Showing results: 346 - 360 of 538 items found.
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capaNCDT -
Micro-Epsilon Group
Capacitive sensors are designed for non-contact measurement of displacement, distance and position, as well as for thickness measurement. Due to their high signal stability and resolution, capacitive displacement sensors are applied in laboratories and industrial measurement tasks. In production control, for example, capacitive sensors measure film thickness and application of the adhesive. Installed in machines, they monitor displacement and tool positions.
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Acheron -
Meyer Sound Laboratories Inc.
Today’s cinema technology offers unprecedented potential for sonic thrills, and a dynamic soundtrack is as important as the action onscreen. Whether you’re creating or playing back cinema sound, rely on the Meyer Sound Acheron system to meet the demands of the state-of-the-art film mix, so the audience hears everything from the softest whisper to room-rattling explosions, exactly as intended.
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Hanatek Instruments
Precision Thickness Gauge is specifically designed to quickly and accurately measure the thickness of a variety of substrates including film, paper, board, foil, tissue and textiles.Operated via an intuitive touch screen interface the instrument will allow the user to define batch size, dwell time & measuring speed.Full test statistics can be easily viewed or printed to label for easy documentation control.
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MKS Instruments
Our process monitors are innovative in-situ process monitoring instruments that are fully integrated, application-specific packages, including component residual gas analyzers (RGAs), analytical equipment, and control software. Process mass spectrometers are used in varied applications, including; Semiconductor, Thin Film (CVD, Etch, PVD and degas), pharmaceutical lyophylization and bulk gas purity monitoring.
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D8 ADVANCE Family -
Bruker AXS GmbH
The D8 ADVANCE is a fully extensible modular system addressing the analytical needs of powder, bulk and thin film samples, at ambient and non-ambient conditions. The D8 ADVANCE is a real quick-change artist that can be configured to take on a single analytical task with great focus and dedicated components, or a fully featured, multi-purpose solution that is capable of dealing with very diverse analytical needs with highest competence.
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Nanotronics Imaging
Nanotronics uses artificial intelligence to give our customers’ unprecedented freedom and control for defect detection. We offer an AI based Anomaly Detection Algorithm (ADA) toolkit that automates the work of writing computer vision algorithms to detect and classify defects on bare substrate and epi wafers as well as on thin films, glass and any other material with a uniform background.
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Hot Electron Bolometer (HEB) -
Insight Product Company
Insight Product Company offers Hot Electron Bolometer (HEB) mixers, receivers, and chips made from NbN or NbTiN thin film. The HEB mixers can operate at frequencies of up to several terahertz. Advantages: Above about 1 THz Hot Electron Bolometer mixers offer the best sensitivity and lowest noise of all the technology for the coherent detection of radiation.
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MSP Corporation
Vaporizers are used in gas phase processes to transition a liquid into a gas for thin film deposition or other processes that require a vapor (metal etch, doped epitaxial growth, etc). Vaporizers are widely used in:*CVD (Chemical Vapor Deposition)*PECVD (Plasma-Enhanced Chemical Vapor Deposition)*MOCVD (Metal-Organic Chemical Vapor Deposition)*ALD (Atomic Layer Deposition)
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SPY Inspection Equipment
Portable holiday detectors are designed for various pipeline, plant, and other surface applications where the inspection surface remains stationary and the detector is moved over the inspection surface. High voltage detectors are used for thicker surface coatings, such as those used on pipelines and other industrial applications. low voltage, wet sponge detectors are used for thin film applications.
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Anton Paar GmbH
The DMA systems from Anton Paar perform dynamic mechanical analysis in torsion, tension, bending and compression at unprecedented precision. Whatever your DMA requirements are, the DMA systems from Anton Paar are efficiently and comfortably adapted to meet your needs. Use the systems for the dynamic mechanical analysis of solutions, melts, solid bars, films, foils, or reactive resins.
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Radiant Technologies, Inc.
Radiant is introducing an I2C digital-to-analog converter product that can be attached to the Precision Premier II and is controlled from Vision. The addition of this extra voltage source makes it possible for the Premier II to measure the performance of thin-ferroelectric-film gate transistors (TFFTs and MFSFETs). This document explains the theory for such testing and gives examples of such tests using Radiant's SFRAM transistors as examples.
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AMETEK Sensors, Test & Calibration
We provide the world’s only ball-type deadweight testers, where the ball and weights float on a thin film of air, which is virtually frictionless. This design eliminates the necessity to rotate the weights during testing, and allows the user to concentrate on the instrument itself. Our testers are engineered to offer user-friendly, safe operation, in the field, or in a lab. Both pneumatic and hydraulic testers are available.
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HORIBA, Ltd.
Spectroscopic ellipsometry is a surface-sensitive, non-destructive, non-intrusive optical technique widely used for thin layers and surface characterization. It is based simply on the change in the polarization state of light as it is reflected obliquely from a thin film sample. Depending on the type of material, spectroscopic ellipsometers can measure thickness from a few Å to tens of microns. It is also an excellent technique for multi-layers measurement.
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Veeco Instruments Inc
Deposit dense, uniform, and repeatable thin, diamond-like carbon (DLC) films for longer-lasting TFMH slider overcoats and landing pads with Veeco's NEXUS DLC-X System. The Nexus DLC-X features the industry's first production-worthy Pulsed Filtered Cathode Arc Source to enable sub-20A overcoat thickness, and supports improved step coverage for better process yield compared to previous generations.
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STAN Series -
Ocean Optics, Inc.
Ocean Optics offers specular reflectance standards for measuring shiny surfaces such as machined metals and semiconductor materials and low-reflectivity surfaces such as anti-reflective coatings and thin film coatings. The STAN-SSH varies in reflectivity from 87%-98% over the 200-2500 nm wavelength range and is available in a version (STAN-SSH-NIST) calibrated to a NIST master standard. The NIST calibration data range is 250-2500 nm.