- Virginia Panel Corporation
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ITA, ICon XL, 2 Module, Extra-Large Backshell, EMI
410123232
The iCon XL offers an extra-large u-shaped cable clamp that can hold cable bundles with an oblong bushing effective diameter of 1.95" and offers a cable bend radius of 1". A slide-off backshell allows easy access to wiring for maintenance and probing. The iCon XL also offers EMI shielding.
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EMI Test System
EMI-9KA
EMI-9KA is an automatic EMI receiver. It is a main test system for EMI (Electro Magnetic Interference) testing. The EMI-9KA is produced by the full closure structure and strong electro-conductibility material, which has high shielding effect. Due to the new technology for the EMI Test System, it solved the instrument self-EMI problem. The test results are according to the international format test report. The EMI Test System EMI-9KA fully meets CISPRl6-1, GB17743, FCC, EN55015 and EN55022.
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EMI Test System
TS9975
The R&S®TS9975 is the base system for conducted and radiated EMI measurements. Due to its modular design, it covers a wide range of applications and can be very easily adapted to the measurement task at hand. Any configuration is possible – from conducted measurements and the small precompliance system with a compact test cell to the accredited test system for large equipment under test. Combinations of different applications or incremental expansion are easily possible.
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EMI and EMC Test System
EMI receiver system. It is a main test system for EMI (Electro Magnetic Interference) testing. The EMI-9KB is produced by the full closure structure and strong electro-conductibility material, which has high shielding effect. Due to the new technology for the EMI Test System, it solved the instrument self-EMI problem.
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EMI Receiver System
EMI-9KC/EMI-9KB
EMI-9KB is an automatic EMI receiver system. It is a main test system for EMI (Electro Magnetic Interference) testing. The EMI-9KB is produced by the full closure structure and strong electro-conductibility material, which has high shielding effect. Due to the new technology for the EMI Test System, it solved the instrument self-EMI problem. The test results are according to the international format test report. The EMI Test System EMI-9KB fully meets CISPRl6-1, GB17743, FCC, EN55015 and EN55022.
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EMI Test Receiver
SER
Saluki SER series EMI receivers comply with CISPR 16-1-1 standard, integrated CISPR-AVG, CISPR-RMS, QPK detectors, and electromagnetic interference measurement. According to CISPR, EN, FCC and MIL standards, which is suitable for EMI testing in home appliances, lighting, automotive electronics, medical, and other industries. Combined with ETR PC measurement software and a wealth of test options, accurate automated testing is possible. The whole system is equipped with a spectrum analysis module and a tracking signal generator to meet the testing needs of users in different fields.
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Emissions Test System
PC-114
Perform Radiated & Conducted EMI pre-compliance testing at your facility up to 1 GHz. Com-Power PC-114 EMI emissions test system is a ideal solution performing pre-compliance EMC testing from 9 kHz - 1 GHz.. It has essential equipment needed for radiated and conducted EMI emissions measurements. The system includes a spectrum analyzer, antennas, near field probes, a preamplifier, LISN and a non conductive antenna tripod. Pre-compliance testing in EMC is a commonly used term not easy to defin...show more -
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Receiver, 9025, 25 Module, EMI Gasket
310104431
The 25 Module Receiver is a rugged system devised to accommodate medium I/O. With high contact point availability, the 25 Module Receiver is suited for larger test and measurement systems. This 9025 offers a gasket for EMI applications.
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Receiver, 9050, 50 Module, Dual Discrete Wiring Tiers, EMI Gasket
310104429
The 9050, 50-module receiver is rugged and designed to accommodate high I/O and suited for larger test and measurement systems. Both tiers are designed for discrete wiring and can accommodate individual 9025 ITAs. This 9050 also offers a gasket for EMI applications.
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Test Software
Elektra
The R&S®ELEKTRA test software controls complete EMC systems and automates measurements of equipment under test (EUT) being certified for emissions (EMI) and immunity (EMS). R&S®ELEKTRA simplifies configuration of test systems and test descriptions in accordance with common standards. It speeds up test execution and paves the way to quickly generating a comprehensive test report.
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Current Caliper
KH23101
Beijing KeHuan Century EMC Technology Co,.LTD
The KH23101 current caliper is a toroidal transformer used to measure EMI current. When measuring, the caliper does not directly touch the electrical conductor or the cable under test. The conductor passing through the caliper window is used as the single-turn primary wire of the transformer, and the secondary is designed to be multi-turn. Use with 50 Ω receiving system (such as EMI electromagnetic interference field strength meter or spectrum analyzer). In order to facilitate installation and rapid measurement of EMI current, it is designed as a caliper that can be opened.
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EOS Tester
KT-200SG
This test instrument stands for the EMI(Electro Magnetic Immunity) ability test to the electric devices, electronic circuit boards & electric equipments. Recently this instrument is widly used in many companies in Korea & other countries to test the immunity to thier products-power supply, drive PCBs, communication systems, LCD display panels whether they are safe or not against the impulse & noise.All for the purpose, of this object, it generates 4 ~ 5 kinds of different impulse test waveforms.Output test voltage level : 5 ~ 200 V ImpulseOutput voltage polarity : Positive, NegativeType of waveforms
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Faraday Cages
LBA's EMFaraCage® faraday cages are EMI and RFI shielding boxes and RF test enclosures that bring convenience to device testing. Faraday cages are ideal for isolating critical systems in high field RF environments or wherever RF ingress or egress must be minimized. Security, production testing, biomedical research and semiconductor testing are only a few of the many areas where EMFaraCage® faraday shielded enclosures are employed. EMFaraCage® faraday cage enclosure systems are fully featured to ...show more -
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Mission Processor
58U91-03
- +28 VDC input- 9 DC outputs at 600 Watts- Provides system EMI per MIL-STD-461- Continuous Background Built-In-Test (BIT)- Temperature monitoring- I2C communication
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RSE Wireless EMC Spurious Emission
TS8996
The R&S®TS8996 RSE test system is designed for EMI and radiated spurious emission testing on wireless devices in semi-anechoic or fully anechoic chambers. The modular design makes it easy to extend the system to include new communications technologies. Typical devices under test include mobile phones or radio sets along with radiated measurements of other short-range devices. Standards require a wide range of test setups and a wide and high frequency range (up to 40 GHz). ESW or FSW frequency ranges are extended up to 325 GHz with option B21 using receive units TC-RSE for 5G FR2. Dedicated RSE test routines are also covered for this frequency range.
