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High Speed Internet Test

Determines the amount of data transferred per second.

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Company
Sponsored by: Pickering Interfaces Inc.

product

PXI/PXIe High Density Electro-mechanical Relay Module, 25xDPST

40-146A-002

Pickering Interfaces Inc.

40-146A-002 - Pickering Interfaces Inc.

The 40-146A-002 (PXI) and 42-146A-002 (PXIe) 25xDPST relay module is part of a range of high density switching modules available in Normally Open (SPST & DPST), Changeover (SPDT) and Normally Closed (SPST) configurations. Connections are made via a front panel 200-pin female connector.

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Ethernet Speed Test Solution

NET-BOX™

VeEX Inc.

NET-BOX™ - VeEX Inc.

The NET- BOX is an optimized Quality of Experience (QoE) testing platform that offers a low cost, reliable, high performance FPGA-based alternative to expensive high-end laptops often used for enterprise and speed tests. With a multi-test port architecture, with four 1GE, one 2.5GE test and 4 Gbps full line rate capability, the NET-BOX can truly test the limits to verify Quality of Service (QoS) and assure QoE for the ever growing high-speed internet service at and beyond 1 Gbps.

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Memory Test System

T5833/T5833ES

Advantest Corp.

T5833/T5833ES - Advantest Corp.

T5833 system is a cost-efficient, high-volume test solution capable of performing both wafer sort and final test of DRAM and NAND flash memory devices. Amid surging sales of mobile electronics, DRAMs, NAND flash memories and multi-chip packages (MCPs) — the main device types used in smart phones and tablets — are quickly evolving toward higher speeds and greater device capacity. Internet and cloud servers also are driving demand for faster, higher-capacity ICs. Yet the cost of testing today's wi...
T5833 system is a cost-efficient, high-volume test solution capable of performing both wafer sort and final test of DRAM and NAND flash memory devices. Amid surging sales of mobile electronics, DRAMs, NAND flash memories and multi-chip packages (MCPs) — the main device types used in smart phones and tablets — are quickly evolving toward higher speeds and greater device capacity. Internet and cloud servers also are driving demand for faster, higher-capacity ICs. Yet the cost of testing today's wide array of memory devices is an obstacle for chipmakers, which urgently require solutions that can deliver high functionality, high performance and low cost of test (COT). Advantest's new, multifunctional T5833 memory test system meets these needs, delivering both wafer sort and final test capabilities for a full range of memory devices, including LPDDR3-DRAMs, high-speed NAND flash memories and next-generation non-volatile memory ICs.
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SHC68-68-RDIO, 68-Pin Male VHDCI to 68-Pin Female D-SUB, Shielded Digital Cable, 1m

191667-01

NI

191667-01 - NI

68-Pin Male VHDCI to 68-Pin Female D-SUB, Shielded Digital Cable 1m

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SHC68-C68-RDIO2, 68-Pin VHDCI Male to 68-Pin VHDCI Male, 80 MHz, Shielded Digital Cable, 1m

156166-01

NI

156166-01 - NI

SHC68-C68-RDIO2 Shielded R Series High Speed Digital Male VHDCI Cable, 1m

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SHC68-C68-RDIO2, 68-Pin VHDCI Male to 68-Pin VHDCI Male, 80 MHz, Shielded Digital Cable, 2m

156166-02

NI

156166-02 - NI

SHC68-C68-RDIO2 Shielded R Series High Speed Digital Male VHDCI Cable, 2m

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EFT Module for Teststand

Bloomy Controls, Inc.

Bloomy Controls, Inc.

The Electronics Functional Test (EFT) Module for TestStand provides out-of-the-box tools to speed up development of automated tests for electronic assemblies including PCBAs, subassemblies and final assemblies. Test engineers can develop, deploy and execute test sequences quickly and efficiently with minimal custom code development for a shorter time-to-solution.

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Prototyping & Test Consulting Services Solutions

Averna

Averna

Don’t cut corners on the path to quality. We are experts in Design for Test (DFT), Design for Manufacturing (DFM), agile development, prototyping and standards/best practices in many industries. Speak to our prototyping and consulting services experts to ensure you make the right decisions and investments at the start of your project.

