Filter Results By:

Products

Applications

Manufacturers

Electronics Test

Devices whose quality of operation is based on the effects of electrons.


Showing results: 691 - 705 of 865 items found.

  • Digital Insulation Tester

    200M - Laxtronics Instruments & Controls Pvt. Ltd

    Digital insulation tester Model No: DIT200M is designed to carry out electrical insulation measurement in delicate or sensitive electronic sensors, transducers, modules and assemblies with test voltage from 1 to 30 Volts DC, its short circuit current is less than 100uA. The instrument can measure Resistance from 1 Meg Ohm to 1000 Meg Ohms.

  • Product Testing And End Of Line

    TetraTek Products, Inc.

    World-class integration of electronic test equipment, instrumentation, test fixtures, automation, load simulation,data acquisition, and software . In partnership with two major leaders in high-technology automation, three very capable machine shops, a custom cabling company, a rapid prototype circuit board fabrication house and two large automated sheet metal manufacturing facilities we offer custom process and test equipment designed and manufactured for convenience and precision. Each component of our systems is carefully consideredto provide you with maximum performance consistent with easy maintainability and long term return on your investment.

  • Electromagnetic anechoic box/Shield box/Anechoic chamber

    MICRONIX

    The necessity of a wireless system test has risen by the spread of recent wireless telecommunication equipment as shown in cellular phone, wireless LAN, RF-ID tag and ETC (Electronic Toll Collection system). It is necessary for a wireless test to be performed in anechoic environment in which an external noise is intercepted and a radio wave does not reflect internally. An anechoic chamber (room version of a shield box) is proper facilities but needs a wide space and a huge cost. Especially, the equipment under wireless system test on the production line can not radiate any signal radio wave outside before approval. The shield box satisfies these conditions.

  • Live-Dead-Live Meter Verifier

    LDL-1200 - Allied Edison LLC

    The Live Dead Live (LDL) Meter Verifier is a small, lightweight, robust, portable, handheld power supply. It supplies just under 150 volts, AC (rms) or DC with a maximum current of less than 5 mA at rated voltage. The LDL-1200 Meter Verifier is specifically designed to facilitate voltage verification tests on most digital multi-meters, electronic voltage detectors, voltage testers, neon test lights, tic tracers and other commonly used electrical voltage test apparatus, while keeping the user as electrically safe as possible with its extremely low “volt-amp” output.

  • Live-dead_Live Meter Verifier

    LDL-1100 - Allied Edison LLC

    The Live Dead Live (LDL) Meter Verifier is a small, lightweight, robust, portable, handheld power supply. It supplies just under 50 volts, AC (rms) or DC with a maximum current of less than 5 mA at rated voltage. The LDL 1100 Meter Verifier is specifically designed to facilitate voltage verification tests on most digital multi-meters, electronic voltage detectors, voltage testers, neon test lights, tic tracers and other commonly used electrical voltage test apparatus, while keeping the user as electrically safe as possible with its extremely low “volt-amp” output.

  • Calibrators

    Orbit Controls AG

    Orbit Controls calibrators are suitable as signal sources for the test field or the laboratory. They can be used as generators for calibrating and testing electronic measuring devices or assemblies both by manufacturers and by companies that have to carry out periodic calibration tasks due to the quality certification. They are also used in laboratories, development departments, repair and calibration services and much more. In addition to manual operation, all devices also have an RS232 or IEEE interface so that the calibrators can be integrated into an automatic measuring station. To calibrate multimeters with an LCD display, a camera is used which scans the display and automatically integrates the measured values ​​into the calibration software.

  • Non Contact Flange Torque Transducer

    FF425 - Datum Electronics, Ltd.

    Contactless Torque Transducers with flange couplings at either end with measuring ranges from 0-100Nm up to 30kNm as standard (bespoke sensors up to 16MNm) for a variety of in line static and rotary torque measurement applications.The Datum Electronics Series FF425 non contact flange torque sensor and FF410 torque sensors have been designed to fit easily inline with any drive train or test rig using standard DIN size couplings. With Flange couplings at either end of the torque transducer, it has many advantages over other torque measurement systems on the market.

  • IVN-8561, Automotive Ethernet Interface Device

    786169-01 - NI

    2-Channel, 4-Port, 100BASE-T1 to 100BASE-TX Automotive Ethernet Interface Device—The IVN-8561 is an interface that converts 100BASE-T1 unshielded twisted pair (UTP) automotive Ethernet to standard 100BASE-TX Ethernet. It is ideal for developing applications that require automotive Ethernet to test and validate automotive electronic control units (ECUs). The IVN-8561 provides two channels to convert data between 100BASE-TX Ethernet and 100BASE-T1 Automotive Ethernet. Each 100BASE-T1 port can be configured as master or slave, using switches on the front panel. The IVN-8561 also provides LED on the front panel so that you can monitor the linkage and activity on the various ports.

  • PXIe-4339, 25 kS/s, 24-Bit, 8-Channel PXI Strain/Bridge Input Module

    783531-01 - NI

    25 kS/s, 24-Bit, 8-Channel PXI Strain/Bridge Input Module—The PXIe‑4339 is a universal bridge input module ideal for test cell installations requiring both accuracy and flexibility. Completely configurable through software, each channel can take bridge-based measurements and direct voltage measurements. Eight input ranges in ratiometric mode and four in voltage mode accommodate a wide variety of sensor types for your changing application needs. The PXIe‑4339 also features per-channel wide bandwidth analog outputs, programmable excitation, Transducer Electronic Data Sheet (TEDS) support, and digital filtering.

