Showing results: 1141 - 1155 of 1435 items found.
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Mors Smitt Group
*Heavy duty Elkonite contact tips*AC and DC versions available*AC versions available with or without internal rectifier PCB*Automated vision system and operator inspection*Comprehensive automated end of line testing*Test Certificates supplied with each relay*Certificate of Conformity supplied with each order*Recertification and repair services available
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US-454A -
United Western Technologies Corp
The US-454A is a portable, hand-held, battery-operated multi-frequency eddy current instrument that can be connected to a laptop, PC and motion controllers for use in semi- or fully automatic data collection applications. Two encoder inputs enable position stamping of data. Pulse-on position input is ideal for motion control applications. Ethernet and USB capabilities allow instrument control along with time- and position-stamped data transfer to the client computer. Built from the rugged US-454 architecture, the US-454A offers single- and multi-frequency inspection, frequency mixing capabilities, enhanced signal-to-noise ratio, USB, Ethernet and data storage capability, and unprecedented digital strip chart data collection.
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T1010 -
Teledyne FLIR
The T1010 uses the power of FLIR Vision Processing™ to deliver detailed, smooth pictures with very little image noise. FLIR Vision Processing combines HD resolution, MSX®, and UltraMax® image enhancement with FLIR's proprietary adaptive filtering algorithms to produce brilliant thermal images with up to 3.1 million pixels. Plus, the T1010 is sensitive enough to detect temperature differences down to <20 mK, for clear, low-noise results that keep you from missing any potential issues during inspections. 1024 × 768 true HD resolution images, with thermal measurements up to 650°C (1202°F).
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The L. S. Starrett Company
Used from a flat surface such as a Starrett granite surface plate, height gages measure the distance from the reference surface to some feature of a part, and can do so with exceptional accuracy. accuracy. Starrett offers a full range of height gages. Our Altissimo advanced electronic height gage is rich in features and exceptionally accurate. gages are available with a choice of range and feature sets. Our vernier height gages are still preferred by many for their exceptional accuracy. For the highest level of accuracy, we offer DIGI-CHEK gages. These tools are typically used in combination with the various scribes, attachments and accessories available from Starrett to complete the inspection work.
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EPOCH 6LT -
Olympus Corp.
Portable and easy to use, the EPOCH 6LT flaw detector is an ergonomic, rugged instrument that delivers user comfort and more uptime. Weighs just 1.95 pounds (890 g) with a grip-oriented weight distribution for one-handed operation with minimal wrist fatigue. Rotary knob and simple button design make it easy to use, even when wearing gloves. Engineered to IP65/67 and drop tested. Clear, bright screen for readable A-scans in any light. The EPOCH 6LT flaw detector’s workflow is simple and straightforward. Despite the instrument’s small size, it has the features and functions to meet the requirements of nearly any conventional ultrasonic inspection application.
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Leuze electronic GmbH + Co. KG
Switching light section sensors are designed to perform scanning, two-dimensional object detection along a laser line. They are especially well suited for completeness monitoring or product monitoring in the case of multiple track transport. The short measurement time and the detection range from 200 to 800 mm enable an inspection of the content at a high throughput rate even with deep containers. The internal data processing offers programming and differentiation of 16 different object types, thereby conserving control capacity. Complex detection tasks can be solved with one sensor. The compact housing ensures high flexibility during installation and saves installation space.
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Leuze electronic GmbH + Co. KG
Switching light section sensors are designed to perform scanning, two-dimensional object detection along a laser line. They are especially well suited for completeness monitoring or product monitoring in the case of multiple track transport. The short measurement time and the detection range from 200 to 800 mm enable an inspection of the content at a high throughput rate even with deep containers. The internal data processing offers programming and differentiation of 16 different object types, thereby conserving control capacity. Complex detection tasks can be solved with one sensor. The compact housing ensures high flexibility during installation and saves installation space.
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FLIR E96 -
Teledyne FLIR
The FLIR E96 is our first pistol-grip camera with 640 × 480 thermal resolution so inspectors can survey high-voltage, hazardous targets safely and quickly diagnose electrical and mechanical failures. Interchangeable AutoCal™ lenses offer complete coverage of near and distant targets, with the laser distance meter ensuring the crisp focus needed for accurate temperature measurement. The onboard FLIR Inspection Route runs pre-planned routes to help inspectors stay organized when surveying large or multiple locations. FLIR Ignite provides automatic uploading of E96 images directly from the camera to the cloud for easy, secure storage and sharing.
