Showing results: 1066 - 1080 of 8165 items found.
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DAQe-2000 Series -
ADLINK Technology Inc.
ADLINK DAQe-2000 series products are simultaneous-sampling multi-function PCI Express DAQ cards to meet a wide range of application requirements. The devices can simultaneously sample 4 AI channels with differential input configuration in order to achieve maximum noise elimination. They also provide 2-CH 12-bit analog outputs with waveform generation capability, which can be performed together with analog input functions. If more analog input or output channels are required, multiple cards can be synchronized through the SSI (system synchronization interface) bus. This makes the DAQe-2000 series ideal for the stimulus/response test.
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DAQe-2213/2214 -
ADLINK Technology Inc.
ADLINK DAQe-2213/2214 can sample up to 16 AI channels with different gain settings and scan sequences. It makes them ideal for dealing with analog signals with various input ranges and sampling speeds. These devices also offer differential mode for 8 AI channels in order to achieve maximum noise elimination.
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PCI-9112 -
ADLINK Technology Inc.
*Supports a 3.3 V or 5 V PCI bus*12-bit A/D and sampling rate up to 110kS/s*16-CH single-ended or 8-CH differential inputs*On-board A/D FIFO
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PXI-2020 -
ADLINK Technology Inc.
ADLINK"s PXI-2022 is a simultaneous-sampling multi-function DAQ card to meet a wide range of application requirements for PXI bus computers. The device can simultaneously sample 16 AI channels with differential input configurations in order to achieve maximum noise elimination.
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DAQe-2200 Series -
ADLINK Technology Inc.
ADLINK DAQe-2200 series are highdensity and high-performance multi-function DAQ PCI Express cards. The devices can sample up to 64 AI channels with different gain settings and scan sequences. It makes them ideal for dealing with high-density analog signals with various input ranges and sampling speeds. These devices also offer differential mode for 32 AI channels in order to achieve maximum noise elimination.
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cPCI-9116 -
ADLINK Technology Inc.
*PICMG 2.0 Rev 2.1*16-bit A/D and sampling rate up to 250kS/s*64-CH single-ended or 32-CH differential input*On-board 1k-sample A/D FIFO
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DAQe-2500 Series -
ADLINK Technology Inc.
ADLINK DAQe-2500 series are high-speed and high-performance analog output multi-function DAQ PCI EXpress cards. The devices are able to update up to 8-CH, 12-bit analog outputs simultaneously at sustaining 1 MS/s. The reference sources and the output polarities are programmable on per channel basis, combining with the multiplying DAC architecture, ADLINK DAQe-2500 series DAQ cards can generate complex modulated analog signals. The hardware-based arbitrary waveform generation frees the CPU intervention even when all analog outputs are updating at full speed, and the lengths of waveforms are only limited by the system memory.
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Delphin Data Center -
Delphin Technology AG
The Delphin Data Center is a centralised measurement data management system that networks, centrally stores, monitors and analyses the measurement data of systems, machines and test stands. The measurement data is archived in a valid and traceable way and is able to access it within seconds, whether on a network, via PC or mobile via smartphone or tablet.
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Signal Transmitter (Data Server) -
ZETLAB Company
The program is used for transferring ZETLAB digitalized signals through the network. As soon as the data server is turned on, any computer in the same subnetwork can connect to it via the program Signal Receiver (Data Client) – and all signals of the server computer appear in its channel list. Then, it does not matter whether these signals are processed by the server computer or a computer to which they are coming via the Data server → Data client system.
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Data Processing and Result View -
ZETLAB Company
The program allows to simultaneously download multiple data files obtained by means of ZETLab programs, as well as to view and edit corresponding data in the graphic and table format.
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Data Collection -
Electronic Systems of Wisconsin, Inc.
ESW recognizes that our test systems provide vital information our customers need to control and understand their process. We have developed our Trend Tracker Software to aid customers with total process control of their line. This software is designed to use information that the tester is gathering on every part tested. Information from all parts tested are stored by part number or other designator. Trend Tracker screens are simple and easy to navigate using drop down menus for each test to select the desired test data to view on the graphs. Once a test is selected, the Test Readings Graph and Histogram are updated automatically. These graphs show a graphic representation of the readings obtained for the selected test.
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Signal Receiver (Data Client) -
ZETLAB Company
The program is used for receiving digitalized signals from server computers. Network data transfer is highly required in distributed measuring systems as well as educational laboratories.
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Vortex Data Distribution Service | DDS -
ADLINK Technology Inc.
ADLINK DDS is a ubiquitous data sharing software framework based on the open and proven DDS standard that supports a wide range of device technologies, operating systems and programming languages. Combining deterministic data delivery, system-wide data sharing and support for data analytics, ADLINK DDS helps system integrators, OEMs, device platform vendors and Cloud service providers (SaaS, PaaS and DaaS) deliver software solutions for many vertical markets, including: Aerospace and Defense, Energy, Robotics, Healthcare, Transportation / Automotive and Industrial Automation.
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Software for Data Exchange -
Raytech AG
The Toolbox .NET provides firmware upgrade capabilities and data transfer stored in internal instrument memory to a PC. The Toolbox .NET is based on Microsoft .NET Framework 3.5 and will operate with the following Raytech products:
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Tester Data Link -
Test Insight Ltd.
VCD/eVCD to tester conversion (via STIL)WGL/TDL to tester conversion (via STIL)Most flexibility to handle complex devices functionality Support protocol definitionUtilize advanced tester features (Such as Xmode, concurrent test etc’… )High Performance Fast run time