Showing results: 1 - 15 of 15 items found.
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WP400-3 -
Wavecontrol, S.L.
Wavecontrol presents a new and unique field probe for the measurement of electric and magnetic fields that integrates both E & H sensors within dimensions of only 3 cm². Which makes it unique is that Wavecontrol has managed to add an E field sensor in a basic structure of a classical 3 cm² field probe. It has been possible, therefore, to obtain a 3 cm² field probe without compromising the capability of assessing E and H fields of its 100 cm² big sister, the recognized and successful WP400.
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TBPS01 -
TekBox Singapore Pte. Ltd.
The TBPS01 EMC near field probes H20, H10, H5 and E5 are magnetic field (H) and electric field (E) probes for radiated emissions EMC pre-compliance measurements. The probes are used in the near field of sources of electromagnetic radiation.
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Model No. 200-04 -
Srico, Inc.
SRICO Model No. 200-04 Photonic Electric Field Sensor System has the ability to measure electric field with minimal disturbance to the field. The lightweight fiber-optic cables allow for easy placement of the E-field probe, allowing it to be unencumbered by the use of heavy coaxial cables that may disturb the field being measured. The dielectric E-field probe is electrically passive.
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XF1 set -
Langer EMV-Technik GmbH
The XF1 set of near field probes consists of 4 passive near field probes and one passive E field probe for making measurements in the development phase of the magnetic and electric fields in ranges from 30 MHz to 6 GHz. Due to their integrated impendance matching, the probes are less sensitive in the lower frequency range than the RF type probes. The probe heads of the XF1 set allow for the step by step identification of interference sources of the magnetic field on an electronic assembly. At first, for example the XF-R 400-1 detects the fields which the assembly emits in total. Next, using higher resolution probes the interference sources can be more precisely detected. The E field probe is used for the detection of electric interfering fields near the assemblies. With trained use of the near field probes, field orientation and field distribution can be detected. The near field probes are small and handy. They have a sheath current attenuation and are electrically shielded. They can be connected to a spectrum analyzer or an oscilloscope with a 50 Ω input. They have an internal terminating resistance.
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Schwarzbeck Mess Elektronik
Nearfield Probe Set includingHFSL 7101 Active Near Field Probe (magnetic), 9 kHz - 30 MHzHFSH 7102 Active Near Field Probe (magnetic), 4 MHz - 1000 MHzEFS 7103 Active Near Field Probe (electric), 9 kHz - 1000 MHzand Separator EW 7110 and AC/DC adaptor ACDC 7110 in storing case
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Beehive Electronics LLC
The Beehive Electronics 100 series EMC probes allow the accurate measurement of magnetic and electric fields. They are useful for EMC troubleshooting, field strength measurement, and troubleshooting of RF circuits.
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ICR E150 -
Langer EMV-Technik GmbH
The near field microprobe is used to measure electric fields at extremely high resolution and sensitivity. The optimal distance to the object being measured is < 1 mm. Due to its small probe head dimension, the probe has to be moved by a manual or automatic positioning system, e.g. Langer-Scanner.
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SEM-600 -
Beijing KeHuan Century EMC Technology Co,.LTD
Broadband Electromagnetic Radiation Analyzer SEM-600 can accurately measure various complex electromagnetic environments. The probe covers all frequencies from low frequency to microwave radiation. It can measure electric field strength and magnetic field by equipping different types of probes. Intensity (magnetic induction) and power density, it is also equipped with ordinary probes and other weighted probes based on human safety standards.
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EMAG Technologies Inc..
NeoScan® is a unique electric field measurement system with unprecedented innovative features. NeoScan systems utilize EMAG’s patented, electro-optic (EO) field probe technology. Unlike conventional near-field scanning systems that require metallic pickup radiators or sensors, NeoScan probes are made of absolutely metal-free parts.
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AR RF/Microwave Instrumentation
The FL8000 Series field probes offer a three-in-one solution capable of measuring continuous-wave, pulsed, and modulated electric fields. Covering 5 kHz – 60 GHz, the FL8000 Series works great in commercial, automotive, military, and aviation applications.
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HS6-DIFF-1000XMEGS-W -
TEAM SOLUTIONS, INC.
The powerful capabilities of the WiFiScope HS6-DIFF-1000XMEGS EMI analyzer give the user the possibility to quickly perform a good EMI compliance test. With this cost effective test, time and money are saved by avoiding extra visits to expensive EMC testing facilities. The supplied EMI probe set TP-EMI-HS6 contains three magnetic field (H field) probes and one electric field (E field) probe. The tripod ensures that the probes can be positioned properly at the object under test.
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Schwarzbeck Mess Elektronik
Active Electric Field Probe with Biconical Elements9 kHz - 300 MHz12 µV/m - 65 V/mconst. antenna factor typ. 46 dB/m high symmetrybuilt in rechargeable batteryThe switchable preamplifier improves the antenna factor to 20 dB/m.
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TDS -
Schmid & Partner Engineering AG
Time Domain Sensor (TDS) probes are miniaturized fully isolated active optical magnetic or electric field sensors operating in the frequency range from 10MHz to 6GHz. TDS offers unparalleled sensitivity for EM measurements resolved in the time and frequency domains while maintaining all amplitude and phase information.
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PI-SH-FCC, PI-SH-ICNIRP -
EMC Test Design, LLC
An isotropic electric field probe with shaped frequency response meeting the ICNIRP or FCC RF safety standards for occupational and general public exposure limits (see the specified frequency ranges below). Meter readings are shown in % of the STD – standard reference level, eliminating the need to know the source frequency. Probe output is proportional to RF power density in the whole specified power range, producing the correct RF power measurements in single and multi-signal environments, typically present at multiple antenna sites.
