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Imaging

Perceives and captures visual representations of matter.

See Also: Hyperspectral Imaging, Confocal, Observation, Cameras, Imagers, Scanning


Showing results: 721 - 735 of 886 items found.

  • PXIe-8246, 4-Port, GigE PXI Frame Grabber Module

    787314-01 - NI

    PXIe, 4-Port, GigE PXI Frame Grabber Module - The PXIe-8246 helps you acquire images in machine vision and scientific imaging applications that require high data throughput. This PXI Frame Grabber Module includes four RJ45 gigabit Ethernet (GigE) ports in a single-slot PXI Express … module and features power over Ethernet (PoE). Additionally, the PXIe-8246 includes a Vision Acquisition Software license.

  • Acoustic Microscope

    AMI D9650 - Nordson Corporation

    Specifically designed to serve as a general purpose tool for failure analysis, process development, material characterization and low volume production inspection, the capabilities of the D9650 are truly unmatched. Representing the latest in C-SAM acoustic micro imaging, the D9650 delivers the unrivaled accuracy and robustness that you would expect from Nordson Test & Inspection instruments, plus improved electronics and software that raises the performance level for laboratory acoustic microscopes.

  • Resistivity Tomography System

    WGMD-60 2D - Langeo Co., Ltd.

    WGMD-60 geo-electrical 2D electrical tomography device is the new developed two-dimention electrical resistivity imaging (ERT) system, which integrated electrode switching and 200v transmitting high power in the mainframe. It support max 60 electrode switching.The whole system features light weight and high stability. It widly applys for different resistivity mapping or geopysical surveys as landslide survey, groundwater investigation, enginnering exploration and so on.

  • Scanning Acoustic Microscopy (CSAM)

    National Technical Systems

    Scanning Acoustic Microscopy, also known as C-SAM or Acoustic Micro Imaging or AMI, outstanding benefit is its ability to find hidden defects within assemblies and materials that can occur during manufacturing or environmental testing. Defects such as delaminations, voids and cracks can be identified and analyzed more effectively using Acoustic Microscopy than with any other inspection method.Unlike other non-destructive techniques such as X-Ray and Infrared Imaging, Acoustic Microscopy is highly sensitive to the elastic properties of the materials it travels through. Because of this, the ability of Acoustic Microscopy to find and characterize these physical defects is clearly superior. Typical applications include production control, failure analysis, and product development.Through the use of ultra-high frequency ultrasound, C-SAM non-destructively finds and characterizes physical defects—such as cracks, voids, delaminations and porosity— that occur during manufacturing, environmental testing or even under normal component operation. Because of the unique aspects of the technology, AMI can locate these defects better than any other inspection method.

  • Scanning Electron Microscopy (SEM Analysis)

    Rocky Mountain Laboratories, Inc.

    Scanning Electron Microscopy (SEM Analysis) can produce images of almost any sample at magnifications of 15-300,000X. The SEM has tremendous depth of field allowing for imaging that cannot be accomplished using optical microscopy. Conductive and nonconductive samples can be imaged. When operated in the backscatter (BSE) detection mode, differences in material composition can be observed. Elemental analysis can be performed on any feature observed with an integrated Energy Dispersive Spectroscopy (EDS) detector.

  • Scanning Auger Nanoprobe

    PHI 710 - Physical Electronics

    The PHI 710 Scanning Auger Nanoprobe is a unique, high performance Auger Electron Spectroscopy AES instrument that provides elemental and chemical state information from sample surfaces and nano-scale features, thin films, and interfaces. Designed as a high performance Auger, the PHI 710 provides the superior Auger imaging performance, spatial resolution, sensitivity, and the spectral energy resolution needed to address your most demanding AES applications.

  • EMCCD Image Sensors for Space and Ground-based Astronomy

    Teledyne e2v

    EM (Electron Multiplication) is a technology that uses on-chip gain in the charge domain to effectively eliminate read noise from an image sensor. This enables advanced ultra-low light applications that require extreme sensitivity at fast frame rates such as adaptive optics and lucky imaging™.The combination of Teledyne e2v’s back-thinning technology and anti-reflection coatings enables industry leading quantum efficiency that can be optimised for applications in the visible, UV or NIR wavelength ranges.