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Alternate 24.00 (680.00) - 96.00 (2722.00) Godzilla High Current Probe

HC375F-6

ECT

HC375F-6 - ECT

Current Rating (Amps): 100Average Probe Resistance (mOhm): 25Test Center (mil): For more details, please contact us.Test Center (mm): For more details, please contact us.Full Travel (mil): 360Full Travel (mm): 9.14Recommended Travel (mil): 250Recommended Travel (mm): 6.35Overall Length (mil): 3,110Overall Length (mm): 78.99

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Brute High Current Probe

P4301-2R

ECT

P4301-2R - ECT

Current Rating (Amps): 50Current Rating Remark: 40 Amps for BeCu plungersAverage Probe Resistance (mOhm): 5Test Center (mil): 300Test Center (mm): 7.62Full Travel (mil): 250Full Travel (mm): 6.35Recommended Travel (mil): 167Recommended Travel (mm): 4.24Mechanical Life (no of cyles): 1,000,000Overall Length (mil): 1,750Overall Length (mm): 44.45

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Brute High Current Probe

P4301-2F

ECT

P4301-2F - ECT

Current Rating (Amps): 50Current Rating Remark: 40 Amps for BeCu plungersAverage Probe Resistance (mOhm): 5Test Center (mil): 300Test Center (mm): 7.62Full Travel (mil): 250Full Travel (mm): 6.35Recommended Travel (mil): 167Recommended Travel (mm): 4.24Mechanical Life (no of cyles): 1,000,000Overall Length (mil): 1,750Overall Length (mm): 44.45

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Brute High Current Probe

P4301-1W

ECT

P4301-1W - ECT

Current Rating (Amps): 50Current Rating Remark: 40 Amps for BeCu plungersAverage Probe Resistance (mOhm): 5Test Center (mil): 300Test Center (mm): 7.62Full Travel (mil): 250Full Travel (mm): 6.35Recommended Travel (mil): 167Recommended Travel (mm): 4.24Mechanical Life (no of cyles): 1,000,000Overall Length (mil): 1,750Overall Length (mm): 44.45

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Brute High Current Probe

P4301-1Z

ECT

P4301-1Z - ECT

Current Rating (Amps): 50Current Rating Remark: 40 Amps for BeCu plungersAverage Probe Resistance (mOhm): 5Test Center (mil): 300Test Center (mm): 7.62Full Travel (mil): 250Full Travel (mm): 6.35Recommended Travel (mil): 167Recommended Travel (mm): 4.24Mechanical Life (no of cyles): 1,000,000Overall Length (mil): 1,750Overall Length (mm): 44.45

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Brute Hight Current Probes

P4301

ECT

P4301 - ECT

Current Rating (Amps): 50Current Rating Remark: 40 Amps for BeCu plungersAverage Probe Resistance (mOhm): 5Test Center (mil): 300Test Center (mm): 7.62Full Travel (mil): 250Full Travel (mm): 6.35Recommended Travel (mil): 167Recommended Travel (mm): 4.24Mechanical Life (no of cyles): 1,000,000Overall Length (mil): 1,750Overall Length (mm): 44.45

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Godzilla High Current Probe, 100 Amp

HC375

ECT

HC375 - ECT

Current Rating (Amps): 100Average Probe Resistance (mOhm): 25Test Center (mil): For more details, please contact us.Test Center (mm): For more details, please contact us.Full Travel (mil): 360Full Travel (mm): 9.14Recommended Travel (mil): 250Recommended Travel (mm): 6.35Overall Length (mil): 3,110Overall Length (mm): 78.99

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K-50 Series Probes

ECT

ECT

The K-50 coaxial probe provides an instrumentation-quality interface for broadband R.F. measurements up to 4 GHz. With the K-50 R. F. circuit design, impedance characterization measurements can be performed using it as a Network Analyzer port-extending accessory. Accurate and repeatable small signal and R.F. power (50 Watts) measurements provide consistent and repeatable results.

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Standard 0.79 (23.40) - 1.75 (49.60) High Frequency Probe

CSP-40G-021

ECT

CSP-40G-021 - ECT

Your product description goes here.

