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- CAMI Research Inc. (CableEye®)
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4-Wire Resistance Measurement | Continuity & HiPot Cable & Wire Harness Testers
CAMI Research Inc. (CableEye®)
An add-on option for the CableEye HVX high voltage cable tester series that permits expanded testing for contact and wire resistance as low as 1 mΩ. After checking for opens, shorts, miswires, and resistance limits, the 4-wire Kelvin measurement applies a user-selectable test current from 10 mA to 1 A to determine connection resistance within 1 mΩ. The resistance profile of a model cable may be stored and used as a basis of comparison during later testing to reveal cold solder joints, faulty crimps, recessed pins, pin contact contamination, improper wire gauge, and stress-extruded wire.This option may be purchased with any new HVX tester, or added as an upgrade to any of your existing HVX testers.
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Kelvin Clips
129141
Comprising of a Red/Grey & a Black/Grey Kelvin Crocodile Clip lead using low loss 1mm²multistranded ( 7/36/0.071. ) double skin silicone cables terminating in 4mm ...
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Kelvin Test Leads
Kelvin Test Probes, Kelvin Test Leads, based on the Parrot™ Clip Invention provide reliable contacts and connections for the Sense and for the Current leads .
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Kelvin Clip Set
11062A
Create custom Kelvin probes for 4-wire resistance measurements; set contains only the two gold-plated clips
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Scanning Kelvin Probe
Our large range of Scanning Kelvin Probes gives the user full access to 2D and 3D work function plots of samples ranging in size from 50 mm to 350 mm. With work function resolution of 1 - 3 meV, and the spatial resolution of the Probe tip diameter (0.05 mm with the SKP5050 model), the Scanning Kelvin Probe gives reliable, repeatable measurements for work function, contact potential difference and Volta potential.
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Single-Point Kelvin Probe
Our Single-Point Kelvin Probe system (KP020) is the introductory system in the KP Technology product family. The off-null signal detection method allows high-quality measurements of the Work Function/Fermi Level of materials.
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Kelvin Probe Systems
Kelvin probe measures the work function difference between the tip and the sample when in thermoequilibrium state (a), and measures the electrical potential when the sample is illuminated (b), which is the sum of the difference in workfunction and internal/external-applied voltages.
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Kelvin Contact Test
C.C.P. Contact Probes Co., LTD.
We offer different tip types for low resistance testing.
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Kelvin Probe Set
11059A
Reduce ground-related errors and contact resistance through gold-plated flat tweezers and special gripping surfaces
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Precision Kelvin Holders
MH-4 Series
Integrating Spheres are essential tools for photometricresearch laboratories & lamp / luminaire manufacturers. To derive the best results from Integrating Sphere Photometry, precision lamp holders are necessary.
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Relative Humidity Kelvin Probe
RHC
The Relative Humidity Kelvin Probe (RHC) systems are the ideal solution for monitoring samples in a controlled atmosphere for contact potential difference (CPD)/work function (Φ) measurements.
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Scanning Kelvin Probe Microscope
VS-SKP
The Kelvin Probe experiment uses a nondestructive method to determine the relative work function difference between the probe and the sample. Work function describes the energy required to liberate an electron from the surface of a conductor; electrochemists often interpret this as the difference from an electrode’s Fermi Level, average energy of electrons, and that of vacuum.
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Off-Set Kelvin Test Sockets
This is an innovative and robust contact technology for making Kelvin contact to 0.5mm pitch QFNs. The contact uses a tip that is angled to one side, matched to an orientation that's flat on the tip. Two such contacts placed in opposition will touch the pad within 0.125mm. And because the tip is offset, the probe diameter is a robust 0.39mm and the load board pad pitch remains 0.5mm.
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Ultra-High Vacuum Kelvin Probe
Our Ultra-high Vacuum Kelvin Probes give the user full access to work function and contact potential difference (CPD) measurements under vacuum. Each system comes with a high-quality, manual, or motorized translator that enables reliable and accurate tip-to-sample positioning, and the unrivalled tracking system always holds the tip separation constant during the measurement. Even under vacuum, the work function resolution is 1 - 3 meV.
