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Germanium
A poorly conducting white, hard and brittle metaloid chemical element.
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Germanium Optical Power Head
81623C
The new 81623C optical power head provides a 5 mm detector area and allows flexible placement of the remote optical power meter, which is then connected to the N7749C. The 81623C accepts parallel beams with up to 4 mm diameter, standard SM fiber and MM fiber with max. 100 μm core diameter, NA ≤ 0.3. A wide choice of adapters allows input from popular fiber connector types, bare fibers or open beams. The magnetic D-shaped adapters allow rapid removal and replacement without twisting attached fibers.
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High Purity Germanium (HPGe) Radiation Detectors
Semiconductor based photon radiation detectors have been evolving for over half a century, with ORTEC pioneering commercial availability for a majority of that time. Initial offerings were based around lithium-drifted germanium Ge(Li) and lithium-drifted silicon Si(Li). Ge(Li) was later replaced with more advanced, high purity germanium (HPGe) detectors. ORTEC provides a comprehensive suite of HPGe detector solutions covering an extensive range of energies and for a variety of applications.
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Cryogenic Temperature Sensors
Germanium
Lake Shore germanium resistance temperature sensors are recognized as “Secondary Standard Thermometers” and have been employed in the measurement of temperature from 0.05 K to 30 K for nearly 40 years. Germanium sensors have a useful temperature range of about two orders of magnitude. The exact range depends upon the doping of the germanium element. Cryogenic temperature sensors with ranges from below 0.05 K to 100 K are available. Between 100 K and 300 K, dR/dT changes sign, and dR/dT above 100 K is very small for all models. Sensor resistance varies from several ohms at its upper useful temperature to several tens of kilohms at its lower temperature.
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*Photodiode Energy Sensors
Ophir photodiode laser energy sensors are able to measure low energy pulses down to 10pJ at frequencies up to 20 kHz. Silicon photodiodes for the UV and visible spectrum and Germanium photodiodes for infrared.
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Transimpediance Amplifiers
The UDT TRAMP products are transimpedance amplifier (current-to-voltage) instruments that provide a low input impedance to accurately measure the short circuit current of phototransducers such as silicon and germanium photodetectors, vacuum photodiodes and photomultiplier tubes. The range includes the economically priced TRAMP, and for ultra precision and accuracy, the TIA-3000.
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Radiation Detectors
High Purity Germanium (HPGe) DetectorsSilicon Charged Particle DetectorsScintillation DetectorsORTEC is a leading supplier of solid-state, high resolution, semiconductor radiation detectors. These radiation detectors are used in research, commercial industry, environmental protection, health and medical physics, as well as homeland security to detect gamma-rays, X-rays, and charged particles.
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NanoModeScan M² Measuring System
This scanning slit M² measurement system accurately analyzes lasers with wavelengths from UV to Far Infrared with its silicon, germanium, or pyroelectric head. It features a compact portable design, immediate results, ISO compliant measurements, and operates in CW or kHz Pulsed modes which makes it ideal for comprehensive analysis of lasers of most wavelengths.
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Photo Detector with Integrated Transimpedance Amplifiers
ADN3010-11
Analog Devices optoelectronic amplifiers include a range of germanium photodiodes that, through a proprietary process, have been monolithically integrated with silicon transimpedance amplifiers and limiting amplifiers. This process eliminates the need for bond wires connecting the photodiode to the transimpedance amplifier, which leads to improved performance and greater manufacturing reliability. Our portfolio of products also supports the growing need for optical and electrical interface miniaturization.
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Gamma-Ray Analysis Software for HPGe Detectors
GAMMA-W
Gamma-W software performs high-precision analysis of gamma-ray spectra from HPGe detectors, and is ideally combined with the PX5-HPGe and your high-purity germanium detector. It is noted for its accurate and reproducible analysis of small peaks even in the presence of high backgrounds. Gamma-W contains all of the options and algorithms legally required by many jurisdictions for quantitative analysis of HPGe gamma-ray spectra, including detection limit, radioactive decay control, uncertainties, documentation, etc…, and allows users to run samples from within the DPPMCA software.
