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Ethernet Test

Evaluation of a packet based ethernet network's wiring and signaling.


Showing results: 226 - 240 of 241 items found.

  • STANAG3910 Electrica lTest And Simulation Modulefor Standard Ethernet

    ANET3910-EN - AIM GmbH

    STANAG3910 Electrical Test and Simulation module for Standard Ethernet. The ANET embedded Linux operating system gives the unique capability to run the optional PBA.pro Engine right in the box.Another option is the ANET-ADK onboard software development kit where users create run-time applications to execute right in the box. For wireless applications, an ANET compatible USB Wifi dongle is optionally available. The capability to execute Python scripts in the ANET is a standard feature. For applications with multiple ANET devices AIM offers the ADock ANET Docking Station to host up to 4 ANET modules.

  • PoE Voltage Monitor Detect & Verify

    PE-400 - Pansco, Ltd

    PE-400 is specific to test and verify PSE or Ethernet outlet either a standard/active PoE or a NON-standard/passive PoE to avoid damaging Non-PoE device as well as monitor and display available Voltage simultaneously.  It built-in PoE interface controller to trigger on 802.3 af, at and bt switch and verify standard PoE type either 802.3 af or 802.3 at, and power source either End or Mid or both, and power polarity as well as display voltage values.  The operational voltage which should be measured when installing a new PoE system or when you troubleshooting an existing system.

  • C Series PROFINET Interface Module

    NI

    The C Series PROFINET Interface Module provides two PROFINET interface ports that enable you to reliably connect programmable logic controllers (PLCs), I/O, sensors, and drives over long distances in industrial environments. PROFINET is an application protocol that uses familiar concepts from PROFIBUS that are implemented on the physical layer of Ethernet. The C Series PROFINET Interface Module includes NI-PROFINET driver software for human machine interface (HMI) and supervisory control and data acquisition (SCADA) applications. You can perform PROFINET device automated test using these interfaces.

  • Ruggedized Ethernet Data Acquisition Systems

    Series 7000 - Pacific Instruments, Inc.

    The Series 7000 Ruggedized Ethernet DAS brings new capabilities and levels of performance to transducer data acquisition. The ruggedized system is designed for installation in wind tunnels, engine test stands and other facilities where it is desired to locate the DAS on or near the test article, reducing installation and cable costs while improving signal quality and reliability. Each unit is a network appliance which conditions, amplifies and digitizes outputs from transducers. Multiple units are easily combined and distributable for larger installations. Real-time temperature Compensation of gain offset and Excitation Voltage, quality signal conditioning with high gain and a 24-Bit A/D per channel provide a high accuracy and high resolution DAS that will perform across a wide operating range.

  • Ethernet & IP Testing

    Spirent Communications plc

    Ethernet speeds are increasing. Networks are becoming more intelligent. Topologies are scaling to sizes never seen before. Spirent understands this growth. We support a variety of speeds and protocols so you can test under realistic conditions. We support unparalleled port and application scale so you can verify your products and services under expected loads. The Spirent products featured in this brochure are designed to support 800, 400, 200, 100, 50, 40, 25,10, 5, 2.5, and 1G.In today’s environment delivering a high quality user experience is more important than ever. A reputation for reliability can create a competitive advantage for new offerings. Maintaining both can be challenging as the number of devices on the network proliferates and the bandwidth they consume skyrockets. Testing your user experience, reliability and quality allows you to confidently launch new services dependent on higher speed links leveraging Spirent’s industry-leading and award-winning portfolio.

  • Multi-wavelength Measurement Optical Time Domain Reflectometer

    MT-7300 Plus - Guangzhou Wanglu Communications Co., Ltd.

    ● 32/30dB high dynamic range● ≤2m extra-short event dead zone● 0.05m high distance resolution,128k sampling points● Fast auto measurement, one-button operating● Test up to four wavelengths with a single unit ● Communication light check automatically● Remote function via Ethernet● USB interfaces, supporting USB stick and printer and direct cable download to PC via ActiveSync● Supporting Bellcore GR196 file format in writing or reading● Built-in lithium battery with high capacity for over 8 hours of operating life● Integrated Visible fault locating (VFL)

  • Multi-Interface TDM, Optical, And Packet/IP Rackmount & Probe Test Platforms

    mTOP™ - GL Communications Inc.

