Filter Results By:
Products
Applications
Manufacturers
-
product
Gas Permeability Tester with Differential Pressure Method
GPT-203
GPT-203 Gas Permeability Tester is based on the differential pressure method and is professionally applicable to the determination of permeance and permeability of plastic films, composite films, high barrier materials, sheeting, metal foils.
-
product
Water Vapor Transmission Rate Tester
(Electrolysis Method)
Shandong Drick Instruments Co., Ltd.
DRK311 water vapor transmission rate tester (electrolytic method), the instrument is suitable for the determination of water vapor transmission rate of plastic films, composite films and other films and sheet materials. Through the measurement of water vapor transmission rate, the technical indicators of control and adjustment of packaging materials and other products can be achieved to meet the different needs of product applications.
-
product
Water Vapor Transmission Rate Tester (infrared method)
DRK311
Shandong Drick Instruments Co., Ltd.
DRK311 water vapor transmission rate tester (infrared method), the instrument is suitable for the determination of water vapor transmission rate of plastic films, composite films and other films and sheet materials. Through the measurement of water vapor transmission rate, the technical indicators of control and adjustment of packaging materials and other products can be achieved to meet the different needs of product applications.
-
product
Modular Test Systems
Whether thin film, thick film, MEMS, multilayer or bulk: With test systems from AixACCT Systems, you can characterize your piezoelectric materials both in development and during production with the greatest accuracy.
-
product
Micro-spot DUV Reflection and Transmission Spectrophotometry
FilmTek 3000 PAR
Scientific Computing International
Metrology system with a 50µm spot that delivers high-performance transmission and reflection measurement of patterned films deposited on transparent substrates. Ideally suited for measuring the thickness and optical constants of very thin absorbing films.
-
product
COATING THICKNESS GAGES
Coating thickness or dry film thickness (DFT) is an important variable that plays a role in product quality, process control, and cost control. Measurement of film thickness can be accomplished by selecting the best mil gage for the particular application.
-
product
Water Vapor Permeability Tester
WPT-304
WPT-304 Water Vapor Permeability Tester is manufactured based on the gravimetric method and is applicable to test the water vapor transmission rate of plastic films, composite films, sheets, and other materials used in packaging, medical and constructive industry.
-
product
Multiple Angle Laser Ellipsometer
PH-LE
The multiple angle laser ellipsometer provides film thickness, refractive index and absorption index at the HeNe laser wavelength 632,8 nm with an extraordinary precision and accuracy. It can be utilized to characterize single films, multiple layer stacks and bulk materials.
-
product
Peel Strength Testers
Peel Strength Tester can be used for peeling, stripping and other performance tests of adhesives, adhesive tapes, pressure sensitive tapes, medical adhesive bandages, protection films, release paper, laminated films, leather, woven bags and paper.
-
product
Horizontal Tensile Tester
BLD-200H
BLD-200H Horizontal Tensile Tester can be used for peeling, stripping and other performance tests of adhesives, adhesive tapes, pressure-sensitive tapes, medical adhesive bandages, protection films, release paper, laminated films, leather, woven bags and paper.
-
product
Peel Tester for Adhesives
BLD-CH
BLD-CH Peel Strength Tester can be used for peeling and other performance tests of adhesives, adhesive tapes, pressure sensitive tapes, medical adhesive bandages, protection films, release paper, laminated films, leather, woven bags and paper.
-
product
Audio Mastering Magnetic Recording Heads
International Electro-Magnetics, Inc.
*Tape and Film*Standard Replacement*Instrumentation Quality*Custom Formats
-
product
FilmPro Infrared Transmission Gauge
Nordson Measurement & Control Solutions
High-Performance Basis Weight and Thickness Measurements for Film, Sheet and Coatings
-
product
Multi-Functional Optical Profiling system
7505-01
Chroma 7505-01 is the newest multi-function optical inspection system that equips with the capability of measuring 1D, 2D and 3D at the same time. Penetrating reflection measurement is used for 1D film thickness measurement to measure the non-destructive film thickness on transparent and translucent material.
-
product
Ellipsometer
alpha-SE®
For routine measurements of thin film thickness and refractive index, this ellipsometer allows you to mount a sample, choose the model that matches your film, and press "measure". You have results within seconds. Works with your materials - dielectrics, semiconductors, organics, and more.
-
product
Gas Permeability Testers
Gas Permeability Tester (Gas Transmission Rate Tester) is based on the differential pressure method and is professionally applicable to the determination of gas transmission rate of plastic films, composite films, high barrier materials, sheeting, metal foils, rubber, tires and permeable membrane.
-
product
Anti-Dripping Progerty Tester
Shijiazhuang Zhongshi Testing Machine Co., Ltd.
The instrument is used for testing the main material of Polyethylene blown covering film and ethylene-vinyl acetate copolymer(EVA),the average content of Vinyl Acetate(VA)is not less than 4% of the anti-dripping progerty blown covering film within add-type. This instrument is mainly testing the first dripping beginning time and the anti-dripping failure time of the film. It is the ideal testing equipment for science research department, universities, commodity inspection, laboratory, graduate school and quality supervision departments
-
product
Thru-beam Type Ultrasonic Sensor
US-N300
Panasonic Industrial Devices Sales Company of America
The Panasonic Thru-Beam Type Ultrasonic Sensor is suitable for detecting transparent film or objects.
