Showing results: 1 - 15 of 162 items found.
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Santa Barbara Infrared, Inc.
Santa Barbara Infrared, Inc. offers an extensive family of test systems and components that test and characterize the performance of laser range finders, designators, illuminators and spot trackers. In this section, detailed information is provided for the following:
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Yelo Ltd.
Life-tests consist of the highly accelerated ageing, under controlled conditions, of a group of lasers taken as a representative sample. Optical degradation of the laser diodes is observed and recorded by precisely measuring changes in the laser's operating characteristics during the test. Life-tests are used for vendor qualification of the laser diodes during product development and can be conducted throughout the production life of the laser.
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58604 -
Chroma ATE Inc.
The Chroma 58604 is a high density, multi-function, and temperature controlled module for laser diode burn-in and lifetime tests. Each module has up to 256 SMU channels which can source current and measure voltage in various control modes as described below.
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AB Controls, Inc.
Lix is a class of instruments for automated laser beam profiling, power measurement and analysis with integrated machine vision.
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LTS8620 -
VX Instruments GmbH
The LTS8620 test system is a modular PXI test system for testing and qualifying laser diodes. The system is able to generate extremely short current pulses. This minimizes the effects of heat on the laser diode.
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Hydra™ -
Textron Systems
Textron Systems' Hydra™ test set is used to stimulate laser warning receiver systems. It is a rugged, battery-operated test set that can be handheld or supported on a simple tripod.
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Yelo Ltd.
The Yelo LIV test instrument allows LIV measurements to be taken from laser devices loaded into a Yelo module. This module can also be used with the Yelo Y1000L Low Power Burn-in system. The LIV test instrument has been designed for easy operation. Once powered on, and with laser supply enabled, the touch screen can be used to initiate, monitor and review measurements of laser devices.
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N1231B -
Keysight Technologies
The Keysight N1231B PCI Three-Axis Laser Board with External Sampling is a register based PCI bus board that implements three axes of laser interferometer measurement for position monitoring and closed-loop servo control. There are four external sample inputs along with four data hold inputs that allow easy synchronization with user systems. Several threshold compare registers, with both hardware outputs and interrupt capability, can be used for travel limit and in window or out of window detection functions. The dual mode hardware position outputs, controlled by the hold inputs, provide either a 32-bits/axis parallel interface or a 36-bit multiplexed interface to the 36-bit axis position data at rates up to 20MHz. The user can programmatically access the externally sampled position and velocity data, as well as software sampled position and velocity data, over the PCI bus at rates up to 100kHz (3 axes of position and velocity) or 200kHz (position or velocity only).
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N1231A -
Keysight Technologies
The Keysight N1231A PCI Three-Axis Laser Board is a register based PCI bus board that implements three axes of laser measurement for position monitoring and closed-loop servo control. The hardware outputs, optimized for connection to a DeltaTau PMAC servo control system, provide parallel digital position data at rates up to 4MHz. The same position data along with velocity data is available over the PCI bus at rates up to 100kHz (3 axes of position and velocity) or 200kHz (position or velocity only).
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58602 -
Chroma ATE Inc.
Chroma 58602 is a high density, precision multi source measurement Unit (SMU) module with temperature control and exchangeable interface developed for burn-in, reliability and life test of optoelectronic components including laser diodes, VCSELs, VCSEL Arrays, silicon Photonics, photo-diodes and other similar components.
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Teledyne LeCroy
Teledyne LeCroy’s PCI Express 5.0 Test Platform is part of a suite of tools that facilitates complete protocol testing of PCI Express devices up to and including version 5.0. The latest feature of the Teledyne LeCroy Test Platform is the addition of an integrated interposer, which eliminates the need for an external interposer. This innovation simplifies setup with fewer connection points and outboard devices, making analysis easier and more reliable than ever. In addition to using the Test Platform with the Exerciser, the user can connect two of their own devices and use the Test Platform as a PCIe 5.0 backplane and as an interposer to capture protocol traffic between the systems.
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PXP-500A -
Teledyne LeCroy
The Teledyne LeCroy PXP-500A Test Platform provides a convenient means for testing PCIe 5.0 cards with a self-contained portable and powered passive backplane. The PXP-500A provides power required for both cards under test.
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iWave Systems Technologies
iWave 3U VPX High-Speed Video/Data Processing Card is a rugged standalone module in the 3U VPX form factor, aimed for the high-speed data, video processing, and display applications is ideal for military, defense, and aerospace applications requiring an optimal balance of performance and power efficiency. iWave 3U VPX High-Speed Video/Data Processing Card is implemented using Xilinx Kintex-7 device architecture and has I/O interfaces including High speed 16 channels of transceiver interfaces capable of operating up to 6 Gbps data rate, Gigabit Ethernet, RS232, RS422, PCIe interface, Built-in health monitoring circuits, HDMI input, and output interfaces
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27014 -
Chroma ATE Inc.
Chroma 27014 Flat Panel Display Tester is a complete testing solution that meets the Liquid Crystal Module testing requirements of production line. With integrated video generator, multi-channel precision power supply and process control unit, the system allows a complete test of signal, pattern and electrical parameters of LCM through a PC or remote control box.
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TS-960e -
Marvin Test Solutions, Inc.
The GENASYS Semi TS-960e PXI Express Semiconductor Test System is an integrated test platform that offers comparable system features and capabilities found in proprietary ATE systems. Available as a bench top system or with an integrated manipulator, the TS-960e takes full advantage of the PXI architecture to achieve a cost-effective and full-featured test solution for device, SoC and SiP test applications.