Showing results: 16 - 30 of 38 items found.
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DURST Motor & Electric Industries Pty Ltd.
DURST Measurement & Diagnostic Products; circuit tester, vehicle battery analyzer, multimeter, dedicated automotive multimeter, clamp meter, sound level meter, oxygen sensor tester, diesel engine tachometer, multisystem ignition analyzer, faultfinder, circuit tester, diode tester, regulator tester, growler for testing motor insulation, armature/commutator tester, diagnostic testers, current clamps, optical photo/contact tachometer, etc.
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TP0620 -
LEMSYS
The portable tester TP0620 is designed for easy and fast functional control of the major power semiconductors in the lab or on site (IGBT, MOSFET, diodes, thyristors and other components).
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PULSOR -
LEMSYS
Portable maintenance testers Pulsor 2kV, Pulsor 4kV, Pulsor 7kV To measure Leakage current ID, IR in given voltage range of power components: IGBTs, MOSFETs, Diodes, Thyristors, Varistors…
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igentic® 621t -
Sterner Automation Limited
Growing demand for light emitting diode (LED) products and increasing testing complexity continue to challenge electronic printed circuit board (PCB) manufacturers. The igentic® 621t is a flexible PCB tester that ensures quality while increasing production. The tester can handle multiple PCB products and test for light measurements, resistance and push button or post detection, as required.
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Amida Technology, Inc.
AMIDA ATI 600 Tester is a dedicated test system for semiconductor components (MOSFET, BJT, DIODE, ... etc.), which can accurately and quickly measure product parameters through form filling and editable program control. In practical applications, AMIDA ATI 600 Tester is the best choice for users, whether it is CP or FT mass production testing, or research projects of component characteristics.
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(SST) 450 -
ATSI
The ATSI SST-450 Surge Suppressor Tester is designed to quickly and easily test allcommonly used transient voltage suppressors: metal-oxide varistors (MOVs), gas-discharge tubes (GDTs), silicon avalanche diodes (SADs), thyristor surge protective devices (TSPDs), and hybrid devices.
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ZHANGZHOU HUAYI ELECTRONICS CO.,LTD.
There are CV, ACV, ACA, , CAP, Frequency, Diode Test, Continuity Test and Duty Cyclr Test function. Otherwise there are auto and manual range, relative measurement, data hold, and backlight auto off time limit mode. Test leads can be inserted on groove of back of the tester.
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IST-8800 -
IST Information Scan Technology, Inc.
The IST-8800 is a fully programmable, low cost tester that provides parameter measurements or parametric GO/NO GO test for transistors, diodes, MOS-FETs, Regulators, Triacs, Zeners, SCRs, and J-FETs. These devices can be tested up to 5 amps or 1200 volts with a measurement range down to the nano amp range. Only four universal test fixtures are required which can test the device across a wide range of packages.
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Get Control, Inc.
GCI's Automated Connector Tester is a self-contained test bench providing reliable testing of filtered and non-filtered electrical connectors. The ACT automates the tedious process of testing each pin against all others and shell for DC and AC leakage. For filter connectors, the ACT accurately measures pin-to-shell capacitance. For pins protected by diodes, the ACT provides leakage and breakdown measurements. The ACT also verifies pins which are intentionally shorted to each other or to the shell.
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34XX -
FETservice, Inc
Performs DC, AC, and pulsed tests. Excels at evaluating difficult to measure parameters on zeners, current limiters, varactor tuning diodes, darlingtons and matched dual transistors. 24 bin opto-isolated handler/prober interface. Parallel first-in first out computer to tester interface for maximum throughput. Parallel testing with a 3402E or 3403E allows shared test execution for extremely high throughput applications when interfaced to high speed handlers with multiple test sites.
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QST286 -
Qmax Test Technologies Pvt. Ltd.
The Qmax Model QST286 is a compact small foot print, sophisticated automatic semiconductor tester. Its state-of-the-art hardware design which is freely configurable to user's application requirements and software features makes it ideal for high throughput production testing of wide range of low pin count medium power ICs as listed below but not limited to Optocouplers, Isolators, LEDs, Photo diodes, Photo transistors, Photo sensors, Photo detectors , Analog Mux , Relays and more.
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Amida Technology, Inc.
AMIDA VCSEL tester can be divided into three parts: LIV measurement system, Near Field measurement system and Far Field measurement system. To achieve the above three measurements, in addition to the necessary optical components and optical instruments, the core technology is to provide fast and stable current pulses to drive the VCSEL laser diode to emit light, and then to test various optical and electrical properties
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Mostrak-2 -
ipTest Limited
M2 test system has multiple test generators which cover static and dynamic test procedures. It is our first truly modular tester which allows for the system to be upgraded and expanded when needed. M2 are designed to get the tester as close as possible to the handler interface and operator at the highest possible speeds. M2 is capable of HV (3 kV) and LV (600A) testing and has dynamic switching capabilities up to 1200V. MOSTRAK systems can test the following device types: MOSFET, IGBT, Bipolar transistor, Diode - rectifiers, Thyristor (SCR) - Triac, Linear voltage regulator (VReg), Transient voltage suppressor (TVS).
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187 MCT -
Standard Electric Works Co., Ltd
Lan Cable Tester● Designed for RJ45/RJ11 modular cables, 10/100 base-T cable and Token Ring cable etc.● The LAN cable tester can verify cable continuity, open, circuit and miss-wired. ● The remote receiving unit is available for installed cables far away either on the wall plates or on the patch panels.● Auto and manual scan function.● Ground wire test.● Display : LED indication for wire status.Digital Multimeter● 4000 counts LCD.● Full automatic measurement. Voltage measurement. Resistor measurement.● Range change function.● Select function.● Data Hold function.● Continuity check.● Diode measurement.● Low battery indication.● Input impedance:10MΩ.
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36XX -
FETservice, Inc
Two test stations on the 3600E and 3601E systems. Performs DC, AC, and pulsed tests. Excels at evaluating difficult to measure parameters on zeners, current limiters, varactor tuning diodes and darlingtons. 24 bin opto-isolated handler/prober interface. Parallel first-in first out computer to tester interface for maximum throughput. Parallel testing with a 3602E or 3603E allows shared test execution for extremely high throughput applications when interfaced to high speed handlers with multiple test sites.