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- Pickering Interfaces Inc.
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PXI 2.5W Programmable Resistor Module, 4-Channel, 1Ω to 62.1Ω
40-251-111
The 40-251-111 is a programmable resistor module with 4 channels which can be set between 1Ω and 62.1Ω with 0.25Ω resolution The 40-251 range provides a simple solution for applications requiring up to 2.5W of power handling per channel. The 40-251 is available in a variety of resistance ranges and resolution capabilities that meet the needs of most functional test systems. Each channel is able to simulate short or open circuit conditions that can be experienced in a system caused by faulty wiring or sensors.
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Circuit Breaker Test System
AutoScan
AutoScan Circuit Breaker Test System is used for performing routine tests on circuit breakers and various other types of switchgear. This test system is designed to test vacuum circuit breakers, high voltage circuit breakers, and extra high voltage circuit breakers as per suitable standards.
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Short Circuit Test System
Shanghai Guantu Technology Co., Ltd.
The short-circuit test system refers to what kind of short-circuit test is carried out by which equipment, and how long is the test time. But I have one thing to tell you, the short circuit test is a kind of destructive test, mainly to test the working condition of the used equipment in a crisis situation, or to test how strong the anti-destructive ability of the used equipment is. Just like a lot of equipment in the military must undergo a short-circuit test, some for 3 minutes or longer, in order to resist breaking calls against the enemy during wartime.
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Circuit Breaker Test System
TDR9100
The Doble TDR9100 Circuit Breaker Analyzer is a state-of-the-art circuit breaker test set for testing all types of circuit breakers with efficient and accurate performance measurements.
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Circuit Breaker Test System
TDR9100
The Doble TDR9100 is a state-of-the-art circuit breaker test set for testing all types of circuit breakers with efficient and accurate performance measurements.The TDR9100 provides main contact timing, motion, resistance and capacitance measurements with the flexibility to double or triple your usable channels.Use this inclusive, rugged and field-portable instrument for simple and complex testing of circuit breakers.
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Circuit Breaker Test System
TDR900
The TDR900 is your entry-level portable circuit breaker test set.It operates and records a circuit breaker's contact timing, motion, velocity, main contact engagement & synchronization, trip and close coil initiation and currents.Use the TDR900 to verify control circuit, check motion of moving parts, validate time of operation and demonstrate results of circuit breaker maintenance.
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Circuit Breaker Test Systems
Crest has over a decade of experience of designing and manufacturing test systems for testing all the different kinds of switchgear and controlgear.
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Test System for Circuit Breakers
Spitzenberger & Spies GmbH & Co. KG
Thermal testing with long-time currents up to 550 A. Magnetic testing with short-time currents up to 2000 A. Control software. Customer specifically adapted. 4 candidate records with pneumatic adapting.
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Circuit Breaker Test System
TDR900
It operates and records a circuit breaker’s contact timing, motion, velocity, main contact engagement & synchronization, trip and close coil initiation and currents.
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Stationary Circuit Breaker Test System
ACTAS C160
Stationary test system for carrying out fully automatic final factory tests, type and function tests on all kinds of switchgear devices, such as circuit breakers, disconnectors or earthing switches, regardless of the type of drive unit. All the electrical and mechanical parameters needed for the assessment of switching performance are measured in real time and evaluated without either the main contact chambers or the drive unit having to be opened. The system has analog and incremental input channels for the acquisition of analog quantities.
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Circuit Breaker Endurance Test System
Endurance testing involves operating – closing and opening – the circuit breaker repeatedly for a set number of cycles. This test is necessary to stabilize the circuit breaker mechanism and to identify “Early Infant Mortality” failures in the switchgear assembly.
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Automatic Circuit Breaker Test Systems
UPA-1 (UPA-3)
These portable systems for primary injection testing of circuit breakers which are used in in AC circuits of industrial frequency.
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Automatic Circuit Breaker Test Systems
UPA-16 (UPA-20)
Mobile systems for primary injection testing and trip curve control of circuit breakers and overcurrent protection relays.
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Switchgear Test Systems / Circuit Breaker Testing
ACTAS test systems provide precise information as to the condition of the chamber and drive unit without requiring them to be opened. The sheer number of parameters to be determined, the wide variety of different types of switchgear equipment in use and the harsh environmental conditions encountered during on-site tests place extreme demands on test equipment.
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Test System for Detecting Exact PCB Short Circuit Locations
QT25
Qmax Test Technologies Pvt. Ltd.
QT25 employs a unique method to detect exact PCB shorts circuit locations and pin down the shorted components and tracks. It is designed in such a manner that it precisely detects exact short circuit locations across VCC - GND or a shorted component connected across a Bus or hair-line shorts between PCB tracks, Which is highly impossible to detect using conventional tools especially when they are connected parallel in circuit. It can also be used in measuring the contact resistance of switches and relays in its milli-ohm mode as a value add.
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Test System for High Volume Production Testing of Integrated Circuits
ETS-364
The ETS-364 is a general-purpose precision analog and mixed-signal test platform designed for high volume production testing of integrated circuits; optimized for high throughput applications with a fully integrated multisite software and hardware architecture.
