Showing results: 1156 - 1170 of 1388 items found.
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EPOCH 6LT -
Olympus Corp.
Portable and easy to use, the EPOCH 6LT flaw detector is an ergonomic, rugged instrument that delivers user comfort and more uptime. Weighs just 1.95 pounds (890 g) with a grip-oriented weight distribution for one-handed operation with minimal wrist fatigue. Rotary knob and simple button design make it easy to use, even when wearing gloves. Engineered to IP65/67 and drop tested. Clear, bright screen for readable A-scans in any light. The EPOCH 6LT flaw detector’s workflow is simple and straightforward. Despite the instrument’s small size, it has the features and functions to meet the requirements of nearly any conventional ultrasonic inspection application.
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Leuze electronic GmbH + Co. KG
Switching light section sensors are designed to perform scanning, two-dimensional object detection along a laser line. They are especially well suited for completeness monitoring or product monitoring in the case of multiple track transport. The short measurement time and the detection range from 200 to 800 mm enable an inspection of the content at a high throughput rate even with deep containers. The internal data processing offers programming and differentiation of 16 different object types, thereby conserving control capacity. Complex detection tasks can be solved with one sensor. The compact housing ensures high flexibility during installation and saves installation space.
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Leuze electronic GmbH + Co. KG
Switching light section sensors are designed to perform scanning, two-dimensional object detection along a laser line. They are especially well suited for completeness monitoring or product monitoring in the case of multiple track transport. The short measurement time and the detection range from 200 to 800 mm enable an inspection of the content at a high throughput rate even with deep containers. The internal data processing offers programming and differentiation of 16 different object types, thereby conserving control capacity. Complex detection tasks can be solved with one sensor. The compact housing ensures high flexibility during installation and saves installation space.
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FLIR E96 -
Teledyne FLIR
The FLIR E96 is our first pistol-grip camera with 640 × 480 thermal resolution so inspectors can survey high-voltage, hazardous targets safely and quickly diagnose electrical and mechanical failures. Interchangeable AutoCal™ lenses offer complete coverage of near and distant targets, with the laser distance meter ensuring the crisp focus needed for accurate temperature measurement. The onboard FLIR Inspection Route runs pre-planned routes to help inspectors stay organized when surveying large or multiple locations. FLIR Ignite provides automatic uploading of E96 images directly from the camera to the cloud for easy, secure storage and sharing.
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4100H -
TUV Rheinland Inc
HinaLea’s Model 4100H is an award-winning hyperspectral imaging camera with a built-in illumination source. It is recognized as the world’s first high-resolution, handheld, autonomous hyperspectral camera and that was awarded the SPIE Best Camera and Imager Prism Award in 2017. The Model 4100H is compact, lightweight and designed for field and factory use. It captures a high-resolution snap-shot image of an object, with spectra at each pixel for the visible (400 – 1000 nm) wavelength range in up to 550 bands. It features a color touch screen interface, battery operation and embedded object identification. It is ideal for medical imaging, precision agriculture, industrial machine vision and food and other quality inspection applications.
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Lt1265R -
Teledyne Lumenera
The Lt1265R USB 3.1 Gen 1 camera builds on leading edge EXview HAD II technology to deliver high sensitivity, low noise and high dynamic range. High-grade electronics ensure clear, sharp and low noise images that render details with amazing accuracy. Superior responsivity up to 1000nm positions it as a good choice for Near-Infrared (NIR) imaging. This industrial-grade camera is ideally suited for a variety of applications including unmanned vehicles, surveillance, traffic, tolling, high-speed inspection and machine vision. A scientific-grade variant is available for the most demanding life science applications such as ophthalmology and fluorescence. The Lt1265R can also be customized to suit OEM designs.
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Guangzhou Amittari Instruments Co.Ltd
AMITTARI l Whiteness Meter is mainly used to directly measure the whiteness value of object or powder with flat surface. It can be widely used in whiteness measurement of textile printing and dyeing, paint, chemical building materials, paper board, plastic products, white cement, ceramics, enamel, talc powder, starch, flour, salt, detergent, cosmetics and other substances. The instrument pass strict inspection and testing, conforms to the JJG 512-2002 Whiteness Meter Verification Regulation. Also conforms to GB3978、GB3979、GB7973、GB7974、ISO2470、GB8904.2、QB1840、GB2913、GB13025.2、GB1543、ISO2471、GB10339、GB5950、GB12911、GB2409 and other standards.
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Applied Image, Inc.