    Most equipment manufacturers and large enterprises prefer rack-based test tools as they are compact and higher density form factor solution for testing, monitoring, and troubleshooting network conditions. GL’s Multiple TDM Optical and Packet (mTOP™) rack enclosure can house any combination of USB based test equipment which are easily deployed and securely fixed to an equipment rack to provide extraordinary scalability to test switches, routers and end-to-end networks. These rack based platforms incorporates the basic test unit along with the necessary PC hardware, Windows® 10 64-bit operating system and remote accessibility via scripting and remote desktop. There are no moving parts with the unit, so reliability and longevity are integral. GL’s latest mTOP™ Probe stand-alone hardware variant is an all-in-one self-contained test instrument. The mTOP™ Probe can include any of the multiple TDM Optical and Packet interfaces USB device combined with the PC into one single box. The comprehensive mTOP™ Probe hardware unit is designed for easier portability and convenient for field testing which incorporates the testing features for multiple interfaces along with necessary PC hardware in a single box. GL’s USB based test equipment - PacketExpert™ (Ethernet), tProbe™ (T1/E1), USB T3/E3 (TDM), Dual UTAs (Analog/Wireless), and LightSpeed1000™ (SONET SDH) to support multiple interfaces in a compact rack space or included in a portable Probe unit.

  • Portable JTAG Boundary-Scan Controller with USB (1.1 and 2.0 High Speed), Ethernet & Firewire Interfaces

    JT 37x7/TSI - JTAG Technologies Inc.

    High speed and performance portable JTAG Boundary-scan controller, containing three interfaces to the test system: USB (1.1 and 2.0 high speed), Ethernet and FirewireThe controllers are targeted at demanding manufacturing test applications, fast in-system flash memory programming and programmable logic configuration. The JT 37×7 is available in different operating levels (memory options) to suit your specific environment and application. Each unit is supplied with a four TAP port signal conditioning module the JT 2147 ‘QuadPOD‘The JT 37×7 DataBlasters are a family of high speed and performance, up to 40 MHz TCK, boundary-scan controllers. Besides being available as bench-top unit with USB/E-net/FireWire interface, these controllers also come as 19″ rack-mountable instrument with the same three interafces and as plug-in cards in PXI(e)and PCI(e) formats.

  • PCI Fault Insertion Switch Range for Differential Serial Interfaces

    50-200/201 - Pickering Interfaces Ltd.

    Pickering Interfaces, a leading supplier of modular signal switching for electronic test and simulation, is expanding its range of PCI Fault Insertion switching with the introduction of two new modules (models 50-200 and 50-201) designed for use with differential serial interfaces. PCI Fault Insertion Switch Cards for Differential Serial InterfacesThe new modules include the Differential PCI Fault Insertion Switch (model 50-200) which is designed for lower data rate serial interfaces such as CAN and FlexRay, and the High Bandwidth Differential PCI Fault Insertion Switch (model 50-201) which is designed for higher data rate serial interfaces such as AFDX and 1000BaseT Ethernet. Each module allows the introduction of fault connections that include data paths open, data paths shorted together, and data paths shorted to externally applied faults such as power supplies and ground. The software driver defaults to a protective mode where conflicting faults are prevented to avoid accidentally shorting unintended paths, such as power to ground. A separate mode allows complete freedom in setting fault patterns.

  • 2-Slot USB/LXI Modular Chassis

    60-104-001 - Pickering Interfaces Ltd.

    This 2-slot USB/LXI modular chassis offers a small lightweight form factor, making it ideal for portable, benchtop, and space restrictive applications. The chassis is designed for desk or rack mounting and features remote control via USB or LXI Ethernet. Remote control over a network enables the switching function of a test system to be located as close as possible to the target equipment. The 60-104 chassis supports one or two 3U PXI modules and accepts Pickering's PXI products, it is the perfect platform to construct small scale applications. Possible systems include switching matrices up to 1104 crosspoints, 396 channel multiplexer or up to 36 channels of programmable resistor/sensor emulation.

  • Network Tester

    ZhangZhou Weihua Electronic co.,ltd

    There is nothing worse than running your drops only to learn that you have a fault in one of the cable runs. Get it right the first time, get it right by choosing and using the right LAN Cable Testers. We offer a variety of cable testers, which are a must have to quickly and easily verify the integrity of Ethernet twisted pair cables. Our LAN testers will test twisted pair cables for open pairs, shorted pairs, reversed pairs, crossed pairs and split pairs. Network cable testers vary in complexity and price, but a basic tester consists of a source of electrical current and a measuring device. After that, cable testers vary in complexity and ability to do various testing.

