Showing results: 346 - 360 of 396 items found.
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WMA-005 And WMA-005LF -
Falco Systems
The Falco Systems WMA-005 is a high voltage amplifier that runs from an 24 - 30V DC power supply and can be battery powered if required, e.g. for use in a Faraday cage. Its internal high voltage generator is inductor-free and hence does not spread magnetic interference in sensitive experimental setups. The output noise is impressively low at 3mVrms. For extremely low noise applications where bandwidth is not an issue, a dedicated WMA-005LF version is available that contains an output low pass filter capacitor which reduces the bandwidth to 50Hz, but makes the noise drop to below 0.1mVrms. This bandwidth-limited amplifier is ideal for MEMS or piezo positioning with manual voltage adjustment.
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WMA-01 And WMA-01LF -
Falco Systems
The Falco Systems WMA-01 is a high voltage amplifier that runs from an 24 - 30V DC power supply and can be battery powered if required, e.g. for use in a Faraday cage. Its internal high voltage generator is inductor-free and hence does not spread magnetic interference in sensitive experimental setups. The output noise is impressively low at 3mVrms. For extremely low noise applications where bandwidth is not an issue, a dedicated WMA-01LF version is available that contains an output low pass filter capacitor which reduces the bandwidth to 50Hz, but makes the noise drop to below 0.1mVrms. This bandwidth-limited amplifier is ideal for MEMS or piezo positioning with manual voltage adjustment.
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WMA-02 And WMA-02LF -
Falco Systems
The Falco Systems WMA-02 is a high voltage amplifier that runs from an 24 - 30V DC power supply and can be battery powered if required, e.g. for use in a Faraday cage. Its internal high voltage generator is inductor-free and hence does not spread magnetic interference in sensitive experimental setups. The output noise is impressively low at 4mVrms. For extremely low noise applications where bandwidth is not an issue, a dedicated WMA-02LF version is available that contains an output low pass filter capacitor which reduces the bandwidth to 50Hz, but makes the noise drop to below 0.2mVrms. This bandwidth-limited amplifier is ideal for MEMS or piezo positioning with manual voltage adjustment.
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SSA3000X-R -
SIGLENT Technologies
The SIGLENT SSA3000X-R real-time spectrum analyzers are powerful and flexible tools for complex RF signal monitor and analysis. With a capability of 40 MHz analysis bandwidth and 7.2 µs 100% POI, the analyzer can provide multi-dimensions data displays, advanced triggering, and RF data capturing, to solve modern RF spectrum challenges, like hopping frequency, conflict channel, spectrum interference, etc. They also provide standard tracking generator for network analysis, optional wideband digital modulation analysis, and EMI pre-compliance test. Applications include broadcast monitoring/evaluation, cellular site, IoT, WiFi, Bluetooth surveying, research and development, education, production, and maintenance.
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S930702B -
Keysight Technologies
S930702B enables fast and accurate active-device modulation distortion characterization under modulated stimulus condition up to 26.5 GHz. The wide dynamic range and vector error correction of the PNA-X result in an extremely low residual EVM of the test setup, so you can get a complete picture of your device’s performance without test system interference. S930702B can measure EVM, NPR, ACPR, and can decompose nonlinear signals and linear signals with the spectral correlation between input and output spectrum without doing demodulation. Integration with the PNA-X SCCM provides quick modulation distortion measurements while making other VNA measurements.
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S930705B -
Keysight Technologies
S930705B enables fast and accurate active-device modulation distortion characterization under modulated stimulus condition up to 50 GHz. The wide dynamic range and vector error correction of the PNA-X result in an extremely low residual EVM of the test setup, so you can get a complete picture of your device’s performance without test system interference. S930704B can measure EVM, NPR, ACPR, and can decompose nonlinear signals and linear signals with the spectral correlation between input and output spectrum without doing demodulation. Integration with the PNA-X SCCM provides quick modulation distortion measurements while making other VNA measurements.
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S930709B -
Keysight Technologies
S930709B enables fast and accurate active device modulation distortion characterization under modulated stimulus conditions up to 90 GHz. The wide dynamic range and vector error correction of the PNA-X results in an extremely low residual EVM of the test setup, delivering you a complete picture of your device’s performance without test system interference. S930709B measures EVM, NPR, ACPR, and decomposes nonlinear signals and linear signals with the spectral correlation between input and output spectrum without doing demodulation. Integration with the PNA-X SCCM provides quick modulation distortion measurements while making other VNA measurements.
