Showing results: 271 - 285 of 538 items found.
-
Flyin Optronics Co., Ltd
Flyin Optronics' Micro-Optical WDM utilizes thin film coating technology and proprietary design of non-flux metal bonding micro optics packaging. It provides low insertion loss, high channel isolation, low temperature sensitivity and epoxy free optical path.
-
508 PV -
CRAIC Technologies
The 508 PV™ Microscope Spectrophotometer is designed to add spectroscopy, color imaging, thin film thickness measurement and colorimetry capabilities to your optical microscope or probe station. It can also be used to upgrade an older microspectrometer with cutting edge optics, electronics and software.
-
KLA-Tencor Corp
The Filmetrics® range of affordable reflectometers deliver high-precision thin-film thickness measurements in seconds. These easy-to-use tools, combined with intelligent software and a broad range of accessories and configurations, provide maximum versatility in film thickness measurements ranging from 1nm to 3mm.
-
Flyin Optronics Co., Ltd
Flyin Optronics' Micro-Optical WDM utilizes thin film coating technology and proprietary design of non-flux metal bonding micro optics packaging. It provides low insertion loss, high channel isolation, low temperature sensitivity and epoxy free optical path.
-
Flyin Optronics Co., Ltd
Flyin Optronics' Micro-Optical WDM utilizes thin film coating technology and proprietary design of non-flux metal bonding micro optics packaging. It provides low insertion loss, high channel isolation, low temperature sensitivity and epoxy free optical path.
-
Flyin Optronics Co., Ltd
Flyin optronics' Micro-Optics WDM utilizes thin film coating technology and proprietary design of non-flux metal bonding micro optics packaging. It provides low insertion loss, high channel isolation, low temperature sensitivity and epoxy free optical path.
-
MS-100 -
Component Engineering, Inc.
The MS-100 booth monitor amplifier is intended to be not only a means by which the projectionist can listen to the film being shown, but as a trouble-shooting diagnostic tool as well. Enough inputs are provided so that all significant points in the theatre's sound system can be sampled and their condition quickly determined.
-
VEO -
Vision Research Inc.
The Phantom VEO camera series was designed to work well in nearly any application. The rugged body construction and custom sensor deliver the superior imaging quality that Phantom cameras are known for. These cameras can be found in science laboratories, outdoor areas, and on film production sets.
-
DRK8681 -
Shandong Drick Instruments Co., Ltd.
As the instrument is equivalent to international standards ISO 2813 "Nonmetallic coating film 20 °, 60 °, 85 specular gloss measurements." so a larger scope. It applies to all use of paintand coatings industry, such as furniture, paint, appliances, but also for plastics, packaging and decoration.
-
Bruker Corporation
Bruker Semiconductor develops, manufactures, markets, and supports metrology solutions for thin films, which are based on novel, rapid, non-contacting and non-destructive X-ray technology. With Bruker’s acquisition of Jordan Valley Semiconductors, a name synonymous with unparalleled worldwide customer service and support, 75% of the world's top 25 semiconductor manufacturers rely on Bruker metrology tools for front-end and back-end applications, including development of their next-generation thin films. Bruker commitment to innovation and technology leadership drives the continued release of new advancements in metrology, and has garnered numerous awards and industry recognition. In applications ranging from C-S thin films materials characterization to wafer substrate analysis and defect detection, Bruker’s systems provide simulation analysis and fit. HRXRD, XRR, WA-XRD, and XRDI measurement types are fully supported, enabling researchers, production engineers, and process developers unparalleled capabilities. Whether you are a semi and C-S fabricator, R&D center or academy, or an industry materials research facility, Bruker has a specifically designed solution for your metrology needs.
-
SEMOZON® AX8580 -
MKS Instruments
The SEMOZON® AX8580 Ozone Delivery System generates and delivers high flow, high concentration, ultra-clean ozone for advanced thin film applications. The SEMOZON AX8580 is specifically designed for use with an increasing number of semiconductor process applications such as ALD, CVD and TEOS/Ozone CVD.
-
Novo-Haze TX -
Rhopoint Instruments
The Novo-Haze TX Transmission Hazemeter offers fast and accurate measurement of the optical quality of plastic films and other transparent materials. This instrument measures total transmission and haze according to ASTM D1003 (CIE C), the most important standard used in most QA applications.
-
Rocky Mountain Laboratories, Inc.
Secondary ion mass spectroscopy is operated either in the dynamic mode (DSIMS) or the static mode (SSIMS). DSIMS is useful for profiling impurity and trace elements through films and interfaces. SSIMS is useful for characterizing polymeric materials and only measures the outermost molecular layer of a specimen.
-
NOVA® Series -
MKS Instruments
The NOVA ; RF Plasma Generators are ideally suited for Plasma Enhanced Chemical Vapor Deposition (PECVD), High Density Plasma CVD (HDPCVD), etching and other thin film applications during the manufacture of integrated circuits, flat panel displays, and data storage devices.
-
DRK138 -
Shandong Drick Instruments Co., Ltd.
DRK138 Inclined Surface Coefficient Of Friction Tester is applied to testing the COF of film, paper, card board, sheet and so on. By testing the material’s frictional properties, the open performance of packages, packaging speed of packers and other indexes could be controlled to meet the requirements for production