Showing results: 1456 - 1470 of 2047 items found.
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Raytheon Company
Raytheon’s Antenna Test Facility (ATF) provides state-of-the-art measurement capabilities to assist in the development of advanced antenna technologies for a variety of airborne and space applications such as advanced radar and communication systems. The ATF is available for use by Raytheon businesses as well as other companies that design and prototype new and experimental antennas.
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SI-C6713DSP -
Sheldon Instruments
The SI-C6713DSP from Sheldon Instruments is a family of powerful Digital Signal Processor (DSP) cards for your PC equipped with a 32 bit PCI bus. It is based on Texas Instruments’ 300Mhz TMS320C6713, 32 bit DSP, and can transform your system into an ultra high performance development platform and DSP accelerator.
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OP1300 -
Opal-RT Technologies Inc.
The multi-purpose and ready-to-use Power Electronics Test Bench combines a state-of-the-art Hardware-in-the-Loop (HIL) simulator from OPAL-RT with Imperix’s Rapid Control Prototyping (RCP) system and real power hardware. It enables rapid development of power electronics, drives and smart-grid applications across industry and academia.
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ScanExpress -
Corelis, Inc.
The ScanExpress Family of boundary-scan software offers a fully integrated development environment that includes boundary-scan and at-speed functional test program generation, test program execution with advanced pin level diagnostics, interactive boundary-scan debugging, and in-System Programming (ISP) of devices such as Flash memory, serial EEPROMs, CPLDd, and FPGAs.
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Fivestar HV Testing Equipment Co., Ltd.
HV DC voltage generators are used to generate high voltage DC test voltages for routine, type and development test on components and complete systems found in electrical power supply systems and operating on DC voltage (HV transmission systems etc). There are K and M series, and available for indoor and outdoor.
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ScanWorks Embedded Diagnostics -
ASSET InterTech, Inc.
The ScanWorks platform for embedded instruments is supported by a wide variety of hardware controllers and accessories with which engineers can connect ScanWorks to their unit under test (UUT). Hardware is available for development, production and repair environments. The test platform required for ScanWorks is either a standard PC or a system with a built-in (embedded) JTAG controller.
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Model 54891 -
Pentek, Inc.
- Jade Xilinx Kintex UltraScale FPGA Products and Navigator Design Suite Software Video- Jade Xilinx Kintex UltraScale FPGA Family Brochure- Accepts RF signals from 925 MHz to 2175 MHz- Programmable LNA handles L-Band input signal levels from -50 dBm to + 10 dBm- Programmable analog downconverter provides IF or I+Q baseband signals at frequencies up to 123 MHz- Two 400 MHz 12-bit A/Ds digitize IF or I+Q signals synchronously- Two FPGA-based multiband DDCs (digital downconverters)- Xilinx® Kintex® UltraScale™ FPGA- Five GB of DDR4 SDRAM- Sample clock synchronization to an external system reference- PCI Express interface (Gen. 1, 2 & 3) up to x8- Clock/sync bus for multimodule synchronization- Optional LVDS and gigabit serial connections for FPGA for custom I/O- Optional optical interface for data streaming- Navigator BSP® for software development- Navigator FDK® for custom IP development- Spark® fully-integrated development system- Free lifetime applications support- Synchronize up to eight modules with Model 7893 System Synchronization and Distribution Amplifier - PCIe
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Model 71821 -
Pentek, Inc.
