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Evaluation

assess fidelity of performance to target values.

See Also: Qualification, Exploration, Prototypes


Showing results: 541 - 555 of 567 items found.

  • RF Coaxial Probes & Probe Positioner

    Fairview Microwave Inc.

    Fairview Microwave’s line of coaxial RF probes and RF PCB probe positioner are ideal for use with chip evaluations, signal integrity measurements, coplanar waveguide, substrate characterization, gigabit SERDES and test fixture applications. The RF coaxial probes provide return loss better than 10 dB and a maximum operating frequency of 20 GHz. The probes have a 3.5mm female interface, a pitch of 800 or 1500 micron and they can be cable-mounted. They feature gold-plated contacts and can be used by hand, with or without a probe positioner. Compliant coaxial GSG (or GS) pogo pins allow for a broad range of probing angles. The RF PCB probe positioner can hold coaxial probes, has articulated joints and delivers multi-axis positioner control. This positioner also boasts a magnetic mounting plate with on-off positioner switch.

  • Precision IV Analyzer / 8 Slot Precision Measurement Mainframe

    E5270B - Keysight Technologies

    Keysight E5270B Precision IV Analyzer is the complete solution for current-voltage characterization of a wide range of materials and devices. The E5270B supports multiple SMUs (Source/Monitor Units) for voltage/current sourcing and voltage/current measurement with the best in the class current measurement performance as low as 0.1 fA. Its modular architecture allows you to configure or upgrade SMU modules for available eight slots. The EasyEXPERT group+ GUI based characterization software is furnished and available on your PC to support all the tasks required in the characterization from the measurement setup to the data analysis. Powerful integration of SMU's versatile measurement capabilities and GUI based characterization software makes the E5270B the best solution for characterization and evaluation of devices, materials, semiconductors, active/passive components, or virtually any other type of electronic device with uncompromised measurement reliability and efficiency.

  • IV Analyzer / 8 Slot Precision Measurement Mainframe

    E5260A - Keysight Technologies

    Keysight E5260A IV Analyzer is the complete solution for current-voltage characterization of a wide range of materials and devices. The E5260A supports multiple SMUs (Source/Monitor Units) for voltage/current sourcing and voltage/current measurement with the best in the class current measurement performance as low as 5 pA. Its modular architecture allows you to configure or upgrade SMU modules for available eight slots. The EasyEXPERT group+ GUI based characterization software is furnished and available on your PC to support all the tasks required in the characterization from the measurement setup to the data analysis. Powerful integration of SMU’s versatile measurement capabilities and GUI based characterization software makes the E5260A the best solution for characterization and evaluation of devices, materials, semiconductors, active/passive components, or virtually any other type of electronic device with uncompromised measurement reliability and efficiency.

  • SINE FBI Charts

    Applied Image, Inc.

    There are two SINE Sinusoidal arrays designed for FBI applications: the SINE M-13-60-S-RM and the SINE M-13-60-FBI Kit.The SINE M-13-60-S-RM was designed jointly by the Federal Bureau of Investigation, of Washington DC, and MITRE, of Bedford MA. The primary function of this Target is for computing Modulation Transfer Function (MTF) evaluation in live scanner fingerprint systems for conformance to Integrated Automated Fingerprint Identification Systems (AFIS) image quality requirements. The array is on reflective material measuring 16mm x 16mm with sinusoidal arrays ranging in frequency from 1.0 to 10.0 cycles per mm; with nominal modulation of the sinusoidal areas at 60%. The top and bottom rows are density scales, from 0.20 to 1.20 densities.The SINE M-13-60-FBI Kit consist of two individual components, the SINE M-13-60-1X-RM and the RR1-N-RM Ronchi Ruling grating.

  • The Leading Measurement System for the Analysis of Porous Materials

    ELWIS - Autoneum Holding AG

    ELWIS (Evaluation of Light Weight Impedance System) offers a full and rapid characterization of porous materials based on the analysis of a single sample. The ELWIS system consists of the ELWIS-A and ELWIS-S components which can be used independently from each other although both applications are needed for a complete material simulation.ELWIS-A measures acoustic parameters that are needed to evaluate the acoustic performance of sound insulation and sound-absorbing multi-layer materials. An additional impedance tube for absorption measurements at higher frequencies is available for ELWIS-A.ELWIS-S measures structural parameters that are needed to simulate the dynamic and acoustic behavior of sound packages in the medium to low frequency range (including the "Poisson Ratio" for foam materials).ELWIS is very easy to operate: Thanks to its user-friendly software, the system can also be used to obtain reliable results by users with only limited experience in the characterization of porous materials.