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S930701B -
Keysight Technologies
S930701B enables fast and accurate active-device modulation distortion characterization under modulated stimulus condition up to 13.5 GHz. The wide dynamic range and vector error correction of the PNA-X result in an extremely low residual EVM of the test setup, so you can get a complete picture of your device’s performance without test system interference. S930701B can measure EVM, NPR, ACPR, and can decompose nonlinear signals and linear signals with the spectral correlation between input and output spectrum without doing demodulation. Integration with the PNA-X SCCM provides quick modulation distortion measurements while making other VNA measurements.
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S930712B -
Keysight Technologies
S930712B enables fast and accurate active device modulation distortion characterization under modulated stimulus conditions up to 125 GHz. The wide dynamic range and vector error correction of the PNA-X results in an extremely low residual EVM of the test setup, delivering you a complete picture of your device’s performance without test system interference. S93072B measures EVM, NPR, ACPR, and decomposes nonlinear signals and linear signals with the spectral correlation between input and output spectrum without doing demodulation. Integration with the PNA-X SCCM provides quick modulation distortion measurements while making other VNA measurements.
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S930704B -
Keysight Technologies
S930704B enables fast and accurate active-device modulation distortion characterization under modulated stimulus condition up to 43.5 GHz. The wide dynamic range and vector error correction of the PNA-X result in an extremely low residual EVM of the test setup, so you can get a complete picture of your device’s performance without test system interference. S930704B can measure EVM, NPR, ACPR, and can decompose nonlinear signals and linear signals with the spectral correlation between input and output spectrum without doing demodulation. Integration with the PNA-X SCCM provides quick modulation distortion measurements while making other VNA measurements.
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S930713B -
Keysight Technologies
S930713B enables fast and accurate active-device modulation distortion characterization under modulated stimulus conditions up to and beyond 125 GHz. The wide dynamic range and vector error correction of the PNA-X results in an extremely low residual EVM of the test setup, delivering you a complete picture of your device’s performance without test system interference. S930713B measures EVM, NPR, ACPR, and decomposes nonlinear signals and linear signals with the spectral correlation between input and output spectrum without doing demodulation. Integration with the PNA-X SCCM provides quick modulation distortion measurements while making other VNA measurements.
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S930707B -
Keysight Technologies
S930707B enables fast and accurate active-device modulation distortion characterization under modulated stimulus condition up to 70 GHz. The wide dynamic range and vector error correction of the PNA-X result in an extremely low residual EVM of the test setup, so you can get a complete picture of your device’s performance without test system interference. S930707B can measure EVM, NPR, ACPR, and can decompose nonlinear signals and linear signals with the spectral correlation between input and output spectrum without doing demodulation. Integration with the PNA-X SCCM provides quick modulation distortion measurements while making other VNA measurements.
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S930700B -
Keysight Technologies
S930700B enables fast and accurate active-device modulation distortion characterization under modulated stimulus condition up to 8.5 GHz. The wide dynamic range and vector error correction of the PNA-X result in an extremely low residual EVM of the test setup, so you can get a complete picture of your device’s performance without test system interference. S930700B can measure EVM, NPR, ACPR, and can decompose nonlinear signals and linear signals with the spectral correlation between input and output spectrum without doing demodulation. Integration with the PNA-X SCCM provides quick modulation distortion measurements while making other VNA measurements.
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ATS1500C -
Rohde & Schwarz GmbH & Co. KG
The R&S®ATS1500C radar test chamber is a compact antenna test range (CATR), consisting of a gold-plated parabolic reflector and a two-axis positioner for 3D movements of the radar module. Combined with the R&S®AREG800A target simulator and other Rohde & Schwarz test and measuring instruments, it can be used for a variety of applications, including antenna characterization, module calibration, RF performance validation, interference testing or in-band compliance testing. The chamber is equipped with a universal feed antenna which gives access to both polarizations in parallel. Automated temperature testing over the range of -40 to 85°C is possible with an optional enclosure.
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SX set -
Langer EMV-Technik GmbH
The SX1 set consists of 3 passive near field probes for making measurements in the development phase of E-field and magnetic field with a high clock frequency in the range from 1 GHz to 10 GHz. The probe heads of the set SX allow for measurements close to electronic assemblies, e.g. on single IC pins, conducting paths, components and their connectors, to localize interference sources. Field orientation and field distribution on an electronic assembly can be detected through trained use of the near field probe. The near field probes are small and handy. They have a sheath current attenuation and are electrically shielded. They can be connected to a spectrum analyzer or an oscilloscope with a 50 Ω input. They have an internal terminating resistance.
