Showing results: 5956 - 5970 of 6366 items found.
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Applicos -
Salland Engineering
Effective mixed-signal test solutions demand know-how and experience. Low level analog signals need to be stimulated and analyzed near fast switching digital logic. Cross talk, magnetic fields, clock jitter, ground noise and non-linearity of components, are just a few of the problems that must be addressed. Applicos knows what it takes to design and produce high quality mixed-signal test solutions. They have been servicing the mixed-signal test industry since 1993 and have established a distinguished reputation for providing our customers with high performance, cost effective solutions. In 2018 we acquired Applicos B.V. to extend our portfolio for the ATE business.
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783086-02 -
NI
51.2 kS/s, 2-Output PXI Sound and Vibration Module - The PXIe‑4463 offers high dynamic range and THD+N for audio, acoustic, and vibration applications. It provides the high precision and dynamic range necessary for the most stringent audio generation requirements in a modular form factor. The PXIe‑4463 contains two 24-bit digital‑to‑analog converters to allow for fully differential simultaneous generation. Complete with three gain ranges, the PXIe‑4463 can generate current with programmable, per channel output configurations. The two timing engines allow you to perform multisample-rate applications on a single module and independently start and stop channels on a single module.
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781156-01 -
NI
8‑Slot, USB CompactDAQ Chassis - The cDAQ‑9178 is a CompactDAQ USB chassis designed for small, portable sensor measurement systems. The chassis provides the plug‑and‑play simplicity of USB to sensor and electrical measurements. It also controls the timing, synchronization, and data … transfer between C Series I/O modules and an external host. You can use this chassis with a combination of C Series I/O modules to create a mix of analog I/O, digital I/O, and counter/timer measurements. The cDAQ‑9178 also has four 32‑bit general-purpose counters/timers. You can access these counters, as well as share clocks and triggers, through two built-in BNC connectors.
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783867-01 -
NI
24-Bit, 32-Channel, 5 kS/s, 42 V, PXI Analog Input Module—The PXIe‑4304 is a filtered analog input module for higher voltage measurements. The module offers the ability to select a digital filter per channel to provide extra filtering performance. You also can operate up to four different sample rates and triggering configurations concurrently to ensure you measure every sensor as needed. The module has an A/D converter per channel to enable a simultaneous sample rate at the maximum sample rate across the input range. The included NI‑DAQmx driver simplifies hardware configuration and measurement.
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CFD200 -
TEAM SOLUTIONS, INC.
The CFD200 is a new concept in test equipment that allows a PDA, laptop or tablet PC to be turned into a dual channel Digital MultiMeter with sophisticated analysis capabilities. SmartAnalysis software facilitates step-by-step fault investigation with instant display of results and an interactive diagnostic guide. With the CFD200 it is possible to integrate multiple measurement functions into a single hardware/software platform, providing high-level analysis features and a small, lightweight and portable unit. The CFD200 is an extended Compact Flash design offering two channels with full galvanic isolation to host and channel-to-channel. Each offers a scope function up to 40KSPS with full datalogging capability and 650V max. input voltage.
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Model 78132 -
Pentek, Inc.
- Jade Xilinx Kintex UltraScale FPGA Products and Navigator Design Suite Software Video- Jade Xilinx Kintex UltraScale FPGA Family Brochure- Complete radar and software radio interface solution- Supports Xilinx Kintex UltraScale FPGAs- Eight 250 MHz 16-bit A/Ds- Eight wideband DDCs (digital downconverters)- 64 multiband DDCs- 5 GB of DDR4 SDRAM- Sample clock synchronization to an external system reference- LVPECL clock/sync bus for multiboard synchronization- PCI Express (Gen. 1, 2, &3) interface up to x8- Optional LVDS and gigabit serial connections to the FPGA for custom I/O- Ruggedized version available
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Model 52641 -
Pentek, Inc.
Ideal radar and software radio interface solutionOne-channel mode with 3.6 GHz, 12-bit A/DTwo-channel mode with 1.8 GHz, 12-bit A/Ds2 GB of DDR3 SDRAMProgrammable one- or two- channel DDC (Digital Downconverter)PCI Express (Gen. 1 & 2) interface x8 wideSync bus for multimodule synchronizationOptional LVDS connections to the Virtex-6 FPGA for custom I/O3U VPX form factor provides a compact, rugged platformCompatible with several VITA standards including: VITA-46, VITA-48 AND VITA-65 (OpenVPX™ System Specification)Ruggedized and conduction-cooled versions availableSynchronize up to twelve modules with Model 9192 System Synchronization and Distribution Amplifier- 1U Rack-mount
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Model 58132 -
Pentek, Inc.
- Jade Xilinx Kintex UltraScale FPGA Products and Navigator Design Suite Software Video- Jade Xilinx Kintex UltraScale FPGA Family Brochure- Complete radar and software radio interface solution- Supports Xilinx Kintex UltraScale FPGAs- 16 250 MHz 16-bit A/Ds- 16 wideband DDCs (digital downconverters)- 128 multiband DDCs- 10 GB of DDR4 SDRAM- Sample clock synchronization to an external system reference- LVPECL clock/sync bus for multiboard synchronization- PCI Express (Gen. 1, 2, &3) interface up to x8- Optional LVDS and gigabit serial connections to the FPGA for custom I/O- Ruggedized and conduction-cooled versions available
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Model 57132 -
Pentek, Inc.