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Preamplifiers
Com-Power broadband high gain preamplifiers were designed for electromagnetic interference (EMI) testing and certification. EMC test labs use preamplifiers to improve sensitivity of the test system during EMI radiated emissions measurements. Without a high gain preamplifier, signals picked by the antenna that have amplitudes below the noise floor of the test system cannot be measured. The preamplifier gain has minimum variations for the entire operating frequency range for accurate emissions measurements. The Com-Power preamplifiers were primarily intended for EMC applications. However, it can be used for other applications that require signal amplification.
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In-Circuit Test System Calibrations
Regular calibration is essential to ensure accuracy and reliability in testing. Forwessun offers precise calibration services tailored to your test systems, verifying that all components meet industry standards. Our calibration services maintain peak accuracy and compliance, so you can be confident in your system’s performance for any testing application. Choose from one-off calibrations or scheduled service contracts to meet your needs.- HP3070 - Agilent- Keysight - GenRad- Teradyne
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In-Circuit Test System Rentals
Forwessun offers flexible test system rental options to meet short-term or seasonal testing demands. Our rental systems are rigorously tested for reliability and performance, giving you access to high-quality equipment without the need for a full purchase commitment. Customised rental agreements allow you to return the equipment when it’s no longer required, providing an ideal solution for scaling up production or filling in during periods of high demand.
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In-Circuit Test System Repairs
Forwessun provides expert repair services for a wide range of Test Systems, helping you maintain optimal performance and extend the life of your equipment. Our team of skilled technicians quickly identifies and addresses issues, ensuring that your system is back in operation with minimal downtime. We handle both routine and complex repairs, offering comprehensive solutions to keep your systems running efficiently and reliably.
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In-Circuit Test Systems For Sale
Forwessun offers a comprehensive range of global services for a variety of Test Systems. We provide refurbished systems that have undergone rigorous testing, giving you reliable performance at a fraction of the cost of new equipment. Whether you’re looking for a long-term solution to enhance your testing capabilities or a temporary setup to meet increased production demands, we have flexible options to suit your needs. - HP3070- Agilent - Keysight- GenRad- Teradyne Our bespoke rental agreements ...show more -
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In-Line Test System
With an Averna in-line test system, clients boost production/yields, catch defects invisible to the human eye, reduce equipment downtime, and ensure repeatable results.
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Iridium Physical Layer Test Systems
PLTS
Averna has worked with Iridium to ensure you have the right equipment to support their test coverage. The Iridium PLTS verifies product performance to Iridium’s standards. Find out more!
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Laser Diode Burn-in Reliability Test System
58604
The Chroma 58604 is a high density, multi-function, and temperature controlled module for laser diode burn-in and lifetime tests. Each module has up to 256 SMU channels which can source current and measure voltage in various control modes as described below.
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Laser Diode Reliability Burn-In / Life-Test System
58602
Chroma 58602 is a high density, precision multi source measurement Unit (SMU) module with temperature control and exchangeable interface developed for burn-in, reliability and life test of optoelectronic components including laser diodes, VCSELs, VCSEL Arrays, silicon Photonics, photo-diodes and other similar components.
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OLED Lifetime Test System
58131
The 58131 Lifetime Test System is designed specifically for the OLED industry. Model 58131 provides twoquadrant constant current (CC) and constant voltage (CV) stimulus to each OLED panel and acquires electrical and optical characteristics automatically. Two independent and isolated precision source-and-measure units (PMU) are incorporated in one modular card, which is capable of testing two OLED panels. Additional instrument cards are added to expand test capacity. Hot plug and play is a key fe...show more -
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Photodiode Burn-in Reliability Test System
58606
The Chroma 58606 PD/APD Burn-in system is a high density, multifunction and temperature controlled module based system for photo diode burn-in and lifetime test. Each module has up to 256 Source Measurement Unit channels which can source current and measure voltage in various scenarios such as one described below. The system can accommodate 7 modules for a total of 1,792 device channels.
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Photonics Module Test System
58625
Chroma 58625 provides characterization testing for 3D sensing illumination devices. various test modules are combined for validation testing under precise temperature control.
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Photonics Wafer Probing Test System
58635
The advancement of the photonics device technology continues to enable broader and more demanding applications in the industry.
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Advanced SoC/Analog Test System
3650
Chroma 3650 is an SoC tester with high throughput and high parallel test capabilities to provide the most cost-effective solution for fabless, IDM and testing houses.
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Advanced SoC/Analog Test System
3650-EX
Chroma 3650-EX is specifically designed for high-throughput and high parallel test capabilities to provide the most cost effective solution for fabless, IDM and testing houses.
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Advanced SoC Test System
3680
The Chroma 3680 is an advanced SoC test system with data rate up to 1Gbps. The Chroma 3680 is capable of conducting parallel tests on multiple chips to meet the digital and analog IC testing requirements, with applications including MCU, digital audio, digital TV, set-top box, DSP, network processor, field programmable gate array (FPGA) and consumer electronics.
