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Functional ATE
Automated application specific testing system.
See Also: Functional Test, ATE, Functional Test Systems
- Pickering Interfaces Inc.
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PXI 8 Slot BRIC 60x32 1-Pole (12 sub-cards)
40-562A-121-60X32
This version of our BRIC is part of a range of high-density PXI matrix modules. These modules are available in 2, 4 or 8-slot PXI sizes to suit all high performance matrix requirements and are constructed using instrumentation quality reed relays. With this high level of switching density, these PXI matrix modules allow a complete Functional ATE system to be housed in a single 3U PXI chassis. These BRIC matrix modules allow the use of lower cost 8 or 14-slot PXI chassis.
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Electronics Functional Test
Functional test for productive manufacturing. Manufacturers of products enabled by electronics must assure proper operation prior to shipment. Bloomy’s line of universal test systems are ideal for functional test of your PCBAs and subassemblies, from the simplest to the most complex. The UTS family of products combines high-performance test instruments, switching, power control and mass-interconnect hardware with our robust UTS software suite into a low-risk, cost-effective and powerful test solution for your device under test (DUT).
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Functional Test
xUTS
Extend test to encompass copious test points and DUT varieties along with real-time, hardware-in-the-loop and other state-of-the-art instrumentation. extendedUTS (xUTS) is a custom product for high complexity functional test. Configured for the unique needs of a class of devices under test (DUTs), the xUTS employs our universal test system approach that combines the best open platform instrumentation and software along with mass interconnect technology.
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Functional Test
cUTS
Get the essentials of measurement automation to power tests of simpler PCBAs and subassemblies. compactUTS (cUTS) is a cost-effective platform for automating manual tests of devices with fewer than fifty cable-accessible test points in manufacturing environments with moderate production volume. DUT-specific electrically keyed cables make changeover quick and easy.
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Functional Test
UTS
The UTS functional test system is perfect for electronics manufacturing operations that have a mix of products where operators load and unload devices under test (DUT) and routinely change out fixtures for each type of DUT.
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Benchtop Automated Functional Test
midUTS
Combining bench-top portability with powerful automated test functionality, the midUTS is an extremely versatile yet cost-effective solution for your electronics functional test needs. Comprised of high-performance commercial-off-the-shelf (COTS) instruments, along with Bloomy’s medium-density signal-routing PCBAs, a built-in or USB-connected PC, and a pair of high-integrity, production-grade cables connected to an adjacent benchtop fixture, the midUTS can be used in engineering for PCBA bring up, as well as scaled to manufacturing to perform high-volume PCBA and sub-assembly functional testing. It is also ideal for depot diagnostic test, debug, and repair of field returns. The two mass-interconnected cables connect the midUTS to as many as 320 test points on the unit under test (UUT), supporting an extreme wide variety of products using bed-of-nails as well as cable-connected UUT test fixtures. Most importantly, the midUTS helps you automate sequences of functional tests using NI TestStand and the Bloomy EFT Module for TestStand. This ideal balance between powerful features and affordable cost allow you to automate earlier in the product development lifecycle, substantially increasing product quality and minimizing time-to-market!
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Functional Test Fixtures
Forwessun’s Functional Test Fixtures are tailored to validate the performance of your electronic assemblies, ensuring each product meets critical quality and functional standards. With customisable designs and precision engineering, these fixtures support a range of testing needs—from checking connectivity and function to confirming performance under real-world conditions. Built to handle rigorous demands, Forwessun's solutions are ideal for industries requiring reliable and repeatable results. Whether for high-volume production or specialised testing, our fixtures provide robust, adaptable support to maintain efficiency and accuracy throughout the testing process. We also create, and work with Ingun to create fixtures using the Ingun kit.
