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Large Area Mapping Spectroscopic Ellipsometers for Flat Panel Display and Photovoltaic Industries
HORIBA Scientific’s large area spectroscopic ellipsometers are designed to provide thin film control solutions in flat panel display and photovoltaic manufacturing.A large mapping system allows thin film measurements at every location on the panel. Our large area spectroscopic ellipsometers are driven by our DeltaPsi2 software platform, which provides reliable recipes for routine thin film measurements. Automatic recipes fully automate measurement+modelling+mapping+results. Automatic reporting, data reprocessing, import/export package are some of the many functionalities of DeltaPsi2.
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Belt Tension Tester
BTT2880
Main used in belt tension measurement, can also be applied to measure the tension of objects such as tapes, wires. Widely applied in industries of automobile, textile, cables, wires, plastic films, paper, printing.
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Spectroscopic Ellipsometer
PH-SE
The spectroscopic ellipsometer is used for thin film and material characterization in R & D. The spectroscopic ellipsometer is designed to meet the requirements in modern research with special emphasis on speed and accuracy for an unmatched variety of applications.
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In Situ Diagnostics
For researchers working on ultra thin films and novel interfaces, Neocera offers insitu, real-time process control and diagnostic tools such as high-pressure RHEED, Low Angle X-ray Spectroscopy (LAXS) and Ion Energy Spectroscopy (IES). RHEED provides exceptional growth control via RHEED intensity oscillations and the Structural data via diffraction. LAXS is a complimentary to RHEED and provides real-time Compositional information. IES provides energetics of the laser generated plasma plume which is directly responsible for obtaining high quality films and interfaces.
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Dynamic Ultra Micro Hardness Tester
DUH-210/DUH-210S
A new evaluation system for measuring the material strength of micro regions, such as semiconductors, LSI, ceramics, hard disks, vapor deposited films, and thin coating layers, not addressed by previous hardness testers. It can also be used to evaluate the hardness of plastics and rubbers. This instrument uniquely measures dynamic indentation depth, not the indentation after the test. This in turn permits measurement of very thin films and surface (treatment) layers that are impossible to measure with conventional methods. Additionally, this same method supplies the data needed to calculate elastic modulus on the test specimens.
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Opacity & Shade Meter
Novo-Shade Duo + Reflectometer
The Novo-Shade Duo reflectometer has 3 modes of operation*OpacityThis is used for measuring the hiding power of a coating or plastic film*ShadeMeasure the shade of surface on a greyscale*CleanlinessMeasure the substrate cleanliness or oxidisation of a surface
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Coercive Force Meter
The meter is mainly used in measuring the coercive force of magnetic components of relays and the mechanical energy meter compensation films, which is the essential instrument of manufacturers who are producing the relays and the energy meters, etc.
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Hot Electron Bolometer (HEB) Mixers/ Receivers In Terahertz Range
Insight Product Company offers Hot Electron Bolometer (HEB) mixers, receivers, and chips made from NbN or NbTiN thin film. The HEB mixers can operate at frequencies of up to several terahertz.
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Glow Discharge Optical Emission Spectrometer
GD-Profiler 2™
The GD-Profiler 2™ provides fast, simultaneous analysis of all elements of interest including the gases nitrogen, oxygen, hydrogen and chlorine. It is an ideal tool for thin and thick films characterization and process studies.
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Advanced Friction Tester (COF Tester)
Coefficient of friction is also known as COF testing. The Hanatek Advanced Friction Tester is the most comprehensive tool available for measuring the coefficient of friction of plastic film, printed cartons, packaging substrates or paper.
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Elcometer Bresle Patches
135B
Elcometer 135B Original Bresle Patches are used to determine surface chloride contamination and are self-adhesive rubber film patches with a sealed compartment for sampling soluble impurities from steel surfaces with a suitable solvent.
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Thermal Insulation Demonstrator
Shenzhen Linshang Technology Co., Ltd.
Linshang Technology offers three sales kits to demonstrate the thermal insulation performance and UV blocking performance of glass and window films, two solar film temperature meters LS300 and LS301 to demonstrate thermal insulation performance through temperature test, two power meter: infrared power meter and UV power meter.
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Auto Spectroscopic Ellipsometer
PH-ASE
The PH-ASE spectroscopic ellipsometer measures thickness, refractive index and extinction coefficient of single films and multilayer stacks. Reflection measurements at different incident angles and transmission measurements can be carried out and combined with ellipsometric data.
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Non-contact Inline Sheet Resistance Measurement Module For Conductive Layer On Substrate
NC-700
*Inline measurement module for moving substrates such as PET film, glass or paper*Continuous measurement(~24h) in Roll to Roll with OFF-SET FREE capability system*Various applications from the research and development to the production line
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Spectroscopic Ellipsometry
Spectroscopic ellipsometers measure film thickness and refractive index of single layers, and multi‑layer stacks. Related properties of bulk materials, isotropic and anisotropic materials, surface and interface roughness as well as gradients can be analysed.