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4100H -
TUV Rheinland Inc
HinaLea’s Model 4100H is an award-winning hyperspectral imaging camera with a built-in illumination source. It is recognized as the world’s first high-resolution, handheld, autonomous hyperspectral camera and that was awarded the SPIE Best Camera and Imager Prism Award in 2017. The Model 4100H is compact, lightweight and designed for field and factory use. It captures a high-resolution snap-shot image of an object, with spectra at each pixel for the visible (400 – 1000 nm) wavelength range in up to 550 bands. It features a color touch screen interface, battery operation and embedded object identification. It is ideal for medical imaging, precision agriculture, industrial machine vision and food and other quality inspection applications.
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Lt1265R -
Teledyne Lumenera
The Lt1265R USB 3.1 Gen 1 camera builds on leading edge EXview HAD II technology to deliver high sensitivity, low noise and high dynamic range. High-grade electronics ensure clear, sharp and low noise images that render details with amazing accuracy. Superior responsivity up to 1000nm positions it as a good choice for Near-Infrared (NIR) imaging. This industrial-grade camera is ideally suited for a variety of applications including unmanned vehicles, surveillance, traffic, tolling, high-speed inspection and machine vision. A scientific-grade variant is available for the most demanding life science applications such as ophthalmology and fluorescence. The Lt1265R can also be customized to suit OEM designs.
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Guangzhou Amittari Instruments Co.Ltd
AMITTARI l Whiteness Meter is mainly used to directly measure the whiteness value of object or powder with flat surface. It can be widely used in whiteness measurement of textile printing and dyeing, paint, chemical building materials, paper board, plastic products, white cement, ceramics, enamel, talc powder, starch, flour, salt, detergent, cosmetics and other substances. The instrument pass strict inspection and testing, conforms to the JJG 512-2002 Whiteness Meter Verification Regulation. Also conforms to GB3978、GB3979、GB7973、GB7974、ISO2470、GB8904.2、QB1840、GB2913、GB13025.2、GB1543、ISO2471、GB10339、GB5950、GB12911、GB2409 and other standards.
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Applied Image, Inc.
Accuracy in machine vision systems is critical to achieving strategic goals regarding quality, efficiency, and consistency. Use our ACCUplace product lines to calibrate vision systems’ distortion, placement/alignment, or other field parameters in systems used for guidance, identification, gauging, and inspection. Using our specialized ACCUedge® technology, our Robotic and Machine Vision Standards are manufactured with line-edge quality that is second to none in the industry, providing the precision needed to calibrate almost any system. Should you need to alter feature patterns, size, or substrate to fit your needs, fill out our Optical Components and Standards form to start the conversation.
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10719A -
Keysight Technologies
The Keysight 10719A One Axis Differential Interferometer makes either a differential linear or angular measurement for use in single and multiple axis applications. The linear measurement gauges the displacement between two objects, such as a stage and an optical column or inspection tool. The 10719A also measures either pitch or roll. An angle is measured when both reference and measurement beams measure to the same mirror. The 10721A provides high immunity to unwanted interferometer displacement, such as thermal expansion. It is a modular, compact design with monolithic optics for maximized mechanical stability. Use of a small 3 mm beam helps decrease Abb offset error.
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HTJ-16 -
Shanghai Dean Electrical Co., Ltd
Executive standard: GB/T4074.3-2008/IEC60851-3; Inspection standard: JB/T4279.4-2008Used to measure the spring back characteristic of enameled round wires with nominal conductor diameter of between 0.080mm and 1.600mm;Number of winding turns: 5 turns and a halfStop accurately at zero position of the scale after automatic windingAs soon as the value of spring back angle stop counting, the dial will stop to rotate immediately, so that the value displayed on LED and read on the dial are the same.Sensor is unnecessary to be adjusted for samples of different specificationsCoils loosen slowly during spring back, no action of spring back or jump suddenly.Application of SCM control allows for fast operation and strong anti-interference capacity;
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KLA-Tencor Corp
KLA’s substrate manufacturing portfolio includes defect inspection and review, metrology and data management systems that help substrate manufacturers manage quality throughout the wafer fabrication process. Specialized wafer inspection and review tools assess wafer surface quality and detect, count and bin defects during production and as a critical part of outgoing wafer qualification. Wafer geometry systems ensure the wafer shape is extremely flat and uniform in thickness, with precisely controlled wafer shape topography. Data analysis and management systems proactively identify substrate fabrication process excursions that can lead to yield loss. KLA’s substrate manufacturing systems support process development, production monitoring and final quality check of a broad range of substrate types and sizes including silicon, prime silicon, SOI, sapphire, glass, GaAs, SiC, GaN, InP, GaSb, Ge, LiTaO3, LiNBO3, and epitaxial wafers.
