Showing results: 361 - 375 of 496 items found.
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MC PRO 1500 HDNC -
Finna Sensors
Finna Sensors built the Transverse HDNC Sawmill Meter to increase the number of potential sensors from 8 to 24. The sensors can now be specified to fit within chain runs and can be located on both the top and bottom faces. This significant increase in surface area allows mills to identify sapwood/heartwood boundary areas or wet pockets for proper sorting prior to kiln drying. Sorting by moisture content has been shown to improve drying productivity by 10% to 15%, as well as, enhance lumber recovery. Further advancements in the software allow users to track packages through the drying process, add Internet of Things (IOT) data and perform advanced analytics with new reports.
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DeltaTRAK
This reusable logger can monitor temperature and humidity in facilities, storage and processing areas, clean rooms, labs, and during transport. It is equipped with an external sharp tip probe, providing the option to monitor internal core temperature. Data is available in PDF or spreadsheet format and used for various purposes, such as process or equipment verification and validation, thermal mapping, and documenting environmental conditions to meet GMP, GDP and regulatory compliance. Reports are analyzed to identify trends and patterns, and management decisions can be made to improve practices in areas such as processing and cold chain logistics. Data is easy to archive for record keeping, audits, and compliance with FDA, CDC, HACCP, FSMA and other regulatory requirements.
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Verix SimFix -
Real Intent, Inc.
Verix X-Pessimism correction system (SimFix) enables accurate gate-level simulations (GLS) that are necessary for a thorough verification sign-off. Inaccurate simulation is caused by the propagation of pessimistic unknowns (e.g. X’s) in netlist designs. SimFix uses mathematical methods to identify conditions under which pessimism can occur, and to determine the correct value when those conditions occur. It then generates auxiliary SimPortal files that, when used in simulation, will detect and correct pessimism so that the simulation accurately models real hardware. Without SimFix, GLS verification is compromised by inaccurate random initialization or costly synthesis switches, neither of which is foolproof and often still requires long and laborious gate-level debug.
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Model 9910 PurePulse/PinScan -
Electro-Tech Systems, Inc.
Model 9910 PurePulse / PinScan is used to determine the ESD susceptibility level of electronic devices up to ±4kV. PurePulse generates ESD pulses up to 4kV for testing electronic devices for susceptibility to Electrostatic Discharge (ESD) using HBM, MM and HMM models. PinScan provides automatic sequencing of ESD testing of up to 128 pin devices, applying a discharge, thenperforming a curve-trace test to identify a failure.
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Spark P3 -
Manta Test Systems
Doble Spark P3 is a universal partial discharge (PD) and electromagnetic interference (EMI) analyzer that uses a software defined radio signal detector to identify characteristics of insulation system deterioration that could lead to the failure of high voltage equipment. It detects signals from suitable sensors in a frequency range between 9 kHz to 2 GHz for PD and EMI, and DC to 500k Hz for acoustic and reference voltage measurements.
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ESDdoctor -
Sofics
ESDdoctor consulting service can identify, diagnose, and solve any ESD/EOS problem quickly and definitively, at a surprisingly low entry cost. You can choose testing and diagnosis only, or add ESD design services to the consulting package. ESD, Latch-up testing: HBM (ANSI/ESDA and JEDEC) on packaged dies. MM (ANSI/ESDA and JEDEC) on packaged dies. Latch-up JEDEC on packaged dies TLP on packaged and bare dies.VF-TLP on bare dies.
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Cincinnati Test Systems
Tracer gas leak testing is a simple and highly-efficient method of leak detection that provides high sensitivity as well as increased accuracy and repeatability. This method is used for testing parts with very low leak rates that are outside the range for conventional air-flow pressure decay and mass flow, or to replace bubble test methods. Tracer gas testing uses escaping tracer gas to identify micro-leaks in the range of 1x10-4 to 10-9 scc/s.
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PA-40 -
Pansco, Ltd
The PA-40 is designed to check both shielded and unshielded twisted pair (STP/UTP) and coaxial BNC-type network cables. With the push of a button, it tests all wires for continuity, miswiring, and polarization. Dual-colored LEDs let you identify correct and reversed pairs; using the included remote unit, cables may be tested before installation or after installation. Features tip/ring polarity test. Uses 1 9V battery.
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6410 DM -
Standard Electric Works Co., Ltd
● 3000 counts with a maximum display of 2999.● Angled display design helps the user to identify the reading of value easier.● Auto scanning function for AC/DC voltage, and current.● Auto ranging.● Range change function.● Continuity check.● Diode & Capacitance measurement.● Data hold function.● Low battery indication.● Over range indication.● Fuse protection.● Special hook design used to hang the meter for ease of use.
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AutoShock-II Test System -
L. A. B. Equipment, Inc.
The AutoShock-II is a fully automated series of shock test systems used to measure and identify product fragility levels and evaluate protective packaging. With the simulation of real world shock pulses and impact energy levels, manufacturers can systematically test and optimize product design and packaging. L.A.B. Equipment, Inc.''s fully automated computer controlled shock and data analysis test systems are the critical path in accomplishing this optimization.
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Jumho Electric Corporation
Noise source identification of large-scale machinery is a tough issue. If you don’t know the noise source, you cannot find out methods of improving you products. Microphone array, or acoustic camera, is an advanced technology for noise source identification in steady, non-steady, motion, or rest state. A microphone array system can display noise source distribution in real time, and identify the locations of noise source inside the equipment
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IST Information Scan Technology, Inc.
As power modules age, their performance degrades. Proper testing and maintenance of semiconductor devices used in power switching can ensure optimal performance and prevent down-time throughout a device’s lifecycle. The IST Model 8900 Series Discrete Semiconductor Test Systems allows you to effectively identify the percent of degradation in semiconductor devices by simulating the exact current and voltage of the parameters used by devices under real operating conditions.
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RAMCHECK LX -
INNOVENTIONS, Inc.
USBWith the RAMCHECK LX DDR4 memory tester package (part number INN-8686-DDR4) you can quickly test and identify DDR4 DIMMs that comply with JEDEC standards. Tests are fast, reliable and easy to do. The RAMCHECK LX DDR4 package includes the RAMCHECK LX base tester and 288-pin DDR4 DIMM adapter. (This package is also available with the DDR4 DIMM Pro adapter, featuring a very rugged test socket).
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SIFT -
FA Instruments
SIFT allows for the analysis of numerous stimuli to identify speed, fault, and parametric differences in silicon. The heart of the SIFT technique revolves around intentionally disturbing devices with external stimuli and comparing the test criteria to reference parts or timing/voltage sensitivities. Synchronous interfacing is possible to any tester without any wiring or program changes. The system can be based on either a motorized probe station or portable microscope stand for test head applications.
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Intego GmbH
Intego's knowhow even makes it possible to identify challenging defects that may be located under the surface. One system is the inspection of chips by means of lock-in thermography, which visually represents the IR radiation intensity signal of electronics. Special lasers and flash lamps generate a very short heat impulse (10 ms) on the chip, which generates a measurable heat flow. In most cases, a resolution of < 1 μm can be achieved.