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Standard 0.79 (23.40) - 1.75 (49.60) High Frequency Probe

CSP-40A-024

ECT

CSP-40A-024 - ECT

Bandwidth @ -1dB (GHz): 6.00Return Loss @ -20dB (GHz): 2.30Nominal Impedance (Ohms): 50Dielectric VTE Rating (k VAC): 1Test Center (mil): 250Test Center (mm): 6.35Full Travel (mil): 200Recommended Travel (mil): 133Recommended Travel Remark: Shield: 211 (5.36) including travel of probesOverall Length (mil): 1,231Overall Length (mm): 31.28Full Travel Remark: Shield: 225 (5.72) including travel of probes

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Standard 0.80 (22.00) - 4.00 (114.00) High Frequency Probe

CSP-03B-006

ECT

CSP-03B-006 - ECT

Current Rating (Amps): 6Bandwidth @ -1dB (GHz): 3.70Return Loss @ -20dB (GHz): 1.80Dielectric VTE Rating (k VAC): 1Nominal Impedance (Ohms): 50Test Center (mil): 300Test Center (mm): 7.62Full Travel (mil): 250Full Travel (mm): 6.35Recommended Travel (mil): 167Recommended Travel (mm): 4.24Overall Length (mil): 1,090Overall Length (mm): 27.76

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Standard 0.80 (22.00) - 4.00 (114.00) High Frequency Probe

CSP-03G-003

ECT

CSP-03G-003 - ECT

Current Rating (Amps): 6Bandwidth @ -1dB (GHz): 3.70Return Loss @ -20dB (GHz): 1.80Nominal Impedance (Ohms): 50Dielectric VTE Rating (k VAC): 1Test Center (mil): 300Test Center (mm): 7.62Full Travel (mil): 250Full Travel (mm): 6.35Recommended Travel (mil): 167Recommended Travel (mm): 4.24Overall Length (mil): 1,090Overall Length (mm): 27.76

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Standard 1.59 (40.40) - 7.00 (198.50) High Frequency Probe

CSP-30TS-011

ECT

CSP-30TS-011 - ECT

Nominal Impedance (Ohms): 50Current Capacity (Amps) @ 20° C: 1.00Bandwidth @ -1dB (GHz): 35.00Recommended Travel (mil): 67Recommended Travel (mm): 1.70Full Travel (mil): 100Full Travel (mm): 2.54Overall Length (mil): 1,003Overall Length (mm): 25.48Rec. Mounting Hole Size (mil): 213Rec. Mounting Hole Size (mm): 5.40Test Center (mil): 375Test Center (mm): 9.53

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Standard 1.90 (53.90) - 8.00 (226.80) High Frequency Probe

CSP-40L-013

ECT

CSP-40L-013 - ECT

Nominal Impedance (Ohms): 50Dielectric VTE Rating (k VAC): 1Bandwidth @ -1dB (GHz): 6.00Return Loss @ -20dB (GHz): 2.30Test Center (mil): 250Test Center (mm): 6.35Full Travel (mil): 200Full Travel (mm): 5.08Full Travel Remark: Shield: 275 (6.99) including travel of probesRecommended Travel (mil): 133Recommended Travel (mm): 3.38Recommended Travel Remark: Shield: 211 (5.36) including travel of probesOverall Length (mil): 1,151Overall Length (mm): 29.24

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Standard 1.90 (53.90) - 8.00 (226.80) High Frequency Probe

CSP-40B-012

ECT

CSP-40B-012 - ECT

Nominal Impedance (Ohms): 50Dielectric VTE Rating (k VAC): 1Bandwidth @ -1dB (GHz): 6.00Return Loss @ -20dB (GHz): 2.30Test Center (mil): 250Test Center (mm): 6.35Full Travel (mil): 200Full Travel (mm): 5.08Full Travel Remark: Shield: 275 (6.99) including travel of probesRecommended Travel (mil): 133Recommended Travel (mm): 3.38Recommended Travel Remark: Shield: 211 (5.36) including travel of probesOverall Length (mil): 1,151Overall Length (mm): 29.24

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Standard- 27.20 (771.00) - 64.00 (1814.00) Godzilla High Current Probe

HC375F-4

ECT

HC375F-4 - ECT

Current Rating (Amps): 100Average Probe Resistance (mOhm): 25Test Center (mil): For more details, please contact us.Test Center (mm): For more details, please contact us.Full Travel (mil): 360Full Travel (mm): 9.14Recommended Travel (mil): 250Recommended Travel (mm): 6.35Overall Length (mil): 3,110Overall Length (mm): 78.99

