Filter Results By:
Products
Applications
Manufacturers
- CAMI Research Inc. (CableEye®)
product
High Voltage, Continuity & Hipot, Cable & Wire Harness Test Systems
CableEye HVX, HVX-21
CAMI Research Inc. (CableEye®)
Fast ● Simple ● Precise
Advanced wiring analyzer scans for continuity (opens, shorts), miswires, resistance, capacitance, components (resistors, diodes, LEDs, capacitors) dielectric breakdown, insulation resistance, intermittent connections
HVX (Item 829) 1500 Vdc, 1000 Vac
HVX-21 (Item 829A) 2100 Vdc, 1200 Vac
For diagnostic and Pass/Fail Testing — Permits expanded testing (compared to models in our low voltage product line) for insulation resistance (IRI) and dielectric breakdown (DWV).
All CableEye testers are suitable for production, fault diagnosis, QC (Quality Control), assembly, and prototyping of standard or custom cables. Each combines test, fault location, design, documentation, labeling, and database storage in one instrument. Tests can be performed on long cables (with or without connectors) or no cables (e.g. connectors, backplanes, PCBs, components).
Standard Features & Benefits:- USB certified, PC-based tester for a versatile, fast, robust system with long life-cycle.
- Multilingual, dynamic, graphic-rich display (netlist & wiring schematic) provides clarity and speeds diagnostics.
- 128 Test Points, expandable to 1024 providing flexibility as your product line changes.
- User-selectable voltage to each connection group in the cable simplifies an otherwise complex process, accelerating testing.
- Programmable Ramp Up, Ramp Down, Dwell Time (same as Test Time), Trip Current, and Trip Delay (same as Soak Time) adds versatility.
- Current leakage detected during HV test phase provides a measure of insulation resistance up to 1 GΩ (HVX) and 5 GΩ (HVX-21) - any leakage current exceeding a preset limit reveals the presence of moisture, flux, or other contamination on exposed contacts.
- Real-time screening for intermittent connections for pinpointing elusive faults and improving quality.
- Automation scripting in a simple, intuitive language allowing non-programmers to reduce operator error by automating repetitive steps.
- Pop-Up Work Instructions. choose the exact amount of detail, imagery, language and automation you need to ensure your work instructions and tests are carried out flawlessly.
- Flexible tolerancing: optionally define as percentages or absolute terms, as well as asymmetrically (e.g. +0%/-10%) for improved yields.
- Barcode-tracking & archival data-logging to achieve error-proof test process and improved traceability & productivity.
- Print PASS/FAIL labels, test reports (with or without color wiring schematics/netlists) and log reports to satisfy ISO9000 reporting requirements.
- Compatible with laptop and touchscreen PCs for fieldwork and rack/off-bench mounting.
Includes:
CB29 board set (Item 759) for bare wire connections; comprehensive PC software with Database of >200 standard cables; 2 yr Product Support Subscription comprising Warranty, free tech support, and free software upgrades.
Select Add-On Options:
Hardware: 128-point Expansion Modules (attach to base); 4-Wire Kelvin Resistance Measurement, 1 mΩ at 1 A; Advanced Measurements; External Measurement Instrument Port (e.g. 10 GΩ Isolation at 100 V); Remote Control Connector for Deadman Switch; Environmental Sensor
Software: PinMap™ fixture editor, Connector Designer™ connector editor, or Autobuild™ guided assembly modules
camiresearch.com |@CAMI_CableEye |+1.978.266.2655 -
-
product
Kelvin Clips
129141
Comprising of a Red/Grey & a Black/Grey Kelvin Crocodile Clip lead using low loss 1mm²multistranded ( 7/36/0.071. ) double skin silicone cables terminating in 4mm ...
-
product
Kelvin Test Leads
Kelvin Test Probes, Kelvin Test Leads, based on the Parrot™ Clip Invention provide reliable contacts and connections for the Sense and for the Current leads .
-
-
product
Kelvin Clip Set
11062A
Create custom Kelvin probes for 4-wire resistance measurements; set contains only the two gold-plated clips
-
product
Scanning Kelvin Probe
Our large range of Scanning Kelvin Probes gives the user full access to 2D and 3D work function plots of samples ranging in size from 50 mm to 350 mm. With work function resolution of 1 - 3 meV, and the spatial resolution of the Probe tip diameter (0.05 mm with the SKP5050 model), the Scanning Kelvin Probe gives reliable, repeatable measurements for work function, contact potential difference and Volta potential.
-
product
Single-Point Kelvin Probe
Our Single-Point Kelvin Probe system (KP020) is the introductory system in the KP Technology product family. The off-null signal detection method allows high-quality measurements of the Work Function/Fermi Level of materials.
-
product
Kelvin Probe Systems
Kelvin probe measures the work function difference between the tip and the sample when in thermoequilibrium state (a), and measures the electrical potential when the sample is illuminated (b), which is the sum of the difference in workfunction and internal/external-applied voltages.
-
-
product
Kelvin Contact Test
C.C.P. Contact Probes Co., LTD.
We offer different tip types for low resistance testing.
-
product
Kelvin Probe Set
11059A
Reduce ground-related errors and contact resistance through gold-plated flat tweezers and special gripping surfaces
-
product
Precision Kelvin Holders
MH-4 Series
Integrating Spheres are essential tools for photometricresearch laboratories & lamp / luminaire manufacturers. To derive the best results from Integrating Sphere Photometry, precision lamp holders are necessary.
-
product
Relative Humidity Kelvin Probe
RHC
The Relative Humidity Kelvin Probe (RHC) systems are the ideal solution for monitoring samples in a controlled atmosphere for contact potential difference (CPD)/work function (Φ) measurements.
