves the world's fastest scan speed (30,000 u/sec) and polarity switching speed (5 msec). These enable ultra-high-speed, high-sensitivity analysis. The excellent cost performance of this system is demonstrated in food safety, environmental analysis, and other quantitative analyses, it can be upgraded to the LCMS-8060.
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Aguard Electronics Co., Ltd
Fiber optic transmission systems all use data links that work similar to the diagram shown above. Each fiber link consists of a transmitter on one end of a fiber and a receiver on the other end. Most systems operate by transmitting in one direction on one fiber and in the reverse direction on another fiber for full duplex operation. It's possible to transmit both directions on one fiber but it requires couplers to do so and fiber is less expensive than couplers. A FTTH passive optical network (PON) is one of the only systems using bidirectional transmission over a single fiber because its network architecture is based around couplers already.
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SCHILLER AUTOMATION GmbH & Co. KG
The Standard SD Express Memory Card Test Adapters support PCIe® 16 GT/s (Gen4) and PCIe® 8 GT/s (Gen3) Interface Compliance Program testing for SD8.0 and SD7.1. Minimal crosstalk, short trace lengths. The Micro SD Express Memory Card Test Adapters supports PCIe® 8 GT/s (Gen3) Interface Compliance Program testing for SD7.1. Minimal crosstalk, short trace lengths. They all support SDHC, SDXC, and SDUC operation modes Data collection via Lab Standard SSMP Test Cables and hard gold mating surface allow for high cycle count insertions and reliable performance.
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WABC -
Wuhan Sangao Electrical Test Installations Limit Co.
Acc to IEC and Relevant national standard, In the power transformer production, transfer and user test process, Transformer ratio test is necessary project, This can be used for quality supervision of transformer factory and the use process, prevent the transformer winding inter turn short circuit, open circuit, connection error, pressure regulating switch failure or contact fault.So our company development and production of automatic ratio tester in the original basis according to the user's site using requirements , make the operation more convenient, complete function, stable and reliable data, the testing speed is greatly improved.To meet the needs of all kinds of small medium and large transformer ratio test.
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UI2001B -
Lisun Electronics Inc.
• Measure input parameters: Vrms, lrms, W, PF, Hz, current crest factor, total harmonic and 0~50th harmonic components. V range: 10.0~300.0V, A range: 0.010~2.000A, F range: 45~65Hz • Measure output parameters: Vrms, lrms, W, PF, Hz, current crest factor, total harmonic and 0~50th harmonic components Lamp voltage range: 10.0~450.0V, Lamp current range: 0.010~2.000A • Accuracy: ± (0.4% reading+0.1% range+1 digit) • Can test every kind of curve, print both data & curve • Communication interface available for PC, running under Windows98/2000/XP/Vista
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Meilhaus Electronic GmbH
Passage test:Detects open wires, short circuits and faulty wiring. Pass / fail test using a given pattern cable. Finding intermittent connections.Save cable data for documentation purposes. Print wiring diagrams. Printing labels. Log and print error logs.Graphical representation of the wiring of cables, graphical comparison of two cables. Easy, intuitive, graphical tracking of individual wires of a cable.Quickly install quick-mount boards for a variety of connector types such as BNC, RJ45, Sub-D, flat-ribbon connectors, and many more.Easy connection to the PC via USB .Light Director System:LED-led assembly of connectors. Optional also with voice output. High degree of safety due to fault checking during assembly.
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Model 4702 -
Barth Electronics, Inc
The Model 4702 HMM+™ is a completely new tester primarily intended for device level testing and produces a current waveform as specified in the IEC-61000-4-2, from a 50 ohm source impedance system.*This tester provides device level test data that allows users to evaluate the IEC current waveform protection level of their devices. We included failure identification by leakage current increases in the 4702 tester so precise pass/failure levels can be closely measured.*The 4702 HMM+™ provides a new and improved test connection method for making quantifiable and repeatable device level HMM measurements.*Convenient, precise, repeatable operation*Computer controlled for automated testing
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Rohde & Schwarz GmbH & Co. KG
With the R&S®RF Ports Alignment software together with the option R&S®SMW-K545, Rohde & Schwarz provides a standard and tailored solution for calibrating amplitude, time and phase of multi-channel SMW setups. The RF Port Alignment automatically collects the gathered correction data for the multi-channel setup using a connected vector network analyzer such as the R&S®ZNA or R&S®ZNB. Thanks to an intuitive graphical user interface the test engineer is guided through the calibration procedure step-by-step in a convenient way. With a calibrated multi-channel setup, tests of advanced systems in wireless communication or of radar receivers can be performed straightforward.
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780338-01 -
NI
Virtex-5 LX50 FPGA, 200 kS/s PXI Multifunction Reconfigurable I/O Module—The PXI‑7842 features a user-programmable FPGA for high-performance onboard processing and direct control over I/O signals to ensure complete flexibility of system timing and synchronization. You can customize these devices with the LabVIEW FPGA Module to develop applications requiring precise timing and control such as hardware‑in‑the‑loop testing, custom protocol communication, sensor simulation, and high-speed control. The PXI‑7842 features a dedicated A/D converter (ADC) per channel for independent timing and triggering. This design offers specialized functionality such as multirate sampling and individual channel triggering, which are outside the capabilities of typical data acquisition hardware.
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780339-01 -
NI
Virtex-5 LX30 FPGA, 750 kS/s PXI Multifunction Reconfigurable I/O Module—The PXI‑7851 features a user-programmable FPGA for high-performance onboard processing and direct control over I/O signals to ensure complete flexibility of system timing and synchronization. You can customize these devices with the LabVIEW FPGA Module to develop applications requiring precise timing and control such as hardware‑in‑the‑loop testing, custom protocol communication, sensor simulation, and high-speed control. The PXI‑7851 features a dedicated A/D converter (ADC) per channel for independent timing and triggering. This design offers specialized functionality such as multirate sampling and individual channel triggering, which are outside the capabilities of typical data acquisition hardware.
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782824-01 -
NI
8‑Slot, Ethernet CompactDAQ Chassis - The cDAQ‑9188 is a CompactDAQ Ethernet chassis designed for small, distributed sensor measurement systems. The chassis controls the timing, synchronization, and data transfer between C Series I/O modules and an external host. You can use this … chassis with a combination of C Series I/O modules to create a mix of analog I/O, digital I/O, and counter/timer measurements. The chassis also has four 32‑bit general‑purpose counters/timers. You can access these counters through an installed, hardware‑timed digital C Series module for applications that involve quadrature encoders, PWM, event counting, pulse train generation, and period or frequency measurement.