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Solar ATE
MS 1534
The Inverterless ATE is an automatic test equipment which is used to test the all functional and various test conditions of Inverterless Solar Unit. This ATE shall be a GO/NOGO Tester for Inverterless Solar Unit. All production units can be tested with this ATE for functional testing and clearance. This ATE reduces the man effort for quality checks and detects the failure units. The Inverterless ATE can check the UUT with minimum user interactions. It shall test and generate test report in PDF format for the conducted tests with necessary data. The ATE operates on 230V AC power. The ATE has In-Built AC-DC converter which provides 12V DC for operate the unit. Also it has additional AC-DC converter to simulate solar power to the Inverterless units. The main objective of the ATE is to test the Inverterless S in all possible test scenarios without external test equipments and less user interactions.
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Spring Probes & Hyperboloid Contacts
In-Circuit / Functional Probes, Socketless X Probes®, High Current Probes, Double Ended Probes, ATE Interface Probes, integraMate®
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PXI 10x4 Matrix 2A 1 Pole
40-545-001
The 40-545 series of modules are high density power switching matrices. Typicalapplications include power routing in Functional ATE systems, specifically automotiveelectronics, for example testing of Engine Management Units.
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ATE Development
Aero Engineering Support Group
ATE Development Aero Engineering Support specializes in designs and manufacturing of a wide variety of Automatic Test Equipment (ATE) of support for military avionics, commercial avionics, industrial sector, etc. AESG is committed to providing industry leading equipment that are designed to be scalable and expandable ATE capable of providing reliable functional test solutions for any electronic assembly or Circuit Card Assembly. New from Aero Engineering Support is the A2500 system, providing:
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Functional Testing
Whatever your functional testing requirement, whether analogue, digital, or a combination of technologies, we have a solution. With over 2500 applications delivered in this field we have a level of experience that cannot be matched. Ensure the reliability of your product with our functional testing tools. Our functional test solutions range from completely standalone applications to those matched for our FLEX range of ATE test systems. Whatever your testing needs, we will help you choose the best option for you.
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Combination Board Functional Test System
QT 4256 ATE
Qmax Test Technologies Pvt. Ltd.
QT 4256 ATE is a combination Board Functional Test System , a main frame Automated Test Equipment (ATE) which can be configured up to maximum of 1280 Bi-directional digital channels ideal for testing circuit card assemblies of high level of complexity and whether it is a legacy or new generation PCB.
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VXI Video Processor System
65VP1
NAI’s 65VP1 is a Video Processor System (VPS) on a VXI board. Capable of highly accurate video stimulus and measurements, this state-of-the-art instrument is the culmination of over three generations of Automatic Test Equipment (ATE) development programs. It provides increased functional density, and it reduces power consumption, size, and cost of the overall system. The 65VP1 is ideally suited for defense and commercial ATE programs, including television applications.
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PXI Single 44x8 Matrix, 1-Pole
40-537-021
Typical applications include signal routing in Functional ATE and data acquisition systems. These PXI matrix modules are constructed using high reliability sputtered Ruthenium reed relays, offering >109operations to give maximum switching confidence with long life and stable contact resistance.
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PXI Single 92x4 Matrix, 1-Pole Switching
40-535-021
Typical applications include signal routing in Functional ATE and data acquisition systems. These PXI matrix modules are constructed using high reliability sputtered Ruthenium reed relays, offering >109operations to give maximum switching confidence with long life and stable contact resistance.
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PXI Dual 44x4 Matrix, 1-Pole Switching
40-536-021
Typical applications include signal routing in Functional ATE and data acquisition systems. These PXI matrix modules are constructed using high reliability sputtered Ruthenium reed relays, offering >109operations to give maximum switching confidence with long life and stable contact resistance.
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PXI Single Screened 44x8 Matrix, 1-Pole
40-537-021-S
Typical applications include signal routing in Functional ATE and data acquisition systems. These PXI matrix modules are constructed using high reliability sputtered Ruthenium reed relays, offering >109 operations to give maximum switching confidence with long life and stable contact resistance.
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PXI Single 64x4 Matrix 2-Pole Switching
40-533A-022
Typical applications include signal routing in Functional ATE and data acquisition systems. These PXI matrix modules are constructed using high reliability sputtered Ruthenium reed relays, offering >109 operations to give maximum switching confidence with long life and stable contact resistance.
