Showing results: 46 - 60 of 111 items found.
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Griffin III -
Hilevel Technology, Inc.
The Griffin III system brings new price/performance efficiency to the Tester-in-a-Head tradition, a concept created and introduced by HILEVEL in 1987. This tester is a superior cost-effective solution for Engineering, Production, and Failure Analysis test applications.
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Trialon Corp.
PCBs are constructed of a variety of materials such as glass, ceramic, copper, solder and Teflon. Trialon has the equipment and experienced staff to perform this difficult analysis. Our state-of-the-art materials analysis lab located in Auburn Hills, MI is managed by a Ph.D with over 20 years of hands-on experience in root cause failure analysis of design, material and process for current and future products.
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Ametek Spectro Scientific
We provide lab instruments, on-site oil analysis systems, and portable tools for a variety of customer needs . Our analyzers provide critical data about machinery condition and can provide an early warning of equipment failure.
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Trialon Corp.
Trialon has the equipment and experienced staff to operate this highly technical piece of laboratory equipment. Our state-of-the-art materials analysis lab located in Auburn Hills, MI is managed by a Ph.D with over 20 years of hands-on experience in root cause failure analysis of design, material and process for current and future products.
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Trialon Corp.
Trialon has the equipment and experienced staff to operate this highly technical piece of laboratory equipment. Our state-of-the-art materials analysis lab located in Auburn Hills, MI is managed by a Ph.D with over 20 years of hands-on experience in root cause failure analysis of design, material and process for current and future products.
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Signal -
XOS
Signal complies with ASTM D7757 and delivers quantitative analysis of silicon (Si) from gasoline to ethanol, and toluene. Silicon contamination continues to impact fuel quality, resulting in costly engine failures and catalyst fouling. Powered by MWDXRF, Signal provides exceptional Si analysis and is an ideal solution for demanding petroleum and industrial environments.
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Labfon Equipment Inc.
FTIR spectroscopy is used to quickly and definitively identify compounds such as compounded plastics, blends, fillers, paints, rubbers, coatings, resins, and adhesives. It can be applied across all phases of the product lifecycle including design, manufacture, and failure analysis.
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Crystal Vision -
FA Instruments
Crystal Vision Microscopy suites are transforming the world of IC Diagnostics and failure analysis. Intuitive software allows user friendliness and enables the breadth of analytical disciplines available. Realtime imaging from both Topside and Backside, allows for maximum productivity.
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Tokyo Electronics Trading Co., Ltd.
This LCD failure analyzer provides test patterns and programmable power supplies for the LCD unit test. R, G, B signals are applied to the LCD unit under test. Compact control box connected by a cable allows test pattern selection, gray scale control, cursor location and scan direction. If PC is connected through RS-232C port, complex test sequence can be programmed. It is applicable to the production test, design verification, quality control and failure analysis.
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TopLine Corp.
Daisy Chain provides engineers with a simple tool to learn valuable information about causes of failures. Such failure analysis paves the way for scientists and engineers to improve assembly processes. Critical applications involving environmental life cycle testing require daisy chain packages with dummy silicon die. The Daisy Chain permits electrical continuity testing, while the dummy silicon die replicates the thermal mass of a "live" device. Si Die, QFN, Lead Frame Packages and BGA devices and more.
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BETA Laboratory
Analyzing physical and chemical properties of organic and inorganic materials to provide useful information for the identification of contaminants and unknowns.Material verification and confirmationMaterial performance and suitabilityInvestigative failure analysis and chemical decomposition/degradationAsbestos IdentificationTensile testing, hardness, dielectric breakdownAccelerated aging of materials - coatings, polymers, elastomers and textiles
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MXI Quadra 7 -
Nordson Corporation
Ultimate image quality and magnification, Quadra 7 reveals quality defects as small as 0.1 µm. Ideal for root cause failure analysis, wire bond integrity checking, component cracking, MEMS inspection and wafer level components including TSV and wafer bumps.
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National Technical Systems
The ever advancing electronics industry requires an increasing need for electronic component testing (IC testing) and component verification. The component test capabilities and component verification lab at NTS performs test and inspection to determine proper component functionality, verification or failure analysis (F/A).
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Leica Microsystems
For inspection, documentation, and analyses such as measurement in 2D and 3D as well as 3D topographies in surface metrology, they have become increasingly popular in production, quality control and quality assurance, failure analysis, research and development as well as forensics. Digital microscopes even have their areas of application in the life sciences.
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JewelBox 70T -
Glenbrook Technologies
The Jewel Box 70-T delivers superior image quality with excellent resolution and sensitivity for laboratory and failure analysis applications. The system?s high-resolution MXRA® x-ray camera and 10-micron MicroTech? x-ray source provide magnification from 7X to 2000X, with resolution of 100 line pairs/mm.