  • Remote Sensing & Proximal Sensing Systems

    SphereOptics GmbH

    Portable or handheld spectrometers (field spectrometers) and hyperspectral cameras (imaging spectrometers) are the ideal tools for spectral data acquisitions and ground truthing of remote sensing imagery. SphereOptics offers you a wide range of spectrometers for the visible (VIS), near infrared (NIR), shortwave infrared (SWIR), and thermal infrared (TIR) wavelength regions. More details about our single point spectrometers for the VIS-NIR-SWIR can be found here, and for TIR here.

  • High Speed Camera Systems

    nac MEMRECAM HX-7s - nac Image Technology Inc.

    nac's compact, lightweight MEMRECAM HX-7s offers an astounding 5 Mega Pixel resolution at up to 850 fps, Full HD resolution at up to 2,000 fps, 1 Mega Pixel resolution at up to 3,600 fps, and so much more! The HX-7s gives the user the best possible solutions: the highest resolutions available; the highest light sensitivity available; true mobility and stand-alone performance; and ultra fast imaging.

  • EVT Software

    Emergent Vision Technologies

    Emergent Vision Technologies has two software packages available to meet all requirements. eCapture is a standalone imaging package that provides accessibility to all functions of the Emergent Vision Cameras. eSDK is Emergent''s Software Developer''s Kit for integration of Emergent cameras into your system. Both software solutions provide <3% CPU overhead for Windows and Linux when capturing a 9Gbps video stream from the cameras.

  • Far Infrared Systems

    Sciencetech, Inc.

    Far-Infrared and terahertz (THz) radiation is the spectral region at the long wavelength end of the infrared and the short end of the microwave region, also known as the sub-millimeter wavelength spectral region. Recently, there has been an explosion of interest in THz applications as the radiation generated can penetrate various materials. THz light is commonly used in materials science, security, pharmaceutical com- pound analysis, biomedical imaging, superconducting materials, astronomy, and particle physics research.

  • Cross Sections and Metallography

    Rocky Mountain Laboratories, Inc.

    Cross sections are prepared by mounting samples in epoxy and then grinding and polishing the mount for imaging in the optical microscope or Scanning Electron Microscopy (SEM). Valuable information from cross sectioning can include: film thicknesses, inclusions, corrosion thickness, dimensional verification, and subsurface defects. Metallographic cross sections are typically etched to reveal the microstructure. Microstructural analysis can provide information about heat treatment history, corrosion susceptibility, as well as undesirable microconstituents.

  • System Architectures

    Tracewell Systems

    Tracewell has extensive experience designing and manufacturing systems based on standard architectures including VPX, VXS, VME, VME64x, VXI, ATCA, MicroTCA, and CPCI. The Tracewell System Architecture (SA) products, based on standard, commercial technologies can be used in a wide variety of commercial and military applications including: battlefield command & control systems, ground and flight sensor control systems, vehicle navigation controls, and medical imaging devices.

  • Connector Inspection

    OptiConcepts

    The USB Connector Inspection System features easy focusing with high resolution imaging. The system includes standard software that provides image display, image capture, digital zoom, auto calibration, and basic analysis tools. Pass/Fail analysis and reporting features are optional software features. The Inspection System scope is fully compatible with the FiberWarrior Pro OTDR as well as other FiberWarrior Pro test sets, providing a full fiber optic testing solution.

  • Microscopy Software/Hardware

    ZEISS Atlas 5 - Carl Zeiss AG

    Atlas 5 is your powerful hardware and software package that extends the capacity of your ZEISS scanning electron microscopes (SEM) and ZEISS focused ion beam SEMs (FIB-SEM). Use its efficient navigation and correlation of images from any source, e.g. light- and X-ray microscopes. Take full advantage of high throughput and automated large area imaging. Unique workflows help you to gain a deeper understanding of your sample.

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