-
product
Thickness Measurement Products
Our film thickness measurement products are available for every application. We stock most of the products listed below for fast delivery. Browse through them or contact one of our Application Engineers, who can immediately assist you with your film thickness measurement needs.
-
product
Micro-spot Spectroscopic Reflectometry
FilmTek 2000M
Scientific Computing International
Micro-spot size benchtop metrology system engineered for unparalleled versatility and high performance, meeting the needs of patterned film applications requiring a very small spot size. Allows for measurement spot sizes as small as 2µm, and delivers reliable measurement of both thin and thick films.
-
product
Scratch Tester
CSR1000
This tester is highly effective in measuring the adhesion strength (adhesion strength) of hard coatings (Ti, TiN, SiC, DLC, etc.) formed by PVD and CVD on metal surfaces such as cemented carbide. Adopting a scratch test method that allows quantitative measurement with simple operations, the film surface is scratched while increasing the load on the sample surface, detecting film breakage with high sensitivity, and providing the load at which film breakage occurs (critical load). tools and mold tools that require
-
product
Intelligent and Unidirectional Scrape Tester
ZDG-25
Shanghai Dean Electrical Co., Ltd
Executive standard: GB/T4074.3-2008/IEC60851-3Inspection standard: JB/T4279.9-2008Meet GB/T6109-2008 standard requirementsUsed to test the film scrap resistance of enamelled round wires with nominal conductor diameter above0.250mm;Application of SCM control,enter the weight value, operation will be completed automatically: put down the scraping rod, stop while film scratch, calculate and show the scraping force, raise the scraping rod, return to zero, sample rotates 120°and repeat the same operation, calculate and show the scraping force of three times and average scraping force.When film is scratched, film scraper would automatically stop scraping, with exposed conductor of sample<3mmWith the advantages of high sensitivity, good repeatability, stable and reliable characteristics.
-
product
Tension Meters
Guangzhou Amittari Instruments Co.Ltd
The Belt Tension Meter Mainly use for automotive belt tension measurement, also can measure and adjust ribbon, filamentous, linear, reticular and other wide objects tension. Applicable to the automotive, textiles, wire and cable, metal wire, plastic film, paper, printing, film industries etc.
-
product
Thin-film deposition
Plasma Source
SPECS Surface Nano Analysis GmbH
Thin-film deposition covers any technique for depositing material onto a bulk or thin film substrate. Elemental alloy or compound films are produced by non-reactive or reactive (co-)deposition. Often functionalization or tailoring of device interfaces by predeposition or deposition assisting surface treatment with atoms or ions is necessary.
-
product
Process XRR, XRF, and XRD metrology FAB tool
MFM310
Thickness, density, roughness & composition of films on blanket and patterned wafers. The Rigaku MFM310 performs high-precision measurements not possible by optical or ultrasonic techniques. This sophisticated X-ray metrology tool makes it practical to perform high-throughput measurements on product and blanket wafers ranging from ultrathin single-layer films to multilayer stacks.
-
product
Gurley Legality Tester
DRK461A
Shandong Drick Instruments Co., Ltd.
It can be applied to quality control and research and development of papermaking, textile, non-woven fabric, plastic film, etc
-
product
Leather Thickness Gauge
UI-FT43
Leather Thickness Gauge is used to measure the thickness of leather. Place the sample in a thickness meter under a specified load for a certain time and them read the thickness. Unuo Instruments supply film thickness gauge, film thickness gauge, rubber thickness gauge and etc. Shore Durometer for rubber is also available.
-
product
PLD Systems
Pulsed Laser Deposition
Is a versatile thin film deposition technique. A pulsed laser (~20 ns pulse width) rapidly evaporates a target material forming a thin film that retains target composition. This unique ability of stoichiometeric transfer of target composition into the film was realized first by the research team led by Dr. Venkatesan at Bell Communications Research, NJ, USA, nearly 30 years ago while depositing high temperature superconducting (YBa2Cu3O7) thin films. Since then, PLD has become the preferred deposition technique where ever thin films of complex material compositions are considered. Another unique feature of PLD is its ability for rapid prototyping of materials. The energy source (pulsed laser) being outside the deposition chamber, facilitates a large dynamic range of operating pressures (10-10 Torr to 500 Torr) during material synthesis. By controlling the deposition pressure and substrate temperature and using relatively small target sizes, a variety of atomically controlled nano-structures and interfaces can be prepared with unique functionalities.
-
product
DUV-NIR Spectroscopic Reflectometry
FilmTek 2000
Scientific Computing International
Automated metrology system designed for rapid, reliable, and accurate characterization of nearly any unpatterned thin film. Fully user-customizable wafer mapping capabilities rapidly generate 2D and 3D data maps of any measured parameter. Capable of simultaneous determination of multiple film characteristics within a fraction of a second per site.
-
product
Powerful and Cost Effective Spectroscopic Ellipsometer
Smart SE
The Smart SE from HORIBA Scientific is a versatile spectroscopic ellipsometer for fast and accurate thin film measurements. It characterizes thin film thickness from a few Angstroms to 20µm, optical constants (n,k), and thin film structure properties (such as roughness, optical graded and anisotropic layers, etc).The spectral range from 450 to 1000nm is measured in a few seconds and ellipsometric data are analyzed using the DeltaPsi2 software platform. The software integrates two levels of software to fulfil both routine analysis with predefined recipes and advanced analysis with state-of-the art ellipsometric modelling.