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Infrared Microscopes
observe, measure and analyze, sample magnified, IR view.
See Also: Microscopes, Acoustic Microscopes, Atomic Force Microscopes
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Yamasaki Fiber Optic Microscope 400x
M400
The Yamasaki M400 Fiber Optic Microscope has high quality precision all glass optics and integrated infra-red safety filter making them the most sought after Fiber Optic Microscopes for use in the field or laboratory.
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Objective Lenses
The objective lens is the most complex and the most important component in a microscope. The multi-element design of these lenses works to produce the real image, which is then seen through the ocular lens. With Olympus’ range of microscope objective lenses, we provide outstanding optical performance from visible light to near infrared.
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NanoFluorescence Microscope
NFM
The NFM is a specialized optical microscope system custom-designed for imaging individual single-walled carbon nanotubes (SWCNTs) through their intrinsic short-wave infrared fluorescence. It is ideal for SWCNT studies in physics, chemistry, biomedicine, and environmental research. The NFM is the new, more affordable replacement for our pioneering NM1 Fluorescence Microscope.
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NeaSNOM Microscope
Based on high-stability scanning-sample Atomic Force Microscope optimized for optical nanoscopyOptical focusing unit accepts visible, infrared and even terahertz illuminationTwo independent module bays allow imaging & spectroscopy at the same time
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Failure Analysis
A partial list of our state of the art test equipment, applicable to these testing disciplines, will include the following: Two Scanning Electron Microscopes with EDS (SEM/EDS) Three Differential Scanning Calorimeters (DSC) Three Thermogravimetric Analyzers (TGA) Three Thermo Mechanical Analyzers (TMA) One Dynamic Mechanical Analyzer (DMA) Two Real-Time Fluoroscopic X-ray Systems, including a Microfocus System One Fourier Transform Infrared Microscope (FTIR) (capable of identifying a single particle of an unknown material) Two Ion Chromatographs (IC) (capable of identifying ionic impurities in ppm)
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High-Speed Video Camera
Hyper Vision HPV-X2
Medical science and engineering have made dramatic progress thanks to visualization technology. Examples include the invention of microscopes capable of enlarged observations of phenomena occurring in the microscopic domain, invisible to the human eye, X-ray inspection systems, which enable the observation of images utilizing light at imperceptible wavelengths, and infrared cameras. Our eyes are incapable of capturing phenomena occurring at times shorter than 50 to 100 ms. As a result, high-speed video cameras have become necessary in order to record phenomena occurring at intervals that cannot be seen with the human eye, and then replay them at a slower rate so that they can be visualized. As the standard tool for visualizing ultra high-speed domains, the Hyper Vision high-speed video camera contributes to our understanding of ultra high-speed phenomena in a variety of fields.
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Widely Tunable Ultrafast Laser System For Multiphoton Imaging
InSight X3
Spectra-Physics’ new InSight® X3™ is the third generation of Spectra-Physics’ industry leading InSight platform, specifically designed for advanced multiphoton microscopy applications. Based on patented technology1, InSight X3 features a broad 680 nm to 1300 nm continuous, gap free tuning from a single source, nearly double the tuning range of legacy Ti:Sapphire ultrafast lasers. InSight X3 delivers high average and peak power levels across the tuning range, including critical near infrared wavelengths above 900 nm for deepest penetration in-vivo. With Spectra-Physics’ integrated patented DeepSee™, the industry standard dispersion pre-compensator, the short pulses are optimally delivered through a microscope to the sample for maximum fluorescence and penetration depth. InSight X3 also has exceptional beam pointing stability, beam quality and output power stability, as well as fast wavelength tuning, making it ideal for microscopy.
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Optical Test And Measurement
Any type of fiber optic interconnection requires its interfaces to be free of dust and scratches in order to reach the lowest transmission loss. Small, handheld and battery powered inspection tools are available from AMS Technologies for inspection of fiber optic connectors in the field as well as high resolution type microscopes suitable for use in a production environment for qualifying the endface preparation. Additional S/W tools can support the user in making a quick decision if a certain defect is acceptable or if the surface fault disqualifies it for further use. Small and lightweight test equipment for measurement of the transmitted power in an optical fiber is needed wherever technicians handle optical fibers. Our product portfolio comprises light sources for various wavelengths, power meters for the visible and infrared and integrated solutions for sources and meters as well as optical time domain reflectometers (OTDR) coupled with visible wavelength light sources for easy fault detection within a fiber optic link.
