Showing results: 661 - 675 of 897 items found.
-
111FFE6012-012X -
ELMA Electronic, Inc.
the VME form factor extender 6U 120 mm allows to adapt boards for use in the same VMEbus system. It maintain the correct depth dimensions and allow the front panel to be aligned.
-
484V2-E09L-30PA1-100 -
ELMA Electronic, Inc.
CompactPCI Serial System Type 12 with 9 Slots, Slot on the left side of the system platform. 1x 300W pluggable, air-cooled with fan fix-mounted and colorless chromated. Vertical backplanes and have a 160mm card cage in the front and a 80mm rear I/O.
-
116FFE6018-0125R -
ELMA Electronic, Inc.
the VME64x form factor extender 6U 180 mm without P0 allows to adapt boards for use in the same VMEbus system. It maintain the correct depth dimensions and allow the front panel to be aligned.
-
DLAP-211-Nano -
ADLINK Technology Inc.
*Deep learning acceleration with NVIDIA® Jetson Nano™*Compact fanless system 148(W)x120(D)x49.1(H)mm*Wide temperature range from -20°C to 70°C
-
Hildebrand Prüf- und Meßtechnik GmbH
The MICRO IRHD SYSTEM provides hardness readings on elastomers according to MICRO IHRD. Recommended specimen thickness is 1 to 5 mm. It complies to international standards such as DIN ISO 48, ISO 48 and ASTM D 1415.
-
MP-265 / MPC-365 -
Sutter Instrument Company
The MP265/M mechanical builds on our existing manipulator line in several ways. First, the narrow format means more manipulators can be grouped around a recording chamber. Next, the narrow format MP-265/M allows a high precision manipulator to be inserted into small spaces in existing setups. Finally, travel in the Y-axis is shortened (12.5 mm) both to economize on width and because radially oriented manipulators do not require long travel in the traverse axis.
-
Geotek Ltd.
The Geotek Multi-Sensor Core Logger (MSCL) systems enable a suite of geophysical measurements to be obtained rapidly, accurately and automatically on sediment or rock cores. The rugged nature of the equipment makes it suitable for use in either an onshore laboratory/repository environment or onboard survey and drilling vessels. All of Geotek’s core loggers accept core between 50 mm and 150 mm in diameter and up to 1.55 m in length. Geological cores and materials come in a variety of sizes therefore the MSCL and X-ray CT systems are designed for a full range of core material in a variety of liner compositions. To accommodate varying customers’ requirements (both operational and scientific), we provide a range of different core loggers and X-ray CT systems:
-
DLAP-201-JT2 -
ADLINK Technology Inc.
*Deep learning acceleration with NVIDIA® Jetson™ TX2*Compact fanless system 148(W)x105(D)x50(H)mm*Wide temperature range from -20°C to 70°C
-
Axiomtek Co., Ltd.
The Nano-ITX form factor is designed as a high integrated native x86 embedded platform, measuring a mere 120 mm x 120 mm which measures in at 50% smaller than the Mini-ITX form factor. The Nano-ITX form factor is available with a rich feature set and is targeted at the fast-emerging embedded markets, allowing developers to highly customize their system designs in the low-profile and fully-configured embedded devices.
-
SE Series -
Nano-View Co. Ltd.
Spectroscopic data measurement– Visible range: 350~840 nm (or 1.5~3.5 eV)– Data acquisition speed: 5 sec for full spectra of {Δ, Ψ}Manually variable angle of incidence– 45°~90° with 5° stepSingle body system– 40 cm (W) × 30 cm (D) × 30 cm (H), 15 kg (typical)* UV- option requires external lamp power supplyEasy operation– No set-up / No keys to control– Low maintenanceUser-friendly software– operation and analysisOther features– Sample stage with tilt & height adjustmentssample size: (5 mm × 5 mm) ~ (200 mm × 200 mm)– Computer with current operating softwareOptions– Mapping stage: manual or automatic– UV-option: 250~840 nm (or 1.5~5.0 eV)
-
YIS 200 -
RMS Vision Systems Inc
The YIS and SF Series metrology systems are designed for optical detection of wafer defects such as crystaldislocations, slip and other defects. The YIS-300HM (for 300 mm wafers) and YIS-200HM (for 200 mm wafers) utilizeMakyoh optics technology (Magic Mirror) and integrated robotic wafer handler provided by Hologenix.
-
OptoScope SC-20 systems -
Optronis GmbH
The SC-20 streak camera system is characterized by its large detection area of 35 mm x 4 mm and a large usable screen diagonal of 40 mm. Signals are mapped onto the fiber optic input window and measured without the need for optical reduction. In the simplest case, the entrance optics consists of a slit mask that lies directly on the entrance window. In addition, a flexible extension with a shutter, a lens mount or an adjustable slot with coupling optics is possible. The time resolution in the sub-nanosecond range qualifies the camera for many applications in detonics and plasma physics.
-
Axiomtek Co., Ltd.
Mini ITX motherboards are designed with rich functionality and reliable performance in a small footprint that measures just 170 x 170 mm. Mini ITX Motherboards provide greater flexibility for applications in which compact size and power-efficiency are required, such as kiosks, POS, lottery machines, gaming systems, factory automation, DSA, and more.
-
MM-10 -
Meyer Sound Laboratories Inc.
Delivering expanded low frequency for applications that require excellent audio quality from a compact system, the MM-10 subwoofer allows system designers to create full-range systems where space limitations are a concern, and are adaptable to complement MM‑4XP and UP-4XP loudspeakers.
-
YIS and SF Series -
RMS Vision Systems Inc
The YIS and SF Series metrology systems are designed for optical detection of wafer defects such as crystaldislocations, slip and other defects. The YIS-300HM (for 300 mm wafers) and YIS-200HM (for 200 mm wafers) utilizeMakyoh optics technology (Magic Mirror) and integrated robotic wafer handler provided by Hologenix.The SF300M and SF300N systems offer a low cost functionally equivalent alternative to the YIS series.