-
product
Scanning Kelvin Probe Microscope
VS-SKP
The Kelvin Probe experiment uses a nondestructive method to determine the relative work function difference between the probe and the sample. Work function describes the energy required to liberate an electron from the surface of a conductor; electrochemists often interpret this as the difference from an electrode’s Fermi Level, average energy of electrons, and that of vacuum.
-
product
Off-Set Kelvin Test Sockets
This is an innovative and robust contact technology for making Kelvin contact to 0.5mm pitch QFNs. The contact uses a tip that is angled to one side, matched to an orientation that's flat on the tip. Two such contacts placed in opposition will touch the pad within 0.125mm. And because the tip is offset, the probe diameter is a robust 0.39mm and the load board pad pitch remains 0.5mm.
-
product
Ultra-High Vacuum Kelvin Probe
Our Ultra-high Vacuum Kelvin Probes give the user full access to work function and contact potential difference (CPD) measurements under vacuum. Each system comes with a high-quality, manual, or motorized translator that enables reliable and accurate tip-to-sample positioning, and the unrivalled tracking system always holds the tip separation constant during the measurement. Even under vacuum, the work function resolution is 1 - 3 meV.
-
product
Large Kelvin Clip Lead
16089A
Measure odd-shaped components that you cannot measure using conventional fixtures
-
product
Kelvin IC Clip Lead
16089C
Measure odd-shaped components that you cannot measure using conventional fixtures
-
product
Medium Kelvin Clip Lead
16089B
Measure odd-shaped components that you cannot measure using conventional fixtures
-
product
Conversion Kit for Kelvin Holders
KC-4
Integrating Spheres are essential tools for photometric research laboratories & lamp / luminaire manufacturers. To derive the best results from Integrating Sphere Photometry, precision lamp holders are necessary
-
product
Kelvin Clip Test Lead Set
5940
Kelvin Clip Test Lead Set. Ideal for resistant measurementsbelow 1 ohm.
-
product
Wide Jaw Kelvin Lead Set
6730
Wide Jaw Kelvin Lead Set. True wire four wire lead set with gold plated alligator clips that open to a wide .800? (20.3mm).
-
product
Ultra-High Vacuum Scanning Kelvin Probe
Our Ultra-high Vacuum Scanning Kelvin Probes (UHVSKP2020 and UHVSKP5050) give the user full access to work function (Φ) and contact potential difference (CPD) measurements under vacuum with the ability to scan a sample area of 20 x 20mm or 50 x 50mm respectively. Each system comes with the UHV head unit, tip amplifier (located at the mounting port), digital control unit and host PC with dedicated software. The tip can be retracted 100mm from the sample and approaches normal to the sample. The associated digital electronic unit powers the head unit and provides an interface between the head unit and the data acquisition system. The system comes with a complete user manual, which includes an introduction to work function measurements and a detailed description of the system software, including examples. The work function resolution of the Ultra-High Vacuum Scanning Kelvin Probes is 1-3 meV.
-
product
Ambient Single Point Kelvin Probe System
This single point Kelvin Probe System operates under ambient conditions and is small enough to be placed in a customized glowth box. The probe head operates with an oscillating membrane and can be easily exchanged. The preamplifier is integrated inside the probe head.
-
product
Ultra-High Vacuum Ф4 Scanning Kelvin Probe
The Ф4 Ultra-high Vacuum Scanning Kelvin Probe system gives the user full access to work function measurements under vacuum with the ability to alter the temperature from 77 K to 860 K. The Kelvin Probe measurement has resolution of 1 - 3 meV for a 2 mm tip on a conducting sample. The sample is mounted on a plate that is located on a motorized (x, y, z) translator attached to a stainless-steel vacuum chamber. Phi 4 also comes with a photoemission spectroscopy system with a tuneable source (3.4 - 7.0 eV). The deep ultra-violet (DUV) light spot measures approximately 3 x 4 mm. Absolute work function measurements can be obtained with this system in the range of 4.0 - 6.5 eV with an accuracy of 0.05 - 0.1 eV.
-
product
Banana-Triax Adapter For 4‑Wire (Kelvin) Connection
N1297B
The N1297 Series is a collection of banana-triax adapters for the Keysight B2900 Series precision source measure unit (SMU). It consists of both 2-wire as well as 4-wire connection requirements.
-
product
MINIATURE SILICON DIODE TEMPERATURE SENSOR, 2 To 600 Degress Kelvin
Insight Product Company offers SILICON DIODE TEMPERATURE SENSORS CAN BE USED FOR TEMPERATURE Â MEASUREMENTS IN DIFFERENT FIELDS OF CRYOGENIC ENGINEERING AND EXPERIMENTAL PHYSICS. THEY ARE MINIATURE AND OPERATE IN THE TEMPERATURE RANGE FROM 2 TO 600 K.
-
product
Controlled Atmosphere
KP Technology offer a range of Kelvin Probes that work in a controlled environment including automatic control of relative humidity within the Kelvin Probe housing and integrated nitrogen atmosphere control.
-
-
product
Multi-Test Resistivity Measurement System
Sheet resistance mapping of thin films with a collinear 4-point probe, Temperature co-efficient of resistance (TCR) of thin films with collinear 4-point probe, Precision temperature co-efficient of resistance (TCR) with 2-point Kelvin probes and precision surface temperature probe, resistor testing with 2-point Kelvin probes,Precision resistor testing with a Kelvin probe card, temperature co-efficient of resistance resistor test (TCR), and Standard TCR test of multiple resistors with Kelvin probes or a probe card.
