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circuitry in a chip.

See Also: Integrated Circuit, Chip, Digital IC Testers, IC Test, IC Clips, IC Probes


Showing results: 241 - 255 of 376 items found.

  • MAX31856 Thermocouple Sensor Arduino Shield

    SEN-30007-J - Playing With Fusion Inc

    Quad channel thermocouple Arduino shield based on the MAX31856 universal digital thermocouple interface IC. This is an exciting update of the MAX31855, with improvements in resolution (19 vs 14 bits), on-board temperature reference (6 vs 4 bits), and compensation (fully compensated vs nonlinear correction required). The MAX31856 is interfaced via 4-wire SPI with options for interrupt triggering. An LDO and a high-speed level shifter are included on ALL device pins to allow interfacing with to any Arduino - both 3.3V and 5.0V variants - without sacrificing device performance in any operating condition.

  • MAX31856 Thermocouple Sensor Arduino Shield

    SEN-30007-ST - Playing With Fusion Inc

    Quad channel thermocouple Arduino shield based on the MAX31856 universal digital thermocouple interface IC. This is an exciting update of the MAX31855, with improvements in resolution (19 vs 14 bits), on-board temperature reference (6 vs 4 bits), and compensation (fully compensated vs nonlinear correction required). The MAX31856 is interfaced via 4-wire SPI with options for interrupt triggering. An LDO and a high-speed level shifter are included on ALL device pins to allow interfacing with to any Arduino - both 3.3V and 5.0V variants - without sacrificing device performance in any operating condition.

  • Magnetic Hall Sensor

    SystematIC

    On basis of extensive experience in Hall Sensor readout and related intellectual property SystematIC has developed several customer-specific and application-specific Hall IC products.For isolated current sensing at DC and low frequencies the Hall sensing technique is a valuable technique. It allows full integration of the sensor elements (Hall plates) and the readout electronics in standard CMOS technology. SystematIC succeeded in combining the full integration with good accuracy parameters and high bandwidth. With a compact die containing magnetic field sensors and programmable readout amplifiers SystematIC contributed to the customers fully integrated current sensor product.SystematIC did the full integrated circuit development and supported in wafer and final test programming. As a result of cooperation with our customer a current-sensor-IC with low offset, high gain accuracy, low TC's and excellent isolation properties has been released for production.

  • EMI Tester

    Peritec Corp.

    The EMI tester automatically measures the noise distribution of the electric field and  the magnetic field radiated from electronic equipment with high accuracy.・ Even if PCB and IC parts have complicated bumpy shape and surface.   The movable assembly can automatically trace them.・ EMI noise distribution is expressed as a variety of maps, such as 4D/3D/2D graphics   and cross section view.

  • Ultra-compact Photoelectric Sensor

    EX-20 Ver.2 - Panasonic Industrial Devices Sales Company of America

    Using a single chip optical IC, Panasonic created the powerful EX-20 Ultra-Compact Photoelectric Sensors, which are among the smallest Photoelectric Sensors worldwide and in spite of their miniature size, the Sensors incorporate a sensitivity adjuster. Since a red LED dot light source is used, alignment and confirmation of the sensing position is easy, even if very tiny objects have to be detected.

  • Pressure Sensors

    ESCP-SAPT Transmitter - ES Systems

    ESCP-SAPT pressure transmitters consist of a MEMS capacitive pressure sensor die, which is underpinned by ES’ innovative microfabrication process that has been proven suitable for the mechanical, radiation and temperature environment of space applications. The full custom, radiation-hardened signal conditioning IC was designed entirely by ES, utilizing a standard deep submicron CMOS process of a European foundry.

  • Semiconductor Test Equipment

    Wewon Environmental Chambers Co, Ltd.

