Showing results: 16 - 30 of 102 items found.
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N8 HORIZON -
Bruker Optics
The N8 HORIZON is a powerful tool for both high-end research and for multi-user facilities investigating a variety of nano-materials from solid bulks, to fibers, surfaces or biological samples.
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EMIA-Expert -
HORIBA, Ltd.
The EMIA-Expert Carbon/Sulfur Analyzer is based on HORIBA''s widely respected expertise in Non-Dispersive Infrared (NDIR) technology. It offers improved the cleaning efficiency, enhanced user-friendly software, durability, operability and maintenance to ensure efficient measurements and its shortened cycle time accelerates your development and manufacturing speed.
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D8 ADVANCE -
Bruker Optics
The intelligent beam path components of the D8 ADVANCE with DAVINCI design provide true plug'n play functionality requiring minimum or even no user intervention. Featuring automatic and tool-free switching of the diffraction geometry without the need for complex adjustments, the D8 ADVANCE with DAVINCI design broadens the analytical capabilities for a wide community of X-ray diffraction users.
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D2 PHASER -
Bruker Optics
The D2 PHASER is the most compact and fastest, all-in-one crystalline phase analysis tool available on the market. It is mobile and easy to install with only the need for standard electrical power. The D2 PHASER is therefore ideal for laboratory or on-location operation, in other words, it is a true Plug'n Analyze system.
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NEX QC+ QuantEZ -
Applied Rigaku Technologies, Inc
As a premium low-cost benchtop EDXRF elemental analyzer, the Rigaku NEX QC+ QuantEZ delivers wide elemental coverage with easy-to-learn Windows®-based QuantEZ software. Non-destructively analyze from sodium (Na) through uranium (U) in almost any matrix, from solids and alloys to powders, liquids, and slurries. The 50 kV X-ray tube and Peltier cooled silicon drift detector (SDD) deliver exceptional short-term repeatability and long-term reproducibility with excellent element peak resolution. This high voltage capability, along with multiple automated X-ray tube filters, provides a wide range of XRF applications’ versatility and low limits-of-detection (LOD).
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SpectrOil M Series -
Ametek Spectro Scientific
The latest SpectrOil M series is the eighth generation RDE Optical Emission Spectrometer for elemental analysis in oil and fuel. It is a compact, rugged, transportable and easy to use optical spectrometer that meets military shock and vibration and environmental test standards. The analyzer can be placed in the toughest remote locations around the globe, while still maintaining the laboratory grade accuracy and sensitivity needed for aerospace engine test requirements.
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HORIBA, Ltd.
HORIBA Scientific provides inorganic elemental analyzers for a wide range of applications based on the inert gas fusion technique and high frequency heating combustion in oxygen stream.The EMIA Series for Carbon and Sulfur analysis and EMGA Series for oxygen, nitrogen and hydrogen analysis strongly rely on HORIBA’s experience as a pioneer in Non-Dispersive Infrared (NDIR) technology. Both EMIA and EMGA designs meet all requirements for the metallurgical industry. These instruments also help scientists working in other application fields such as semiconductor, battery materials, ceramics and more.
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Pharmaceutical Elemental Impurities Analysis System -
Shimadzu Corp.
Control of Elemental Impurities in Pharmaceuticals In the pharmaceutical industry, the analysis of elemental impurities is necessary to ensure the safety of pharmaceuticals. In December 2014, the "Guideline for Elemental Impurities" (Q3D) was issued by the International Council for Harmonisation of Technical Requirements for Pharmaceuticals for Human Use (ICH), consisting of representatives from Europe, the U.S. and Japan. In Japan, the "Guideline for Elemental Impurities in Drug Products" (PFSB/ELD Notification 0930 #4 from the Ministry of Health, Labour and Welfare) was issued, and will be applied to new drug products submitted for approval after April 1 2017. For 24 elements categorized in Class 1 to Class 3, residual quantities in pharmaceutical drug products must be controlled within permissible limits. Although ICP-AES and ICP-MS are used for precise analysis of elemental impurities, X-ray fluorescence spectrometers can be used as an alternative analysis method. This is because they can quantitatively and qualitatively analyze a variety of elements nondestructively, and without chemical pretreatment, unlike ICP-AES and ICP-MS systems. The X-ray fluorescence spectrometry has been adopted as a general method of analysis in the U.S Pharmacopeia and the European Pharmacopoeia. (USP<735>, Ph.Eur.2.2.37)
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Bruker Nano Surfaces
Elemental analysis of CS and ONH in inorganic materials | Based on the know-how of many decades Bruker offers innovative solutions for rapid and precise elemental analysis of carbon, sulfur, oxygen, nitrogen and hydrogen.
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Bruker microCT
Elemental analysis of CS and ONH in inorganic materials | Based on the know-how of many decades Bruker offers innovative solutions for rapid and precise elemental analysis of carbon, sulfur, oxygen, nitrogen and hydrogen.
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Skyray Instruments
Is a non-destructive analytical technique used to determine the elemental composition of materials.
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Elemental Analysis, Inc.
As with other current organic carbon and elemental carbon (OC/EC) procedures, Thermal-Optical analysis is method-defined. However, this unit has been designed to specifically address some of the problems observed in other methods in assigning carbon to either the organic or the elemental fraction. By careful system control and continuous monitoring of the optical absorbance of the sample during analysis, this method is able to both prevent any undesired oxidation of original elemental carbon and make corrections for the inevitable generation of carbon char produced by the pyrolitic conversion of organics into elemental carbon. The OC/EC instrument utilized by EAC is used to analyze both bulk samples, and aerosol particles collected on quartz-fiber filters.
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Elemental Analysis, Inc.
XRF is an elemental analysis technique with unique capabilities including (1) highly accurate determinations for major elements and (2) a broad elemental survey of the sample composition without standards. For example, XRF is used in analysis of rocks and metals with an accuracy of ~0.1% of the major elements.
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SciAps, Inc.
LIBS is a type of optical emission spectroscopy used to measure elemental concentrations in a material.
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ARCOS -
SPECTRO Analytical Instruments GmbH
For the most demanding elemental analyses in industry and research. ARCOS analyzer represents a new pinnacle of productivity and performance for inductively coupled plasma optical emission spectrometers. SPECTRO ARCOS excels in industrial and academic applications for the most advanced elemental analysis of metals, chemicals, petrochemicals, and other materials.