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PXI Single 64x4 Matrix 1-Pole Switching
40-533A-021
Typical applications include signal routing in Functional ATE and data acquisition systems. These PXI matrix modules are constructed using high reliability sputtered Ruthenium reed relays, offering >109 operations to give maximum switching confidence with long life and stable contact resistance.
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ATE For ADC Module
MS 1527
The Semi-ATE is used for testing the analog ADC. It shall carry out the functional test on ADC analog module. The ATE shall have all necessary IO signals on the connector end. The semi-ATE can carry out the functional tests on ADC analog module with host PC or laptop. It provides +15V, -15V, +5V & -5V to module and +2.5V high precision reference voltage. It can able to control keysight N6700B Power supply mainframe using RS422 interface.
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Powerful, Fully Integrated Workstation for Emission Microscopy
PEM-1000
The PEM-1000 emission microscope incorporates the latest technology in real time, high quantum efficiency, mega-pixel CCD detectors in a back-thinned cooled camera. A portable system, the PEM 1000 can interface with all analytical probe stations, ATE (automated test equipment) and bench top configurations for high speed functional testing.
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PXI Dual 10x4 Matrix 2A 1 Pole
40-546-001
Model 40-546-001 is a high density dual 1-pole 10x4 power matrix module. It is also available in single 10x4, single 10x8 or single 20x4 relay formats: Typical applications include power routing in Functional ATE systems, specifically automotive electronics, for example testing of Engine Management Units.
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PXI 20x4 Power Matrix 2A 1Pole
40-548-001
Model 40-548-001 is a high density single 1-pole 20x4 power matrix module. It is also available in single 10x4, dual 10x4 or single 10x8 relay formats: Typical applications include power routing in Functional ATE systems, specifically automotive electronics, for example testing of Engine Management Units.
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PXI 10x8 Power Matrix 2A 1 Pole
40-547-001
Model 40-547-001 is a high density single 1-pole 10x8 power matrix module. It is also available in dual 10x4, dual 10x4 or single 20x4 relay formats: Typical applications include power routing in Functional ATE systems, specifically automotive electronics, for example testing of Engine Management Units.
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Power Supply Test System
The Procyon PTS 2100-10 is a configurable turnkey Power Test System, delivering automated test equipment (ATE) to some of the world’s largest-volume manufacturers as well as the affordability needed by niche market producers. Aerospace, defense, and avionics power supply ATE test systems applications include functional testing of AC and DC power supplies, generator, and engine control units, as well as a wide range of associated electronics.
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Bi-Directional Differential-TTL I/O PXI Card
GX5641 Series
The GX5641 is a 3U PXI instrument card that can be used for general data acquisition, process control, Automatic Test Equipment (ATE), functional test, and factory automation applications. The GX5641 consists of 64 bi-directional TTL-differential I/O channels. Each channel has two ports (TTL and differential) which can be individually set to operate in either conversion or static I/O modes.
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Bi-Directional Differential-TTL I/O PXI Card
GX5641
The GX5641 is a 3U PXI instrument card that can be used for general data acquisition, process control, Automatic Test Equipment (ATE), Functional Test, and factory automation applications. The GX5641 consists of 64 bi-directional TTL-differential I/O channels. Each channel has two ports (TTL and differential) and can be individually set to operate in either conversion or static I/O modes.
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Bi-Directional Differential-TTL I/O PXI Card
GX5642
The GX5642 is a 3U PXI instrument card that can be used for general data acquisition, process control, Automatic Test Equipment (ATE), Functional Test, and factory automation applications. The GX5642 consists of 64 bi-directional TTL-to-differential LVDS I/O channels. Each channel has two ports (TTL and LVDS) and can be individually set to operate in either conversion or static I/O modes.
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Bi-Directional Differential-TTL I/O PXI Card
GX5642
The GX5642 is a 3U PXI instrument card that can be used for general data acquisition, process control, Automatic Test Equipment (ATE), Functional Test, and factory automation applications. The GX5642 consists of 64 bi-directional TTL-to-differential LVDS I/O channels. Each channel has two ports (TTL and LVDS) and can be individually set to operate in either conversion or static I/O modes.