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Scanning Slit Beam Profiling
NanoScan
Measure your beam as never before with the NanoScan™ beam profiler. The advantage of scanning slit beam profiling is sub-micron precision for measuring beam position and size. Scan head configurations include Silicon, Germanium, and Pyroelectric versions for a wide range of wavelengths and laser power levels. The NanoScan software is available in two versions: Standard and Professional, and includes an extensive set of ISO quantitative measurements, an M2 Wizard, and the ability to measure laser power.
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Cryocoolers
GT
The GT Cooler was brought to commercialization in 2005. The GT has been used successfully in applications such as High Temperature Superconductivity (HTS) filters, high altitude balloons, refrigeration, germanium detectors, IR detectors, radio telescopes, laser diode cooling, and research among others. We believe the customer will agree that the CryoTel® GT is the smallest 16W @77K cooler available at an attractive price point with a Mean Time to Failure of over 200,000 hours. The GT currently utilizes the Generation 2 controller.
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Cryocoolers
CT
The CT Cooler was brought to commercialization in 2001 after 10 years of cryocooler development at Sunpower. The CT stands for CryoTel®, as the first commercial application was for the telecommunications industry. The CT has been used successfully in applications such as High Temperature Superconductivity (HTS) filters, high altitude balloons, refrigeration, germanium detectors, IR detectors, radio telescopes, laser diode cooling, and research among others. We believe the customer will agree that the CryoTel® CT is the smallest 11W @77K cooler available at an attractive price point with a Mean Time to Failure of over 200,000 hours.
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Cryocoolers
MT
The MT cooler has been in production since 2003 and is based on the CT cooler design. It was developed for the customer who did not need the lift of the CT cryocooler and wanted size and weight reduction for their application. The MT has been used successfully in applications such as High Temperature Superconductivity (HTS) filters, high altitude balloons, refrigeration, germanium detectors, IR detectors, radio telescopes, laser diode cooling, and research among others. We believe the customer will agree that the CryoTel® MT is the smallest 5W @77K cooler available at an attractive price point with a Mean Time to Failure of over 200,000 hours.
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Universal Multichannel System up to 8 kV
- From 12 to 24 independently controllable High Voltage channels- 8 kV maximum output voltage- Maximum Current 1 mA- Either Radiall Multipin or SHV connectors- Available with either positive or negative polarity- Up to 500 pA/50 pA current set / monitor resolution- Up to 100 mV/10 mV voltage set / monitor resolution- Very Low ripple, down to < 5 mV- 3 different channel grounding - Common Ground (AGxxxx) - Common Floating Return (Axxxx) - Individual Floating (A1534 only)- Independently programmable for each channel: - Output voltage - Current limit - Ramp up/down (1 ÷ 500 V/sec) - TRIP parameter- Current generator operation in overcurrent condition- Specific design for Germanium detectors (A15x0H only)
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Semiconductor Metrology Systems
MTI Instruments'' semiconductor wafer metrology tools consist of a complete line of wafer measurement systems for virtually any material including Silicon wafer (Si), Gallium Arsenide wafer (GaAs), Germanium wafer (Ge) and Indium Phosphide wafer (InP). From manual to semi-automated wafer inspection systems, the Proforma line of wafer metrology inspection tools is ideal for wafer thickness, wafer bow, wafer warp, resistivity, site and global flatness measurement. Our proprietary push/pull capacitance probes provide outstanding accuracy throughout their large measurement range, allowing measurement of highly warped wafers and stacked wafers. MTII''s solar metrology tools include off line manual systems for wafer thickness and Total Thickness Variation (TTV), as well as, in-process measurement systems capable of measuring wafer thickness, TTV and wafer bow at the speed of 5 wafers/second.
