Showing results: 16 - 30 of 330 items found.
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TR518 SII DRAWER -
Equip-Test Kft.
*The DRAWER Type is the new Manufacturing Defect *Analyzer (MDA) platform.
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Jiangsu Keyland Laser Technology Co., Ltd.
Features: - Reveals invisible defects- Improves line yield prior to lamination- Improves quality and reliability of final product- Exceptional optical resolution in its class- Flexible system configuration for framed or unframed modules testing
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MM513 -
McGan Technology
McGan Technology’s MM513 electrosurgical insulation defect detector is a compact, hand held, battery operated unit that tests the integrity, such as pinholes, cracks or defects, of the insulation of electrosurgical instrument in order to prevent inadvertent tissue burns which may occur during electrosurgical instrument procedures. The integrity of the insulation of electrosurgical instruments can occur over time, through normal surgical use, through the accidental contact with a sharp instrument or the rubbing of the insulation to the point of abrading it. The insulation failure provides an alternate pathway for the current to leave the instrument’s electrode usually beyond the sight of the surgeon which will result in the unintended tissue burn. Using an electrosurgical test equipment maintenance program can greatly reduce the number of these inadvertent burns during electrosurgical procedures.
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SAE International
The SAE Counterfeit Defect Coverage Tool is a dynamic, web-based application that supplements SAE Standard AS6171 authored by the SAE G-19A Test Laboratory Standards Development Committee. It provides potential test sequences for the identification of counterfeit electrical, electronic, and electromechanical (EEE) parts along a range of risk levels and EEE part types. Allowing users to compare alternative test sequences as a function of resources needed to implement those tests, the SAE CDC Tool is appropriate for those ordering counterfeit detection tests as well as those performing the tests.
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Yamashita Denso Corp.
Wafer for inspection of surface condition of specular flat substrate, glass substrate, others φ 100 ~ φ 300 compatible
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HS-WDI -
HenergySolar
Application■Semiconductor wafer■Solar wafer■Solar Cell■Thin-film Cell
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TotalView® Debugger -
Rogue Wave Software Inc.
Dynamic source code and memory debugging for C, C++ and Fortran applications. TotalView provides analytical displays of the state of your running program for efficient debugging of memory errors and leaks and diagnosis of subtle problems like deadlocks and race conditions.
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VS6845E -
Industrial Vision Technology Pte Ltd.
Comply with IEC63068-3 Standard: Test method for defects using photoluminescence, Model VS-6845 SiC Wafer defect inspection system has capability on Non-destructive recognition criteria of defects in silicon carbide homoepitaxial wafer for power devices.
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ALTO-SD-150/200 -
Alto Inspection Corp.
ALTO-SD SERIES IS AN IN-LINE INSPECTION SYSTEM SUPPLYING HIGH THROUGHPUT, FULL SURFACE DEFECT INSPECTION FOR ALL KINDS OF WAFERS INCLUDING SILICON, QUARTZ, SAPPHIRE, COMPOUND AND MEMS WAFERS. HIGH-RESOLUTION CAMERA OPTICS PLUS LED ILLUMINATION GUARANTEE RELIABLE DETECTION OF ALL LOCAL DEFECTS. IT INSPECTS DEFECT SIZE OF 1~ 10 MICRONS, CONFIGURABLE INSPECTION RESOLUTION TO OPTIMIZE DEFECT SIZE VS. THROUGHPUT. THE SYSTEM COMBINES HIGH-PRECISION MEASUREMENT, POWERFUL DATA ANALYSIS AND USER-FRIENDLY OPERATIONS.
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EagleView -
Microtronic, Inc.
EagleView automated macro defect semiconductor wafer inspection system provides industry leading throughput, defect detection accuracy, and wafer classification for semiconductor manufacturing. EagleView systems have inspected over 100 million semiconductor wafers worldwide. The EagleView macro defect inspection tool resolves many of the problems and pitfalls of manual and micro wafer inspection by automating and standardizing semiconductor wafer inspection processes while creating complete images of every wafer in the cassette. Unlike manual micro defect wafer inspection, EagleView’s automated wafer inspection is always consistent, tireless, reliable, and fast. EagleView helps find macro defects while there’s still time to take corrective action.
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LP-100 -
HenergySolar
Easy to use and portable■ low price with long lifetime■ can be used to detect many defects, like micro crack, bubbles, impurity, crystal subgrain■ When the laser go though the crystal, if it is monocrystal the light should be scattering, in macro it should be white.
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MMPD -
McGan Technology
McGan Technology’s MMPD-8K electrosurgical insulation defect detector is a battery operated unit that tests the integrity, such as pinholes, cracks or defects, of the insulation of electrosurgical instrument in order to prevent inadvertent tissue burns which may occur during electrosurgical instrument procedures. The integrity of the insulation of electrosurgical instruments can occur over time, through normal surgical use, through the accidental contact with a sharp instrument or the rubbing of the insulation to the point of abrading it. The insulation failure provides an alternate pathway for the current to leave the instrument’s electrode usually beyond the sight of the surgeon which will result in the unintended tissue burn. Using an electrosurgical test equipment maintenance program can greatly reduce the number of these inadvertent burns during electrosurgical procedures.
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Robotic Welding Defect Detection -
ADLINK Technology Inc.
ADLINK and Intel have developed an automated defect-detection solution for robotic welding in heavy equipment manufacturing using machine vision AI to increase output, improve quality and reduce costs. The system detects welding porosity defects and stops the welding process performed by a robotic arm. The integrated solution sends a stop command to the robot when a defect is identified – all in real-time at the edge and has proven 97% accuracy in detecting weld porosity defects.
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ProcessGuard -
Microtronic, Inc.
Microtronic ProcessGUARD Software is the desktop client for the EagleView auto macro wafer defect inspection system. ProcessGUARD is a high volume, high speed semiconductor wafer defect inspection management solution that provides an easy-to-use, customizable and extensible platform and interface to automate your fabs defect inspection process. ProcessGUARD is feature rich (see below) and its newest releases include complete wafer randomization software, a user-defined defect library, and an integrated trainer and knowledge base.
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DDR200 and DDR300 -
McBain Systems
The McBain DDR200 and DDR300 for 200mm and 300mm wafer defect detection and review are unmatched in value and features in this special application and price category. The systems offer significant and unique advantages for both production and engineering use, and provide an ideal solution when both defect detection and dimensional metrology are required. They can be used as dedicated production tools or as versatile process development tools.