Showing results: 316 - 330 of 366 items found.
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ZDS-50B -
Shanghai Dean Electrical Co., Ltd
Executive standard: GB/T4074.5-2008/IEC60851-4; Inspection standard: JB/T4279.11-2008Used to test the breakdown voltage performance under room temperature of enameled round and flat wires with nominal conductor diameter of 0.018mm and above;Three voltage rise speeds are available: 20V/s, 100V/s and 500V/s, with error being ±5%;Three test methods can be adopted: round bar method, twist pair method and ball method;Clamp a group of test samples (5 for each) once, available to complete breakdown or withstand voltage test for any of sample one by one or individually; breakdown voltage and withstand voltage time would be automatically saved for future enquiry; all operations would be automatically completed;Capable of conducting high temperature breakdown voltage test in combination with RDS-50 thermal-state voltage tester;LED would automatically display test results and automatically return;During sample breakdown, breakdown voltage indication value would be automatically locked, free from flashing, and the test result is distinct and relatively clear;Equipped with test fixture for round rod method and twist pair method as well as the test weight for round rod method;Equipped with ball method test device (steel balls are prepared by user);Test door is provided with safety interlocking device, compliant with relevant regulations on high voltage testing equipment.
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Arcadia Test
Board stress analysis is an increasingly critical part of the test fixture build process today. Probe densities under BGA devices put tremendous pressure onto the solder joints of these devices. If the fixture is not designed properly, immediate damage can occur to the BGA’s, or even more devastating, future damage, which creates field failures. We can provide strain testing before shipping your fixture to insure that there are not excessive forces placed on your BGA parts. With the use of National Instruments Strain equipment, and tri-directional rosettes, we cycle test the board/fixture and measure and record the amount of strain from each corner of each BGA. Any over limit conditions are corrected before shipment. This service insures that your products will not be damaged at ICT, and help to reduce field failures from damaged components, compromised solder joints, or lifted pads.
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Labtone Test Equipment Co., LTD
Labtone EV series of electrodynamic shaker vibration test System simulate the vibration environment under the laboratory condition, and test the impact strength as well as reliability of various vibration test applications.Labtone EV series of electromagnetic vibration testing system simulate the vibration environment under the laboratory condition, and test the impact strength as well as reliability of various vibration test applications. In the laboratory, with the aid of vibration testing system, simulations of reproduction of sinusoidal, random, resonant search and dwell, classical shock and road models, etc. can be achieved. It is essential for product quality assurance, new product research and development.Labtone EV series of electromagnetic vibration testing system is specially designed to meet the need for long time operation. Vertical and horizontal vibrations can be achieved by the installation of vibration resistant base. The standard platform is equipped with high efficiency airbag shock isolation device, so that the vibration transmitted to the building can be minimized. There is no need for additional foundation in most of the cases.A complete set of vibration testing system is composed of shaker, power amplifier and vibration measuring control system, in accordance with the relevant national and international standards (such as: MIL-STD, DIN, ISO, ASTM, IEC, ISTA, GB, GJB, JIS, BS, etc.) to provide technical support for establishing product quality inspection.
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61800 -
Chroma ATE Inc.
Chroma Power Electronics Test Solutions not only apply in the industries of Information Technology, Communication, Aerospace and National Defense, but also in energy efficient products such as Hybrid Automobiles, LED luminance devices, solar and fuel cells that are developed aggressively under the pressure of natural resource constraints. Chroma has a wide variety of instrumentation including AC Power Sources, DC Power Supplies, DC Electronic Loads, AC Electronic Loads, Digital Power Meters, and Automatic Test Systems that are ideal for power input/output terminal tests and dynamic simulation.
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Chroma ATE Inc.
Chroma Power Electronics Test Solutions not only apply in the industries of Information Technology, Communication, Aerospace and National Defense, but also in energy efficient products such as Hybrid Automobiles, LED luminance devices, solar and fuel cells that are developed aggressively under the pressure of natural resource constraints. Chroma has a wide variety of instrumentation including AC Power Sources, DC Power Supplies, DC Electronic Loads, AC Electronic Loads, Digital Power Meters, and Automatic Test Systems that are ideal for power input/output terminal tests and dynamic simulation.
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Aeromarine SRT Ltd
The International Marine Organization states that all GMDSS equipment (including SARTs) should be periodically maintained and verified to meet all the performance requirements. In case of test failure, ships may be detained in a port under SOLAS regulation IV/15.8.The 9GHz Search and rescue radar transponder (radar-SART) is indispensable safety device and it must be checked regularly or annually during radio inspection.The purpose of an annual testing is to determine that SART is operational as defined in appropriate performance standards for Survival Craft Radar Transponders for use in Search and Rescue Operations, IMO Resolution A.802 (19).