- Jade Xilinx Kintex UltraScale FPGA Products and Navigator Design Suite Software Video- Jade Xilinx Kintex UltraScale FPGA Family Brochure- Complete radar and software radio interface solution- Supports Xilinx Kintex UltraScale FPGAs- Eight 250 MHz 16-bit A/Ds- Eight wideband DDCs (digital downconverters)- 64 multiband DDCs- 5 GB of DDR4 SDRAM- Sample clock synchronization to an external system reference- LVPECL clock/sync bus for multiboard synchronization- PCI Express (Gen. 1, 2, &3) interface up to x8- Optional LVDS and gigabit serial connections to the FPGA for custom I/O- Ruggedized and conduction-cooled versions available
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Model 58661 -
Pentek, Inc.
- Complete radar and software radio interface solution- Supports Xilinx Virtex-6 LXT and SXT FPGAs- Eight 200 MHz 16-bit A/Ds- Eight multiband DDCs (digital downconverters)- Two multiboard programmable beamformers- Up to 4 GB of DDR3 SDRAM; or: 64 MB of QDRII+ SRAM- PCI Express (Gen. 1 & 2) interface up to x8- Sample clock synchronization to an external system reference- LVPECL clock/sync bus for multiboard synchronization- Optional LVDS connections to the Virtex-6 FPGA for custom I/O- Ruggedized and conduction-cooled versions available- Synchronize up to eight modules with Model 7893 System Synchronization and Distribution Amplifier - PCIe
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Model 57661 -
Pentek, Inc.
- Complete radar and software radio interface solution- Supports Xilinx Virtex-6 LXT and SXT FPGAs- Four 200 MHz 16-bit A/Ds- Four multiband DDCs (digital downconverters)- One multiboard programmable beamformer- Up to 2 GB of DDR3 SDRAM; or: 32 MB of QDRII+ SRAM- PCI Express (Gen. 1 & 2) interface up to x8- Sample clock synchronization to an external system reference- LVPECL clock/sync bus for multiboard synchronization- Optional LVDS connections to the Virtex-6 FPGA for custom I/O- Ruggedized and conduction-cooled versions available- Synchronize up to eight modules with Model 7893 System Synchronization and Distribution Amplifier - PCIe
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Neutronics Manufacturing Co.
Introduction: Measuring the line loop contact resistance by bridges is not the ideal method as the test current is only a few milli amperes. Thus the value is not the true value of the contact resistance. Model HL- 100 is a direct reading tester, and uses a test current of 100A DC, resulting in true v alue and accur ate measurements. Model HL- 100 adopts digital circuit technique and is used for measuring contact resistance of switch control equipments at test current of 100A DC. The measurements are accurate as the test is highly stable.HL- 100 is a new, fully automatic micro controlled tester that measures contact resistance at 100A DC with built in printer. The advantages of HL-100
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LQ6324P -
Aplab Limited
- Multi Output Linear DC Power Supply- Digitally Controlled Output Settings- Store / Load 10 Sets of Output Settings in Internal Memory- USB Interface Provided- Programmable Arbitrary Variable Output by Feeding Coefficient of the Curve- User Friendly Front End- Low Cost General Purpose Laboratory Bench Unit- Fully Protected against Overload and Short Circuit- 5V/5A with Over Voltage Crowbar Protection for Digital ICs- Three Independent Outputs Electrically isolated from Each Other- Electrically Floating Outputs up to 500V DC w.r.t. Ground- Precise Regulation, Low Ripple and Noise for Both Constant Voltage & Current Operation
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A6-SG -
Chuan Sheng Electronics Co., Ltd.
A6-SG weighing controller has been designed with high accuracy measurement (24bit A/D), 6 digital display, flexible I/O functions and communication port for general weighing application.They are also build in 4 Relay outputs, 4 External Control Inputs, 1 Analogue output and 1 RS485 (Modbus RTU Mode) interface with versatile functions such as control, alarm, re-transmission and communication for a wide range of industrial applications.They was designed the tracking zero and tracking stable function in programming level. According to the system, user can set the function to get the suitable reading.According the purpose, the 4 relays can be selected individual for feeder, discharge, peak, or alarm in 7 control modes.
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VPA-60080 -
Veer Electronics
VEER Power Analyzer VPA-60080 is result of continuous R & D activities. It is an accurate Instrument to test 3 phase & 1 phase electrical Machines due to high sampling rate & simultaneous measurement of parameters. It has no adjustable components inside so, accuracy remains long time. We provide Free Software VEER POWER ANALYZER TOOL with VPA-60080 to communicate with computer which is capable to collect all parameters from VPA-60080 & generates test report. You can see parameters in different view like Digital, Analog, Graphical etc in real time. You can record test data in real time to eliminates Human error in Testing.
