Showing results: 31 - 45 of 229 items found.
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ioLight Ltd.
*Very compact fluorescence microscope*Detects organisms expressing GFP or other fluorophores*Perfect for sample triage, education and outreach
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Beacon -
Del Mar Photonics, Inc.
Beacon up-conversion spectrometer has been specially designed for measuring fluorescence lifetimes in the 400 - 1500 nm spectral range.
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FACTORY LAB MXF-2400 -
Shimadzu Corp.
Wavelength Dispersive X-Ray Fluorescence Spectrometer The Shimadzu MXF-2400 is an improved version of the Shimadzu Multi-Channel X-ray fluorescence spectrometer, which has been rated highly in the overseas market as well as in the Japanese market. The latest hardware designed to fully utilize the principle of X-ray fluorescence spectrometry and the data processing unit that uses various software programs to permit automatic management of analysis data combine to provide high analytical productivity both in R&D and production control. Up to 36 elements can be simultaneously determined by the fixed monochrometer and up to 48 elements can be determined sequentially by the optional scanning monochrometer. High analytical precision is provided even in high sensitivity analysis of a few ppm quantity level.
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FOG100 -
CDP Systems Corp.
Femtosecond optical gating (FOG) methods give best temporal resolution in light induced fluorescence lifetime measurements. Since 1997 we manufacture model FOG100-DX for operation with femtosecond oscillators and we offer now FOG100-DA for operation with femtosecond amplified pulses.
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FISCHERSCOPE X-RAY/XULM -
Helmut Fischer AG
Flexible instrument for measuring coating thickness with multiple usesBoth thin and thick coatings (e.g. 50 nm Au or 100 m Sn) can be measured equally well through selectable high voltage filter combinationsThe micro-focus tube enables small measurement spot sizes at short measurement distances of just 100 mHigh count rates of a few kcps through proportional counter tubeMeasuring direction from bottom to top, this allows for quick and easy sample positioningLarge measurement chamber with a cutout (C-slot)
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FISCHERSCOPE X-RAY/XDAL -
Helmut Fischer AG
With semiconductor detector, this expands the possibilities in element analyses and for measuring thin coatings due to better signal/noise ratiosMicro-focus tube allows also for smaller measurement spots, but because lower in intensity, less well suited for smaller structures.Large and spacious measurement chamber with a cutout(C-slot)Fast, programmable XY-stage with pop-out function
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FISCHERSCOPE X-RAY/XAN 250 -
Helmut Fischer AG
Universal premium instrument with comprehensive measurement capabilitiesAperture (collimator) 4x electrically changeable, Primary filter 6x electrically changeableWith high-resolution silicon drift detector (SDD) also applicable for more complex analyses with many elementsMeasuring direction from bottom to top, this allows for quick and easy sample positioning
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FISCHERSCOPE XDL -
Helmut Fischer AG
Robust instrument suited for coating thickness measurements, even at large measuring distances (DCM, stroke 0-80 mm)Features a fixed aperture and a fixed filterSuitable for structure sizes starting at about 1 mmLarge and spacious measurement chamber with a cutout(C-slot)A programmable stage for automated measurements is availableStandard X-ray tube, proportional counter tube
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FISCHERSCOPE X-RAY/XDLM -
Helmut Fischer AG
Very universal because equipped with a micro-focus tube, 4-x aperture changer and 3 primary filtersSuitable for smaller structures such as connector contacts or printed circuit boardsLarger measuring distances are possible as well (DCM, stroke 0-80 mm)Large and spacious measurement chamber with a cutout(C-slot)A programmable stage for automated measurements is available
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FISCHERSCOPE X-RAY/XUL -
Helmut Fischer AG
For coating thickness measurements in the electroplating industryFixed aperture and fixed primary filterX-ray tube with a slightly larger primary spot, well suited for applications with measurement spot sizes starting at about 1 mmLow-energy beam components are excited with lower effectiveness, however for standard applications measuring the thickness of typical electroplated coatings such as Cr, Ni, Cu, this poses little to no problemMeasuring direction from bottom to top, this allows for quick and easy sample positioningLarge measurement chamber with a cutout (C-slot) Standard X-ray tube, proportional counter tube
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SPECTRO MIDEX -
SPECTRO Analytical Instruments GmbH
The SPECTRO MIDEX is known to be an all-round talent for the fast, non-destructive analysis of small spots and the rapid mapping of large surfaces (up 233x160 mm, 9.2x6.3’’) in research and development as well is in compliance screening applications as many elemental analysis tasks in industry, research and the sciences require a non-destructive measuring system that is extremely sensitive and offers a small measuring spot.
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FISCHERSCOPE X-RAY 4000 -
Helmut Fischer AG
For continuous measurement of coatings on foils, strips and punched strips in ongoing productionMeasuring head may be positioned at right angles to the transport direction of the specimenEasy handling and quick start-upProportional counter tube, peltier-cooled silicon PIN diode or silicon drift detector as X-ray detectorPositioning device for measurements on several measuring positionsCustomer-specific designAutomated calibrationFast conversion from one production line to anotherEasy integration into quality management systems and process controls
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FISCHERSCOPE X-RAY 5000 -
Helmut Fischer AG
Flange measuring head for continuous measurements in production linesProportional counter tube, peltier-cooled silicon PIN diode or silicon drift detector as X-ray detectorQuick and easy calibration on a workpiece master directly in the production processFor use in air or vacuumAllows measurements even on very hot substrate materials up to 500 C (930 F)Design is focused on maximum robustness and serviceability
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FISCHERSCOPE X-RAY/XDV-SDD -
Helmut Fischer AG
Premium model with universal application characteristicsHighest excitation flexibility, for both the size of the measurement spot and the spectral compositionWith the silicon drift detector, even very high intensities> 100 kcps can be processed without a loss in energy resolutionVery low detection limits and excellent repeatabilityLarge and easily accessible measurement chamberAutomated series testing with fast, programmable XY-stage
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Gasmet Technologies Oy
Cold Vapor Atomic Fluorescence (CVAF) is a powerful technique based on detecting fluorescence light emitted by the sample. Below the principle of the technique is explained in a nutshell.