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YAVAR438 -
6TL Engineering
- Hardware controlled Enable Input- 12 Power relays up to 10A 250VAC/DC and 300W or 2.700VA switching power- 12 10-mOhm shunt resistors.- 6 Switched 2-Pole sense channels- Single phase isolated or 3-Phases non-isolated switching capabilities, to or from the device under test (power or load)- VPC TriPaddle 96 pins connector.- NI LabView & TestStand driver.- .NET, C/C++, VB driver.- Soft Front panel for direct interface.- CAN Control or Ethernet (with Ethernet to CAN Gateway).- Self-test module available.- Form A
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783861-01 -
NI
±60 V, 1 kS/s/ch, 24-Bit, Simultaneous Input, 8-Channel C Series Voltage Input Module - The NI‑9228 performs differential analog input. With channel-to-channel isolation, your entire system, including the device under test, is protected from harmful voltage spikes up to the isolation rating. The NI‑9228 is simultaneous sampling with two options for filtering: a low-latency filter or a 50/60 Hz rejection filter. The low-latency filter enables users to use this module in industrial or control applications while getting better external noise rejection.
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783862-01 -
NI
±10 V, 1 kS/s/ch, 24-Bit, Simultaneous Input, 8-Channel C Series Voltage Input Module - The NI‑9224 performs differential analog input. With channel‑to‑channel isolation, your entire system, including the device under test, is protected from harmful voltage spikes up to the isolation rating. The NI‑9224 is simultaneous sampling with two options for filtering a low-latency filter or a 50/60 Hz rejection filter. The low-latency filter enables users to use this module in industrial or control applications while getting better external noise rejection.
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783861-02 -
NI
±60 V, 1 kS/s/ch, 24-Bit, Simultaneous Input, 8-Channel C Series Voltage Input Module - The NI‑9228 performs differential analog input. With channel-to-channel isolation, your entire system, including the device under test, is protected from harmful voltage spikes up to the isolation rating. The NI‑9228 is simultaneous sampling with two options for filtering: a low-latency filter or a 50/60 Hz rejection filter. The low-latency filter enables users to use this module in industrial or control applications while getting better external noise rejection.
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779785-01 -
NI
±60 V, 50 kS/s/ch, 24-Bit, Simultaneous Input, 4-Channel C Series Voltage Module - The NI‑9229 performs differential analog input. The NI‑9229 is an effective general-purpose analog module because of its resolution, sample rate, and input range. With channel‑to‑channel isolation, your entire system, including the device under test, is protected from harmful voltage spikes up to the isolation rating. In addition to safety, isolation eliminates measurement errors caused by ground loops because the front end of the module is floating.
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780180-01 -
NI
±60 V, 50 kS/s/ch, 24-Bit, Simultaneous Input, 4-Channel C Series Voltage Module - The NI‑9229 performs differential analog input. The NI‑9229 is an effective general-purpose analog module because of its resolution, sample rate, and input range. With channel‑to‑channel isolation, your entire system, including the device under test, is protected from harmful voltage spikes up to the isolation rating. In addition to safety, isolation eliminates measurement errors caused by ground loops because the front end of the module is floating.
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779785-02 -
NI
±60 V, 50 kS/s/ch, 24-Bit, Simultaneous Input, 4-Channel C Series Voltage Module - The NI‑9229 performs differential analog input. The NI‑9229 is an effective general-purpose analog module because of its resolution, sample rate, and input range. With channel‑to‑channel isolation, your entire system, including the device under test, is protected from harmful voltage spikes up to the isolation rating. In addition to safety, isolation eliminates measurement errors caused by ground loops because the front end of the module is floating.
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JT 2127/Flex Socket Test Module -
JTAG Technologies Inc.
The JT 2127/Flex STM memory socket tester is a family of hardware adapters specifically designed for the testing of of PCB-mounted DIMM & SODIMM sockets using a JTAG/boundary-scan controller and supporting software. The testing of memory sockets has always been troublesome for test and production engineers using JTAG/boundary-scan systems. Even when it is possible to create memory writes/reads from a boundary-scan compliant access device on the UUT (Unit Under Test), the initialization process may fail leaving you with little diagnostics information. What’s more it can still be uncertain whether fault lays with the DIMM module itself or the socket. Using the new JT 2127-Flex system from JTAG Technologies you get pin-point diagnostics from a known-good test interface so you can be certain that your socket is soldered correctly.
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34906A -
Keysight Technologies
The Keysight 34906A RF multiplexer module for the 34970A/34972A Data Acquisition/Switch Unit offers broadband switching capabilities for high-frequency and pulsed signals. Use it to route test signals between your device under test and your signal generator, oscilloscope, spectrum analyzer, or other instrumentation. The RF multiplexers are arranged as two independent 1 x 4 multiplexers, each with a common shield and a switched center conductor. Connections can be made directly to SMB inputs with 2 GHz usable bandwidth, or to the BNC-to-SMB adapters provided with 1 bandwidth. Multiple banks may be cascaded together for applications requiring even larger topologies--create a stubless 16:1 multiplexer in a single frame.