    Probe card manufacturing need the semiconductor test equipment. When we designed the thermal testing equipment, Only some commonly used test items are packaged into the IC tester, and the logic function of the verification chip is implemented in a fixed test mode. But as chip products diversify, Some thermal inducing system can no longer do it alonehttps://www.wewontech.com/semiconductor-test-equipment/

  • Diamondx Test System

    Cohu, Inc.

    Diamondx semiconductor test system extends Cohu’s low-cost, high-throughput production test solution platforms to high pin count, higher site count wireless, mobility, SOC, Flat Panel Display drivers, Power Management, and microcontrollers. Designed to meet the cost drivers IC companies face, Diamondx extends Cohu’s leadership in lowering the cost of operations.

  • Analytical Chemistry Test

    Aero Nav Laboratories, Inc.

    Spectroscopy, Chromatography, Electrochemistry, Thermal Analysis, and Advanced Physical Testing Protocols!Certified Testing per EPA / FPA / ISO / ASTM / USP-NF / CODEX / AOAC / AOCS Chromatography (gC & HPLC), Heavy Metals (DCP, AAS, I-C & XRF), Spectroscopy (FT-IR, UV-VIS, & Fluorescence), Foods & Nutrition, Environmental Impact, Complete MSDS Testing & Green/LEEDS Certification, Military.

  • Contamination Analysis

    National Technical Systems

    Contamination Analysis, which begins with a set of basic evaluations that on most occasions will answer the “What is this?” question. The protocol contains four parts:*Visual Examination*Organic Analytical Testing by Fourier Transform Infrared (FTIR) Spectroscopy*Elemental Analytical Testing by Scanning Electron Microscopy / Energy Dispersive X-Ray Spectroscopy (SEM/EDS)*Ionic Analytical Testing by Ion Chromatography (IC)

  • Oscilloscope Probe Kit

    6HP-9060 - Prokit's Industries Co., Ltd.

    Switchable X1/X10/X100 attenuation with reference switch positions. Break-resistant center conductor & wide compensation range. Flatter response, sharper leading edges. Faster rise time and replaceable cable probe head tip and ground lead. Max. input voltage: 600V/1200V (DC-peak AC). Includes BNC adapter, IC tip, insulating tip & trimming tool.

  • PathWave RFIC Design (GoldenGate)

    Keysight Technologies

    Early in the RFIC design phase, monitoring system IC specifications such as EVM via RF simulation is a must. Simulations include effects of layout parasitics, complex modulated signals, and digital control circuitry. With PathWave RFIC Design, you can simulate in both the frequency and time domain and bring your designs to and from Cadence Virtuoso and Synopsys Custom Compiler.

  • Advanced SoC Test System

    3680 - Chroma ATE Inc.

    The Chroma 3680 is an advanced SoC test system with data rate up to 1Gbps. The Chroma 3680 is capable of conducting parallel tests on multiple chips to meet the digital and analog IC testing requirements, with applications including MCU, digital audio, digital TV, set-top box, DSP, network processor, field programmable gate array (FPGA) and consumer electronics.

  • J1939 Simulator

    DFLSJ1939BV1 - Dafulai Electronics

    The DFLSJ1939BV1 simulator is designed to simulate the truck or car''s ECU using J1939 protocol. It uses the DFL-SJ1939 IC with compact size. You can use free configuration software to customize the source address and 8 bytes of device name, and provide 2 extra customized PGNs. The configration software is free. You can download right now. New version 2.00 allows you to configure VIN#, and you can select J1939 DTC frame format from version1 to Version4. Furthermore, you can use our free PCTOOL software to change PGN value in real time.

  • Laser Induced Incandescence (LII)

    Dantec Dynamics A/S

    Soot is considered a hazardous pollutant emission and is typically a result of incomplete combustion processes, and thus is also related to combustion performance. Laser Induced Incandescence (LII) is a laser-optical measurement technique dedicated to soot diagnostics. LII can provide measurements of soot volume fraction, such as in Diesel engine exhaust, and even instantaneous images of soot distribution during formation inside a running IC engine.

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