Showing results: 211 - 225 of 538 items found.
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PH-SE -
HenergySolar
The spectroscopic ellipsometer is used for thin film and material characterization in R & D. The spectroscopic ellipsometer is designed to meet the requirements in modern research with special emphasis on speed and accuracy for an unmatched variety of applications.
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Neocera, Inc.
For researchers working on ultra thin films and novel interfaces, Neocera offers insitu, real-time process control and diagnostic tools such as high-pressure RHEED, Low Angle X-ray Spectroscopy (LAXS) and Ion Energy Spectroscopy (IES). RHEED provides exceptional growth control via RHEED intensity oscillations and the Structural data via diffraction. LAXS is a complimentary to RHEED and provides real-time Compositional information. IES provides energetics of the laser generated plasma plume which is directly responsible for obtaining high quality films and interfaces.
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DUH-210/DUH-210S -
Shimadzu Corp.
A new evaluation system for measuring the material strength of micro regions, such as semiconductors, LSI, ceramics, hard disks, vapor deposited films, and thin coating layers, not addressed by previous hardness testers. It can also be used to evaluate the hardness of plastics and rubbers. This instrument uniquely measures dynamic indentation depth, not the indentation after the test. This in turn permits measurement of very thin films and surface (treatment) layers that are impossible to measure with conventional methods. Additionally, this same method supplies the data needed to calculate elastic modulus on the test specimens.
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Novo-Shade Duo + Reflectometer -
Rhopoint Instruments
The Novo-Shade Duo reflectometer has 3 modes of operation*OpacityThis is used for measuring the hiding power of a coating or plastic film*ShadeMeasure the shade of surface on a greyscale*CleanlinessMeasure the substrate cleanliness or oxidisation of a surface
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Dexing Magnet Tech. Co., Ltd
The meter is mainly used in measuring the coercive force of magnetic components of relays and the mechanical energy meter compensation films, which is the essential instrument of manufacturers who are producing the relays and the energy meters, etc.
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Insight Product Company
Insight Product Company offers Hot Electron Bolometer (HEB) mixers, receivers, and chips made from NbN or NbTiN thin film. The HEB mixers can operate at frequencies of up to several terahertz.
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GD-Profiler 2™ -
HORIBA, Ltd.
The GD-Profiler 2™ provides fast, simultaneous analysis of all elements of interest including the gases nitrogen, oxygen, hydrogen and chlorine. It is an ideal tool for thin and thick films characterization and process studies.
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Rhopoint Instruments
Coefficient of friction is also known as COF testing. The Hanatek Advanced Friction Tester is the most comprehensive tool available for measuring the coefficient of friction of plastic film, printed cartons, packaging substrates or paper.
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135B -
Elcometer Limited
Elcometer 135B Original Bresle Patches are used to determine surface chloride contamination and are self-adhesive rubber film patches with a sealed compartment for sampling soluble impurities from steel surfaces with a suitable solvent.
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Shenzhen Linshang Technology Co., Ltd.
Linshang Technology offers three sales kits to demonstrate the thermal insulation performance and UV blocking performance of glass and window films, two solar film temperature meters LS300 and LS301 to demonstrate thermal insulation performance through temperature test, two power meter: infrared power meter and UV power meter.
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PH-ASE -
HenergySolar
The PH-ASE spectroscopic ellipsometer measures thickness, refractive index and extinction coefficient of single films and multilayer stacks. Reflection measurements at different incident angles and transmission measurements can be carried out and combined with ellipsometric data.
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NC-700 -
NAPSON Corp.
*Inline measurement module for moving substrates such as PET film, glass or paper*Continuous measurement(~24h) in Roll to Roll with OFF-SET FREE capability system*Various applications from the research and development to the production line
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SENTECH Instruments GmbH.
Spectroscopic ellipsometers measure film thickness and refractive index of single layers, and multi‑layer stacks. Related properties of bulk materials, isotropic and anisotropic materials, surface and interface roughness as well as gradients can be analysed.
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M-2000 -
J.A. Woollam Co., Inc.
The M-2000 line of spectroscopic ellipsometers is engineered to meet the diverse demands of thin film characterization. An advanced optical design, wide spectral range, and fast data acquisition make it an extremely powerful and versatile tool.
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Jinan Saicheng Instrument
Thickness Tester is a high precision mechanical contact method thickness tester, which can be used to thickness measurement of films, sheeting, paper, corrugated paperboard, textiles, non-woven fabrics, and solid insulation materials, etc.