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Test System Optimized for High Volume Production Testing of Integrated Circuits
ETS-364 / ETS-600
The ETS-364 is a general-purpose precision analog and mixed-signal test platform designed for high volume production testing of integrated circuits; optimized for high throughput applications with a fully integrated multisite software and hardware architecture. The test system offers separate floating resources for each site, improving site isolation and measurement accuracy coupled with digital instrumentation enabling the most efficient, high-volume testing available. The system supports up to 240 analog pin channels, and offers 133 MVPS digital vector rate with up to 128 digital pin channels. Eagle's scalability includes the ability to double the capacity of an ETS-364, providing more than 480 analog pin channels and up to 256 digital I/O pin channels with the ETS-600.
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Automatic Test System
Automatic Test system is the ultimate solution for power electronic testing. The system includes a wide range of hardware choice such as AC/DC Sources, Electronic Loads, DMM, Oscillate Scope, Noise Analyzer and Short /OVP Tester. This flexibility combined with its open architecture software platform-PowerPro III, gives users a flexible, powerful and cost effective test system for almost all types of power supply testing.
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SoC Test System
Specifically designed for high-throughput and high parallel test capabilities to provide the most cost-effective solution for fabless, IDM and testing houses. With the full functions of test capability, high accuracy, powerful software tools and excellent reliability, 3650-EX is ideal for testing consumer devices, high-performance microcontrollers, analog devices and SoC devices.
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Semiconductor Test System
TS-960e
The GENASYS Semi TS-960e PXI Express Semiconductor Test System is an integrated test platform that offers comparable system features and capabilities found in proprietary ATE systems. Available as a bench top system or with an integrated manipulator, the TS-960e takes full advantage of the PXI architecture to achieve a cost-effective and full-featured test solution for device, SoC and SiP test applications.
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VLSI Test System
3380P
The 3380D/3380P/3380 test system have 4 wires HD VI source and any-pins-to-any-site high parallel test (multi-sites test) functions (512 I/O pins to test 512 ICs in parallel) that can meet the upcoming higher IC testing demands.
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VLSI Test System
3380D
The 3380D/3380P/3380 test system have 4 wires HD VI source and any-pins-to-any-site high parallel test (multi-sites test) functions (256 I/O pins to test 256 ICs in parallel) that can meet the upcoming higher IC testing demands.
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OLED Lifetime Test System
58131
The 58131 Lifetime Test System is designed specifically for the OLED industry. Model 58131 provides twoquadrant constant current (CC) and constant voltage (CV) stimulus to each OLED panel and acquires electrical and optical characteristics automatically. Two independent and isolated precision source-and-measure units (PMU) are incorporated in one modular card, which is capable of testing two OLED panels. Additional instrument cards are added to expand test capacity. Hot plug and play is a key feature of 58131. When a UUT fails or an instrument card needs to be replaced, 58131 does not have to be shutdown and testing continues for other UUTs. Hot plug and play obviates life test cycle restarts due to isolated faults and significantly improves life test efficiency. We firmly believe that hot plug and play capability should be mandatory for all lifetime test systems.
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Regenerative Battery Pack Test System
17020E
Charge/discharge modes (CC, CV, CP)Power Range: 10kW / 20kW per channelVoltage Range: 60V/ 100VCurrent Range: 100A/200A/300A/400A/ 500A/600A/700A/800A per channelRegenerative battery energy discharge, efficiency 85%Channels paralleled for higher currentsDriving cycle simulationFast current conversion without current interruptHigh precision measurementSmooth current without over shootTest data analysis functionData recovery protection (after power failure)Independent protection of multi-channel
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Photodiode Burn-in Reliability Test System
58606
The Chroma 58606 PD/APD Burn-in system is a high density, multifunction and temperature controlled module based system for photo diode burn-in and lifetime test. Each module has up to 256 Source Measurement Unit channels which can source current and measure voltage in various scenarios such as one described below. The system can accommodate 7 modules for a total of 1,792 device channels.
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Regenerative Battery Pack Test System
17040E
High-power testing equipment up to 1,700V/ 4800A/ 1.2MW Multiple safety protections for personnel safety risk management and control of battery testing Flexible Integration for automated battery verification solutions
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Photonics Module Test System
58625
Chroma 58625 provides characterization testing for 3D sensing illumination devices. various test modules are combined for validation testing under precise temperature control.
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PXI Semiconductor/IC Test System
A high-density 100MHz PXIe digital IO card designed for characterizing, validating, and testing a variety of digital and mixed-signal ICs. Each IO card consists of a Sequencer Pattern Generator (SQPG) and 32 channels of full ATE-like features. The 33010 IO card is expandable up to 256 channels. Some unique features of the 33010 include an on-board SQPG, per pin timing/levels/ PMU/TFMU, multiple time domains, and multithreaded testing for complex IC testing. Each channel is also equipped with 64M vector memory, 16 timing sets with on-the-fly timing change, and per pin timing and frequency measurements up to 400 MHz.
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Mini LED Backlight Module Automatic Optical Test System
7661-K003
Chroma 7661-K003 Mini LED Backlight Module Automatic Optical Test System contains a 71803-2 2D color analyzer to measure chromaticity and brightness
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Laser Diode Reliability Burn-In / Life-Test System
58602
Chroma 58602 is a high density, precision multi source measurement Unit (SMU) module with temperature control and exchangeable interface developed for burn-in, reliability and life test of optoelectronic components including laser diodes, VCSELs, VCSEL Arrays, silicon Photonics, photo-diodes and other similar components.
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Laser Diode Burn-in Reliability Test System
58604
The Chroma 58604 is a high density, multi-function, and temperature controlled module for laser diode burn-in and lifetime tests. Each module has up to 256 SMU channels which can source current and measure voltage in various control modes as described below.