Accuracy in machine vision systems is critical to achieving strategic goals regarding quality, efficiency, and consistency. Use our ACCUplace product lines to calibrate vision systems’ distortion, placement/alignment, or other field parameters in systems used for guidance, identification, gauging, and inspection. Using our specialized ACCUedge® technology, our Robotic and Machine Vision Standards are manufactured with line-edge quality that is second to none in the industry, providing the precision needed to calibrate almost any system. Should you need to alter feature patterns, size, or substrate to fit your needs, fill out our Optical Components and Standards form to start the conversation.
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10719A -
Keysight Technologies
The Keysight 10719A One Axis Differential Interferometer makes either a differential linear or angular measurement for use in single and multiple axis applications. The linear measurement gauges the displacement between two objects, such as a stage and an optical column or inspection tool. The 10719A also measures either pitch or roll. An angle is measured when both reference and measurement beams measure to the same mirror. The 10721A provides high immunity to unwanted interferometer displacement, such as thermal expansion. It is a modular, compact design with monolithic optics for maximized mechanical stability. Use of a small 3 mm beam helps decrease Abb offset error.
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KLA-Tencor Corp
KLA’s substrate manufacturing portfolio includes defect inspection and review, metrology and data management systems that help substrate manufacturers manage quality throughout the wafer fabrication process. Specialized wafer inspection and review tools assess wafer surface quality and detect, count and bin defects during production and as a critical part of outgoing wafer qualification. Wafer geometry systems ensure the wafer shape is extremely flat and uniform in thickness, with precisely controlled wafer shape topography. Data analysis and management systems proactively identify substrate fabrication process excursions that can lead to yield loss. KLA’s substrate manufacturing systems support process development, production monitoring and final quality check of a broad range of substrate types and sizes including silicon, prime silicon, SOI, sapphire, glass, GaAs, SiC, GaN, InP, GaSb, Ge, LiTaO3, LiNBO3, and epitaxial wafers.
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MTI Instruments
MTI Instruments'' semiconductor wafer metrology tools consist of a complete line of wafer measurement systems for virtually any material including Silicon wafer (Si), Gallium Arsenide wafer (GaAs), Germanium wafer (Ge) and Indium Phosphide wafer (InP). From manual to semi-automated wafer inspection systems, the Proforma line of wafer metrology inspection tools is ideal for wafer thickness, wafer bow, wafer warp, resistivity, site and global flatness measurement. Our proprietary push/pull capacitance probes provide outstanding accuracy throughout their large measurement range, allowing measurement of highly warped wafers and stacked wafers. MTII''s solar metrology tools include off line manual systems for wafer thickness and Total Thickness Variation (TTV), as well as, in-process measurement systems capable of measuring wafer thickness, TTV and wafer bow at the speed of 5 wafers/second.
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Ponovo Power Co., Ltd.
PONOVO has long-term follow-up technology in China and abroad. Based on its own mature intelligent power detection equipment, and according to its own advantages in the field of new energy, PONOVO could be able to provide users with professional new energy test system solutions. In the field of electric vehicle technology, the electric vehicle charging facility detection platform based on the Internet cloud platform was introduced. This platform is one of the few domestic testing platforms that can automatically test the charging piles for network inspection, project acceptance, and factory testing. The platform has the advantages of automatic testing, low usage threshold, and high integration. It is widely used in the detection of relevant charging facilities in more than 20 provinces and cities in China, effectively meets the inspection of electric vehicle charging stations, and provides powerful technical support for the site acceptance test of charging stations.
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DCM401 -
Draper Tools Ltd
Expert Quality, auto and manual ranging clamp meter capable of voltage, current, resistance, diode, continuity, capacitance, frequency, duty cycle and temperature testing. Maximum jaw - opening diameter of 36mm, backlit LCD screen, auto power off and a useful inspection light. Supplied with test leads, temp probe, case and 3 x AAA batteries.
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IxLoad VE -
Keysight Network Applications and Security
IxLoad VE supports complete functional and performance testing of virtualized servers and 10GbE[LE1] converged network adapters (CNAs) for cloud computing environments. Using Ixia Virtual Load Modules, IxLoad VE is able to test a host of virtualized assets, including firewalls, deep packet inspection (DPI) devices, load balancers, and other network devices.
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NeuroCheck -
NeuroCheck GmbH
NeuroCheck is a general purpose image processing software for industrial quality control. The software has been designed to meet the requirements that an up-to-date quality management system makes on the visual inspection of every single item. Using NeuroCheck, you can check completeness of assembly groups, surface quality and measurements of work pieces, correctness of inscriptions and precise positioning.
