Showing results: 3406 - 3420 of 4999 items found.
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3233 -
Elcometer Limited
Available in aluminium or stainless steel this instrument consists of two concentric cylinders, one sliding inside the other. A spherical glass lens, which has engraved measurements, is fitted to the end of the central cylinder and when pressed into the wet film, leaves a circular trace.The diameter of the mark on the lens is measured and, using the supplied conversion table, the thickness of the coating can be easily assessed.Ideal for measuring the thickness of wet translucent products such as varnishes, oils etc.Measurement range of 2.25 - 360μm (0.09 - 14.17mils)
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Rinch Industrial Co.,Limited
This instrument is compatible with four standards of site to measure surface roughness of various machinery-processed parts, calculate corresponding and clearly display all measurement parameters.When measuring the roughness of a surface, the sensor is placed on the surface and then uniformly slides along the surface by driving the mechanism by the sharp built-in probe. This roughness causes displacement of the probe which results in change of inductive amount of induction coils so as to generate analogue signal, which is in proportion to the surface roughness at output end of phase-sensitive rectifier.
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Northern Digital Inc.
The Polaris Vega® optical measurement solution has three models of optical trackers that can be integrated into the workflow of OEM surgical navigation systems: the Polaris Vega XT, Polaris Vega VT, and Polaris Vega ST. All three Polaris Vega models share a common optical measurement technology platform, using near-infrared (IR) light to track the real-time positions of OEM surgical instruments via attached navigation markers. Tracking occurs wirelessly over a large measurement volume.
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Idex Health and Science
IDEX Health & Science stocks filter cubes used in fluorescence microscope platforms from the major microscope manufacturers, including Leica Microsystems, Nikon Instruments, Olympus Corp., and Zeiss Microscopy. Our super-resolution filter cubes set the new standard for laser-based microscopes and are optimized for mounting half-wave flatness, 1 mm thick super-resolution dichroic beam-splitters. Whether you order a custom or catalog filter set, complimentary filter mounting into the filter cube of your choice is performed by the certified staff.
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Duma Optronics LTD
The LAT (Laser Analyzing Telescope) is a powerful measuring instrument enabling direct measurement of laser beams or other light sources.The LAT will analyze and display the angular direction of incoming laser beams with resolutions down to 1 micro-radian and accuracy of 1 millidegree (~20 micro-radian).The built-in back Filter Slider allows control of the laser level impinging the detector area. Moreover, a special version will allow angle measurement of cross-like collimated targets to be examined.Results are clearly displayed by the provided software.
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HORIBA, Ltd.
We offer a range of OEM instruments from miniature fiber spectrometers to research-grade grating spectrometer systems with TE or LN2-cooled CCD and InGaAs detectors.HORIBA Scientific provides miniature CCD and PDA USB spectrometers as well as 70 to 1250 mm focal length imaging spectrometers with single and multichannel detectors.If you are not a future OEM and are looking for larger, research-grade spectroscopy systems (focal lengths of 1/4 meter spectrometers and longer), please visit our Custom Spectroscopy Division
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Hinds Instruments, Inc.
Hinds Instruments Birefringence Measurement technology has been adopted by industry leaders world wide to measure birefringence and characterize stress birefringence in materials with unsurpassed accuracy, resolution and repeatability. Capable of measuring optical retardation at 0.001nm resolution with noise floors as low as 0.005nm, these systems are robust, dynamic and scalable to fit the demanding requirements of your application. We provide measurement systems across the light spectrum (DUV, VIS and NIR) and are able to measure virtually all optical materials.
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Allen-Bradley
Condition monitoring products help you keep your plant floor running productively by detecting potential equipment failures. We offer real-time protection modules, sensors, portable instruments, and surveillance software. Our XM® Series of intelligent I/O modules performs real-time processing of critical parameters used in assessing the current health and predicting the future health of industrial machinery. Apply our XM modules in standalone systems or with existing automation and control systems.
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Practical Instrument Electronics, Inc.
PIE has an RTD calibrator to fit your needs from the PIE 510B single type RTD simulator to the advanced troubleshooting capabilities of the PIE 311Plus. Have you had issues in the past where your RTD calibrator wouldn’t work with some of the instruments in your plant? Our RTD calibrators are guaranteed to be compatible with all process RTD inputs including all brands of smart temperature and multivariable transmitters, PLC input cards, DCS systems and multichannel recorders.
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Bruker AXS GmbH
Nano Surfaces provides industry-leading surface analysis instruments for the research and production environment. Our broad range of 2D and 3D surface profiler solutions supply the specific information needed to answer R&D, QA/QC, and surface measurement questions with speed, accuracy, and ease. Bruker’s AFMs are enabling scientists around the world to make discoveries and advance their understanding of materials and biological systems. Our tribometers and mechanical testers deliver practical data used to help improve development of materials and tribological systems.
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Practical Instrument Electronics, Inc.
PIE has a thermocouple calibrator to fit your needs from the PIE 520B single type thermocouple simulator to the advanced troubleshooting capabilities of the PIE 422Plus. Have you had issues in the past where your thermocouple calibrator wouldn’t work with some of the instruments in your plant? Our thermocouple calibrators are guaranteed to be compatible with all process thermocouple inputs including all brands of smart temperature transmitters, PLC input cards, DCS systems and multichannel recorders.
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AcoustoSizer II -
Colloidal Dynamics, LLC
The new AcoustoSizer IIs provides thorough characterization of concentrated colloidal dispersions. Directly measuring particle size, zeta potential, pH, conductivity, and temperature, it furnishes the most comprehensive analysis available in a single, turnkey instrument. Based on a flow-through sensor design, the AcoustoSizer IIs can be used in a laboratory batch analysis mode or connected directly to a process slipstream. Built-in syringe pumps provide automated potentiometric and volumetric titration capabilities for accurate isoelectric point and surfactant addition determination.
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Agilent Technologies
Set up your lab faster with ready-to-run eMethods. With Agilent eMethods, Agilent we’ve has done the hard work for you. eMethods are designed to accelerate your startup time by condensing large the vast amounts of technical information and optimized analytical methods into a ready-to-run, downloadable, digital information package.Each eMethod supplies you with information on the instrument configuration, consumables, Sample Preparation Protocols, Analytical methods for sample introduction, chromatographic separation, detection, and data analysis.
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Nanonics Imaging Ltd.
NSOM Is the premier tool for imaging and manipulation of light on the nanoscale and is a critical instrument for understanding plasmonics, photonic waveguides, photovoltaic and photoconductivity studies. The optical openness of the NSOM system permits any illumination scenario while the Multiprobe NSOM head offers optical transport and dynamic study on the nanoscale for the first time. Offering a variety of options from entry level to low-temperature systems, the MultiView NSOM series has been the platform of choice for imaging on the nanoscale for nearly two decades.
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NanoSight Range -
Malvern Panalytical Ltd
The Malvern Panalytical NanoSight range of instruments utilizes Nanoparticle Tracking Analysis (NTA) to characterize nanoparticles from 10nm -2000nm* in solution. Each particle is individually but simultaneously analyzed by direct observation and measurement of diffusion events. This particle-by-particle methodology produces high resolution results for nanoparticle size distribution and concentration, while visual validation provides users with additional confidence in their data. Both particle size and concentration are measured, while a fluorescence mode provides differentiation of intrinsic or fluorescently labelled nanoparticles.