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Device Under Test

a specific purpose component or module check; ex. substantial component of a PCB.

See Also: DUT, Unit Under Test, EUT


Showing results: 256 - 270 of 344 items found.

  • Single Board Source/Meter/Switch

    SMSU - SW Link Ltd

    SMSU Series SourceMeterSwitch Unit (SMSU), introduced by SW Link Ltd, is single-channel voltage/current sourcing, 4X6 switch matrix and measurement instruments. Each Series 100 SMSU instrument tightly integrates highly accurate stable DC power source and a true instrument-grade programmable gain amplifier and 18bits ADC on a 100x100mm PCBs. It can output up to 20V, sub-uA to 1A current to device under test (DUT)

  • Multi-Channel Attenuation Control Unit (4-channels), DC to 18 GHz, 0 to 121 dB, 1 dB Step

    J7204B - Keysight Technologies

    The J7204B is a multi-channel (4-channels) attenuation solution for signal attenuation and conditioning of up to 4 devices under test (DUT). Operating frequency from DC to 18 GHz, with 121 dB, 1 dB steps. Exceptional 0.03 dB insertion loss repeatability per section for the entire 5 million cycles and excellent attenuation accuracy and flatness, the J7204B reduces cost of ownership and provide the best measurement accuracy.

  • Multi-Channel Attenuation Control Unit (5-channels), DC to 18 GHz, 0 to 121 dB, 1 dB Step

    J7205B - Keysight Technologies

    The J7205B is a multi-channel (5-channels) attenuation solution for signal attenuation and conditioning of up to 5 devices under test (DUT). Operating frequency from DC to 18 GHz, with 121 dB, 1 dB steps. Exceptional 0.03 dB insertion loss repeatability per section for the entire 5 million cycles and excellent attenuation accuracy and flatness, the J7205B reduces cost of ownership and provide the best measurement accuracy.

  • Multi-Channel Attenuation Control Unit (5-channels), DC to 6 GHz, 0 to 121 dB, 1 dB Step

    J7205A - Keysight Technologies

    The J7205A is a multi-channel (5-channels) attenuation solution for signal attenuation and conditioning of up to5 devices under test (DUT). Operating frequency from DC to 6 GHz, with 121 dB, 1 dB steps. Exceptional 0.03 dB insertion loss repeatability per section for the entire 5 million cycles and excellent attenuation accuracy and flatness, the J7205A reduces cost of ownership and provide the best measurement accuracy.

  • Multi-Channel Attenuation Control Unit (4-channels), DC to 6 GHz, 0 to 121 dB, 1 dB Step

    J7204A - Keysight Technologies

    The J7204A is a multi-channel (4-channels) attenuation solution for signal attenuation and conditioning of up to 4 devices under test (DUT). Operating frequency from DC to 6 GHz, with 121 dB, 1 dB steps. Exceptional 0.03 dB insertion loss repeatability per section for the entire 5 million cycles and excellent attenuation accuracy and flatness, the J7204A reduces cost of ownership and provide the best measurement accuracy.

  • Dynamic Digital I/O with Per Channel Programmable Logic Levels and PMU PXI Card

    GX5295 - Marvin Test Solutions, Inc.

    The GX5295 offers outstanding digital test capabilities and channel density in a compact 3U PXI form factor. Offering both performance digital and analog test capabilities, the GX5295 provides a cost-effective, tester per pin architecture - making this card the ideal choice for high throughput, mixed-signal component test applications. Each digital channel can be individually programmed for a drive hi, drive lo, sense hi, sense lo, and load value (with commutation voltage level). In addition, each channel offers a parametric measurement unit (PMU) providing users with the capability to perform parallel DC measurements on the DUT (device under test).

  • Digital I/O with Per Channel Programmable Logic Levels and PMU PXI Card

    GX5295 - Terotest Systems Ltd.

    The GX5295 offers outstanding digital test capabilities and channel density in a compact 3U PXI form factor. Offering both performance digital and analog test capabilities, the GX5295 provides a cost-effective, tester per pin architecture - making this card the ideal choice for high throughput, mixed-signal component test applications. Each digital channel can be individually programmed for a drive hi, drive lo, sense hi, sense lo, and load value (with commutation voltage level). In addition, each channel offers a parametric measurement unit (PMU) providing users with the capability to perform parallel DC measurements on the DUT (device under test).