  • Extremely Accelerated Stress Test Chambers

    ACMAS Technologies Pvt. Ltd.

    The extremely accelerated stress environment is defined by high temperature, high humidity and high pressure. WEIBER provides humidity resistance evaluation test for electronics components through customized Extremely Accelerated Stress Test Chamber. This chamber provides high performance test in minimal amount of time according to international IEC 60068-2-66 standard. This chamber also known as Accelerated Stress Test Chamber, Halt and Hass Test Chamber, Halt Test Chamber and Hass Test Chamber.This chamber reduces the time taken for humidity testing in electronic components. 2 types of tests saturated and unsaturated extremely accelerated stress test can be performed. In saturated test the temperature is maintained at 1210C at 100%RH, and for unsaturated temperature of 110, 120, 1300C is maintained at 85%RH. Normally for electronic components unsaturated type test is done.

  • Aircraft Escape Spares/Repairs

    Teledyne Defense Electronics

    As the OEM of all of our products, both end items and support equipment, Teledyne can support all repair needs for end users. Turn-around times are typically less than 90 days with units being returned fully tested to their specific program requirements. All repairs are performed using new materials and components. Once the repair has been received, and purchase order issued, a Test and Evaluation report is sent to the end user fully describing our findings and the proposed repair.Following live ejections, Teledyne will download and prepare a post ejection report for any of our ejection seat sequencers AT NO COST to the end user. This report will document the data stored in the flash memory of the unit. The data will be a representation of what the sequencer recorded. However, Teledyne is unable to give any opinions or technical advice on the operation of the seat system.​

  • Life Cyclic Durability Testing

    Environment Associates Inc.

    Environment Associates can provide everything you need for cyclic durability testing and performance fixturing. Services include mechanical cycling to a position or load, fatigue cycling to a fixed load, rotational torque cycling, and simple push/pull cycling. EA can design your fixture with electro-dynamic, air, or hydraulic assistance to mechanically move your part. All of our fixtures can be manufactured to withstand a wide range of temperature, humidity and vibration inputs. If required, forces can be monitored electronically, using a wide variety of inputs (i.e. strain gages, load cells, rotational transducers, thermocouples, shunts, and more). EA can create holding and check fixtures to perform “pre” and “post” evaluation for dimensional issues that may occur during testing. EA can provide fixtures for single tests run internally for EA test labs and can manufacture fixtures to be purchased directly by the customer for their internal use.

  • SINE (Sinusoidal) Targets & Arrays

    Applied Image, Inc.

    Sinusoidal Target Arrays have been recognized as a superior test method for a variety of applications, from moiré contouring to reliable MTF Evaluation of materials, lenses, cameras, and electro-optical systems (Follow the hyperlink to learn about using Sinusoids for MTF eval). Sinusoidal Pattern Arrays are manufactured on two different materials for both reflective and transmissive applications. Because of the inherent limitations of reflective materials, the maximum spatial frequency of the reflective pattern arrays is limited to 20 cycles per mm, while the transmission film arrays are offered in various sizes up to 256 cycles per mm. In addition, the sinusoidal arrays are available in a Single Frequency Grating or with Multi-Frequency Gratings. If instead of continuous sinusoidal frequency, you are looking for a square wave frequency design, then look to the Ronchi Gratings page. Should you need to alter the size of the pattern or the substrate, fill out our Custom Test Targets and Charts form and start the conversation.

  • Benchtop Unit for Universal Coating Thickness Measurement

    FISCHERSCOPE MMS PC2 - Helmut Fischer AG

    Coating thickness measurement and material testing with just one instrument!Compact and extremely versatile desktop multi-function measuring system with data archiving and measurement data processing capabilities.User-friendly operation with large, high-resolution color LCD touch screen. Windows CE based.Many different plug-in testing modules allow numerous instrument configurations to meet the needs of the user. The modular design allows the upgrading of the instrument at any time. Similar or different modules can be installed depending on the applications.Different physical measurement principles are applied by the plug-in modules BETASCOPE, SIGMASCOPE, PHASCOPE, DUPLEX, NICKELSCOPE, SR-SCOPE and PERMASCOPE, Details see brochure.Multi-channel measurements at up to 8 measurement locationsA great variety of probes for different test piece geometries and measuring ranges are available.Delivery with PC software FISCHER DataCenter with the following functionality: Transferring and archiving measurement data, comprehensive statistical and graphical evaluations, easy creation and printing of inspection reports

  • Steering Test Equipment: Software & Hardware

    MB Dynamics Inc.