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Large Kelvin Clip Lead
16089A
Measure odd-shaped components that you cannot measure using conventional fixtures
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Kelvin IC Clip Lead
16089C
Measure odd-shaped components that you cannot measure using conventional fixtures
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Medium Kelvin Clip Lead
16089B
Measure odd-shaped components that you cannot measure using conventional fixtures
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Conversion Kit for Kelvin Holders
KC-4
Integrating Spheres are essential tools for photometric research laboratories & lamp / luminaire manufacturers. To derive the best results from Integrating Sphere Photometry, precision lamp holders are necessary
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Kelvin Clip Test Lead Set
5940
Kelvin Clip Test Lead Set. Ideal for resistant measurementsbelow 1 ohm.
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Wide Jaw Kelvin Lead Set
6730
Wide Jaw Kelvin Lead Set. True wire four wire lead set with gold plated alligator clips that open to a wide .800? (20.3mm).
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Ultra-High Vacuum Scanning Kelvin Probe
Our Ultra-high Vacuum Scanning Kelvin Probes (UHVSKP2020 and UHVSKP5050) give the user full access to work function (Φ) and contact potential difference (CPD) measurements under vacuum with the ability to scan a sample area of 20 x 20mm or 50 x 50mm respectively. Each system comes with the UHV head unit, tip amplifier (located at the mounting port), digital control unit and host PC with dedicated software. The tip can be retracted 100mm from the sample and approaches normal to the sample. The associated digital electronic unit powers the head unit and provides an interface between the head unit and the data acquisition system. The system comes with a complete user manual, which includes an introduction to work function measurements and a detailed description of the system software, including examples. The work function resolution of the Ultra-High Vacuum Scanning Kelvin Probes is 1-3 meV.
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Ambient Single Point Kelvin Probe System
This single point Kelvin Probe System operates under ambient conditions and is small enough to be placed in a customized glowth box. The probe head operates with an oscillating membrane and can be easily exchanged. The preamplifier is integrated inside the probe head.
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Ultra-High Vacuum Ф4 Scanning Kelvin Probe
The Ф4 Ultra-high Vacuum Scanning Kelvin Probe system gives the user full access to work function measurements under vacuum with the ability to alter the temperature from 77 K to 860 K. The Kelvin Probe measurement has resolution of 1 - 3 meV for a 2 mm tip on a conducting sample. The sample is mounted on a plate that is located on a motorized (x, y, z) translator attached to a stainless-steel vacuum chamber. Phi 4 also comes with a photoemission spectroscopy system with a tuneable source (3.4 - 7.0 eV). The deep ultra-violet (DUV) light spot measures approximately 3 x 4 mm. Absolute work function measurements can be obtained with this system in the range of 4.0 - 6.5 eV with an accuracy of 0.05 - 0.1 eV.
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Banana-Triax Adapter For 4‑Wire (Kelvin) Connection
N1297B
The N1297 Series is a collection of banana-triax adapters for the Keysight B2900 Series precision source measure unit (SMU). It consists of both 2-wire as well as 4-wire connection requirements.
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MINIATURE SILICON DIODE TEMPERATURE SENSOR, 2 To 600 Degress Kelvin
Insight Product Company offers SILICON DIODE TEMPERATURE SENSORS CAN BE USED FOR TEMPERATURE Â MEASUREMENTS IN DIFFERENT FIELDS OF CRYOGENIC ENGINEERING AND EXPERIMENTAL PHYSICS. THEY ARE MINIATURE AND OPERATE IN THE TEMPERATURE RANGE FROM 2 TO 600 K.
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Controlled Atmosphere
KP Technology offer a range of Kelvin Probes that work in a controlled environment including automatic control of relative humidity within the Kelvin Probe housing and integrated nitrogen atmosphere control.
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Multi-Test Resistivity Measurement System
Sheet resistance mapping of thin films with a collinear 4-point probe, Temperature co-efficient of resistance (TCR) of thin films with collinear 4-point probe, Precision temperature co-efficient of resistance (TCR) with 2-point Kelvin probes and precision surface temperature probe, resistor testing with 2-point Kelvin probes,Precision resistor testing with a Kelvin probe card, temperature co-efficient of resistance resistor test (TCR), and Standard TCR test of multiple resistors with Kelvin probes or a probe card.