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Spectroscopic Ellipsometers
M-2000
The M-2000 line of spectroscopic ellipsometers is engineered to meet the diverse demands of thin film characterization. An advanced optical design, wide spectral range, and fast data acquisition make it an extremely powerful and versatile tool.
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Disk Peel Tester
DRK186
Shandong Drick Instruments Co., Ltd.
DRK186 Disk peel tester is applied to test the ink layer bonding strength of plastic film printing and PT print. To test the surface adhesion state of vacuum coating, surface coating, composite process.
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Terahertz Coating Thickness Analysis
TeraCota
TeraView presents a film thickness gauge designed for the automotive industry. The sensor can determine the individual thickness of multiple paint layers on both metallic and non-metallic substrates and offers significant benefits over existing techniques.
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Anti-Fogging Progerty Tester
Shijiazhuang Zhongshi Testing Machine Co., Ltd.
The instrument is used for testing anti-fogging property of the soft PVC Calendar stenter film. It is the ideal testing equipment for science research department, universities, commodity inspection, laboratory, graduate school and quality supervision departments.
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Thickness Measurement
Thickness Tester is a high precision mechanical contact method thickness tester, which can be used to thickness measurement of films, sheeting, paper, corrugated paperboard, textiles, non-woven fabrics, and solid insulation materials, etc.
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Metrology Solutions for Semiconductors
Bruker Semiconductor develops, manufactures, markets, and supports metrology solutions for thin films, which are based on novel, rapid, non-contacting and non-destructive X-ray technology. With Bruker’s acquisition of Jordan Valley Semiconductors, a name synonymous with unparalleled worldwide customer service and support, 75% of the world's top 25 semiconductor manufacturers rely on Bruker metrology tools for front-end and back-end applications, including development of their next-generation thin films. Bruker commitment to innovation and technology leadership drives the continued release of new advancements in metrology, and has garnered numerous awards and industry recognition.
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Auto Tensile Tester
ATT-03
Jinan Leading Instruments Co., Ltd.
ATT-03 Auto Tensile Tester is applicable inthe test of physical mechanical properties of plastic films, laminated materials, flexible packaging materials, plastic flexible tube, adhesives,adhesive tapes, pressure sensitive tape, adhesive bandage (plaster), releasepaper, protective film, flip off cap, foil, diaphragm, back sheet, non-woven, rubber and paper fiber, etc. It can perform the test items of tensile, peeling,deformation, tearing, heat seal, adhesive, puncture force, open force,low-speed unwinding force and unsnapping force, etc.
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Hot Tack Tester
Guangzhou Biaoji Packaging Equipment Co., Ltd.
GBPI Hot Tack Tester To test the sticking strength of packaging films after heat sealed with different temperature, pressure and time. It simulates the use of packaging bag and makes impact experiment on the part of hot tack.
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Ellipsometer
MARY-102
Ellipsometer is optical instruments which measure the change in polarizationstate of light beam upon reflection from a sample surface to analyzethe film thickness, the optical constants as the refractive index / absorption,or the optical constants of bulk materials.
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Ellipsometer
Ellipsometer is optical instruments which measure the change in polarizationstate of light beam upon reflection from a sample surface to analyzethe film thickness, the optical constants as the refractive index / absorption,or the optical constants of bulk materials.
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kSA RateRat Pro
kSA RateRat Pro is a compact, convenient and easy-to-use optical metrology tool for thin-film characterization. Its unique capability is to measure, in situ and in real-time, optical constants (n and k), deposition rate and film thickness.
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Falling Dart Impact Tester
Falling dart impact tester can be used for the determination of impact resistance of packaging materials such as plastic films, laminates by a free falling dart from a certain height. This instrument is designed according to ASTM D1709 with method A & B.
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C-Band / L-Band MWDM
WD1615/C, WD1516/L
Hangzhou Huatai Optic Tech. Co., Ltd.
WD1615/C, WD1516/L WDM is based on mature thin film filtering tech, with wide bandwidth, flatness, low insertion loss and high isolation. It is mainly applied to EDFA and DWDM network to achieve the combination and separation of C-Band and L-Band.
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C-Band Red/Blue-Band Pass MWDM
WD1515/R, WD1515/B
Hangzhou Huatai Optic Tech. Co., Ltd.
WD1515/R, WD1515/B is based on mature thin film filtering tech, with wide bandwidth, flatness, low insertion loss and high isolation. It is mainly applied to the combination and separation of C-Band, Red-Band (1547~1563nm) and Blue-Band (1528~1543nm).
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L-Band Red/Blue-Band Pass MWDM
WD1616/R, WD1616/B
Hangzhou Huatai Optic Tech. Co., Ltd.
WD1616/R, WD1616/B is based on mature thin film filtering tech, with wide bandwidth, flatness, low insertion loss and high isolation. It is mainly applied to the combination and separation of L-Band, Red-Band (1589~1603nm) and Blue-Band (1570~1584nm).