    MB Dynamics delivers steering test equipment to help fulfill a myriad of application test requirements, or jobs-to-be-done. The steering test equipment consists of software for multi-test-head, synchronized MIMO closed-loop control and data acquisition; rotary servo motors for attachment to a steering spline or wheel; electrodynamic shaker systems; long-stroke linear motor actuators; pneumatic actuators; column stands for mounting steering column; gear fixture for mounting the gear; instrumentation (force, torque, displacement, rotary position, acoustic, acceleration); fixtures for mounting gears and columns; brackets, clamps, and fixtures for holding test items; jounce/rebound fixtures and tilt positioners for aligning input forces with tie rods at angles; software and associated data acquisition hardware up to 16 channels for recording, analysis and evaluation of in-lab steering noises and accelerations, road load data acquisition, and general Sound & Vibration analysis; and engineering services to accelerate test effectiveness.

  • Surface Inspection Systems

    CVS Trevista X4 - STEMMER IMAGING Ltd.

    The fourth generation of CVS Trevista Surface, Cylinder and Multiline surface inspection systems from Stemmer Imaging features brighter illumination to enable faster image acquisition and have a larger measuring field. The new Trevista X4 models utilize a 2.5-D process, called "Shape from Shading," and are especially suited to the examination of components with shiny and diffusely scattering surfaces. Surface defects such as scratches, burrs, dents, discoloration or grinding marks, even if only a few micrometers deep, can be detected with significantly greater certainty with this process than with conventional image processing systems, according to the manufacturer. The X4 generation offers structured, diffuse dome illumination that is brighter by a factor of 2.5 compared with the previous models, enabling faster image acquisition. For a typical image size of four megapixels, evaluation using the Trevista algorithm takes place around 20% faster than before, which results in potentially lower cycle times.

  • Test Engines

    Verified Systems International GMBH

    The test system cluster architecture is based on dual CPU or 4-CPU PCs acting as cluster nodes. The nodes communicate and synchronise over a high-speed network (Myrinet or InfiniBand). A modification of the Linux operating system allows to run the test execution and evaluation algorithms in hard real-time on reserved CPUs, where scheduling is non-preemptive and controlled by the test system itself. The interrupts caused by interfaces to the system under test may be relayed to CPUs designated explicitly for their handling. This approach offers the opportunity to utilise high-performance standard hardware and the services provided by the widely accepted Linux operating system in combination with all mechanisms required for hard real-time computing. The cluster architecture presents an opportunity to distribute interfaces with high data throughput on different nodes, so that PCI bus overload can be avoided. In addition, the CPU load can be balanced by allocating test data generators, environment simulations and checkers for the behaviour of the system under test ("test oracles") on dedicated CPUs.

  • Low Temperature Chamber

    ACMAS Technologies Pvt. Ltd.

    The Ultra Low Temperature Test Chamber from Weiber are specially designed equipments that provide specific low temperature environments for testing a wide variety of products and their performance under non-ambient testing conditions. They are engineered and configured to meet the exacting low temperature requirements of various research applications and often find their use for evaluation of material properties at extreme temperatures. These versatile test chambers offer the capabilities of measuring temperature extremes, allowing both freeze tolerance studies as well as the effect of heat stress on the sample specimen within the same equipment. They combine advanced technological features with an energy efficient design for highly accurate test conditions and repeatability of results. These test chambers provide a cost-effective solution to expensive laboratory tests and are available at economical prices for increased affordability. They are designed for safe and reliable operation and find widespread usage in chemical and pharmaceutical industries, biotechnology and medicine industry, petroleum industry, food industries and other industrial and manufacturing units.

  • Dual Shaker Testing

    National Technical Systems

    NTS has a number of facilities capable of conducting dual shaker testing, vibration testing utilizing multiple electrodynamic exciters, for the evaluation of large payloads.Once such example was conducted as part of the test program for NASA’s Lunar Atmosphere and Dust Environment Explorer or LADEE. NTS worked with NASA’s Ames Research Center for simulated environmental testing of the LADEE observatory which included dual shaker vibration.Vibration testing on the observatory was conducted utilizing the NTS Santa Clarita facilities tandem Ling B-340 electrodynamic exciters. These exciters allow either dual shaker vibration testing, or in the case of the LADEE observatory tests, they minimize the test set-up time. The electrodynamic exciters were staged with one in the thrust axis and the other set-up for lateral axes vibration. This dual shaker set up allowed for a quick transition from one test to the other. During the tests, the vibration test lab was maintained at a class 10,000 cleanliness level.

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