  • Radiation Microdosimeters

    Teledyne Defense Electronics

    Teledyne e2v HiRel Microdosimeter is a compact hybrid microcircuit which directly measures total ionizing dose (TID) absorbed by an internal silicon test mass. The test mass simulates silicon die of integrated circuits on-board a host spacecraft in critical mission payloads and subsystems. By accurately measuring the energy absorbed from electrons, protons, and gamma rays, an estimate of the dose absorbed by other electronic devices on the same vehicle can be made. The Microdosimeter can operate from a wide range of input voltages. The accumulated dose is presented to three dc linear outputs and one pseudo-logarithmic output giving a dose resolution of 14 µrads and a measurement range up to 40 krads. These outputs are intended to be directly connected to most analog-to-digital converters (ADCs) or spacecraft housekeeping analog inputs (0-5 V range), which makes minimal demands on the host vehicle. The Microdosimeter incorporates a test function to allow electrical testing of the hybrid without the need for a radiation source.

  • Miniature Axial Extensometers

    Model 3442 - Jinan Testing Equipment IE Corporation

    Weighing as little as 8 grams, these miniature extensometers are designed to have very low operating force with minimal specimen influence. All use an improved version of Epsilon’s dual flexure design which makes them very rugged for their size. With a module height of 15.2 mm (0.6 inches), they will fit in the limited space between grips that is typical with small test samples. Gauge lengths can be as short as 3 mm or as long as 50 mm. A newly designed gage setting pin and assembly allows the gauge length to be set accurately and repeatably to ASTM and ISO requirements for all gauge lengths. Reengineered quick attach wire forms provide simple and secure specimen attachment. Wire forms for round and flat specimens are included, as well as flat, 3-point, and vee knife edges. The wire forms may be removed to enable mounting using elastic bands or springs. A tethering attachment point provides fall protection and enables counterbalancing of the extensometer’s weight when testing delicate specimens.Model 3442 extensometers are strain gaged devices, making them compatible with any electronics designed for strain gaged transducers. Most often they are connected to a test machine controller and Epsilon will equip the extensometer with a compatible connector wired to plug directly into the controller. For systems lacking the required electronics, Epsilon can provide a variety of solutions for signal conditioning and connection to data acquisition systems, chart recorders, or other equipment.

  • Leakage Current Tester

    TOS3200 - Kikusui Electronics Corp.

    The Leakage Current Tester TOS3200 is designed to perform leakage current (touch current and protective conductor current) tests on general electrical equipment but not medical electrical equipment.It enables you to conduct tests that conform to the requirements of the applicable IEC, UL, JIS, and other standards, as well as the Electrical Appliance and Material Safety Law. The memory in the main unit stores the 51 types of test conditions laid down in the IEC/JIS standards for information technology equipment, household electrical appliances, audio, video electronic apparatus, luminaires, motor-operated electric tools, and electrical equipment for measurement and control and in the Electrical Appliance and Material Safety Law, thereby enabling you to conduct standard tests with simple panel operation.

  • PXI-5154, 1 GHz, 2 GS/s, 8-Bit, 64 MB/ch, PXI Oscilloscope

    780319-02 - NI

    1 GHz, 2 GS/s, 8-Bit, 64 MB/ch, PXI Oscilloscope—The PXI‑5154 is ideal for acquisition and characterization of fast, nanosecond-edge speeds. It is well-suited for automated test and data streaming applications in the consumer electronics, semiconductor, aerospace/defense, and life sciences industries. The PXI‑5154 also comes equipped with up to 256 MB of memory per channel to provide high, sustained sample rates over extended data capture windows. This digitizer, optimized for automated test, uses a high-throughput bus to lower test times, provides picosecond-level synchronization among modules, and integrates with the entire suite of NI hardware, so you can build and customize a complete mixed-signal or high‑channel‑count test system.

  • PXI-5154, 1 GHz, 2 GS/s, 8-Bit, 8 MB/ch, PXI Oscilloscope

    780319-01 - NI

    1 GHz, 2 GS/s, 8-Bit, 8 MB/ch, PXI Oscilloscope—The PXI‑5154 is ideal for acquisition and characterization of fast, nanosecond-edge speeds. It is well-suited for automated test and data streaming applications in the consumer electronics, semiconductor, aerospace/defense, and life sciences industries. The PXI‑5154 also comes equipped with up to 256 MB of memory per channel to provide high, sustained sample rates over extended data capture windows. This digitizer, optimized for automated test, uses a high-throughput bus to lower test times, provides picosecond-level synchronization among modules, and integrates with the entire suite of NI hardware, so you can build and customize a complete mixed-signal or high‑channel‑count test system.

  • PXI-5154, 1 GHz, 2 GS/s, 8-Bit, 256 MB/ch, PXI Oscilloscope

    780319-03 - NI

    1 GHz, 2 GS/s, 8-Bit, 256 MB/ch, PXI Oscilloscope—The PXI‑5154 is ideal for acquisition and characterization of fast, nanosecond-edge speeds. It is well-suited for automated test and data streaming applications in the consumer electronics, semiconductor, aerospace/defense, and life sciences industries. The PXI‑5154 also comes equipped with up to 256 MB of memory per channel to provide high, sustained sample rates over extended data capture windows. This digitizer, optimized for automated test, uses a high-throughput bus to lower test times, provides picosecond-level synchronization among modules, and integrates with the entire suite of NI hardware, so you can build and customize a complete mixed-signal or high‑channel‑count test system.

Get Help