- Jade Xilinx Kintex UltraScale FPGA Products and Navigator Design Suite Software Video- Jade Xilinx Kintex UltraScale FPGA Family Brochure- Exceptional dynamic range and analog signal integrity- Xilinx® Kintex® UltraScale" FPGA- Three 200 MHz 16-bit A/Ds- Three multiband DDCs (digital downconverters)- One DUC (digital upconverter)- Two 800 MHz 16-bit D/As- 5 GB of 2400 MHz DDR4 SDRAM- Programmable frequency synthesized sample clock generator- Sample clock synchronization to an external system reference- Powerful DMA controllers for moving data- PCI Express (Gen. 1, 2 & 3) interface up to x8- Multi-channel synchronization with clock/sync bus- Optional clock/sync generator for multi-board systems- Optional LVDS port for custom FPGA I/O- Optional gigabit serial links for custom FPGA I/O- Ruggedized and conduction-cooled versions available- Navigator® BSP for software development- Navigator® FDK for custom IP development- SPARK® fully-integrated development system- Free lifetime applications support- Synchronize up to eight modules with Model 7893 System Synchronization and Distribution Amplifier - PCIe
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Model 58891 -
Pentek, Inc.
- Jade Xilinx Kintex UltraScale FPGA Products and Navigator Design Suite Software Video- Jade Xilinx Kintex UltraScale FPGA Family Brochure- Accepts RF signals from 925 MHz to 2175 MHz- Programmable LNA handles L-Band input signal levels from -50 dBm to + 10 dBm- Programmable analog downconverter provides IF or I+Q baseband signals at frequencies up to 123 MHz- Four 400 MHz 12-bit A/Ds digitize IF or I+Q signals synchronously- Four FPGA-based multiband DDCs (digital downconverters)- Two Xilinx® Kintex® UltraScale™ FPGA- 10 GB of DDR4 SDRAM- Sample clock synchronization to an external system reference- PCI Express interface (Gen. 1, 2 & 3) up to x8- Clock/sync bus for multimodule synchronization- Optional LVDS and gigabit serial connections for FPGA for custom I/O- Navigator BSP® for software development- Navigator FDK® for custom IP development- Spark® fully-integrated development system- Free lifetime applications support- Synchronize up to eight modules with Model 7893 System Synchronization and Distribution Amplifier - PCIe
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Reedholm Systems
We make DC test systems used by semiconductor manufacturers to make measurements on electrical test structures and simple devices. Because of the broad application of test structures, our test systems help assure quality and reliability in process development, wafer acceptance testing, reliability evaluation, and dc final test.
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Keysight Network Applications and Security
The Ixia 400GbE Jumpstart Test System is a developer tool kit to help network equipment manufacturers shorten development and test time – accelerating pre-standard 400GbE networking hardware. Now customers can create, test and verify the interoperability of their next Higher Speed Ethernet technologies while maximizing their 400GbE test investment.
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Instron
The crash simulators are capable of reproducing a wide range of standardized and user-defined crash tests including advanced applications such as side impact and vehicle pitch simulation. Instron’s acceleration sled systems are used for the development and approval of vehicle safety systems, vehicle parts and also for the investigation of solids and structures during crash events.
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SI-C33DSP -
Sheldon Instruments
The SI-C33DSP-PCI from Sheldon Instruments is a powerful Digital Signal Processor (DSP) card for your PC equipped with a PCI bus. It is based on Texas Instruments’ new 150Mhz TMS320VC33, 32 bit floating point DSP, and can transform your PC into an ultra high performance development system and DSP accelerator.
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MC151 -
Powertek LLC
MC151 Current calibrator is an accurate current source capable of 120 A. Typical uses include calibration of current sensors, current probes, current transformers, shunts, ammeters, DMMs or as stable current source for test and development applications. The calibrator is equipped with a built-in multimeter that can be used for simulation of programmable transconductance or current amplifier.
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Neutrino® IS Series -
Teledyne FLIR
Neutrino IS series combines Teledyne FLIR’s world-class mid-wavelength infrared (MWIR) OEM camera modules and continuous zoom (CZ) lenses to offer high–performance imaging solutions with various FPA resolutions and CZ zoom/FOV ranges. Neutrino IS lowers development and manufacturing risk and improves time-to-market. Cutting-edge HOT FPAs, long life and low vibration linear coolers, common camera interfaces, and fully athermalized lenses make for the best-in-class solution. Each camera module and lens are designed for each other, providing optimal performance not achievable when buying and integrating cameras and lenses from multiple sources.