  • Basic Power Supply - 80 W Max Output Power

    NGA100 - Rohde & Schwarz GmbH & Co. KG

    The R&S®NGA100 DC power supplies are linear, compact and easy to use in diverse scenarios. All models have excellent readback accuracy with a low-current range for demanding measurements. Data logging, arbitrary waveforms, built-in statistics and remote sensing features make the instruments ideal for various bench applications, such as:- R&D;- Creating IoT low power designs - Manufacturing- Education- General purpose use casesEquipped with a number of different remote interfaces, including USB and Ethernet, R&S®NGA100 DC power supplies are also great for automated tests. The channel fusion feature extends voltage and current range. Get up to 200 V with the R&S®NGA142 in serial mode and up to 12 A with the R&S®NGA102 in parallel mode. Advanced protection functions keep devices connected and power supplies safe.Choose the DC power supply for your use case by selecting the base unit and necessary options in our online configurator. This makes the procedure easy and fully price transparent for fast processing of your order request by our authorized distribution partners. Click "configure and quote" to start your configuration.

  • IEC61850 Digital Substation Testing

    Ponovo Power Co., Ltd.

    With the development of power system, more and more digital substation based on IEC61850 has been built in the world. IEC61850 is the new communication protocol which is adopted by power system so as to change the analog complicated wiring connection and protocol conversion. Based on IEC61850, all Messages, such as GOOSE, SV, MMS, PTP, etc, could be communicated on the Ethernet via fiber optical cable connection. In China, the digital substation have started since 2003, until now there are already more than 6000 digital substation put on operation, China Power Grid is planning to build 5000 more new digital substations. PONOVO, as the leading power system testing solution provider, have launched plenty of IEC61850 digital testing tools, not only digital relay test set, but also MU test set, multi-functional analyzer, 24 hours online monitoring and analyzing system, etc so that users could have suitable testing equipment for the digital substation commissioning and testings.

  • PCIe 5.0 Protocol Analyzer

    Summit T54 - Teledyne LeCroy

    Teledyne LeCroy’s Summit™ T54 joins the Summit™ Family as the high performance protocol analyzer at PCIe 5.0 architecture. The new Summit™ T54 protocol analyzer based on the PCIe 5.0 specification supports up to 32GT/s and up to x4 lane width for protocol analysis. Companies that are interested in testing PCIe 5.0 based I/O cards such as Storage Controllers, Ethernet, Fibre Channel, Infiniband, and others will now be able to get all of the protocol analyzer debugging features they need, while being able to better manage their costs. SSD storage applications will also benefit from the integrated support for SSD bus protocols such as PCIe/ NVMe/ SMBus/ NVMe-MI/ TCG and others. When combined with Teledyne LeCroy’s Summit™ Z58 or Z516 protocol exerciser, the Summit™ T54 will provide a deeper understanding of test results on a variety of test configurations. Teledyne LeCroy’s wide range of high speed interposers and probes provide full flexibility and connectivity to CEM and other form factor sockets on system boards as well as solder down and mid-bus probes.

  • PCIe 4.0 Protocol Analyzer

    Summit T48 - Teledyne LeCroy

    Teledyne LeCroy’s Summit™ T48 joins the Summit™ T416 as the second protocol analyzer to be released in its family of tools supporting the PCIe 4.0 architecture. The new Summit™ T48 protocol analyzer based on the PCIe 4.0 specification supports up to 16GT/s and up to x8 lane width for protocol analysis. Companies that are interested in testing PCIe 4.0 based I/O cards such as Storage Controllers, Ethernet, Fibre Channel, Infiniband, and others will now be able to get all of the protocol analyzer debugging features they need, while being able to better manage their costs. SSD storage applications will also benefit from the integrated support for SSD bus protocols such as PCIe/ NVMe/ SMBus/ NVMe-MI/ TCG and others. When combined with Teledyne LeCroy’s Summit™ Z416 protocol exerciser, the Summit™ T48 will provide a deeper understanding of test results on a variety of test configurations. Teledyne LeCroy’s wide range of high speed interposers and probes provide full flexibility and connectivity to CEM and other form factor sockets on system boards as well as solder down and mid-bus probes.

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