Showing results: 151 - 165 of 366 items found.
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Martin Testing Laboratories
Vibration testing includes kinetic energy transfer to the test specimen, often described as the Device Under Test or simply DUT. Typically specified in terms of displacement, velocity, acceleration or the corresponding power spectral density units as a function of frequency. The form of the vibration may be sinusoidal, random, or a combination.
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YAV90PIN -
6TL Engineering
The YAV90PIN board is designed to cover the need to control the available power supplies in a test system to the device under test. A VPC 90 series connector is used as interface with the fixture, guaranteeing more than 20.000 mating cycles. Two connector contacts per relay contact are used.
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CSM Products, Inc.
Measurement points distributed throughout a device under test, whether in a vehicle or at a test bench place high demands on the measurement technology. Measurement modules must be compact, robust, reliable, and easy to use. CSM meets all these requirements with its long-term proven CAN MiniModule series.
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CAT-H Series -
Amperis sl
The operation of the breaker can be initiated in different ways (e.g. from a control room, by a local breaker or externally by a test device) depending on the test conditions. Various time measurement triggers are available to record a measurement under a different test condition:*Coil control channel*Continuous current clamping channel*DC voltage channel
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HVSCM -
Test Electronics
Designed to be used with the Model HVST High Voltage Surge tester. The Surge Current Monitor allows simultaneously surge testing 20 units. The Surge Current Monitor monitors the current going through each unit under test at the time of the surge. If a unit under test breaks down or leaks, the Surge Current Monitor will identify the bad unit by lighting the corresponding LED. The most important features of the surge tester are its ability to test the entire winding insulation system. A high voltage surge generates turn to turn, coil to coil, and phase to phase voltage stress, as well as ground insulation stress. When used as a dielectric test, accurate voltage readings are essential. The HV Surge Tester monitors the voltage directly across the winding under test. In production testing we expect that most of the time the devices will pass. In the event that one should fail, the failed device would be removed and then all the parts would have ot undergo another surge test. Since most devices pass most of the time, simultaneous surge testing can be a real time saver.
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41-753-001 -
Pickering Interfaces Ltd.
The 41-753 is a battery simulator module that can be used to simulate the power supplies of cellular phones and other portable battery devices. It features fully floating output terminals that can deliver voltages up to 6 Volts. The fast responding remote sense connections allow the module to regulate the supply voltage at the device under test.
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M5302A -
Keysight Technologies
M5302A is a single-slot Digital IO PXIe module with 28 programmable LVDS channels and 8 single-ended channels. The LVDS channels can be used to communicate to the device under test or can be used to control other devices by emulating protocols such as Camera Link. The single-ended channels are suitable for event triggers or other general-purpose IO applications.
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M9185A -
Keysight Technologies
The M9185A is a fully independent, isolated D/A converter that is capable of supplying high voltage levels in parallel of up to eight or sixteen channels. Each channel is able to output up to 16V as stimulus signals to Device Under Tests (DUTs).
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TCM1001 -
Rhesca Co., Ltd.
In recent years, there has been a demand for small and thin electronic products such as mobile devices, and printed circuit boards are shifting to thin, multi-layered, and even modularized printed circuit boards. effect of bonding materials, that is, the ability to easily conduct heat, is emphasized, and testing equipment that evaluates thermal conductivity is required .As a business of our company, we have mainly manufactured and sold test equipment for solder wettability tests and solder bonding strength, but there was a need to urgently develop next-generation bonding material test equipment to replace these. Under these circumstances, we received a request from an academic research facility to manufacture a device that can measure the thermal conductivity of conductive adhesives under research and development, and we were able to obtain an opportunity to develop the device. We proceeded with the development based on these requirements .
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RF ITS -
Sterner Automation Limited
Sterner's automated test management system, combined with integrated RF technology modules, provides full functionality, including: Apply power to the device under test (DUT). Read and write blocks of data to set up and validate product EEPROM using a hard-wired communications interface. Scan transmitting devices or traveller barcodes and write the information to the DUT (the "sign-up process"). Inject an RF signal of known frequency and power level to test receiver sensitivity.
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41-750-001 -
Pickering Interfaces Ltd.
The 41-750 is a battery simulator module that can be used to simulate the power supplies of cellular phones and other portable battery devices. It features fully floating output terminals than can deliver voltages up to 6 Volts. The fast responding remote sense connections allow the module to regulate the supply voltage at the device under test.
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778572-15 -
NI
35-Channel, 0.25 A PXI Signal Insertion Switch Module—The PXI‑2515 is a multiplexer switch module that enables connectivity by routing high-speed digital I/O (DIO) signals between a device under test (DUT) and an NI high-speed DIO device or a parametric measurement device. You can use modules such as PXI Source Measure Units (SMUs) and PXI Digital Multimeters (DMMs) with high-speed digital devices. With the PXI‑2515, you can perform parametric tests on digital pins without external connectivity or impedance mismatch challenges.
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780587-15 -
NI
PXIe, 35-Channel, 0.25 A PXI Signal Insertion Switch Module—The PXIe‑2515 is a multiplexer switch module that enables connectivity by routing high-speed digital I/O (DIO) signals between a device under test (DUT) and an NI high-speed DIO device or a parametric measurement device. You can use modules such as PXI Source Measure Units (SMUs) and PXI Digital Multimeters (DMMs) with high-speed digital devices. With the PXIe‑2515, you can perform parametric tests on digital pins without external connectivity or impedance mismatch challenges.
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IEC60884 fig38 -
Shenzhen Chuangxin Instruments Co., Ltd.
IEC60884 fig38 thermal compression test device for plug testingUsed to evaluate the pressure resistance of electrical accessories and wall mounted mounting boxes under heatStandard: GB2099.1-2008 Articles 24.19 and 25.4 and Figure 38, IEC60884-1 Figure 38, etc.
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P5570A -
Keysight Technologies
Keysight PCIe 6.0 Protocol Analyzer redefines protocol debugging and validation through a new innovative CEM card form factor, bringing vast improvement in signal integrity and equalization with instant link-up to systems as well as devices under test