  • TMS Test Management Software

    LX TMS - LXinstruments GmbH

    To diagnose and analyze electronic components and devices, various tests are required in development, production and service. Equipped with all the necessary standard functions, the test sequencer developed by LXinstuments meets all criteria for a successful and smooth test process. The test item ( DUT ) is examined under various operating conditions for its properties, function and usability. Typical areas of application can be found where the usual complexity of test sequences has to be processed. The test sequencer is therefore suitable for small and medium-sized systems where special functions of other sequencers are not required. The free, cross-platform, open source developer platform .NET serves as a starting point. The integrated WPF (Windows Presentation Foundation) framework ensures a user-friendly program interface.

  • MEDTEQ Testing Services

    MEDTEQ

    The MEDTEQ facility has a medium range of test equipment as detailed below for testing to various standards. MEDTEQ reports have the equivalent status of a manufacturer's report, which is acceptable under medical device regulations for many regions, such as US, Europe, Canada and Australia. The reports contain a cover page, general description, sample identification (including photos), clause list (core evaluation), and test data. Unlike CB scheme reports, the test data section is a self contained record for all items inspected, measured or tested, with full details such as test engineer, sample identification, testing dates, environment, test equipment and methods used. This detail provides confidence for regulatory auditors.

  • Protocol Analyzer

    PGY-SSMlite SD - Prodigy Technovations Pvt. Ltd.

    PGY-SSMlite SD Protocol Analyzer is the most feature rich comprehensive Protocol Analyzer available to capture and debug SD protocol data. PGY-SSMlite Protocol Analyzer supports SD, Protocol analysis for wide data rate up to 200MHz SDR mode (UHS-I). The innovative active probe has minimum electrical loading on device under test (DUT) and allows the protocol data capture without affecting the performance DUT. PGY-SSMlite protocol analyzer allows industry first continuous streaming of protocol data from PGY-SSMlite Protocol Analyzer to host system (using USB3.0 or GbE interface). Comprehensive decoding of data, protocol tests, and error analysis enables verification of communication of SD host and device.

  • Multimedia Test Video Generator/Analyzer

    882EA-DP - Teledyne LeCroy quantumdata

    The Teledyne LeCroy quantumdata 882EA-DP test instrument with both a DisplayPort 1.1 transmitter and receiver (analyzer) option is packed with features for video and audio testing of DisplayPort monitors and sources at pixel rates up to 268 MHz. The 882EA-DP test instrument provides two (2) additional DisplayPort ports for passive monitoring of the link layer through the optional Aux Channel Analyzer (ACA) application. The ACA option enables you to monitor link training transactions either between the instruments Tx port or its Rx port with the DisplayPort device under test. The 882EA-DP instrument can optionally be equipped with industry approved compliance tests for Link Layer, EDID and HDCP 1.2.

  • PXI Switch Matrix Modules

    Pickering Interfaces Ltd.

    From low density to high power - we have the PXI matrix switch modules you need. PXI matrix switch modules deliver low, medium and high-density switching of multiple channels in a single instance. They are organized in rows and columns to provide maximum flexibility, allowing you to connect any row to any column, making them ideal for routing multiple signals between your device under test and your instruments.

  • Pressure Comparator (System D)

    P Series - AMETEK Sensors, Test & Calibration

    The P-Series (System D) comparators are hydraulic screw pumps designed for easy, controlled, high pressure generation. Each comparator includes a 4 connection manifold, which can be used for the reference indicator, the device under test, a fine adjust, an isolation valve, or a fluid reservoir. The adjustable reference pressure port lets you set your reference gauge at the best viewing angle. Three models are available for hydraulic oil, water, or both.

  • External Frontend

    FE50DTR - Rohde & Schwarz GmbH & Co. KG

    The R&S®FE50DTR external frontend can extend the frequency range up to 50 GHz for Rohde&Schwarz signal and spectrum analyzers as well as signal generators. The R&S®FE50DTR enables signal up and downconversion directly at the device under test (DUT), lowering cable losses, increasing sensitivity and delivering more power at the antenna in an OTA environment. With a dual connector system, testing of active components is an easy task.

  • AC Line Splitter

    Extech 480172 - Extech Instruments Corporation

    This Extech 480172 Line Splitter provides a fast and easy way to “open” standard 120 Volt AC electrical lines, eliminating the need to cut off the plug and separate the conductors. When connected between a 120 Volt AC outlet and a device under test, this splitter separates the hot/live conductor from the neutral and ground, which enables users to measure AC current up to 15 Amp on a two-wire or three-wire lines using a clamp meter. This splitter also features two Voltage Test jacks so that voltage can be measured using a multimeter.

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