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Standard 3.06 (86.70) - 4.00 (113.40) RF Probe For SMA Connectors

CSP-30ES-013

ECT

CSP-30ES-013 - ECT

Nominal Impedance (Ohms): 50Current Capacity (Amps) @ 20° C: 1.00Bandwidth @ -1dB (GHz): 35.00Return Loss @ -20dB (GHz): 22.00Test Center (mil): 328Test Center (mm): 8.33Recommended Travel (mil): 100Recommended Travel (mm): 2.54Full Travel (mil): 200Full Travel (mm): 5.08Overall Length (mil): 1,033Overall Length (mm): 26.24Rec. Mounting Hole Size (mil): 297Rec. Mounting Hole Size (mm): 7.54

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Standard 3.27 (93.00) - 8.13 (231.00) High Frequency Probe

K-50L

ECT

K-50L - ECT

Current Rating (Amps): 5Bandwidth @ -1dB (GHz): 4.00Return Loss @ -20dB (GHz): 1.90Nominal Impedance (Ohms): 50Test Center (mil): 550Test Center (mm): 13.97Full Travel (mil): 250Full Travel (mm): 6.35Recommended Travel (mil): 225Recommended Travel (mm): 5.72Overall Length (mil): 1,830Overall Length (mm): 46.48

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Standard 3.27 (93.00) - 8.13 (231.00) High Frequency Probe

K-50L-QG

ECT

K-50L-QG - ECT

Bandwidth @ -1dB (GHz): 4.00Return Loss @ -20dB (GHz): 0.80Nominal Impedance (Ohms): 50Test Center (mil): 550Test Center (mm): 13.97Full Travel (mil): 250Full Travel (mm): 6.35Recommended Travel (mil): 225Recommended Travel (mm): 5.72Overall Length (mil): 1,830Overall Length (mm): 46.48

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Standard 3.74 (106.00) - 14.35 (407.00) High Frequency Probe

K-50B-QG-75R

ECT

K-50B-QG-75R - ECT

Nominal Impedance (Ohms): 50Bandwidth @ -1dB (GHz): 12.00Return Loss @ -20dB (GHz): 3.00Test Center (mil): 550Test Center (mm): 13.97Full Travel (mil): 100Full Travel (mm): 2.54Recommended Travel (mil): 67Recommended Travel (mm): 1.70Overall Length (mil): 1,637Overall Length (mm): 41.58

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Standard 3.74 (106.00) - 14.35 (407.00) High Frequency Probe

K-50B-QG-75

ECT

K-50B-QG-75 - ECT

Nominal Impedance (Ohms): 50Bandwidth @ -1dB (GHz): 12.00Return Loss @ -20dB (GHz): 3.00Test Center (mil): 550Test Center (mm): 13.97Full Travel (mil): 100Full Travel (mm): 2.54Recommended Travel (mil): 67Recommended Travel (mm): 1.70Overall Length (mil): 1,575Overall Length (mm): 40.00

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Standard 3.74 (106.00) - 14.35 (407.00) High Frequency Probe

K-50L-QG-75R

ECT

K-50L-QG-75R - ECT

Nominal Impedance (Ohms): 50Bandwidth @ -1dB (GHz): 12.00Return Loss @ -20dB (GHz): 3.00Test Center (mil): 550Test Center (mm): 13.97Full Travel (mil): 100Full Travel (mm): 2.54Recommended Travel (mil): 67Recommended Travel (mm): 1.70Overall Length (mil): 1,637Overall Length (mm): 41.58

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Standard 3.74 (106.00) - 14.35 (407.00) High Frequency Probe

K-50L-QG-75

ECT

K-50L-QG-75 - ECT

Nominal Impedance (Ohms): 50Bandwidth @ -1dB (GHz): 12.00Return Loss @ -20dB (GHz): 3.00Test Center (mil): 550Test Center (mm): 13.97Full Travel (mil): 100Full Travel (mm): 2.54Recommended Travel (mil): 67Recommended Travel (mm): 1.70Overall Length (mil): 1,575Overall Length (mm): 40.00

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